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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1336942-F15.10.0Rel-15CR to measurement capability for NE-DC in 36133 R15 Details R4-2011134 agreedRAN4#96-eHuawei, Hisilicon Details RP-201512 approvedRAN#89-eRAN415.11.0NR_newRAT-Core
See details 36.1336940-F15.10.0Rel-15Correction on UE measurement capability in NR idle mode R15 Details R4-2011130 agreedRAN4#96-eHuawei, Hisilicon Details RP-201512 approvedRAN#89-eRAN415.11.0NR_newRAT-Core
See details 36.13369351F15.10.0Rel-15CR on NB-IoT Intra frequency with serving cell measurement relaxation test case 4.2.38 R15 Details R4-2012085 agreedRAN4#96-eHuawei, Hisilicon Details RP-201512 approvedRAN#89-eRAN415.11.0NB_IOTenh2-Perf
See details 36.1336915-A15.10.0Rel-15Correction to intra-frequency event triggered reporting test case in CEModeA Details R4-2009536 agreedRAN4#96-eANRITSU LTD Details RP-201512 approvedRAN#89-eRAN415.11.0LTE_MTCe2_L1-Perf