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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-30094-F15.0.0Rel-15Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC Details R5-187614 agreedRAN5#81Ericsson Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300931F15.0.0Rel-15LTE Anchor Link configuration for FR2 Details R5-188039 agreedRAN5#81Anritsu Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300921F15.0.0Rel-15Updates to clause 7.3B.3.4 in TS 38.521-3 Details R5-187833 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300911F15.0.0Rel-15Updates to Clause 5 in TS 38.521-3 Details R5-187835 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300901F15.0.0Rel-15Udpates to sections 1-4 in TS 38.521-3 to align with core spec Details R5-187834 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300891F15.0.0Rel-15FR2 Reference Sensitivity test case update Details R5-187832 agreedRAN5#81Qualcomm Austri... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300881F15.0.0Rel-15FR2 General Spurious Emission test case update Details R5-187831 agreedRAN5#81Qualcomm Austri... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30087-F15.0.0Rel-15Updates to TS 38.521-3 Section 4 with LTE anchor details Details R5-187565 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30086-F15.0.0Rel-15Update to 7.3B.2.2 - REFSENS for Intra-band Non-Contiguous EN-DC Details R5-187563 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30085-F15.0.0Rel-15Update to TC6.5B.3.2.1 - General Spurious Emissions for intra-band non-contiguous EN-DC Details R5-187562 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30084-F15.0.0Rel-15Updates to TS 38.521-3 Section 5 to align with core spec Details R5-187559 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30083-F15.0.0Rel-15Updates to TS 38.521-3 common sections 1-4 to align with core spec Details R5-187552 agreedRAN5#81Qualcomm Japan Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300821F15.0.0Rel-15Update TC 7.4B.3 Details R5-188027 agreedRAN5#81Huawei, Hisilicon Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300811F15.0.0Rel-15Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 Details R5-188024 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300801F15.0.0Rel-15Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 Details R5-188023 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30078-F15.0.0Rel-15Addition of TC6.3B.2.2 Transmit OFF Power for intra-band non-contiguous EN-DC Details R5-187373 agreedRAN5#81SGS Wireless Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30077-F15.0.0Rel-15Addition of TC6.3B.2.3 Transmit OFF Power for inter-band EN-DC within FR1 Details R5-187372 agreedRAN5#81SGS Wireless Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30076-F15.0.0Rel-15Addition of TC6.3B.2.1 Transmit OFF Power for intra-band contiguous EN-DC Details R5-187371 agreedRAN5#81SGS Wireless Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300751F15.0.0Rel-15Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 Details R5-188022 agreedRAN5#81SGS Wireless Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300741F15.0.0Rel-15Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC Details R5-188021 agreedRAN5#81SGS Wireless Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300731F15.0.0Rel-15Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC Details R5-188020 agreedRAN5#81SGS Wireless Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300721F15.0.0Rel-15Introduction of In-band Emissions for intra-band contiguous EN-DC Details R5-188019 agreedRAN5#81LG Electronics Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300711F15.0.0Rel-15Introduction of Carrier Leakage for intra-band contiguous EN-DC Details R5-187829 agreedRAN5#81LG Electronics Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300701F15.0.0Rel-15Introduction of Error Vector Magnitude for intra-band contiguous EN-DC Details R5-187828 agreedRAN5#81LG Electronics Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300691F15.0.0Rel-15Core alignment CR to capture TS 38.101-3 updates during RAN4#89 Details R5-188222 agreedRAN5#81NTT DOCOMO, INC. Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300681F15.0.0Rel-15Spurious emission band UE co-existence for intra-band non-contiguous EN-DC Details R5-188018 agreedRAN5#81Qualcomm Incorp... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300671F15.0.0Rel-15Addition of notes to clarify test point selection into general section of TS 38.521-3 Details R5-187913 agreedRAN5#81NTT DOCOMO, INC. Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300661F15.0.0Rel-15Additonal Spurious emission for inter-band EN-DC Details R5-188017 agreedRAN5#81Qualcomm Incorp... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300651F15.0.0Rel-15Additonal Spurious Emissions for Intra-band non-contiguous EN-DC Details R5-188016 agreedRAN5#81Qualcomm Incorp... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300641F15.0.0Rel-15Additonal Spurious Emissions for Intra-band contiguous EN-DC Details R5-188015 agreedRAN5#81Qualcomm Incorp... