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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 33.5150005-F16.1.0Rel-16Deleting test case on TEID uniqueness Details S3-201103 agreedSA3#99-eHuawei, Hisilicon Details SP-200358 approvedSA#88-eSA WG316.2.0SCAS_5G