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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-311821F17.1.0Rel-17Addition of cl 6.2B.1.3A for RF Details R5-216039 agreedRAN5#92-eCMCC, Qualcomm,... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31181-F17.1.0Rel-17Update of 6.5B.2.3 out of band emissions for inter-band EN-DC Details R5-215804 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31180-F17.1.0Rel-17EN-DC including FR2 DL CA up to 8 NR CCs REFSENS measurement uncertainties Details R5-215673 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31179-F17.1.0Rel-17Correcting references in EN-DC RX test cases Details R5-215668 agreedRAN5#92-eEricsson Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-311781F17.1.0Rel-17Update to Rel.15 EN-DC FR2 Band Combination Tables Details R5-216095 agreedRAN5#92-eApple Portugal Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311731F17.1.0Rel-17Update for 6.5B.3.3.1 for Rel 16 combos Details R5-215927 agreedRAN5#92-eQualcomm Austri... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-311711F17.1.0Rel-17Update for reference sensitivity for DC_48A_n66A Details R5-216108 agreedRAN5#92-eQualcomm Austri... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311701F17.1.0Rel-17Update for 6.5B.3.3.1 for Rel 15 combos Details R5-216013 agreedRAN5#92-eQualcomm Austri... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311691F17.1.0Rel-17Measurement Uncertainties and test tolerances for NSA FR2 CA Maximum Output Power and Spectrum Emission Mask Details R5-215833 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311681F17.1.0Rel-17Message contents addition for intra-band non contiguous EN-DC SEM, A-SEM and ACLR test cases Details R5-215890 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311671F17.1.0Rel-17Message content updates for intra-band contiguous EN-DC additional spectrum emission mask test Details R5-215889 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311621F17.1.0Rel-17EN-DC including FR2 DL CA up to 8 NR CCs REFSENS test cases addition Details R5-215832 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311611F17.1.0Rel-17Spurious co-existence corrections for band combo DC_8_n41 Details R5-215926 agreedRAN5#92-eKeysight techno... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-31160-F17.1.0Rel-17Updates to Editors note for spurious emission CA test case Details R5-215521 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311591F17.1.0Rel-17Spurious co-existence core requirement updates for Dual connectivity including band n28 and other core requirement alignments Details R5-216131 agreedRAN5#92-eKeysight techno... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311561F17.1.0Rel-17Addition of test case 6.4B.2.4.5 Details R5-215888 agreedRAN5#92-eROHDE & SCHWARZ Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31155-F17.1.0Rel-17Correction of 5.4B.1 for channel spacing for intra-band EN-DC carriers Details R5-215460 agreedRAN5#92-eZTE Corporation Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311541F17.1.0Rel-17Update of 6.5B.3.3.2.3 for the requirements of spurious emission band UE co-existence limits for Rel-16 Details R5-216016 agreedRAN5#92-eZTE Corporation Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-31147-F17.1.0Rel-17Updated to title of clause 6.5B.5.x Details R5-215381 agreedRAN5#92-eBureau Veritas Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31146-F17.1.0Rel-17Update of applicability and title for R16 EN-DC Tx tests Details R5-215380 agreedRAN5#92-eBureau Veritas Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-31145-F17.1.0Rel-17Update of R15 EN-DC Tx tests Details R5-215379 agreedRAN5#92-eBureau Veritas Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31144-F17.1.0Rel-17Update to EN-DC R17 common section Details R5-215378 agreedRAN5#92-eBureau Veritas,... Details RP-211732 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-311431F17.1.0Rel-17Update to EN-DC R16 common section Details R5-215928 agreedRAN5#92-eBureau Veritas,... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-31142-F17.1.0Rel-17Update to EN-DC R15 common section Details R5-215376 agreedRAN5#92-eBureau Veritas Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311411F17.1.0Rel-17Editors note correction to reference sensitivity for inter-band EN-DC including FR2 Details R5-215900 agreedRAN5#92-eAnritsu Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31140-F17.1.0Rel-17Correction of test CBW for n28 in 6.2B.1.3 Details R5-215337 agreedRAN5#92-eAnritsu Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31138-F17.1.0Rel-17Correction of power control in 38.521-3 Details R5-215323 agreedRAN5#92-eAnritsu Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31137-F17.1.0Rel-17Editorial correction to clause 7.3B.2.0.3 Details R5-215296 agreedRAN5#92-eHuawei, Hisilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31136-F17.1.0Rel-17Updating 7.3B.2.3 REFSENS testing for DC_7A-20A_n28A Details R5-215294 agreedRAN5#92-eHuawei, Hisilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31135-F17.1.0Rel-17Updating 7.3B.2.3 REFSENS testing for DC_3A-20A_n28A Details R5-215292 agreedRAN5#92-eHuawei, Hisilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311341F17.1.0Rel-17Updating 7.3B.2.3 REFSENS testing for DC_7A_n28A-n78A Details R5-215899 agreedRAN5#92-eHuawei, Hisilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311331F17.1.0Rel-17Updating 7.3B.2.3 REFSENS testing for DC_3A_n28A-n78A Details R5-215898 agreedRAN5#92-eHuawei, Hisilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311321F17.1.0Rel-17Updated editors note to indicate missing LO retrieval RRC framework Details R5-216093 agreedRAN5#92-eQualcomm Wirele... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311311F17.1.0Rel-17Updated EN-DC spur emissions including FR2 editor notes Details R5-215887 agreedRAN5#92-eQualcomm Wirele... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31130-F17.1.0Rel-17Added refsens deltaRIB test case for EN-DC including FR1 and FR2 Details R5-215266 agreedRAN5#92-eQualcomm Wirele... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31129-F17.1.0Rel-17Update of reference sensitivity test coverage for 4CC EN-DC configurations Details R5-215257 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311281F17.1.0Rel-17Update of reference sensitivity test coverage for 3CC EN-DC configurations Details R5-216094 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31127-F17.1.0Rel-17Correction to reference sensitivity test configuration for 3CC EN-DC Details R5-215255 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31126-F17.1.0Rel-17Update of reference sensitivity test requirements for DC_41A_n77A and DC_41A_n78A Details R5-215254 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31125-F17.1.0Rel-17Addition of reference sensitivity testing for DC_3A-7A_n28A Details R5-215235 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31124-F17.1.0Rel-17Addition of reference sensitivity testing for DC_1A-7A_n28A Details R5-215234 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31123-F17.1.0Rel-17Addition of reference sensitivity testing for DC_1A-3A_n28A Details R5-215233 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31122-F17.1.0Rel-17Addition of reference sensitivity testing for DC_1A_n28A-n78A Details R5-215232 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311211F17.1.0Rel-17Update of MOP requirements for DC_3A_n3A Details R5-215886 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31120-F17.1.0Rel-17Addition of test case body to 6.5B.5 transmit intermodulation Details R5-215230 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31119-F17.1.0Rel-17Correction to 6.4B.2 in-band emission for intra-band contiguous EN-DC Details R5-215228 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31118-F17.1.0Rel-17Correction to 6.5B.3.1.2 and 6.5B.3.2.2 UE co-existence spurious emissions Details R5-215223 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311171F17.1.0Rel-17Update of general spurious emissions test requirements for Rel-16 inter-band EN-DC Details R5-216015 agreedRAN5#92-eHuawei, HiSilicon Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-311161F17.1.0Rel-17Correction to 6.5B.2.2.3 ACLR for intra-band non-contiguous EN-DC Details R5-216120 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311151F17.1.0Rel-17Correction to 6.5B.2.2.1 SEM for intra-band non-contiguous EN-DC Details R5-216119 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31114-F17.1.0Rel-17Correction to 6.5B.2.1.3 ACLR for intra-band contiguous EN-DC Details R5-215210 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31113-F17.1.0Rel-17Correction to 6.5B.2.1.1 SEM for intra-band contiguous EN-DC Details R5-215209 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311121F17.1.0Rel-17Cleanup for TS 38.521-3 spurious emission for UE co-existence table Rel-16 Details R5-216012 agreedRAN5#92-eApple Italia S.R.L. Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311111F17.1.0Rel-17Cleanup for TS 38.521-3 spurious emission for UE co-existence table for Rel-15 Details R5-216011 agreedRAN5#92-eApple Italia S.R.L. Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311101F17.1.0Rel-17Update of test applicability for 6.2B.2 MPR and 6.2B.3 A-MPR for inter-band EN-DC Details R5-215885 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31109-F17.1.0Rel-17Correction to 6.2B.2.2 MPR for intra-band non-contiguous EN-DC Details R5-215195 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31108-F17.1.0Rel-17Correction to 6.2B.2.1 MPR for intra-band contiguous EN-DC Details R5-215194 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311071F17.1.0Rel-17Addition of TC6.3B.4.4 PRACH Time Mask for inter-band EN-DC including FR2 Details R5-215884 agreedRAN5#92-eSGS Wireless Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311061F17.1.0Rel-17Addition of TC6.3B.3.4D Transmit ON/OFF time mask for inter-band EN-DC including FR2 for UL-MIMO Details R5-215883 agreedRAN5#92-eSGS Wireless Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-311041F17.1.0Rel-17Addition of TC6.3B.2.4D Transmit OFF Power for inter-band EN-DC including FR2 for UL-MIMO Details R5-215882 agreedRAN5#92-eSGS Wireless Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31100-F17.1.0Rel-17Update of REFSENS for inter-band EN-DC 3CC adding DC_3A-28A_n78A Details R5-215063 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31099-F17.1.0Rel-17Update of REFSENS for inter-band EN-DC 3CC adding DC_1A-28A_n78A Details R5-215062 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31098-F17.1.0Rel-17Update of REFSENS for inter-band EN-DC 2CC adding DC_28A_n78A Details R5-215061 agreedRAN5#92-eHuawei, HiSilicon Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310971F17.1.0Rel-17Addition of spurious emission for DC 1A_n78A and 20A_n78A and 28A_n78A Details R5-215881 agreedRAN5#92-eHuawei, HiSilic... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31096-F17.1.0Rel-17Correcting references in EN-DC TX test cases Details R5-215047 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310951F17.1.0Rel-17Editorial correction to test applicability in 6.2B.1.4_1.1.1 Details R5-215880 agreedRAN5#92-eTTA Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31094-F17.1.0Rel-17Correction to EN-DC receiver spurious emission test cases Details R5-214846 agreedRAN5#92-eAnritsu Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310931F17.1.0Rel-17Addition of 7.5B.0.4a Inter-band NE-DC including FR2 Details R5-215897 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310911F17.1.0Rel-17Addition of 7.9B.3A Spurious Emissions for inter-band NE-DC within FR1 Details R5-215896 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310901F17.1.0Rel-17Addition of 7.8B.2.3A Wide band Intermodulation for inter-band NE-DC within FR1 Details R5-215895 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310891F17.1.0Rel-17Addition of 7.6B.4.3A Narrow band blocking for inter-band NE-DC within FR1 Details R5-215894 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310881F17.1.0Rel-17Addition of 7.6B.2.3A In-band blocking for inter-band NE-DC within FR1 Details R5-215893 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310871F17.1.0Rel-17Addition of 7.5B.3A ACS for inter-band NE-DC within FR1 Details R5-215892 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310861F17.1.0Rel-17Addition of 7.4B.3A Maximum Input Level for inter-band NE-DC within FR1 Details R5-215891 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310841F17.1.0Rel-17Addition of 6.5B.5.3A Transmit Intermodulation for Inter-band NE-DC within FR1 Details R5-215879 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310821F17.1.0Rel-17Addition of 6.5B.3.3A.1 General Spurious Emissions for Inter-band NE-DC within FR1 Details R5-215878 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310811F17.1.0Rel-17Addition of 6.5B.2.3A.3 Adjacent channel leakage ratio for inter-band NE-DC within FR1 Details R5-215877 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310801F17.1.0Rel-17Addition of 6.5B.2.3A.2 Additional Spectrum emissions mask for Inter-band NE-DC within FR1 Details R5-215876 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310791F17.1.0Rel-17Addition of 6.5B.2.3A.1 Spectrum emissions mask for Inter-band NE-DC within FR1 Details R5-215875 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310771F17.1.0Rel-17Addition of 6.4B.2.3A.3 In-band Emissions for inter-band NE-DC within FR1 Details R5-215874 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310761F17.1.0Rel-17Addition of 6.4B.2.3A.2 Carrier Leakage for inter-band NE-DC within FR1 Details R5-215873 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310751F17.1.0Rel-17Addition of 6.4B.2.3A.1 Error Vector Magnitude for inter-band NE-DC within FR1 Details R5-215872 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310741F17.1.0Rel-17Addition of 6.4B.1.3A Frequency Error for inter-band NE-DC within FR1 Details R5-215871 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31073-F17.1.0Rel-17Clarification on NSA Option 3 Rx test cases Details R5-214484 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31072-F17.1.0Rel-17Clarification on NSA Option 3 Tx test cases Details R5-214483 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31071-F17.1.0Rel-17Update of Applicability and Titles for ACS for EN-DC within FR1 Details R5-214481 agreedRAN5#92-eCMCC Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31070-F17.1.0Rel-17Update clause 7 for R17 DC RX characteristics in TS 38.521-3 Details R5-214384 agreedRAN5#92-eChina Telecommu... Details RP-211732 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-310691F17.1.0Rel-17Clarification of SA and NSA support in the UE Details R5-215870 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31067-F17.1.0Rel-17Update of Rel-16 EN-DC DC_40A_n78A in spurious emission test cases Details R5-214318 agreedRAN5#92-eEricsson Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.521-31065-F17.1.0Rel-17Update of Rel-15 EN-DC DC_66A_n78A in spurious emission test cases Details R5-214313 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31064-F17.1.0Rel-17Update of Rel-15 EN-DC DC_66A_n5A in spurious emission test cases Details R5-214312 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31063-F17.1.0Rel-17Update of Rel-15 EN-DC DC_41A_n79A in spurious emission test cases Details R5-214311 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31062-F17.1.0Rel-17Update of Rel-15 EN-DC DC_41A_n78A in spurious emission test cases Details R5-214310 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31061-F17.1.0Rel-17Update of Rel-15 EN-DC DC_41A_n77A in spurious emission test cases Details R5-214309 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31060-F17.1.0Rel-17Update of Rel-15 EN-DC DC_39A_n79A in spurious emission test cases Details R5-214308 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31059-F17.1.0Rel-17Update of Rel-15 EN-DC DC_26A_n78A in spurious emission test cases Details R5-214307 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310581F17.1.0Rel-17Update of Rel-15 EN-DC DC_26A_n77A in spurious emission test cases Details R5-216010 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310571F17.1.0Rel-17Update of Rel-15 EN-DC DC_25A_n41A in spurious emission test cases Details R5-215869 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31056-F17.1.0Rel-17Update of Rel-15 EN-DC DC_11A_n79A in spurious emission test cases Details R5-214304 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31055-F17.1.0Rel-17Update of Rel-15 EN-DC DC_11A_n78A in spurious emission test cases Details R5-214303 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31054-F17.1.0Rel-17Update of Rel-15 EN-DC DC_11A_n77A in spurious emission test cases Details R5-214302 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31053-F17.1.0Rel-17Update of Rel-15 EN-DC DC_7A_n78A in spurious emission test cases Details R5-214301 agreedRAN5#92-eEricsson, Orange Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310521F17.1.0Rel-17Update of Rel-15 EN-DC DC_5A_n78A in spurious emission test cases Details R5-215868 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31051-F17.1.0Rel-17Update of Rel-15 EN-DC DC_5A_n66A in spurious emission test cases Details R5-214299 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31050-F17.1.0Rel-17Update of Rel-15 EN-DC DC_3A_n79A in spurious emission test cases Details R5-214298 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310491F17.1.0Rel-17Update of Rel-15 EN-DC DC_1A_n78A in spurious emission test cases Details R5-216038 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31048-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_42A_n77A to spurious emission test cases Details R5-214296 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310471F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_28A_n79A to spurious emission test cases Details R5-215867 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31045-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_28A_n77A to spurious emission test cases Details R5-214293 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31044-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_21A_n79A to spurious emission test cases Details R5-214292 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31043-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_21A_n78A to spurious emission test cases Details R5-214291 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31042-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_21A_n77A to spurious emission test cases Details R5-214290 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310411F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_20A_n78A to spurious emission test cases Details R5-215866 agreedRAN5#92-eEricsson, Huawe... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310401F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_20A_n28A to spurious emission test cases Details R5-216009 agreedRAN5#92-eEricsson, Orang... Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310391F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_19A_n79A to spurious emission test cases Details R5-215865 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310381F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_19A_n78A to spurious emission test cases Details R5-215864 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310371F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_19A_n77A to spurious emission test cases Details R5-215863 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310361F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_7A_n28A to spurious emission test cases Details R5-216008 agreedRAN5#92-eEricsson, Orange Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31035-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_3A_n77A to spurious emission test cases Details R5-214283 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31034-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_3A_n28A to spurious emission test cases Details R5-214282 agreedRAN5#92-eEricsson, Orange Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31033-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_1A_n79A to spurious emission test cases Details R5-214281 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31032-F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_1A_n77A to spurious emission test cases Details R5-214280 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-310311F17.1.0Rel-17Introduction of Rel-15 EN-DC DC_1A_n28A to spurious emission test cases Details R5-216007 agreedRAN5#92-eEricsson Details RP-211690 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.521-31030-F17.1.0Rel-17Update of R17 CADC configurations into TS38.521-3 clause 5 Details R5-214188 agreedRAN5#92-eChina Telecommu... Details RP-211732 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...