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300631F15.0.0Rel-15Introduction of wideband intermodulation tests for FR1 inter-band EN-DC Details R5-188220 agreedRAN5#81Anritsu Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300621F15.0.0Rel-15Introduction of receiver spurious emission tests for FR1 inter-band EN-DC Details R5-188219 agreedRAN5#81Anritsu Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30061-F15.0.0Rel-15Updated EN-DC configuration information in clause 5 Details R5-187153 agreedRAN5#81Bureau Veritas Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300601F15.0.0Rel-15Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 Details R5-187827 agreedRAN5#81KTL, MTCC Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300591F15.0.0Rel-15Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 Details R5-187826 agreedRAN5#81KTL, MTCC Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300581F15.0.0Rel-15Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 Details R5-187825 agreedRAN5#81KTL Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300571F15.0.0Rel-15Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC Details R5-188012 agreedRAN5#81KTL Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300561F15.0.0Rel-15Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC Details R5-187823 agreedRAN5#81KTL Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300551F15.0.0Rel-15Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC Details R5-187822 agreedRAN5#81KTL Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300541F15.0.0Rel-15LTE TDD configuration for UE Tx test in EN-DC Details R5-188221 agreedRAN5#81Ericsson Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300531F15.0.0Rel-15Update general parameter Connection without release in initial conditions in TS 38.521-3 Details R5-187819 agreedRAN5#81Keysight Techno... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300521F15.0.0Rel-15Addition OBW intraband non contiguous EN-DC Details R5-187821 agreedRAN5#81Keysight Techno... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300511F15.0.0Rel-15Addition SEM intra-band contiguous EN-DC Details R5-188014 agreedRAN5#81Keysight Techno... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300501F15.0.0Rel-15Addition OBW intra-band contiguous EN-DC Details R5-188013 agreedRAN5#81Keysight Techno... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30049-F15.0.0Rel-15Minor update OBW, SEM and ACLR inter-band FR1 test cases Details R5-186788 agreedRAN5#81Keysight Techno... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300481F15.0.0Rel-15Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 Details R5-187816 agreedRAN5#81Ericsson Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30047-F15.0.0Rel-15Updates to test case 6.2B.2.3, UE Maximum Output Power reduction for Inter-Band EN-DC within FR1 Details R5-186684 agreedRAN5#81Ericsson Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30046-F15.0.0Rel-15Updates to EN-DC test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC Details R5-186681 agreedRAN5#81Ericsson Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30045-F15.0.0Rel-15Updating test case 6.5B.2.1.2 Additional spectrum emissions mask for intra-band contiguous EN-DC Details R5-186673 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30044-F15.0.0Rel-15Updating test case 6.2B.3.1 Additional Maximum Output Power reduction for Intra-band contiguous EN-DC Details R5-186672 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300431F15.0.0Rel-15Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC Details R5-187820 agreedRAN5#81Ericsson Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30042-F15.0.0Rel-15Spurious emission band UE co-existence for Inter-band EN-DC within FR1 Details R5-186608 agreedRAN5#81Qualcomm Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300411F15.0.0Rel-155G NR_EN_DC with FR1_Text update for Inter-Band RX sensitivity Details R5-188026 agreedRAN5#81Qualcomm Inc Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30040-F15.0.0Rel-155G NR_Text update for TX spurious emission intra-band contiguous EN-DC Details R5-186602 agreedRAN5#81Qualcomm Inc. Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30039-F15.0.0Rel-155G NR_EN_DC with FR1_Text update for Intra-Band Contiguous RX sensitivity Details R5-186601 agreedRAN5#81Qualcomm inc. Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300381F15.0.0Rel-15Update Clause 7.5B.3 in TS 38.521-3 Details R5-188025 agreedRAN5#81CMCC Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300371F15.0.0Rel-15Updates of TT in TS 38.521-3 Annex F during RAN5#81 Details R5-188029 agreedRAN5#81NTT DOCOMO, INC. Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-300361F15.0.0Rel-15Updates of MU in TS 38.521-3 Annex F during RAN5#81 Details R5-188028 agreedRAN5#81NTT DOCOMO, INC. Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30035-F15.0.0Rel-1538.521-3 Applicability Rules Details R5-186507 agreedRAN5#81Qualcomm Finlan... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30034-F15.0.0Rel-15Update Text on Store Beam Peak Coordinate Details R5-186506 agreedRAN5#81Qualcomm Finlan... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.521-30033-F15.0.0Rel-15FR2 Spurious Emission test case updates Details R5-186503 agreedRAN5#81Qualcomm Finlan... Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest