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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1337004-A15.11.0Rel-15Correction to test parameters for FDD and TDD intra-frequency RSRP for Cat-M1 UE in CEModeA Details R4-2016550 agreedRAN4#97-eQualcomm Incorp... Details RP-202513 approvedRAN#90-eRAN415.12.0TEI13
See details 36.1336989-F15.11.0Rel-15CR 36.133 Removal of brackets for SFTD measurements Details R4-2016022 agreedRAN4#97-eEricsson Details RP-202486 approvedRAN#90-eRAN415.12.0NR_newRAT-Core
See details 36.1336986-F15.11.0Rel-15CR 36.133 Corrections to test cases for SCell Hibernation Details R4-2016012 agreedRAN4#97-eEricsson Details RP-202491 approvedRAN#90-eRAN415.12.0LTE_euCA-Perf
See details 36.1336966-A15.11.0Rel-15CR on maintaining V2X test cases in TS36.133 R15 Details R4-2015462 agreedRAN4#97-eHuawei, HiSilicon Details RP-202512 approvedRAN#90-eRAN415.12.0TEI14