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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9050116-F15.1.0Rel-15TP analysis of FR1 time alignment error for UL MIMO Details R5-192239 agreedRAN5#82China Unicom Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501151F15.1.0Rel-15TP_analysis_38.905_6.5B.3_TX_SpurEmission Details R5-192624 agreedRAN5#82Qualcomm UK Ltd Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501142F15.1.0Rel-15Introduction of new section for Tp analysis of Tx spurious Details R5-192846 agreedRAN5#82NTT DOCOMO, INC. Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501131F15.1.0Rel-15Addition of TP analysis for EN-DC 6.2B.4.1.3 Configured transmitted power inter-band within FR1 Details R5-192444 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501121F15.1.0Rel-15Addition of TP analysis for EN-DC 6.2B.4.1.2 Configured transmitted power Intra-band non-contigous Details R5-192692 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501111F15.1.0Rel-15Addition of TP analysis for EN-DC 6.2B.4.1.1 Configured transmitted power Intra-band contigous Details R5-192691 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501101F15.1.0Rel-15Update of TP analysis of FR1 6.3.1 Minimum Output Power Details R5-192410 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501091F15.1.0Rel-15Add Tp analysis sttatements for MIMO tests Details R5-192582 agreedRAN5#82Huawei, Hisilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050108-F15.1.0Rel-15Adding test case 6.2B.1.3 to 38.905 Details R5-192009 agreedRAN5#82Huawei, Hisilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050107-F15.1.0Rel-15Adding test case 6.2B.1.2 to 38.905 Details R5-192008 agreedRAN5#82Huawei, Hisilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050106-F15.1.0Rel-15Adding test case 6.2B.1.1 to 38.905 Details R5-192007 agreedRAN5#82Huawei, Hisilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050105-F15.1.0Rel-15Adding test case 7.4B.2 to 38.905 Details R5-192003 agreedRAN5#82Huawei, Hisilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050104-F15.1.0Rel-15Adding test case 7.4B.1 to 38.905 Details R5-192002 agreedRAN5#82Huawei, Hisilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501031F15.1.0Rel-15TP analysis for FR1 6.5A.4.1 Transmit intermodulation for CA (2UL CA) Details R5-192406 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501021F15.1.0Rel-15TP analysis for FR1 6.5A.3.2.1 Spurious emissions for UE co-existence for CA (2UL CA) Details R5-192575 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501011F15.1.0Rel-15TP analysis for FR1 6.5A.3.1.1 General spurious emissions for CA (2UL CA) Details R5-192574 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90501001F15.1.0Rel-15TP analysis for FR1 6.5A.2.4.2.1 UTRA ACLR for CA (2UL CA) Details R5-192405 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500991F15.1.0Rel-15TP analysis for FR1 6.5A.2.4.1.1 NR ACLR for CA (2UL CA) Details R5-192404 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500981F15.1.0Rel-15TP analysis for FR1 6.5A.2.2.1 Spectrum emission mask for CA (2UL CA) Details R5-192573 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500971F15.1.0Rel-15TP analysis for FR1 6.4A.2.3.1 In-band emissions for CA (2UL CA) Details R5-192572 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500961F15.1.0Rel-15TP analysis for FR1 6.4A.2.2.1 Carrier leakage for CA (2UL CA) Details R5-192571 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500951F15.1.0Rel-15TP analysis for FR1 6.4A.2.1.1 Error Vector Magnitude for CA (2UL CA) Details R5-192568 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500941F15.1.0Rel-15TP analysis for FR1 6.4A.1.1 Frequency error for CA (2UL CA) Details R5-192569 agreedRAN5#82Samsung Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500921F15.1.0Rel-15Addition of Test Point analysis of FR2 6.3.4.4 Aggregate power tolerance Details R5-192647 agreedRAN5#82LG Electronics Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050091-F15.1.0Rel-15TP_analysis_38.905_6.5.3.1_TX_SpurEmission Details R5-191855 agreedRAN5#82Qualcomm UK Ltd Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050087-F15.1.0Rel-15Test Point analysis update for FR2 TxSpurious test case Details R5-191811 agreedRAN5#82Qualcomm UK Ltd Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050086-F15.1.0Rel-15Addition of TP analysis of FR2 6.3.1 Minimum output power Details R5-191678 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500851F15.1.0Rel-15Addition of TP analysis of FR1 6.2.4 Configured transmitted power Details R5-192401 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500841F15.1.0Rel-15Update of TP analysis of FR1 6.2.1 MOP Details R5-192599 agreedRAN5#82Huawei, HiSilicon Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500821F15.1.0Rel-15Test Point analysis for FR1 6.3.3.6 SRS time mask Details R5-192546 agreedRAN5#82MTCC Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050081-F15.1.0Rel-15Adding test case 6.2B.2.1 to 38.905 Details R5-191337 agreedRAN5#82Ericsson Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500801F15.1.0Rel-15Adding FR2 test case 6.3.4.3 to 38.905 Details R5-192449 agreedRAN5#82Ericsson Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050079-F15.1.0Rel-15Test Point analysis for NR spurious response in FR1 Details R5-191261 agreedRAN5#82CAICT Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050078-F15.1.0Rel-15Test Point analysis for NR Narrow band in FR1 Details R5-191260 agreedRAN5#82CAICT Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.9050077-F15.1.0Rel-15Test Point analysis for TC 6.3.3.4 PRACH time mask in FR1 Details R5-191257 agreedRAN5#82KTL Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest
See details 38.90500731F15.1.0Rel-15TP analysis for FR1 Rx 7.9A.1 Spurious Emission for 2DL CA Details R5-192684 agreedRAN5#82CMCC Details RP-190076 approvedRAN#83TSG WG RAN515.2.05GS_NR_LTE-UEConTest