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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90503931F16.6.0Rel-16Reference sensitivity TP analysis for DC_7A-28A_n3A Details R5-211909 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503921F16.6.0Rel-16Reference sensitivity TP analysis for DC_7A-20A_n1A Details R5-211908 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503911F16.6.0Rel-16Reference sensitivity analysis for DC_3A-7A_n1A Details R5-211907 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503901F16.6.0Rel-16Reference sensitivity TP analysis for DC_1A-28A_n3A Details R5-211906 agreedRAN5#90-eEricsson Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.9050389-F16.6.0Rel-16NS_12, NS_13, NS_14, NS_15 TP analysis to 38.905 Details R5-211230 agreedRAN5#90-eDish Network Details RP-210145 approvedRAN#91-eTSG WG RAN516.7.0NR_bands_BW_R16...
See details 38.90503881F16.6.0Rel-16Test Point analysis update for FR2 Tx additional spurious emission test case Details R5-211748 agreedRAN5#90-eQualcomm Finlan... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503871F16.6.0Rel-16TP analysis for DC_41A_n77A and DC_41A_n78A Details R5-211902 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503861F16.6.0Rel-16TP analysis for DC_26A_n79A Details R5-211901 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503851F16.6.0Rel-16TP analysis for DC_26A_n77A and DC_26A_n78A Details R5-211900 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503841F16.6.0Rel-16TP analysis for DC_26A_n41A Details R5-211899 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503831F16.6.0Rel-16TP analysis for DC_11A_n79A Details R5-211898 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503821F16.6.0Rel-16TP analysis for DC_8A_n77A Details R5-211897 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.9050380-F16.6.0Rel-16TP analysis for ULFPTx in MPR test case Details R5-211134 agreedRAN5#90-eEricsson Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.90503791F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A Details R5-211747 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503781F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A Details R5-211746 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503771F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A Details R5-211745 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503761F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A Details R5-211744 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503751F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A Details R5-211743 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503741F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A Details R5-211742 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503731F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A Details R5-211741 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503721F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A Details R5-211740 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503711F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A Details R5-211739 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503701F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A Details R5-211738 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503691F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A Details R5-211737 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.9050368-F16.6.0Rel-16TP analysis for test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward) Details R5-211018 agreedRAN5#90-eEricsson Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.90503661F16.6.0Rel-16Spur emission TP analysis R16 DC_66A_n41A Details R5-211781 agreedRAN5#90-eQualcomm Korea,... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503651F16.6.0Rel-16Spur emission TP analysis R16 DC_48A_n66A Details R5-211780 agreedRAN5#90-eQualcomm Korea Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503641F16.6.0Rel-16Spur emission TP analysis R16 DC_48A_n5A Details R5-211779 agreedRAN5#90-eQualcomm Korea,... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503631F16.6.0Rel-16Spur emission TP analysis R16 DC_13A_n2A Details R5-211778 agreedRAN5#90-eQualcomm Korea Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.9050362-F16.6.0Rel-16Spur emission TP analysis R16 DC_5A_n2A Details R5-210963 agreedRAN5#90-eQualcomm Korea Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503611F16.6.0Rel-16Spur emission TP analysis R16 DC_2A_n41A Details R5-211777 agreedRAN5#90-eQualcomm Korea,... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503601F16.6.0Rel-16Moving of principles for reference sensitivity test point selection from attachments to annexes Details R5-211895 agreedRAN5#90-eEricsson Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503591F16.6.0Rel-16Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC Details R5-211894 agreedRAN5#90-eEricsson, Huawe... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503581F16.6.0Rel-16Adding TP analysis for NR test case-Time mask for UL carrier switching Details R5-211914 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.9050356-F16.6.0Rel-16Updating TP analysis for FR1 REFSENS for SUL testing Details R5-210905 agreedRAN5#90-eHuawei, Hisilicon Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.9050354-F16.6.0Rel-16Updating TP analysis for Spurious Emissions for CA in FR1 Details R5-210900 agreedRAN5#90-eHuawei, Hisilicon Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.9050353-F16.6.0Rel-16Adding TP selection for 6.4C.2 Transmit modulation quality for SUL Details R5-210791 agreedRAN5#90-eHuawei, HiSilicon Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.90503521F16.6.0Rel-16Update of TP analysis for FR1 SUL test cases Details R5-211811 agreedRAN5#90-eHuawei, HiSilicon Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.90503511F16.6.0Rel-16Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK Details R5-211810 agreedRAN5#90-eHuawei, HiSilicon Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.90503501F16.6.0Rel-16Adding TP analysis for Rel-16 DMRS in A-MPR test case Details R5-211809 agreedRAN5#90-eHuawei, HiSilicon Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.9050349-F16.6.0Rel-16Resubmitting TP analysis of FR1 A-MPR for NS_44 Details R5-210743 agreedRAN5#90-eHuawei, HiSilicon Details RP-210145 approvedRAN#91-eTSG WG RAN516.7.0NR_bands_BW_R16...
See details 38.9050348-F16.6.0Rel-16Adding TP analysis of FR1 A-MPR for NS_49 Details R5-210742 agreedRAN5#90-eHuawei, HiSilicon Details RP-210145 approvedRAN#91-eTSG WG RAN516.7.0NR_bands_BW_R16...
See details 38.9050347-F16.6.0Rel-16Updating TP analysis of FR1 A-MPR for NS_48 Details R5-210740 agreedRAN5#90-eHuawei, HiSilicon Details RP-210145 approvedRAN#91-eTSG WG RAN516.7.0NR_bands_BW_R16...
See details 38.90503461F16.6.0Rel-16Update of test point analysis for FR2 MPR, SEM and ACLR test cases Details R5-211893 agreedRAN5#90-eKeysight Techno... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503451F16.6.0Rel-16Update of test point analysis for FR2 UL CA frequency error test cases Details R5-211736 agreedRAN5#90-eKeysight Techno... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.9050344-F16.6.0Rel-16Introduction of test point analysis for SA FR2 7.4A Maximum input level for CA Details R5-210512 agreedRAN5#90-eCAICT Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.9050343-F16.6.0Rel-16Correct a tpyo of 6.3A.4.2 Details R5-210383 agreedRAN5#90-eGuangdong OPPO ... Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.90503421F16.6.0Rel-16TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous Details R5-211735 agreedRAN5#90-eKeysight Techno... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503411F16.6.0Rel-16TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous Details R5-211734 agreedRAN5#90-eKeysight Techno... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503401F16.6.0Rel-16Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Details R5-211733 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.90503391F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Details R5-211776 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503381F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A Details R5-211775 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...
See details 38.90503371F16.6.0Rel-16Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Details R5-211774 agreedRAN5#90-eNokia, Nokia Sh... Details RP-210144 approvedRAN#91-eTSG WG RAN516.7.0NR_CADC_NR_LTE_...