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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1336243-F13.14.0Rel-13CR on NB random access test cases R13 Details R4-1901099 agreedRAN4#90Huawei, HiSilicon Details RP-190413 approvedRAN#83RAN413.15.0TEI13
See details 36.13362371F13.14.0Rel-13CR to 36.133 for corrections on section A.9.10 and section A.9.13 Details R4-1902026 agreedRAN4#90ZTE Details RP-190414 approvedRAN#83RAN413.15.0LTE_MC_load-Perf
See details 36.1336227-A13.14.0Rel-13Correction to Incmon test cases for reselection from E-UTRA FDD/TDD to UTRA Details R4-1900933 agreedRAN4#90Ericsson Details RP-190411 approvedRAN#83RAN413.15.0LTE_UTRA_IncMon-Perf
See details 36.13362021F13.14.0Rel-13Clarification on test requirements for transmit timing accuracy for HD-FDD Category NB1 UE Details R4-1902070 agreedRAN4#90Qualcomm Incorp... Details RP-190413 approvedRAN#83RAN413.15.0NB_IOT-Perf
See details 36.13361981F13.14.0Rel-13Corrections to HD-FDD NB-IoT In-Sync RLM tests Details R4-1902069 agreedRAN4#90Qualcomm Incorp... Details RP-190413 approvedRAN#83RAN413.15.0NB_IOT-Perf
See details 36.13361941F13.14.0Rel-13Clarifications on HD-FDD NB-IoT Out-of-sync RLM test cases Details R4-1902068 agreedRAN4#90Qualcomm Incorp... Details RP-190413 approvedRAN#83RAN413.15.0NB_IOT-Perf
See details 36.13361891F13.14.0Rel-13Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX Details R4-1902025 agreedRAN4#90ANRITSU LTD Details RP-190414 approvedRAN#83RAN413.15.0LTE_LAA-Perf