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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1336533-F13.15.0Rel-13Corrections to NB-IoT PRACH test cases (Rel-13) Details R4-1906934 agreedRAN4#91Rohde & Schwarz Details RP-191260 approvedRAN#84RAN413.16.0TEI13
See details 36.1336509-F13.15.0Rel-13Corrections on inter-frequency RS-SINR measurement accuracy test in TS36.133 R13 Details R4-1906499 agreedRAN4#91Huawei, HiSilicon Details RP-191260 approvedRAN#84RAN413.16.0TEI13
See details 36.13364881F13.15.0Rel-13CR on threshold for FS3 RSSI and channel occupancy tests R13 Details R4-1907326 agreedRAN4#91MediaTek inc. Details RP-191260 approvedRAN#84RAN413.16.0TEI13
See details 36.13364621F13.15.0Rel-13Maintenance on HD-FDD inter-frequency re-establishment test cases R13 Details R4-1907325 agreedRAN4#91Huawei, HiSilicon Details RP-191260 approvedRAN#84RAN413.16.0TEI13
See details 36.1336450-F13.15.0Rel-13Correction to timing advance adjustment accuracy test for Cat-M1 UE Details R4-1905492 agreedRAN4#91ANRITSU LTD Details RP-191258 approvedRAN#84RAN413.16.0LTE_MTCe2_L1-Core
See details 36.1336446-F13.15.0Rel-13Correction to event triggered reporting on Deactivated SCell Details R4-1905488 agreedRAN4#91ANRITSU LTD Details RP-191260 approvedRAN#84RAN413.16.0TEI13