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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 37.571-10318-F16.7.0Rel-16Update to Annex C for TDD NB-IOT RSTD measurement test cases Details R5-210757 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest
See details 37.571-103171F16.7.0Rel-16Addition of TDD NB-IOT RSTD measurement test case 9.8.3 Details R5-211801 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest
See details 37.571-103161F16.7.0Rel-16Addition of TDD NB-IOT RSTD measurement test case 9.8.2 Details R5-211800 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest
See details 37.571-103151F16.7.0Rel-16Addition of TDD NB-IOT RSTD measurement test case 9.8.1 Details R5-211799 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest
See details 37.571-103141F16.7.0Rel-16Addition of TDD NB-IOT RSTD measurement test case 9.7.3 Details R5-211798 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest
See details 37.571-103131F16.7.0Rel-16Addition of TDD NB-IOT RSTD measurement test case 9.7.2 Details R5-211797 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest
See details 37.571-103121F16.7.0Rel-16Addition of TDD NB-IOT RSTD measurement test case 9.7.1 Details R5-211796 agreedRAN5#90-eHuawei, HiSilicon Details RP-210141 approvedRAN#91-eTSG WG RAN516.8.0NB_IOTenh2-UEConTest