• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
1
Page size:
PageSizeComboBox
select
 11 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.521-32661-F16.13.0Rel-16Correction of MTSU and TT in Annex F for 6 and 7 DL CA test cases Details R5-225164 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32660-F16.13.0Rel-16Correction of Cell Configuration in Annex E for 6 and 7 DL CA test cases Details R5-225163 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32659-F16.13.0Rel-16Correction of 7 DL CA Activation and Deactivation of Unknown SCell Test Case 8.16.102 Details R5-225162 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32658-F16.13.0Rel-16Correction of 7 DL CA Activation and Deactivation of Known SCell Test Case 8.16.101 Details R5-225161 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32657-F16.13.0Rel-16Correction of 7 DL CA Event Triggered Reporting on Deactivated SCell Test Case 8.16.100 Details R5-225160 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32656-F16.13.0Rel-16Correction of 6 DL CA Activation and Deactivation of Unknown SCell Test Case 8.16.98 Details R5-225159 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32655-F16.13.0Rel-16Correction of 6 DL CA Activation and Deactivation of Known SCell Test Case 8.16.97 Details R5-225158 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32654-F16.13.0Rel-16Correction of 6 DL CA Event Triggered Reporting on Deactivated SCell test case 8.16.96 Details R5-225157 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32653-F16.13.0Rel-16Editorial Correction of 5 DL CA Event Triggered Reporting on Deactivated SCell test case 8.16.92 Details R5-225156 agreedRAN5#96-eEricsson Details RP-221949 approvedRAN#97-eTSG WG RAN516.14.0LTE_CA_R15-UEConTest
See details 36.521-32652-F16.13.0Rel-16Update to V2X test case 12.1.2 Details R5-224840 agreedRAN5#96-eHuawei, HiSilicon Details RP-221996 approvedRAN#97-eTSG WG RAN516.14.0TEI14_Test, LTE...
See details 36.521-326471F16.13.0Rel-16Correction of Default Configuration Parameters for Test 1 in Test Case 7.1.11 Details R5-225837 agreedRAN5#96-eSTMicroelectronics Details RP-221996 approvedRAN#97-eTSG WG RAN516.14.0TEI13_Test