• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
1
Page size:
PageSizeComboBox
select
 87 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-30935-F16.6.0Rel-16Introduction of DC_7A- 28A_n3A to referce sensitivity test Details R5-211241 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-30934-F16.6.0Rel-16Introduction of DC_7A-20A_n1A to reference sensitivity test Details R5-211240 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-309331F16.6.0Rel-16Introduction of DC_1A-28A_n3A to reference sensitivity test Details R5-211905 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-309321F16.6.0Rel-16Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3 Details R5-211888 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309311F16.6.0Rel-16Addition of DC_26A_n79A in test case 7.3B.2.3 Details R5-211887 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309301F16.6.0Rel-16Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3 Details R5-211886 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309291F16.6.0Rel-16Addition of DC_26A_n41A in test case 7.3B.2.3 Details R5-211885 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309281F16.6.0Rel-16Addition of DC_11A_n79A in test case 7.3B.2.3 Details R5-211884 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309271F16.6.0Rel-16Addition of DC_8A_n77A in test case 7.3B.2.3 Details R5-211883 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309261F16.6.0Rel-16Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2 Details R5-211882 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309251F16.6.0Rel-16Update of 3CC refsens test case 7.3B.2.3_1.1 Details R5-211881 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309241F16.6.0Rel-16Update of 2CC refsens test case 7.3B.2.3 Details R5-211880 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30922-F16.6.0Rel-16Update of 5.3B for UE channel bandwidth for EN-DC Details R5-211125 agreedRAN5#90-eZTE Corporation Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-30921-F16.6.0Rel-16Corrections to subclauses in 38.521-3 with appropriate subclause level and heading styles Details R5-211111 agreedRAN5#90-eZTE Corporation Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309201F16.6.0Rel-16Update FR2 MU and TT in 38.521-3 Details R5-211928 agreedRAN5#90-eAnritsu Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309181F16.6.0Rel-16Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 Details R5-211873 agreedRAN5#90-eAnritsu Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30917-F16.6.0Rel-16Correction to editors note about number of E-UTRA carriers Details R5-211099 agreedRAN5#90-eAnritsu Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309161F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 Details R5-211709 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309151F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 Details R5-211708 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309141F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 Details R5-211707 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309131F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 Details R5-211706 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309121F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 Details R5-211705 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309111F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 Details R5-211704 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309101F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 Details R5-211703 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309091F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 Details R5-211702 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309081F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 Details R5-211701 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309071F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 Details R5-211700 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309061F16.6.0Rel-16Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 Details R5-211699 agreedRAN5#90-eEricsson Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309031F16.6.0Rel-16Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3 Details R5-211770 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-30902-F16.6.0Rel-16Adding EN-DC configurations DC_1A-28A_n3A and DC_7A-28A_n3A to clause 5.5B.4.2 Details R5-211020 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-30901-F16.6.0Rel-16Update of test coverage for reference sensitivity for 3CC EN-DC Details R5-211017 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-309001F16.6.0Rel-16Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions Details R5-211879 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30899-F16.6.0Rel-16Adding in-gap tests to ACS for intra-band non-contiguous EN-DC Details R5-211014 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308981F16.6.0Rel-16Correction to refsens test requirements for DC_1A-7A_n78A Details R5-211878 agreedRAN5#90-eHuawei, HiSilic... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308971F16.6.0Rel-16Update of reference sensitivity for inter-band 2CC EN-DC Details R5-211877 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308961F16.6.0Rel-16Update of reference sensitivity for intra-band non-contiguous EN-DC Details R5-211876 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30895-F16.6.0Rel-16Update of reference sensitivity for intra-band contiguous EN-DC Details R5-211010 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30893-F16.6.0Rel-16Update to EN-DC R16 Configuration information in clause 5 Details R5-211005 agreedRAN5#90-eBureau Veritas,... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308901F16.6.0Rel-16Correction to EN-DC Wideband Intermodulation tests Details R5-211854 agreedRAN5#90-eBureau Veritas,... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30889-F16.6.0Rel-16Update for 7.3B.2.0 Minimum Conformance Requirements of Reference sensitivity for EN-DC Details R5-210989 agreedRAN5#90-eQualcomm Korea Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308881F16.6.0Rel-16Update for 6.5B.3.3.2 Spurious emission band UE co-existence Details R5-211852 agreedRAN5#90-eQualcomm Korea Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308871F16.6.0Rel-16Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16 Details R5-211769 agreedRAN5#90-eQualcomm Korea,... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308861F16.6.0Rel-16Correction to the TDM pattern configuration for EN-DC Tx test cases Details R5-211872 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30883-F16.6.0Rel-16Adding delta TIB and delta RIB for DC_2-7-7-66_n78 Details R5-210943 agreedRAN5#90-eHuawei, HiSilicon Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-30882-F16.6.0Rel-16Editorial correction to test case 6.2B.4.1.3 Details R5-210909 agreedRAN5#90-eHuawei, Hisilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308811F16.6.0Rel-16Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16 Details R5-211843 agreedRAN5#90-eHuawei, HiSilicon Details RP-210163 approvedRAN#91-eTSG WG RAN516.7.0TEI16_Test
