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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.5090058-F16.3.0Rel-16Addition of EHC function to the test loop mode A Details R5-221401 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220090 approvedRAN#95-eTSG WG RAN516.4.0NR_IioT-UEConTest
See details 38.50900551F16.3.0Rel-16Correction to test protocol messages for SL test Details R5-221517 agreedRAN5#94-eHuawei, Hisilicon Details RP-220093 approvedRAN#95-eTSG WG RAN516.4.05G_V2X_NRSL_eV2...
See details 38.50900541F16.3.0Rel-16Correction to test loop procedures for SL test Details R5-221516 agreedRAN5#94-eHuawei, Hisilicon Details RP-220093 approvedRAN#95-eTSG WG RAN516.4.05G_V2X_NRSL_eV2...
See details 38.50900531A16.3.0Rel-16Addition of test loop mode for NE-DC Details R5-221430 agreedRAN5#94-eROHDE & SCHWARZ Details RP-220076 approvedRAN#95-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest
See details 38.50900511F16.3.0Rel-16Editorial update of section 6.6.2 and 6.7 Details R5-221410 agreedRAN5#94-eMediaTek Inc. Details RP-220076 approvedRAN#95-eTSG WG RAN516.4.05GS_NR_LTE-UEConTest