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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90503011F16.4.0Rel-16Update of TPanalysis 6.5A.3.2.1_SECoex for CA_n1A-n78A Details R5-204959 agreedRAN5#88-eChina Unicom Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90503001F16.4.0Rel-16Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Details R5-204950 agreedRAN5#88-eEricsson Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502991F16.4.0Rel-16Add_TP_analysis_table for TX_spurious_emission Details R5-204720 agreedRAN5#88-eQualcomm Austri... Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502981F16.4.0Rel-16TP analysis 6.5B.3 TX SpurEmission EN-DC V2 Details R5-204949 agreedRAN5#88-eQualcomm Austri... Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502951F16.4.0Rel-16Addition of Test Point analysis for FR2 Transmit OFF Power for CA Details R5-204948 agreedRAN5#88-eDOCOMO Communic... Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502941F16.4.0Rel-16Addition of test point analysis for additional spurious emission with NS_17 Details R5-204964 agreedRAN5#88-eHuawei, Orange, CMCC Details RP-201461 approvedRAN#89-eTSG WG RAN516.5.0NR_bands_BW_R16...
See details 38.90502931F16.4.0Rel-16Addition of test point analysis for AMPR NS_48 Details R5-204829 agreedRAN5#88-eHuawei, HiSilicon Details RP-201461 approvedRAN#89-eTSG WG RAN516.5.0NR_bands_BW_R16...
See details 38.90502921F16.4.0Rel-16Correction to test point analysis for spurious emissions UE co-existence for a few inter-band EN-DC configurations Details R5-204797 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502911F16.4.0Rel-16Updating test point analysis for DC_28A-n3A for spurious emissions UE co-existence Details R5-204822 agreedRAN5#88-eHuawei, Hisilicon Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502901F16.4.0Rel-16Updating test point analysis for DC_12A-n78A for spurious emissions UE co-existence Details R5-204821 agreedRAN5#88-eHuawei, Hisilicon Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502891F16.4.0Rel-16Updating test point analysis for DC_8A-n1A for spurious emissions UE co-existence Details R5-204820 agreedRAN5#88-eHuawei, Hisilicon Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502881F16.4.0Rel-16Updating test point analysis for DC_7A-n66A for spurious emissions UE co-existence Details R5-204819 agreedRAN5#88-eHuawei, Hisilicon Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502871F16.4.0Rel-16Updating test point analysis for DC_7A-n1A for spurious emissions UE co-existence Details R5-204818 agreedRAN5#88-eHuawei, Hisilicon Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502861F16.4.0Rel-16Updating test point analysis for DC_3A-n1A for spurious emissions UE co-existence Details R5-204817 agreedRAN5#88-eHuawei, Hisilicon Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502851F16.4.0Rel-16Updating test point analysis for DC_7A-n78A for spurious emissions UE co-existence Details R5-204796 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502841F16.4.0Rel-16Updating test point analysis for DC_3A-n78A for spurious emissions UE co-existence Details R5-204795 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502831F16.4.0Rel-16Updating test point analysis for DC_3A-n7A for spurious emissions UE co-existence Details R5-204794 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502821F16.4.0Rel-16Updating test point analysis for DC_2A-n78A for spurious emissions UE co-existence Details R5-204793 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502811F16.4.0Rel-16Updating test point analysis for DC_2A-n66A for spurious emissions UE co-existence Details R5-204792 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502801F16.4.0Rel-16Updating test point analysis for DC_1A-n78A for spurious emissions UE co-existence Details R5-204791 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502791F16.4.0Rel-16Update of test point analysis of MOP for intra-band contiguous EN-DC Details R5-204728 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502781F16.4.0Rel-16Addition of test point analysis in Tx spurious emissions Details R5-204726 agreedRAN5#88-eSporton, Ericsson Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502761F16.4.0Rel-16Update test point analysis for A-MPR NS_18 with CBW being 30MHz Details R5-204963 agreedRAN5#88-eCMCC, Huawei, H... Details RP-201461 approvedRAN#89-eTSG WG RAN516.5.0NR_bands_BW_R16...
See details 38.9050275-F16.4.0Rel-16Editorial correction to references to EN-DC configurations Details R5-203751 agreedRAN5#88-eEricsson Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502741F16.4.0Rel-16Updating TP analysis for 6.2A.4-Configured output power for CA Details R5-204838 agreedRAN5#88-eHuawei, Hisilicon Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.90502731F16.4.0Rel-16Updating TP analysis for 6.2A.2-MPR for CA Details R5-204727 agreedRAN5#88-eHuawei, Hisilicon Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.90502721F16.4.0Rel-16Update of TP analysis for NS_43U and NS_01 in FR1 A-MPR for CA Details R5-204790 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.90502711F16.4.0Rel-16Update of TP analysis for NS_43 and NS_01 in FR1 A-MPR for CA Details R5-204789 agreedRAN5#88-eHuawei, Hisilicon Details RP-201453 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.9050270-F16.4.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n78A Details R5-203643 agreedRAN5#88-eEricsson, Telefonica Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.9050269-F16.4.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n1A Details R5-203642 agreedRAN5#88-eEricsson, Telefonica Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...
See details 38.90502682F16.4.0Rel-16Updated TP analysis for 7.3A Details R5-204982 agreedRAN5#88-eWE Certificatio... Details RP-201460 approvedRAN#89-eTSG WG RAN516.5.0NR_CADC_NR_LTE_...