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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90506741F17.5.0Rel-17Updated TP analysis MPR for CA in FR2 Details R5-225832 agreedRAN5#96-eEricsson Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test
See details 38.9050673-F17.5.0Rel-17Editorial correction for DC_1A_n5A Details R5-225108 agreedRAN5#96-eROHDE & SCHWARZ Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050672-F17.5.0Rel-17Updating TP analysis for FR1 test case 6.3A.3.1_1 Details R5-225076 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.9050671-F17.5.0Rel-17Adding TP analysis for new FR1 test case 6.3C.3.2 Details R5-225074 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.9050670-F17.5.0Rel-17Updating test point selection criteria for FR1 SUL test cases Details R5-225065 agreedRAN5#96-eHuawei, Hisilicon Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050669-F17.5.0Rel-17Incorrect TP analysis revision for test case 6.2D.2 Details R5-224965 agreedRAN5#96-eEricsson Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050668-F17.5.0Rel-17Editorial corrections to spurious emission test cases for DC_8A_n3A, DC_8A_n20A and DC_20A_n3A Details R5-224959 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050667-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_66A_n41A Details R5-224955 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050666-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n66A Details R5-224953 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050665-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n5A Details R5-224951 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050664-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Details R5-224949 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050663-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_13A_n2A Details R5-224948 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050662-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A Details R5-224947 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050661-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Details R5-224945 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050660-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_2A_n41A Details R5-224944 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050659-F17.5.0Rel-17Introduction of reference sensitivity test point analysis for DC_2A-66A_n41A Details R5-224940 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050658-F17.5.0Rel-17Editorial corrections to the timeline for introduction of test points Details R5-224938 agreedRAN5#96-eZTE Corporation Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050657-F17.5.0Rel-17General rule for TP selection for NR_U test cases Details R5-224901 agreedRAN5#96-eQualcomm Austri... Details RP-221966 approvedRAN#97-eTSG WG RAN517.6.0NR_unlic-UEConTest
See details 38.90506561F17.5.0Rel-17Ref sensitivity TP selection for DC_21A_n79A Details R5-225831 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.90506551F17.5.0Rel-17Ref sensitivity TP selection for DC_8A_n79A Details R5-225830 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.90506541F17.5.0Rel-17Ref sensitivity TP selection for DC_5A_n78A Details R5-225829 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.90506531F17.5.0Rel-17Ref sensitivity TP selection for DC_8A_n78A Details R5-225828 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.90506521F17.5.0Rel-17Ref sensitivity TP selection for DC_3A_n77A Details R5-225827 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.90506511F17.5.0Rel-17Ref sensitivity TP selection for DC_1A_n77A Details R5-225826 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.90506501F17.5.0Rel-17Update Spurious emission TP R16 DC_5A_n2A Details R5-225716 agreedRAN5#96-eQualcomm Austri... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050649-F17.5.0Rel-17TP analysis for additional spurious emission for NS_14 Details R5-224886 agreedRAN5#96-eQualcomm Austri... Details RP-221952 approvedRAN#97-eTSG WG RAN517.6.0NR_bands_BW_R16...
See details 38.90506481F17.5.0Rel-17Ref sensitivity TP selection for DC_2A_n41A Details R5-225825 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050647-F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n77 Details R5-224873 agreedRAN5#96-eLigado Networks Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050646-F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n48 Details R5-224872 agreedRAN5#96-eLigado Networks Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506451F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n41 Details R5-225739 agreedRAN5#96-eLigado Networks Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506441F17.5.0Rel-17Test point analysis for reference sensitivity for many 4CA combos Details R5-225738 agreedRAN5#96-eWE Certificatio... Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506431F17.5.0Rel-17Tx Spurious emissions test point analysis for many UL CA combos Details R5-225737 agreedRAN5#96-eWE Certificatio... Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506421F17.5.0Rel-17Update to MPR for CA TP analysis to add PC2 requirements Details R5-225779 agreedRAN5#96-eHuawei, HiSilicon Details RP-221979 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1_enh-U...
See details 38.90506411F17.5.0Rel-17Update TP analysis for AMPR NS_05 and NS_05U Details R5-225746 agreedRAN5#96-eMediaTek Beijin... Details RP-221978 approvedRAN#97-eTSG WG RAN517.6.0NR_PC2_UE_FDD-U...
See details 38.9050640-F17.5.0Rel-17Addition of test point analysis for TxD test cases Details R5-224792 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.90506381F17.5.0Rel-17TP analysis for ref sensitivity for Rel-16 NR CA combos Details R5-225715 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506371F17.5.0Rel-17Update TP analysis for Rel-16 CA_n66A_n77A Details R5-225714 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506361F17.5.0Rel-17Update TP analysis for Rel-16 CA_n5A_n77A Details R5-225713 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506351F17.5.0Rel-17Update TP analysis for Rel-16 CA_n2A_n77A Details R5-225712 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050634-F17.5.0Rel-17Correction of test points analysis of some Rx test cases in 38.521-1 for the addition of test points for asymmetric channel bandwidths and UL-MIMO Details R5-224254 agreedRAN5#96-eCAICT Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050633-F17.5.0Rel-17Adding test point analysis for A_MPR NS_27 with 30 MHz channel bandwidth Details R5-224207 agreedRAN5#96-eEricsson Details RP-221969 approvedRAN#97-eTSG WG RAN517.6.0NR_lic_bands_BW...
See details 38.90506321F17.5.0Rel-17Introduction of spurious emission TP analysis for CA_n48A-n70A Details R5-225749 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221967 approvedRAN#97-eTSG WG RAN517.6.0LTE_NR_DC_CA_en...
See details 38.9050631-F17.5.0Rel-17Introduction of reference sensitivity test point analysis for DC_3A-7A-20A_n8A Details R5-224158 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506301F17.5.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n8A Details R5-225711 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506291F17.5.0Rel-17Test point analysis for test 6.2.4_1 Configured transmitted power with Power Boost Details R5-225745 agreedRAN5#96-eKeysight techno... Details RP-221963 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR2_req_e...