See details 38.521-308801F16.6.0Rel-16Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16 Details R5-211842 agreedRAN5#90-eHuawei, HiSilicon Details RP-210163 approvedRAN#91-eTSG WG RAN516.7.0TEI16_Test
See details 38.521-308791F16.6.0Rel-16Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16 Details R5-211841 agreedRAN5#90-eHuawei, HiSilicon Details RP-210163 approvedRAN#91-eTSG WG RAN516.7.0TEI16_Test
See details 38.521-308781F16.6.0Rel-16Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16 Details R5-211840 agreedRAN5#90-eHuawei, HiSilicon Details RP-210163 approvedRAN#91-eTSG WG RAN516.7.0TEI16_Test
See details 38.521-308771F16.6.0Rel-16Clarification of tested Rx antenna numbers on E-UTRA band Details R5-211715 agreedRAN5#90-eHuawei, HiSilic... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308761F16.6.0Rel-16Correction of test requirements for EN-DC configured output power Details R5-211698 agreedRAN5#90-eHuawei, HiSilic... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308751F16.6.0Rel-16Correcting EN-DC A-MPR test requirements for non-overlapping test points Details R5-211871 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30874-F16.6.0Rel-16Omitting of NSA Rx cases with UL-MIMO on TDD bands Details R5-210725 agreedRAN5#90-eHuawei, HiSilicon Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30872-F16.6.0Rel-16Default message exceptions for LTE carriers in EN-DC Details R5-210548 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308711F16.6.0Rel-16EN-DC FR2 UL CA Frequency error test cases update Details R5-211697 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308701F16.6.0Rel-16Update to EN-DC Reference Sensitivity Details R5-211875 agreedRAN5#90-eROHDE & SCHWARZ Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308691F16.6.0Rel-16Adding Inter-band EN-DC combination within FR1 Details R5-211773 agreedRAN5#90-eKDDI Corporation Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308681F16.6.0Rel-16Correction of test configuration tables in section 7 Details R5-211714 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308671F16.6.0Rel-16Editorial correction for errors in 7.6B.4.3_1 Details R5-211713 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30866-F16.6.0Rel-16Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 7.6B.3.3 Details R5-210502 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30865-F16.6.0Rel-16Completion of 7.6B.2.3_1.3 Inband blocking for EN-DC within FR1 5 CCs Details R5-210501 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30864-F16.6.0Rel-16Correction of test configuration tables in section 6 Details R5-210500 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30863-F16.6.0Rel-16Correction of test applicability of 6.5B.5.3 Details R5-210499 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30862-F16.6.0Rel-16Addition of editor note to the incomplete test cases Details R5-210498 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30861-F16.6.0Rel-16Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 6.2B.1.3 Details R5-210497 agreedRAN5#90-eCAICT Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30860-F16.6.0Rel-16Addition of new test case 6.4B.2.4.3_1.3 In-band Emissions for inter-band EN-DC including FR2 with 5 CCs Details R5-210417 agreedRAN5#90-eLG Electronics Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30859-F16.6.0Rel-16Addition of new test case 6.4B.2.4.3_1.2 In-band Emissions for inter-band EN-DC including FR2 with 4 CCs Details R5-210416 agreedRAN5#90-eLG Electronics Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30858-F16.6.0Rel-16Addition of new test case 6.4B.2.4.3_1.1 In-band Emissions for inter-band EN-DC including FR2 with 3 CCs Details R5-210415 agreedRAN5#90-eLG Electronics Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30857-F16.6.0Rel-16Correction to EN-DC OoB emissions Details R5-210387 agreedRAN5#90-eROHDE & SCHWARZ Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308561F16.6.0Rel-16Update Test description of 6.5B.1.1 Details R5-211696 agreedRAN5#90-eGuangdong OPPO ... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308551F16.6.0Rel-16Addition of new test case 7.3B.4 for EIS Spherical Coverage Details R5-211712 agreedRAN5#90-eROHDE & SCHWARZ Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308541F16.6.0Rel-16Update of 7.3B.2.3_1.1 RefSens DC_3A-8A_n78A Details R5-211711 agreedRAN5#90-eKT Corp. Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308531F16.6.0Rel-16Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 DC_1A-8A_n78A Details R5-211710 agreedRAN5#90-eKT Corp. Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308521F16.6.0Rel-16MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs Details R5-211927 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308511F16.6.0Rel-16MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs) Details R5-211926 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308491F16.6.0Rel-16ACLR for intra-band non-contiguous EN-DC Test Definition Details R5-211695 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30848-B16.6.0Rel-16Addition of new test case 6.5B.1.4D OBW for inter-band EN-DC FR2 UL MIMO Details R5-210302 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30847-F16.6.0Rel-16Completion of OBW intra-band non-contiguous test 6.5B.1.2 Details R5-210301 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308451F16.6.0Rel-16Correction of LTE frequency for 19-n79 combo in 7.3B.2.3 Details R5-211874 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308441F16.6.0Rel-16Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition Details R5-211694 agreedRAN5#90-eKeysight Techno... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-308431F16.6.0Rel-16Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 Details R5-211870 agreedRAN5#90-eCMCC, Qualcomm,... Details RP-210133 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.521-30842-F16.6.0Rel-16Introduction of DC_7A-20A_n3A to reference sensitivity test Details R5-210093 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308411F16.6.0Rel-16Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test Details R5-211772 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308401F16.6.0Rel-16Introduction of DC_7A_n3A to reference sensitivity test Details R5-211771 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308391F16.6.0Rel-16Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2 Details R5-211768 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308381F16.6.0Rel-16Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2 Details R5-211767 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.521-308371F16.6.0Rel-16Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2 Details R5-211766 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...