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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9050587-F17.3.0Rel-17Update of spurious emission TP analysis for DC_40A_n41A Details R5-221636 agreedRAN5#94-eAnritsu Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050586-F17.3.0Rel-17Update of spurious emission TP analysis for DC_39A_n41A Details R5-221635 agreedRAN5#94-eAnritsu Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050585-F17.3.0Rel-17Update of spurious emission TP analysis for DC_25A_n41A Details R5-221633 agreedRAN5#94-eAnritsu Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050584-F17.3.0Rel-17Update of spurious emission TP analysis for DC_8A_n41A Details R5-221632 agreedRAN5#94-eAnritsu Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050583-F17.3.0Rel-17Update of spurious emission TP analysis for DC_3A_n41A Details R5-221631 agreedRAN5#94-eAnritsu Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050582-F17.3.0Rel-17Update of spurious emission TP analysis for DC_26A_n41A Details R5-221634 agreedRAN5#94-eAnritsu Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.9050581-F17.3.0Rel-17Correction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n3A Details R5-221603 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050580-F17.3.0Rel-17Correction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A Details R5-221602 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505791F17.3.0Rel-17Modification of test point analysis clause for FR1 NR CA Details R5-221753 agreedRAN5#94-eEricsson, WE Ce... Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.90505781F17.3.0Rel-17Addition of reference sensitivity checklist for CA reference sensitivity test point analysis Details R5-221752 agreedRAN5#94-eEricsson Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.9050577-F17.3.0Rel-17TP analysis for ref sensitivity for DC_2A_n66A Details R5-221327 agreedRAN5#94-eQualcomm Korea Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505761F17.3.0Rel-17Test Point analysis for FR2 Tx spur emission UL MIMO tests Details R5-221751 agreedRAN5#94-eQualcomm Finlan... Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.9050575-F17.3.0Rel-17TP analysis for ref sensitivity for 4 Rel-17 ENDC combos Details R5-221320 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505741F17.3.0Rel-17Update_TP_analysis for EVM Details R5-221750 agreedRAN5#94-eQualcomm Korea,... Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.9050573-F17.3.0Rel-17TP analysis for ref sensitivity for DC_2A_n78A Details R5-221313 agreedRAN5#94-eQualcomm Korea Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.90505711F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_28A_n7A Details R5-221783 agreedRAN5#94-eEricsson, Qualcomm Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505701F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n5A Details R5-221782 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505691F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n5A Details R5-221781 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505681F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n7A Details R5-221780 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505671F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n5A Details R5-221779 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050566-F17.3.0Rel-17Updating TP analysis for FR1 SEM for intra-band CA test case Details R5-221129 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.9050565-F17.3.0Rel-17Updating TP analysis for FR1 ACLR for intra-band CA test case Details R5-221127 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.9050564-F17.3.0Rel-17Updating TP analysis for FR1 Absolute power tolerance CA test case Details R5-221125 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.9050563-F17.3.0Rel-17Updating TP analysis for FR1 MPR for intra-band CA test case Details R5-221123 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.9050562-F17.3.0Rel-17Updating TP analysis for FR1 AMPR for CA_n41A-n79A testing Details R5-221115 agreedRAN5#94-eHuawei, Hisilicon Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050561-F17.3.0Rel-17Update of test point analysis for Adjacent Channel Selectivity for EN-DC within FR1 Details R5-220982 agreedRAN5#94-eHuawei, Hisilicon Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.90505591F17.3.0Rel-17TP analysis for 6.2D.2 for ULFPTx Details R5-221841 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN517.4.0NR_eMIMO-UEConTest
See details 38.9050558-F17.3.0Rel-17TP analysis for 6.2D.1 for ULFPTx Details R5-220794 agreedRAN5#94-eHuawei, HiSilicon Details RP-220094 approvedRAN#95-eTSG WG RAN517.4.0NR_eMIMO-UEConTest
See details 38.90505571F17.3.0Rel-17TP analysis for 6.2E.2.2 MPR for concurrent opration Details R5-221829 agreedRAN5#94-eHuawei, HiSilicon Details RP-220093 approvedRAN#95-eTSG WG RAN517.4.05G_V2X_NRSL_eV2...
See details 38.90505561F17.3.0Rel-17Addition of Test Point analysis for FR1 Spurious emission for UE co-existence for DC_21_n1 Details R5-221749 agreedRAN5#94-eNTT DOCOMO INC. Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.90505551F17.3.0Rel-17Addition of Test Point analysis for FR1 Spurious emission for UE co-existence for DC_19_n1 Details R5-221748 agreedRAN5#94-eNTT DOCOMO INC. Details RP-220076 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.9050553-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_28A_n7A-n78A Details R5-220389 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050552-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_7A_n5A-n78A Details R5-220388 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505511F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_7A_n78A Details R5-221778 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050550-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_7A_n28A Details R5-220385 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050549-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_7A-n5A Details R5-220383 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050548-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_3A_n5A Details R5-220381 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050547-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_1A_n5A Details R5-220379 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050546-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_28A_n7A Details R5-220378 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050545-F17.3.0Rel-17Introduction of reference sensitivity test point analysis for DC_1A-n7A Details R5-220377 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050544-F17.3.0Rel-17Update TP analysis for Rel-17 DC_66A_n77A Details R5-220366 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050543-F17.3.0Rel-17Update TP analysis for Rel-17 DC_13A_n77A Details R5-220365 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050542-F17.3.0Rel-17Update TP analysis for Rel-17 DC_5A_n77A Details R5-220364 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050541-F17.3.0Rel-17Update TP analysis for Rel-17 DC_2A_n77A Details R5-220363 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.9050537-F17.3.0Rel-17Adding Reference sensitivity Test point analysis for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-220321 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505361F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n79A Details R5-221777 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505351F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_28A_n5A Details R5-221776 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505341F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n7A Details R5-221775 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.90505331F17.3.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n20A Details R5-221774 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...