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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90504291F17.0.0Rel-17Test Point analysis for FR2 Tx spurious emission CA test case Details R5-214071 agreedRAN5#91-eQUALCOMM JAPAN LLC. Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.9050428-F17.0.0Rel-17Correction of test coverage clause numbering Details R5-213114 agreedRAN5#91-eEricsson Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504271F17.0.0Rel-17General TP analysis update for NR CA refsens Details R5-213962 agreedRAN5#91-eEricsson Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504261F17.0.0Rel-17TP analysis for DC_42A_n77A Details R5-213961 agreedRAN5#91-eEricsson Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504251F17.0.0Rel-17TP analysis for DC_25A_n41A Details R5-213960 agreedRAN5#91-eEricsson Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504241F17.0.0Rel-17TP analysis for DC_11A_n78A Details R5-213959 agreedRAN5#91-eEricsson Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504231F17.0.0Rel-17TP analysis for DC_11A_n77A Details R5-213958 agreedRAN5#91-eEricsson Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504221F17.0.0Rel-17Update of test point analysis for FR2 MPR SEM and ACLR UL-MIMO test cases Details R5-213957 agreedRAN5#91-eSporton Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.9050421-F17.0.0Rel-17TP analysis for 6.2.4 updated for eMIMO Details R5-213053 agreedRAN5#91-eEricsson Details RP-211011 approvedRAN#92-eTSG WG RAN517.1.0NR_eMIMO-UEConTest
See details 38.90504201F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_30A_n5A Details R5-213956 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504191F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_26A_n79A Details R5-213955 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504181F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_26A_n41A Details R5-213954 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504171F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_12A_n66A Details R5-213953 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504161F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_8A_n77A Details R5-213952 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504151F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_3A_n78A Details R5-213951 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504141F17.0.0Rel-17Update of TP analysis for general spurious emissions for DC_3A_n7A Details R5-213950 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504131F17.0.0Rel-17Correction to test points selection for inter-band EN-DC co-existence spurious emissions testing Details R5-213949 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504121F17.0.0Rel-17Correction to test points selection for inter-band EN-DC general spurious emissions testing Details R5-214093 agreedRAN5#91-eHuawei, HiSilic... Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.9050411-F17.0.0Rel-17Correction to test points selection for intra-band EN-DC spurious emissions testing Details R5-213024 agreedRAN5#91-eHuawei, HiSilicon Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.9050409-F17.0.0Rel-17Updating TP analysis for UTRA ACLR MIMO testing for band n1 Details R5-212990 agreedRAN5#91-eHuawei, HiSilicon Details RP-211007 approvedRAN#92-eTSG WG RAN517.1.0NR_RF_FR1-UEConTest
See details 38.9050407-F17.0.0Rel-17Addition of TP analysis for CA_n28A-n41A in Tx Spurious Emision cases Details R5-212982 agreedRAN5#91-eHuawei, HiSilicon Details RP-211005 approvedRAN#92-eTSG WG RAN517.1.0NR_CADC_NR_LTE_...
See details 38.9050406-F17.0.0Rel-17Addition of TP analysis of 6.3E.1 V2X minimum output power non-concurrent Details R5-212930 agreedRAN5#91-eHuawei, HiSilicon Details RP-211010 approvedRAN#92-eTSG WG RAN517.1.05G_V2X_NRSL_eV2...
See details 38.9050405-F17.0.0Rel-17Addition of TP analysis of V2X MPR, SEM and ACLR non-concurrent Details R5-212929 agreedRAN5#91-eHuawei, HiSilicon Details RP-211010 approvedRAN#92-eTSG WG RAN517.1.05G_V2X_NRSL_eV2...
See details 38.90504031F17.0.0Rel-17Addition of test points analysis for NS_06 FR1 test cases Details R5-213948 agreedRAN5#91-eEricsson, AT&T Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504021F17.0.0Rel-17Correction of power control in 38.905 Details R5-214070 agreedRAN5#91-eAnritsu Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90504011F17.0.0Rel-17Spurious emission TP analysis for Rel-15 EN-DC configuration DC_2A_n71A Details R5-213947 agreedRAN5#91-eQUALCOMM Europe... Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.9050400-F17.0.0Rel-17Spurious emission TP analysis for Rel-15 EN-DC configuration DC_66A_n71A Details R5-212524 agreedRAN5#91-eQUALCOMM Europe... Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90503991F17.0.0Rel-17Spurious emission TP analysis for Rel-16 EN-DC configuration DC_14A_n66A Details R5-214074 agreedRAN5#91-eQUALCOMM Europe... Details RP-211005 approvedRAN#92-eTSG WG RAN517.1.0NR_CADC_NR_LTE_...
See details 38.90503981F17.0.0Rel-17Spurious emission TP analysis for Rel-16 EN-DC configuration DC_14A_n2A Details R5-214073 agreedRAN5#91-eQUALCOMM Europe... Details RP-211005 approvedRAN#92-eTSG WG RAN517.1.0NR_CADC_NR_LTE_...
See details 38.9050397-F17.0.0Rel-17Update of test point analysis for FR2 Occupied Bandwidth for UL MIMO test case Details R5-212519 agreedRAN5#91-eTTA Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest
See details 38.90503961F17.0.0Rel-17Introduction of test point analysis for FR2 CA Error Vector Magnitude test case Details R5-213946 agreedRAN5#91-eTTA Details RP-210997 approvedRAN#92-eTSG WG RAN517.1.05GS_NR_LTE-UEConTest