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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-305311F16.1.0Rel-16TS 38.521-3 updates across section 7 test cases Details R5-199524 agreedRAN5#85Qualcomm Japan Inc Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305301F16.1.0Rel-16TS 38.521-3 updates across section 6 test cases Details R5-199522 agreedRAN5#85Qualcomm Japan Inc Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305291F16.1.0Rel-16TS 38.521-3 Section 1-5 and Annex updates to align with core specification Details R5-199352 agreedRAN5#85Qualcomm Japan Inc Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305281F16.1.0Rel-16Update 4.5 Applicability and test coverage rules Details R5-199569 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305271F16.1.0Rel-16Update for Additional Spurious Emissions for Intra-band contiguous EN-DC Details R5-199521 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305261F16.1.0Rel-16Update for 7.3B.2.0 Minimum Conformance Requirements of Reference sensitivity for EN-DC Details R5-199523 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305251F16.1.0Rel-16Update for 7.3B.2.3 Reference sensitivity for Inter-band EN-DC within FR1 Details R5-199568 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30524-F16.1.0Rel-16Update for 6.5B.3.3.2 Spurious emission band UE co-existence for Inter-band within FR1 Details R5-198735 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30523-F16.1.0Rel-16Update for 6.5B.3.3.1 General spurious emissions for Inter-band EN-DC within FR1 Details R5-198734 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305221F16.1.0Rel-16Update to test case 7.3B.2.3 Details R5-199567 agreedRAN5#85ROHDE & SCHWARZ Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305201F16.1.0Rel-16Correction of E-UTRA Mid channel bandwidth Details R5-199543 agreedRAN5#85ROHDE & SCHWARZ Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30519-F16.1.0Rel-16Update for 7.3B.1 General Details R5-198722 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305181F16.1.0Rel-16Update for 6.5B.3.2.1 General spurious emissions for Intra-band non-contiguous EN-DC Details R5-199520 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305171F16.1.0Rel-16Update for 6.5B.3.1.1 General spurious emissions for intra-band contiguous EN-DC Details R5-199519 agreedRAN5#85Qualcomm commun... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30516-F16.1.0Rel-16Corrections on delta TIB for EN-DC configurations in 38.521-3 Details R5-198686 agreedRAN5#85ZTE Corporation Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30515-F16.1.0Rel-16Update single allowed info and MPR test description to EN-DC configuration in 38.521-3 Details R5-198685 agreedRAN5#85ZTE Corporation Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30513-F16.1.0Rel-16Updated to EN-DC General clause and band information Rel-15 Details R5-198637 agreedRAN5#85Bureau Veritas Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30512-F16.1.0Rel-16Updated to EN-DC band information Rel-16 Details R5-198559 agreedRAN5#85Bureau Veritas Details RP-192477 approvedRAN#86TSG WG RAN516.2.0NR_CADC_NR_LTE_...
See details 38.521-30511-F16.1.0Rel-16Updates to 6.5B.2.1.2, Additional spectrum emission mask for intra-band Contig EN-DC Details R5-198539 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30510-F16.1.0Rel-16Updates to 6.2B.3.2, UE A-MPR for Intra-band Non-Contig EN-DC Details R5-198538 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30509-F16.1.0Rel-16Updates to 6.2B.3.1, UE A-MPR for Intra-band Contig EN-DC Details R5-198537 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305081F16.1.0Rel-16Addition of MU and TT for NSA 7.6B.2.3_1, 7.6B.2.4, 7.6B.2.4_1 and 7.6B.4.3_1 TCs in F.1.3 and F.3.3 Details R5-199351 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30504-F16.1.0Rel-16Correction to Spurious emission band UE co-existence for Inter-band within FR1 Details R5-198406 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30502-F16.1.0Rel-16Correction to Additional Spurious Emissions for Inter-band EN-DC within FR1 Details R5-198404 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30501-F16.1.0Rel-16Correction to TC 6.4B.1.3 test description Details R5-198403 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-305001F16.1.0Rel-16Correction to minimum output power for intra-band EN-DC Details R5-199498 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304991F16.1.0Rel-16Corrections to EN-DC and NE-DC Configurations Details R5-199547 agreedRAN5#85Samsung R&D Ins... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304981F16.1.0Rel-16Corrections to DC Config and dual UL interferer Details R5-199546 agreedRAN5#85Samsung R&D Ins... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304961F16.1.0Rel-16Removal of 7.7A Spurious Response for CA Details R5-199506 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304951F16.1.0Rel-16Addition of 7.6B.4.3_1 Narrow band blocking for EN-DC within FR1 (>2 CCs) Details R5-199348 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304941F16.1.0Rel-16Addition of 7.6B.2.4_1 Inband blocking for inter-band EN-DC including FR2 (>2 CCs) Details R5-199566 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304931F16.1.0Rel-16Addition of 7.6B.2.3_1 Inband blocking for EN-DC within FR1 (>2 CCs) Details R5-199347 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304921F16.1.0Rel-16Addition of 7.6A Blocking Characteristics for CA Details R5-199346 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304911F16.1.0Rel-16Update of minimum conformance requirements of 7.6B.3 and editorial correction in 7.6B and 7.7B Details R5-199345 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30490-F16.1.0Rel-16Introduction of New TC 6.4B.2.1.4 EVM Equalizer Flatness for intra-band contiguous EN-DC Details R5-198280 agreedRAN5#85LG Electronics Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304891F16.1.0Rel-16Correction and addition of uplink power measurement MUs for NSA FR1 TCs Details R5-199350 agreedRAN5#85CAICT Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30488-F16.1.0Rel-16Updating incorrect note in test procedure Details R5-198172 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304871F16.1.0Rel-16Editorial correction of test description in TC 6.4B.2.3.3 Details R5-199343 agreedRAN5#85TTA, Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30486-F16.1.0Rel-16Update of TC 7.5B.1 ACS for for intra-band contiguous EN-DC 2CCs Details R5-198046 agreedRAN5#85CMCC Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30485-F16.1.0Rel-16Update of TC 7.5B.0 ACS for EN-DC Details R5-198045 agreedRAN5#85CMCC Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304841F16.1.0Rel-16Updates to test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC Details R5-199508 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304831F16.1.0Rel-16Updates to test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC Details R5-199342 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304821F16.1.0Rel-16Addition of 2A-7A-7A-66A_n66A Details R5-199413 agreedRAN5#85Huawei, HiSilicon Details RP-192477 approvedRAN#86TSG WG RAN516.2.0NR_CADC_NR_LTE_...
See details 38.521-30480-F16.1.0Rel-16Addition of 7.4B.5 Maximum Input Level for inter-band EN-DC including FR1 and FR2 Details R5-197949 agreedRAN5#85Huawei, HiSilicon Details RP-192464 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304791F16.1.0Rel-16Addition of 7.4B.4 Maximum Input Level for inter-band EN-DC including FR2 Details R5-199378 agreedRAN5#85Huawei, HiSilicon Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304781F16.1.0Rel-16Addition of 7.4B.3 Maximum Input Level for inter-band EN-DC within FR1 Details R5-199344 agreedRAN5#85Huawei, HiSilicon Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30477-F16.1.0Rel-16Addition of 7.4A Maximum Input Level for FR1-FR2 CA Details R5-197946 agreedRAN5#85Huawei, HiSilicon Details RP-192464 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30476-F16.1.0Rel-16Update of 6.2B.4.1.5 configured transmitted power for Inter-Band EN-DC including FR1 and FR2 Details R5-197945 agreedRAN5#85Huawei, HiSilicon Details RP-192464 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30475-F16.1.0Rel-16Update of 6.2B.4.1.4 configured transmitted power for Inter-Band EN-DC including FR2 Details R5-197944 agreedRAN5#85Huawei, HiSilicon Details RP-192464 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-30472-F16.1.0Rel-16Addition of 6.2B.1.5 MOP for Inter-Band EN-DC including FR1 and FR2 Details R5-197940 agreedRAN5#85Huawei, HiSilicon Details RP-192464 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304711F16.1.0Rel-16Update of 6.2B.1.4 MOP for Inter-Band EN-DC including FR2 Details R5-199377 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304691F16.1.0Rel-16Update of 6.2B.1.1 MOP for Intra-Band contiguous EN-DC Details R5-199514 agreedRAN5#85Huawei, HiSilicon Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304681F16.1.0Rel-16Add Uplink Power window explanation when centred on a target Details R5-199349 agreedRAN5#85ANRITSU LTD Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304671F16.1.0Rel-16Updates of test procedure for MOP and co-existence tests Details R5-199518 agreedRAN5#85NTT DOCOMO, INC. Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-304661F16.1.0Rel-16Updates of MU and TT in TS 38.521-3 Details R5-199088 agreedRAN5#85NTT DOCOMO, INC. Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest