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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90505071F17.1.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A Details R5-216020 agreedRAN5#92-eKeysight techno... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.90505061F17.1.0Rel-17TP analysis for ref sensitivity DC_48A_n66A Details R5-216109 agreedRAN5#92-eQualcomm Austri... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050505-F17.1.0Rel-17Update_TP_analysis for Rel_15_DC_66A_n71A Details R5-215550 agreedRAN5#92-eQualcomm Austri... Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050504-F17.1.0Rel-17Update_TP_analysis for Rel_15_DC_2A_n71A Details R5-215547 agreedRAN5#92-eQualcomm Austri... Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050503-F17.1.0Rel-17Update_TP_analysis for Rel_16_DC_13A_n2A Details R5-215545 agreedRAN5#92-eQualcomm Austri... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050502-F17.1.0Rel-17Update_TP_analysis for Rel_16_DC_14A_n2A Details R5-215543 agreedRAN5#92-eQualcomm Austri... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.90505011F17.1.0Rel-17Defining TP analysis for MPR, SEM and ACLR for FR2 UL MIMO Details R5-216062 agreedRAN5#92-eKeysight techno... Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90505001F17.1.0Rel-17Update_TP_analysis for Rel_16_DC_14A_n66A Details R5-216064 agreedRAN5#92-eQualcomm Austri... Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050499-F17.1.0Rel-17Correction to TP analysis for FR1 A-SPR with NS_17 Details R5-215336 agreedRAN5#92-eAnritsu Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050498-F17.1.0Rel-17TP analysis for FR2 General ON OFF time mask Details R5-215327 agreedRAN5#92-eAnritsu Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050497-F17.1.0Rel-17Updating TP analysis for Occupied bandwidth for CA Details R5-215306 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.9050496-F17.1.0Rel-17Updating TP analysis for Aggregate power tolerance for CA Details R5-215304 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.9050495-F17.1.0Rel-17Updating TP analysis for Relative power tolerance for CA Details R5-215302 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.90504941F17.1.0Rel-17Updating TP analysis for Absolute power tolerance for CA Details R5-216068 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.90504931F17.1.0Rel-17Updating Test point analysis for DC_7A-20A_n28A Details R5-216061 agreedRAN5#92-eHuawei, Hisilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050492-F17.1.0Rel-17Updating Test point analysis for DC_3A-20A_n28A Details R5-215293 agreedRAN5#92-eHuawei, Hisilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504911F17.1.0Rel-17Updating Test point analysis for DC_7A_n28A-n78A Details R5-216060 agreedRAN5#92-eHuawei, Hisilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504901F17.1.0Rel-17Updating Test point analysis for DC_3A_n28A-n78A Details R5-216059 agreedRAN5#92-eHuawei, Hisilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504891F17.1.0Rel-17Correction to Annex D Principles for test point selection for EN-DC reference sensitivity test cases Details R5-216058 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504881F17.1.0Rel-17Correction to TP analysis for reference sensitivity per EN-DC configuration Details R5-216057 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050487-F17.1.0Rel-17Addition of reference sensitivity TP analysis for DC_3A-7A_n28A Details R5-215239 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050486-F17.1.0Rel-17Addition of reference sensitivity TP analysis for DC_1A-7A_n28A Details R5-215238 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050485-F17.1.0Rel-17Addition of reference sensitivity TP analysis for DC_1A-3A_n28A Details R5-215237 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050484-F17.1.0Rel-17Addition of reference sensitivity TP analysis for DC_1A_n28A-n78A Details R5-215236 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050483-F17.1.0Rel-17Correction to TP analysis for in-band emission for intra-band contiguous EN-DC Details R5-215229 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504821F17.1.0Rel-17Update of TP analysis for general spurious emissions for DC_40A_n41A Details R5-216019 agreedRAN5#92-eHuawei, HiSilicon Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.90504811F17.1.0Rel-17Update of TP analysis for general spurious emissions for DC_39A_n41A Details R5-216018 agreedRAN5#92-eHuawei, HiSilicon Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050480-F17.1.0Rel-17Update of TP analysis for general spurious emissions for DC_28A_n3A Details R5-215220 agreedRAN5#92-eHuawei, HiSilicon Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050479-F17.1.0Rel-17Update of TP analysis for general spurious emissions for DC_12A_n78A Details R5-215219 agreedRAN5#92-eHuawei, HiSilicon Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.90504771F17.1.0Rel-17Update of TP analysis for general spurious emissions for DC_3A_n41A Details R5-216017 agreedRAN5#92-eHuawei, HiSilicon Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.90504761F17.1.0Rel-17Correction to IE and UE capability for low PAPR DMRS in test point analysis Details R5-216142 agreedRAN5#92-eHuawei, HiSilicon Details RP-211709 approvedRAN#93-eTSG WG RAN517.2.0NR_eMIMO-UEConTest
See details 38.9050475-F17.1.0Rel-17Addition of test points analysis for NS_06 power class 1 test cases Details R5-215164 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050474-F17.1.0Rel-17Addition of TP analysis of V2X minimum output power for non-concurrent with SL-MIMO Details R5-215077 agreedRAN5#92-eHuawei, HiSilicon Details RP-211708 approvedRAN#93-eTSG WG RAN517.2.05G_V2X_NRSL_eV2...
See details 38.9050473-F17.1.0Rel-17Addition of TP analysis of V2X MPR, SEM and ACLR non-concurrent with SL-MIMO Details R5-215076 agreedRAN5#92-eHuawei, HiSilicon Details RP-211708 approvedRAN#93-eTSG WG RAN517.2.05G_V2X_NRSL_eV2...
See details 38.90504721F17.1.0Rel-17Addition of TP for REFSENS for inter-band EN-DC 2CC and 3CC combos Details R5-216056 agreedRAN5#92-eHuawei, HiSilicon Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504711F17.1.0Rel-17Addition of TP analysis for spurious emissions for DC_28A_n78A Details R5-215921 agreedRAN5#92-eHuawei, HiSilic... Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050469-F17.1.0Rel-17Introduction of test point analysis for FR2 Time alignment error for UL MIMO test case Details R5-214907 agreedRAN5#92-eTTA Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050468-F17.1.0Rel-17Adding TP analysis for test case 6.5D.1_1 Details R5-214721 agreedRAN5#92-eEricsson Details RP-211709 approvedRAN#93-eTSG WG RAN517.2.0NR_eMIMO-UEConTest
See details 38.9050467-F17.1.0Rel-17Introduction of NR FR2 Test Points For Aggregate power tolerance for CA Details R5-214385 agreedRAN5#92-e3in Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050466-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n78A Details R5-214316 agreedRAN5#92-eEricsson Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050465-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n1A Details R5-214315 agreedRAN5#92-eEricsson Details RP-211702 approvedRAN#93-eTSG WG RAN517.2.0NR_CADC_NR_LTE_...
See details 38.9050464-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_66A_n78A Details R5-214278 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050463-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_66A_n5A Details R5-214277 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050462-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n79A Details R5-214276 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050461-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A Details R5-214275 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050460-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A Details R5-214274 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050459-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_39A_n79A Details R5-214273 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050458-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A Details R5-214272 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050457-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A Details R5-214271 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504561F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A Details R5-215920 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050455-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A Details R5-214269 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050454-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A Details R5-214268 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050453-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A Details R5-214267 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050452-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_7A_n78A Details R5-214266 agreedRAN5#92-eEricsson, Orange Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050451-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_5A_n78A Details R5-214265 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050450-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_5A_n66A Details R5-214264 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050449-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_3A_n79A Details R5-214263 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050448-F17.1.0Rel-17Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n78A Details R5-214262 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050447-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_42A_n77A Details R5-214261 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050446-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_28A_n79A Details R5-214260 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050444-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_28A_n77A Details R5-214258 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050443-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_21A_n79A Details R5-214257 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050442-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_21A_n78A Details R5-214256 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050441-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_21A_n77A Details R5-214255 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504401F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_20A_n78A Details R5-215919 agreedRAN5#92-eEricsson, Huawe... Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050439-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_20A_n28A Details R5-214253 agreedRAN5#92-eEricsson, Orange Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050438-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_19A_n79A Details R5-214252 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050437-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_19A_n78A Details R5-214251 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050436-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_19A_n77A Details R5-214250 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050435-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_7A_n28A Details R5-214249 agreedRAN5#92-eEricsson, Orange Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050434-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_3A_n77A Details R5-214248 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050433-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_3A_n28A Details R5-214247 agreedRAN5#92-eEricsson, Orange Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050432-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n79A Details R5-214246 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.9050431-F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n77A Details R5-214245 agreedRAN5#92-eEricsson Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest
See details 38.90504301F17.1.0Rel-17Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n28A Details R5-216014 agreedRAN5#92-eEricsson, Orange Details RP-211694 approvedRAN#93-eTSG WG RAN517.2.05GS_NR_LTE-UEConTest