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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9050267-F16.3.0Rel-16TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_43 Details R5-202524 agreedRAN5#87-eQUALCOMM Europe... Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502661F16.3.0Rel-16Addition of TPanalysis 6.5A.3.2.1_SECoex for CA_n1A-n78A Details R5-202926 agreedRAN5#87-eChina Unicom Details RP-200588 approvedRAN#88-eTSG WG RAN516.4.0NR_CADC_NR_LTE_...
See details 38.90502641F16.3.0Rel-16TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_05 Details R5-202757 agreedRAN5#87-eQUALCOMM Europe... Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502631F16.3.0Rel-16Updated TP analysis for 7.3A Reference sensitivity for CA Details R5-202955 agreedRAN5#87-eEricsson, WE Ce... Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050262-F16.3.0Rel-16NS_24 TP analysis to TR 38.905 Details R5-202111 agreedRAN5#87-eDish Network Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050261-F16.3.0Rel-16Introduction of test point analysis for 2CCs EN-DC TCs in FR1 in 7.6B Blocking characteristics for DC and 7.7B Spurious response for DC Details R5-202029 agreedRAN5#87-eCAICT Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050260-F16.3.0Rel-16Combined TP analysis for MPR, ACLR and SEM intra-band contiguous EN-DC test cases Details R5-201931 agreedRAN5#87-eEricsson, Keysi... Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502591F16.3.0Rel-16Combined TP analysis for MPR, NR ACLR and SEM FR1 test cases Details R5-202954 agreedRAN5#87-eEricsson, Keysi... Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050258-F16.3.0Rel-16Cleanup in 38.905 Details R5-201929 agreedRAN5#87-eEricsson Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050257-F16.3.0Rel-16Update of Test Point Analysis for UE Co-existence for DC_66A-n78A Details R5-201875 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050256-F16.3.0Rel-16Update of Test Point Analysis for UE Co-existence for DC_66A-n5A Details R5-201874 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050255-F16.3.0Rel-16Update of Test Point Analysis for UE Co-existence for DC_5A-n78A Details R5-201873 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050254-F16.3.0Rel-16Update of Test Point Analysis for UE Co-existence for DC_5A-n66A Details R5-201872 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050253-F16.3.0Rel-16Update of test points analysis in UE co-existence for inter-band EN-DC Details R5-201871 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502521F16.3.0Rel-16Updating TP of MOP for intra-band non-contiguous EN-DC Details R5-202953 agreedRAN5#87-eHuawei, HiSilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502511F16.3.0Rel-16Updating TP of MOP for intra-band contiguous EN-DC Details R5-202952 agreedRAN5#87-eHuawei, HiSilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050250-F16.3.0Rel-16Test points analysis for NS_47 A_MPR FR1 test case Details R5-201773 agreedRAN5#87-eEricsson, SoftB... Details RP-200589 approvedRAN#88-eTSG WG RAN516.4.0NR_bands_BW_R16...
See details 38.90502491F16.3.0Rel-16Test points analysis for NS_42 A_MPR FR1 test case Details R5-202756 agreedRAN5#87-eEricsson Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502481F16.3.0Rel-16Test points analysis for NS_41 A_MPR FR1 test case Details R5-202755 agreedRAN5#87-eEricsson Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050247-F16.3.0Rel-16Test points analysis for NS_40 A_MPR FR1 test case Details R5-201767 agreedRAN5#87-eEricsson Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050246-F16.3.0Rel-16Test points analysis for NS_27 A_MPR FR1 test case Details R5-201765 agreedRAN5#87-eEricsson Details RP-200589 approvedRAN#88-eTSG WG RAN516.4.0NR_bands_BW_R16...
See details 38.90502451F16.3.0Rel-16Addition of TP analysis for FR1 In-band blocking for 3DL CA Details R5-202933 agreedRAN5#87-eHuawei,Hisilicon Details RP-200590 approvedRAN#88-eTSG WG RAN516.4.0NR_RF_FR1-UEConTest
See details 38.90502441F16.3.0Rel-16Addition of TP analysis for FR1 Maximum input level for 3DL CA Details R5-202932 agreedRAN5#87-eHuawei,Hisilicon Details RP-200590 approvedRAN#88-eTSG WG RAN516.4.0NR_RF_FR1-UEConTest
See details 38.9050243-F16.3.0Rel-16Addition of TP analysis for FR1 A-MPR for CA Details R5-201747 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.9050242-F16.3.0Rel-16Addition of Number of test points for FR1 in SUL test cases Details R5-201746 agreedRAN5#87-eHuawei,Hisilicon Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.90502391F16.3.0Rel-16Test Point analysis for FR2 Frequency Error for CA Details R5-202918 agreedRAN5#87-eNTT DOCOMO INC. Details RP-200576 approvedRAN#88-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest