• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
1
Page size:
PageSizeComboBox
select
 24 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-40189-F16.2.0Rel-16Core spec alignment for FR1 4Rx FDD PDSCH Type A Demodulation performance Details R5-200729 agreedRAN5#86-eLG Electronics Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40188-F16.2.0Rel-16Update of Test Tolerance in Annex F Details R5-200718 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401871F16.2.0Rel-16Update of TC 6.4.2.1_1 2Rx FDD RI reporting Details R5-201068 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40184-F16.2.0Rel-16Update of TC 5.2.3.2.3_1 4Rx TDD PDSCH mapping Type B Details R5-200714 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40183-F16.2.0Rel-16Update of TC 5.2.3.2.2_1 4Rx TDD PDSCH mapping Type A and CSI-RS overlapped Details R5-200713 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40182-F16.2.0Rel-16Update of TC 5.2.3.1.3_1 4Rx FDD PDSCH mapping Type B Details R5-200712 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40181-F16.2.0Rel-16Update of TC 5.2.3.1.2_1 4Rx FDD PDSCH mapping Type A and CSI-RS overlapped Details R5-200711 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40180-F16.2.0Rel-16Update of TC 5.2.2.1.3_1 2Rx FDD PDSCH mapping Type B Details R5-200710 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40179-F16.2.0Rel-16Correction to Applicability rules for Performance tests Details R5-200682 agreedRAN5#86-eBureau Veritas Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40178-F16.2.0Rel-16Updated to Annex A and B for performance tests Details R5-200672 agreedRAN5#86-eBureau Veritas Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401771F16.2.0Rel-16Replacing derivation paths to 38.331 Details R5-201090 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401761F16.2.0Rel-16Correction to test case 8.2.2.2.1.1 2 Rx, TDD FR2 periodic CQI reporting under AWGN performance for both SA and NSA Details R5-200914 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40175-F16.2.0Rel-16Correcting CQI value in test procedure Details R5-200660 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40174-F16.2.0Rel-16Correction to PDCCH demod TCs Details R5-200456 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40173-F16.2.0Rel-16Correction to measurement uncertainty and test tolerance for CQI test cases Details R5-200455 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40172-F16.2.0Rel-16Correction to FR1 4Rx PDSCH demodulation test cases Details R5-200454 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40171-F16.2.0Rel-16Correction to FR1 2Rx PDSCH demodulation test cases Details R5-200453 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401701F16.2.0Rel-16Core alignment to 4Rx PDCCH Demod Test Cases Details R5-201245 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401691F16.2.0Rel-16Core alignment for FR2 demod test case Details R5-200985 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40168-F16.2.0Rel-16Addition of message exceptions for Type2 QCL information Details R5-200450 agreedRAN5#86-eAnritsu Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401671F16.2.0Rel-16Addition of FR2 Demod sustained data rate test case Details R5-201180 agreedRAN5#86-eQualcomm Techno... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40166-F16.2.0Rel-16CR to 38.521-4 to introduce isolation procedure Details R5-200322 agreedRAN5#86-eKeysight Techno... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-40165-F16.2.0Rel-16Update to Demod TC 5.2.3.2.1_1 Details R5-200271 agreedRAN5#86-eQualcomm Techno... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.521-401641F16.2.0Rel-16Update of Clause 4 in TS 38.521-4 Details R5-200915 agreedRAN5#86-eCMCC, Telecom I... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest