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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90503361F16.5.0Rel-16Update of test point analysis for occupied bandwidth in FR2 Details R5-206876 agreedRAN5#89-eROHDE & SCHWARZ Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050333-F16.5.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n3A Details R5-206037 agreedRAN5#89-eEricsson Details RP-202234 approvedRAN#90-eTSG WG RAN516.6.0NR_CADC_NR_LTE_...
See details 38.90503321F16.5.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n3A Details R5-206729 agreedRAN5#89-eEricsson Details RP-202234 approvedRAN#90-eTSG WG RAN516.6.0NR_CADC_NR_LTE_...
See details 38.90503311F16.5.0Rel-16Update of TPA for in-band emission and carrier leakage TCs Details R5-206875 agreedRAN5#89-eROHDE & SCHWARZ Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.90503301F16.5.0Rel-16Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Details R5-206917 agreedRAN5#89-eEricsson Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050329-F16.5.0Rel-16Addition of test point analysis for A-MPR NS_46 Details R5-205885 agreedRAN5#89-eHuawei, HiSilicon Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.90503281F16.5.0Rel-16Update to test point analysis for A-MPR NS_18 with 30MHz Details R5-206853 agreedRAN5#89-eHuawei, HiSilicon Details RP-202235 approvedRAN#90-eTSG WG RAN516.6.0NR_bands_BW_R16...
See details 38.90503251F16.5.0Rel-16Update of test point analysis for Tx spurious emissions in NR FR1 Details R5-206769 agreedRAN5#89-eHuawei, HiSilicon Details RP-202240 approvedRAN#90-eTSG WG RAN516.6.0NR_eMIMO-UEConTest
See details 38.90503241F16.5.0Rel-16Update of test point analysis for MOP in FR1 Details R5-206858 agreedRAN5#89-eHuawei, HiSilicon Details RP-202240 approvedRAN#90-eTSG WG RAN516.6.0NR_eMIMO-UEConTest
See details 38.90503231F16.5.0Rel-16Update of test point analysis for MPR, SEM and ACLR in NR FR1 Details R5-206857 agreedRAN5#89-eHuawei, HiSilicon Details RP-202240 approvedRAN#90-eTSG WG RAN516.6.0NR_eMIMO-UEConTest
See details 38.9050322-F16.5.0Rel-16Addition of test point analysis for DC_13A_n66A in Tx spurious emissions cases Details R5-205785 agreedRAN5#89-eHuawei, HiSilicon Details RP-202234 approvedRAN#90-eTSG WG RAN516.6.0NR_CADC_NR_LTE_...
See details 38.9050321-F16.5.0Rel-16Addition of test point analysis for DC_30A_n5A in Tx spurious emissions cases Details R5-205783 agreedRAN5#89-eHuawei, HiSilicon Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050320-F16.5.0Rel-16Addition of test point analysis for DC_12A_n66A in Tx spurious emissions cases Details R5-205782 agreedRAN5#89-eHuawei, HiSilicon Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050319-F16.5.0Rel-16Addition of test point analysis for DC_8A_n78A in Tx spurious emissions cases Details R5-205781 agreedRAN5#89-eHuawei, HiSilicon Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050318-F16.5.0Rel-16Addition of test point analysis for DC_2A_n5A in Tx spurious emissions cases Details R5-205780 agreedRAN5#89-eHuawei, HiSilicon Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.90503171F16.5.0Rel-16Updating TP analysis for Inband blocking for 3DL CA Details R5-206856 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.90503161F16.5.0Rel-16Updating TP analysis for Maximum input level for 3DL CA Details R5-206855 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.90503151F16.5.0Rel-16Updating TP analysis for REFSENS for CA Details R5-206893 agreedRAN5#89-eHuawei, Hisilic... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.90503141F16.5.0Rel-16Updating TP analysis for OBW for CA Details R5-206854 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.9050313-F16.5.0Rel-16Addition of TP Analysis for TC 6.5A.2.2 Adjacent channel leakage ratio for CA in FR2 Details R5-205630 agreedRAN5#89-eKTL, NTT DOCOMO INC. Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050312-F16.5.0Rel-16Addition of TP Analysis for TC 6.5A.2.1 Spectrum Emission Mask for CA in FR2 Details R5-205619 agreedRAN5#89-eKTL, NTT DOCOMO INC. Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.90503111F16.5.0Rel-16Combined TP analysis for FR2 test cases MPR, ACLR and SEM Details R5-206874 agreedRAN5#89-eEricsson Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.90503101F16.5.0Rel-16Restructuring of TR 38.905. Details R5-206873 agreedRAN5#89-eEricsson Details RP-202226 approvedRAN#90-eTSG WG RAN516.6.05GS_NR_LTE-UEConTest
See details 38.9050309-F16.5.0Rel-16Adding test point analysis for A-MPR test of band n30 with NS_21 Details R5-205558 agreedRAN5#89-eEricsson, AT&T Details RP-202235 approvedRAN#90-eTSG WG RAN516.6.0NR_bands_BW_R16...
See details 38.9050305-F16.5.0Rel-16Addition of Test Point analysis for 6.3A.4.3 Details R5-205267 agreedRAN5#89-eGuangdong OPPO ... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.9050304-F16.5.0Rel-16Addition of Test Point analysis for 6.3A.4.2 Details R5-205265 agreedRAN5#89-eGuangdong OPPO ... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.9050303-F16.5.0Rel-16Addition of Test Point analysis for 6.3A.4.1 Details R5-205264 agreedRAN5#89-eGuangdong OPPO ... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.90503021F16.5.0Rel-16Addition of test point analysis for A-MPR NS_45 Details R5-206752 agreedRAN5#89-eNokia, Nokia Sh... Details RP-202235 approvedRAN#90-eTSG WG RAN516.6.0NR_bands_BW_R16...