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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9030305-F16.10.1Rel-16Correction of clause 3 Details R5-221304 agreedRAN5#94-eEricsson Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.90303041F16.10.1Rel-16Test Tolerance analysis for inter-frequency RRC re-establishment test case Details R5-221644 agreedRAN5#94-eEricsson Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.9030303-F16.10.1Rel-16Test Tolerance analysis for inter-frequency RRC re-establishment test case Details R5-221287 agreedRAN5#94-eEricsson Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.9030302-F16.10.1Rel-16Test Tolerance analysis for E-UTRA - NR FR1 Cell reselection tests for HST Details R5-221286 agreedRAN5#94-eEricsson Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.90303011F16.10.1Rel-1638.903 Beam correspondence Measurement Uncertainties Details R5-221629 agreedRAN5#94-eKeysight techno... Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.90303001F16.10.1Rel-16Update of predicted SNR upper bound for noise free SDR scenarios Details R5-221747 agreedRAN5#94-eQualcomm CDMA T... Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.9030299-F16.10.1Rel-16Addition of test tolerance analysis for 6.6.8.3 NR SA CSI-RS based L1-SINR measurement Details R5-220998 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN516.11.0NR_eMIMO-UEConTest
See details 38.9030298-F16.10.1Rel-16Addition of test tolerance analysis for 6.6.8.2 NR SA SSB based L1-SINR measurement Details R5-220997 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN516.11.0NR_eMIMO-UEConTest
See details 38.9030297-F16.10.1Rel-16Addition of test tolerance analysis for 4.6.7.3 EN-DC CSI-RS based L1-SINR measurement Details R5-220996 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN516.11.0NR_eMIMO-UEConTest
See details 38.9030296-F16.10.1Rel-16Addition of test tolerance analysis for 4.6.7.2 EN-DC SSB based L1-SINR measurement Details R5-220995 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN516.11.0NR_eMIMO-UEConTest
See details 38.9030295-F16.10.1Rel-16Addition of test tolerance analysis for 4.6.7.1 and 6.6.8.1 EN-DC and NR SA CSI-RS based L1-SINR measurement Details R5-220994 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN516.11.0NR_eMIMO-UEConTest
See details 38.90302941F16.10.1Rel-16Add Test Tolerance analyses for NR SA FR1 cell re-selection for UE configured with highSpeedMeasFlag-r16 Test cases Details R5-221656 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.90302931F16.10.1Rel-16Addition of TT analysis for FR2 BFR test cases Details R5-221840 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN516.11.0NR_eMIMO-UEConTest
See details 38.90302921F16.10.1Rel-16Addition of summary table for MU factors Details R5-221746 agreedRAN5#94-eHuawei, HiSilicon Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.90302911F16.10.1Rel-16TT analysis for Mob_enh RRM TCs 7.3.3.1 Details R5-221814 agreedRAN5#94-eHuawei,Hisilicon Details RP-220091 approvedRAN#95-eTSG WG RAN516.11.0NR_Mob_enh-UEConTest
See details 38.90302901F16.10.1Rel-16TT analysis for Mob_enh RRM TCs 7.3.1.4 and 7.3.1.5 Details R5-221649 agreedRAN5#94-eHuawei,Hisilicon Details RP-220091 approvedRAN#95-eTSG WG RAN516.11.0NR_Mob_enh-UEConTest
See details 38.9030289-F16.10.1Rel-16TT analysis for FR2 SSB intra-freq measurement with DRX TCs Details R5-220718 agreedRAN5#94-eHuawei,Hisilicon Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.90302881F16.10.1Rel-16TT analysis for FR2 SSB intra-freq measurement without DRX TCs Details R5-221745 agreedRAN5#94-eHuawei,Hisilicon Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.90302871F16.10.1Rel-16TT analysis for FR2 SSB based BFD TCs Details R5-221744 agreedRAN5#94-eHuawei,Hisilicon Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.90302861F16.10.1Rel-16FR2 EVM MU definition in 38.903 Details R5-221743 agreedRAN5#94-eKeysight Techno... Details RP-220076 approvedRAN#95-eTSG WG RAN516.11.05GS_NR_LTE-UEConTest
See details 38.9030285-F16.10.1Rel-16Test Tolerance analysis for FR1 CLI-RSSI measurement with non-DRX Details R5-220281 agreedRAN5#94-eQualcomm Tech. ... Details RP-220099 approvedRAN#95-eTSG WG RAN516.11.0NR_CLI-UEConTest
See details 38.90302841F16.10.1Rel-16TT analysis for Mob_enh RRM TC 6.3.1.11+6.3.1.12 Details R5-221648 agreedRAN5#94-eChina Telecommu... Details RP-220091 approvedRAN#95-eTSG WG RAN516.11.0NR_Mob_enh-UEConTest
See details 38.90302811F16.10.1Rel-16TT analysis for Mob_enh RRM TC 6.3.1.9+6.3.1.10 Details R5-221647 agreedRAN5#94-eChina Telecommu... Details RP-220091 approvedRAN#95-eTSG WG RAN516.11.0NR_Mob_enh-UEConTest