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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90502381F16.2.0Rel-16Addition of TP analysis for FR1 In-band blocking for CA Details R5-200990 agreedRAN5#86-eHuawei,Hisilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050237-F16.2.0Rel-16Update of Test Point Analysis for UE Coexistence for DC_3A-n41A and DC_8A-n41A Details R5-200815 agreedRAN5#86-eROHDE & SCHWARZ Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050236-F16.2.0Rel-16Updated test point analysis for FR2 A-MPR test case Details R5-200799 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90502351F16.2.0Rel-16Test points analysis for NS_18 A-MPR FR1 test case Details R5-201239 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050234-F16.2.0Rel-16Test points analysis for NS_43U A-MPR FR1 test case Details R5-200768 agreedRAN5#86-eEricsson, SoftB... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050233-F16.2.0Rel-16Test points analysis for NS_43 A-MPR FR1 test case Details R5-200766 agreedRAN5#86-eEricsson, SoftB... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050232-F16.2.0Rel-16Test points analysis for NS_39 A-MPR FR1 test case Details R5-200764 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050231-F16.2.0Rel-16Test points analysis for NS_38 A-MPR FR1 test case Details R5-200762 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90502301F16.2.0Rel-16Test points analysis for NS_37 A-MPR FR1 test case Details R5-201237 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050229-F16.2.0Rel-16Correction of NS_05 test points analysis Details R5-200758 agreedRAN5#86-eEricsson Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050227-F16.2.0Rel-16Test Point analysis for FR2 ref sens for CA Details R5-200603 agreedRAN5#86-eQualcomm Finlan... Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050226-F16.2.0Rel-16Addition of Test point selection for FR1 in SUL test cases Details R5-200574 agreedRAN5#86-eHuawei,Hisilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050224-F16.2.0Rel-16Update of test point analysis for 7.8A Wide band Intermodulation for CA Details R5-200460 agreedRAN5#86-eCAICT Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050223-F16.2.0Rel-16Update of test point analysis for 7.6A.4 Narrow band blocking for CA Details R5-200459 agreedRAN5#86-eCAICT Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050222-F16.2.0Rel-16Update of test point analysis for 7.6A.3 Out-of-band blocking for CA Details R5-200419 agreedRAN5#86-eCAICT Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050221-F16.2.0Rel-16Editorial change of replacing zip file of FR2 6.3.1 by v2 Details R5-200412 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90502201F16.2.0Rel-16Updating TP of configured output power for intra-band non-contiguous EN-DC Details R5-201186 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90502181F16.2.0Rel-16Updating TP of configured output power for intra-band contiguous EN-DC Details R5-201184 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.90502161F16.2.0Rel-16Updating TP of configured output power for inter-band EN-DC Details R5-201182 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest
See details 38.9050215-F16.2.0Rel-16Updating TP of MOP for inter-band EN-DC Details R5-200402 agreedRAN5#86-eHuawei, HiSilicon Details RP-200063 approvedRAN#87-eTSG WG RAN516.3.05GS_NR_LTE-UEConTest