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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.13370771F15.12.0Rel-15CR on CRS muting for eMTC R15 Details R4-2103504 agreedRAN4#98-eHuawei, HiSilicon Details RP-210112 approvedRAN#91-eRAN415.13.0LTE_eMTC4-Core
See details 36.13370742F15.12.0Rel-15CR on TC for eMTC RSTD measurement R15 Details R4-2104072 agreedRAN4#98-eHuawei, HiSilicon Details RP-210113 approvedRAN#91-eRAN415.13.0LTE_eMTC4-Perf
See details 36.1337061-F15.12.0Rel-15CR to idle more requirements in 36133 R15 Details R4-2102734 agreedRAN4#98-eHuawei, HiSilicon Details RP-210117 approvedRAN#91-eRAN415.13.0NR_newRAT-Core
See details 36.13370581F15.12.0Rel-15CR to remove intra-frequency ECID requirements for NE-DC 36133 R15 Details R4-2104044 agreedRAN4#98-eHuawei, HiSilicon Details RP-210117 approvedRAN#91-eRAN415.13.0NR_newRAT-Core
See details 36.1337055-A15.12.0Rel-15Correction to requirements for NCSG patterns Details R4-2102697 agreedRAN4#98-eNokia, Nokia Sh... Details RP-210119 approvedRAN#91-eRAN415.13.0TEI14
See details 36.13370511F15.12.0Rel-15Correction to applicability of E-UTRAN E-CID measurements requirements for NE-DC Details R4-2103501 agreedRAN4#98-eNokia, Nokia Sh... Details RP-210121 approvedRAN#91-eRAN415.13.0TEI15
See details 36.1337038-F15.12.0Rel-15CR 36.133 (A.8.16.106) Correction of test case for direct SCell activation at addition Details R4-2102348 agreedRAN4#98-eEricsson Details RP-210115 approvedRAN#91-eRAN415.13.0LTE_euCA-Perf
See details 36.13370201F15.12.0Rel-15CR: Correction of eMTC RLM test cases Details R4-2103500 agreedRAN4#98-eEricsson Details RP-210120 approvedRAN#91-eRAN415.13.0LTE_feMTC-Perf