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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-405801F16.12.0Rel-16Corrections for TDD Power Saving test cases Details R5-225727 agreedRAN5#96-eKeysight Techno... Details RP-221958 approvedRAN#97-eTSG WG RAN516.13.0NR_UE_pow_sav-U...
See details 38.521-405791F16.12.0Rel-16Corrections for FDD Power Saving test cases Details R5-225726 agreedRAN5#96-eKeysight Techno... Details RP-221958 approvedRAN#97-eTSG WG RAN516.13.0NR_UE_pow_sav-U...
See details 38.521-40578-F16.12.0Rel-16Update CQI report periodicity for TDD FR1 periodic wideband CQI reporting under fading conditions Details R5-225208 agreedRAN5#96-eKeysight Techno... Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40577-F16.12.0Rel-16Update of minimum test time Details R5-225121 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-405761F16.12.0Rel-16Clarification of UL RMC in FR1 aperiodic CQI reporting tests Details R5-225812 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40575-F16.12.0Rel-16Correction of CQI reporting test cases Details R5-225118 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-405741F16.12.0Rel-16Correction of NR-LTE coexistence test cases Details R5-225811 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40573-F16.12.0Rel-16Correction of aperiodicTriggeringOffset Details R5-225110 agreedRAN5#96-eROHDE & SCHWARZ Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-405721F16.12.0Rel-16Removal of brackets for DCI format in clause 5 Details R5-225810 agreedRAN5#96-eEricsson Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40569-F16.12.0Rel-16Editorial correction to sub-clause ID for test requirement to TC5.2.3.2.1_x Details R5-225004 agreedRAN5#96-eBureau Veritas Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-405661F16.12.0Rel-16FR2 demod testability update Details R5-225670 agreedRAN5#96-eQualcomm Korea Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40565-F16.12.0Rel-16Update of FR2 PDCCH TCs Details R5-224657 agreedRAN5#96-eRohde & Schwarz Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-405641F16.12.0Rel-16Addition of missing RMC for PDCCH tests Details R5-225813 agreedRAN5#96-eRohde & Schwarz Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40563-F16.12.0Rel-16Addition of missing message exceptions for CQI tests Details R5-224655 agreedRAN5#96-eRohde & Schwarz Details RP-222001 approvedRAN#97-eTSG WG RAN516.13.0TEI15_Test, 5GS...
See details 38.521-40562-F16.12.0Rel-16Correction to message exception in 5.2.3.2.10_1 Details R5-224644 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-40561-F16.12.0Rel-16Correction to DCI bit size in 5.2.2.2.4_1 Details R5-224643 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-40560-F16.12.0Rel-16Correction to CQI-RI-PMI delay in 6.2A.3.1 Details R5-224642 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-40559-F16.12.0Rel-16Core alignment and editorial corrections for FR1 Demodulation CA test cases Details R5-224633 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-405581F16.12.0Rel-16Core alignment and editorial corrections for FR1 CSI CA test cases Details R5-225809 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-40557-F16.12.0Rel-16Correction to Annex F for NR SL Demod TCs Details R5-224503 agreedRAN5#96-eHuawei, HiSilicon Details RP-221955 approvedRAN#97-eTSG WG RAN516.13.05G_V2X_NRSL_eV2...
See details 38.521-40556-F16.12.0Rel-16Re-orginzation of NR SL Demod test cases Details R5-224502 agreedRAN5#96-eHuawei, HiSilicon Details RP-221955 approvedRAN#97-eTSG WG RAN516.13.05G_V2X_NRSL_eV2...