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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90301161F16.2.0Rel-16Update to FR2 TRx Measurement Uncertainties Details R5-200918 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9030114-F16.2.0Rel-16FR1 Test tolerance analysis for interruptions deactivated NR SCC Details R5-200470 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9030112-F16.2.0Rel-16CR to 38.903 on XPD Verification Details R5-200329 agreedRAN5#86-eKeysight Techno... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90301111F16.2.0Rel-16Test Tolerance analysis for SSB-Based L1-RSRP measurement test cases Details R5-201043 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90301101F16.2.0Rel-16Test Tolerance analysis for CSI-RS-Based L1-RSRP measurement test cases Details R5-201042 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90301091F16.2.0Rel-16Test tolerance analysis SS-RSRQ and inter-frequency SS-SINR Details R5-201038 agreedRAN5#86-eROHDE & SCHWARZ Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90301081F16.2.0Rel-16Test tolerance analysis inter-frequency SS-RSRP and intra-frequency SS-SINR Details R5-201037 agreedRAN5#86-eROHDE & SCHWARZ Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9030107-F16.2.0Rel-16Add Annex A.2 handling of common Test Tolerance Topics for FR2 Details R5-200163 agreedRAN5#86-eANRITSU LTD Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest