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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-314491F17.5.0Rel-17P-MaxUE-FR1-r15 correction for PC2 ENDC test cases Details R5-225806 agreedRAN5#96-eKeysight techno... Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314481F17.5.0Rel-17Introduction of test tase for UL MIMO EN-DC A-MPR in FR2 Details R5-225805 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314471F17.5.0Rel-17Introduction of test tase for UL MIMO EN-DC MPR in FR2 Details R5-225804 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314461F17.5.0Rel-17Introduction of test section for UL MIMO EN-DC A-MPR with FR1 and FR2 Details R5-225803 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314451F17.5.0Rel-17Introduction of test section for UL MIMO EN-DC MPR with FR1 and FR2 Details R5-225802 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314411F17.5.0Rel-17Correction of reference sensitivity test case Details R5-225808 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314401F17.5.0Rel-17Addition of new test case additional spurious for FR2 Details R5-225881 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314391F17.5.0Rel-17Removal of brackets for DCI format for Tx test cases Details R5-225801 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31438-F17.5.0Rel-17Add EN-DC Enhanced Beam Correspondence Test Case Details R5-225031 agreedRAN5#96-eApple Portugal Details RP-221963 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR2_req_e...
See details 38.521-31437-F17.5.0Rel-17Update to test case 6.5B.3.3.2 Details R5-225006 agreedRAN5#96-eBureau Veritas Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31436-F17.5.0Rel-17Editorial correction to reference table ID to TC6.2B.1.3 Details R5-225005 agreedRAN5#96-eBureau Veritas Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31435-F17.5.0Rel-17Update to R17 Configuration for DC Details R5-225001 agreedRAN5#96-eBureau Veritas Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31434-F17.5.0Rel-17Update to R16 Configuration for DC Details R5-225000 agreedRAN5#96-eBureau Veritas,... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31431-F17.5.0Rel-17Update of Rel-16 EN-DC configuration DC_66A_n41A in spurious emission test cases Details R5-224954 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31430-F17.5.0Rel-17Update of Rel-16 EN-DC configuration DC_48A_n66A in spurious emission test cases Details R5-224952 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31429-F17.5.0Rel-17Update of Rel-16 EN-DC configuration DC_48A_n5A in spurious emission test cases Details R5-224950 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31428-F17.5.0Rel-17Update of DC_8A_n41A, DC_3A_n41A, DC_25A_n41A, DC_26A_n41A, DC_39A_n41A and DC_40A_n41A in spurious emission test cases Details R5-224946 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31427-F17.5.0Rel-17Update of Rel-16 EN-DC configuration DC_2A_n41A in spurious emission test cases Details R5-224943 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31426-F17.5.0Rel-17Corrections on general spurious emission test requirements for DC_2A_n5A Details R5-224942 agreedRAN5#96-eZTE Corporation Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31425-F17.5.0Rel-17Introduction of DC_2A-66A_n41A reference sensitivity test requirements Details R5-224939 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-314241F17.5.0Rel-17Corrections on test configuration table in spurious emission band UE co-existence for Rel-16 inter-band EN-DC configuration Details R5-225708 agreedRAN5#96-eZTE Corporation Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31423-F17.5.0Rel-17Corrections on test configuration table in spurious emission band UE co-existence for Rel-15 inter-band EN-DC configuration Details R5-224936 agreedRAN5#96-eZTE Corporation Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314221F17.5.0Rel-17Update for reference sensitivity for DC_5A_n77A Details R5-225736 agreedRAN5#96-eQualcomm Austri... Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-314211F17.5.0Rel-17Update for reference sensitivity for DC_48A_n66A Details R5-225709 agreedRAN5#96-eQualcomm Austri... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-314201F17.5.0Rel-17Update for ref sensitivity for R15_combos Details R5-225807 agreedRAN5#96-eQualcomm Austri... Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314191F17.5.0Rel-17Update 6.5B.3.3.2 for DC_5A_n2A Details R5-225707 agreedRAN5#96-eQualcomm Austri... