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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.141-101351F15.5.0Rel-15CR to 38.141-1 Rel-15 with correction to TPDR test procedure Details R4-2008743 agreedRAN4#95-eNokia, Nokia Sh... Details RP-200986 approvedRAN#88-eRAN415.6.0NR_newRAT-Perf
See details 38.141-10133-F15.5.0Rel-15CR to 38.141-1: Adding missing TT value for BS demod testing (C.3) Details R4-2007463 agreedRAN4#95-eKeysight Techno... Details RP-200986 approvedRAN#88-eRAN415.6.0NR_newRAT-Perf
See details 38.141-10125-F15.5.0Rel-15CR to TS 38.141-1: Correction to out-of-band blocking requirement is subclause 7.5 Details R4-2006919 agreedRAN4#95-eEricsson Details RP-200986 approvedRAN#88-eRAN415.6.0NR_newRAT-Perf
See details 38.141-10123-F15.5.0Rel-15CR 38.141-1 Rel15 4.9.2.3 corrections for random data generation Details R4-2006730 agreedRAN4#95-eFuturewei Details RP-200986 approvedRAN#88-eRAN415.6.0NR_newRAT-Perf
See details 38.141-10119-F15.5.0Rel-15CR to TS 38.141-1: Clarifications and corrections on extreme test environment Details R4-2006097 agreedRAN4#95-eNokia, Nokia Sh... Details RP-200986 approvedRAN#88-eRAN415.6.0NR_newRAT-Perf
See details 38.141-10117-F15.5.0Rel-15CR to TS 38.141-1: Corrections on generation of test configurations Details R4-2006095 agreedRAN4#95-eNokia, Nokia Sh... Details RP-200986 approvedRAN#88-eRAN415.6.0NR_newRAT-Perf