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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.9030444-F15.4.0Rel-15Additon of TT analysis of 4.2.38 NB-IOT TDD-TDD Intra frequency cell reselection in normal coverage with WUS Details R5-205896 agreedRAN5#89-eHuawei, HiSilicon Details RP-202230 approvedRAN#90-eTSG WG RAN515.5.0NB_IOTenh2-UEConTest
See details 36.9030443-F15.4.0Rel-15Additon of TT analysis of NB-IOT TDD RRM test cases 4.2.35, 4.2.36 and 4.2.37 Details R5-205894 agreedRAN5#89-eHuawei, HiSilicon Details RP-202230 approvedRAN#90-eTSG WG RAN515.5.0NB_IOTenh2-UEConTest
See details 36.90304421F15.4.0Rel-15Addition of test point analysis for sTTI RRM test cases Details R5-206711 agreedRAN5#89-eHuawei, HiSilicon Details RP-202228 approvedRAN#90-eTSG WG RAN515.5.0LTE_sTTIandPT-U...