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31418-F17.5.0Rel-17Editorial correction for 6.2B.1.3 Maximum output power for Inter-band EN-DC within FR1 Details R5-224809 agreedRAN5#96-eTTA Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31417-F17.5.0Rel-17Correction of reference to test configuration table for intra band contiguous EN-DC test case Details R5-224653 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31415-F17.5.0Rel-17Correction to E-UTRA output power in intra-band contiguous EN-DC Rx test cases Details R5-224629 agreedRAN5#96-eAnritsu Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31414-F17.5.0Rel-17Correction to test frequency definition for DC combination including n28 Details R5-224626 agreedRAN5#96-eAnritsu Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31413-F17.5.0Rel-17Addition of test requirement for E-UTRA cell of PC2 UE in 6.2B.4.1 Details R5-224622 agreedRAN5#96-eAnritsu Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31412-F17.5.0Rel-17Addition of new CADC MOP TC Details R5-224437 agreedRAN5#96-eIntertek Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-314111F17.5.0Rel-17Replacing the word LTE by E-UTRA in description of exception requirement Details R5-225800 agreedRAN5#96-eSporton, Ericsson Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314101F17.5.0Rel-17Update of FR2 5CC to 8CCs Transmission Test Cases Details R5-225678 agreedRAN5#96-eSporton Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-314091F17.5.0Rel-17PC1 MU - General Editor notes update in 38.521-3 FR2 Rx tests Details R5-225668 agreedRAN5#96-eKeysight Techno... Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31408-F17.5.0Rel-17FR2 NSA EVM test case editor notes update Details R5-224308 agreedRAN5#96-eKeysight Techno... Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-314061F17.5.0Rel-17Correction of Power Class 2 test requirements in 6.2B.1.3.5 for Interband EN-DC FDD and TDD Duplex-mode Details R5-225799 agreedRAN5#96-eCAICT Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-31405-F17.5.0Rel-17Introduction of Allowed reference sensitivity relaxation for DC_3A-7A-20A_n8A Details R5-224161 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31404-F17.5.0Rel-17Introduction of DC_3A-7A-20A_n8A reference sensitivity 3-band fallback test requirements Details R5-224160 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31403-F17.5.0Rel-17Introduction of DC_3A-7A-20A_n8A reference sensitivity 2-band fallback test requirements Details R5-224159 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31402-F17.5.0Rel-17Introduction of Spurious emissions band UE co-existence Rel-16 Test requirements for DC_3A_n8A Details R5-224156 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-314011F17.5.0Rel-17Introduction of Spurious emissions band UE co-existence Test description for DC_3A_n8A Details R5-225706 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31400-F17.5.0Rel-17Introduction of Spurious emissions band UE co-existence limits Rel-16 for DC_3A_n8A Details R5-224154 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31399-F17.5.0Rel-17Introduction of General Spurious emissions requirements for DC_3A_n8A Details R5-224153 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-31398-F17.5.0Rel-17Introduction of Allowed maximum configured output power relaxation for DC_3_n8 Details R5-224152 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-313971F17.5.0Rel-17Introduction of Output power requirements for DC_3A_n8A Details R5-225705 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221951 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.521-313961F17.5.0Rel-17Rel-15 Beam correspondence test tolerance definition Details R5-225669 agreedRAN5#96-eKeysight techno... Details RP-222001 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.521-313951F17.5.0Rel-17Measurement uncertainties and test tolerances for test case 6.2B.4.1.4_1 Configured Output Power with Power Boost for Inter-Band EN-DC including FR2 (1 NR CC) Details R5-225662 agreedRAN5#96-eKeysight techno... Details RP-221963 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR2_req_e...
See details 38.521-313941F17.5.0Rel-17New test case addition: 6.2B.4.1.4_1 Configured Output Power with Power Boost for Inter-Band EN-DC including FR2 (1 NR CC). Details R5-225661 agreedRAN5#96-eKeysight techno... Details RP-221963 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR2_req_e...