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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.1333095-F16.14.0Rel-16CR to TS38.133:Revise the abbreviation of AoA, A-AoA and ZoA Details R4-2303211 agreedRAN4#106ZTE Corporation Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Core
See details 38.1333093-F16.14.0Rel-16CR to TS38.133: Revise the Measured quantity value(ZoA) Details R4-2303209 agreedRAN4#106ZTE Corporation Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Core
See details 38.1333080-F16.14.0Rel-16CR to TS 38.133: Corrections to NR positioning requirements (Rel 16) Details R4-2302721 agreedRAN4#106Rohde & Schwarz Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Perf
See details 38.1333077-F16.14.0Rel-16CR to TS 38.133: Corrections to NR RRM test cases (Rel 16) Details R4-2302718 agreedRAN4#106Rohde & Schwarz Details RP-230505 approvedRAN#99RAN416.15.0NR_newRAT-Perf
See details 38.13330671F16.14.0Rel-16CR on BFD and LR tests in NR-U standalone mode Details R4-2303788 agreedRAN4#106Qualcomm Incorp... Details RP-230507 approvedRAN#99RAN416.15.0NR_unlic-Perf
See details 38.13330661F16.14.0Rel-16CR on RLM OOS and IS tests with no DRX in NR-U standalone mode Details R4-2303152 agreedRAN4#106Qualcomm Incorp... Details RP-230507 approvedRAN#99RAN416.15.0NR_unlic-Perf
See details 38.1333049-F16.14.0Rel-16Correction to Inter-RAT Idle Mode CA/DC Measurement Tests in TS 38.133 Details R4-2302624 agreedRAN4#106Ericsson, Noka,... Details RP-230500 approvedRAN#99RAN416.15.0LTE_NR_DC_CA_en...
See details 38.13329821F16.14.0Rel-16CR on correction of eMIMO test cases R16 Details R4-2303230 agreedRAN4#106Huawei, HiSilicon Details RP-230513 approvedRAN#99RAN416.15.0NR_eMIMO-Perf
See details 38.13329761F16.14.0Rel-16Correction to CBW change TCs_R16 Details R4-2303155 agreedRAN4#106Huawei, HiSilico Details RP-230507 approvedRAN#99RAN416.15.0NR_RRM_enh-Perf
See details 38.1332953-F16.14.0Rel-16CR on positioning accuracy requirements R16 Details R4-2301940 agreedRAN4#106Huawei, HiSilicon Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Perf
See details 38.1332950-F16.14.0Rel-16CR on positioning test cases R16 Details R4-2301937 agreedRAN4#106Huawei, HiSilicon Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Perf
See details 38.1332944-F16.14.0Rel-16CR on measurement requirements with per-FR gap R16 Details R4-2301931 agreedRAN4#106Huawei, HiSilicon Details RP-230503 approvedRAN#99RAN416.15.0NR_newRAT-Core
See details 38.1332934-F16.14.0Rel-16PRS measurement period for Deferred MT-LR with event “Periodic Location” Details R4-2301843 agreedRAN4#106Nokia, Nokia Sh... Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Core
See details 38.13329091F16.14.0Rel-16CR on TC maintenance for NR-U R16 Details R4-2303196 agreedRAN4#106Huawei, HiSilicon Details RP-230507 approvedRAN#99RAN416.15.0NR_unlic-Perf
See details 38.1332876-F16.14.0Rel-16Correction on test cases for direct SCell activation delay Details R4-2300978 agreedRAN4#106Nokia, Nokia Sh... Details RP-230500 approvedRAN#99RAN416.15.0LTE_NR_DC_CA_en...
See details 38.1332864-F16.14.0Rel-16FR1 HST L1-RSRP test configuration correction Details R4-2300847 agreedRAN4#106Qualcomm Inc. Details RP-230514 approvedRAN#99RAN416.15.0NR_HST
See details 38.1332857-F16.14.0Rel-16Sidelinek R16 resource selection test configuration correction Details R4-2300840 agreedRAN4#106Qualcomm, Inc. Details RP-230499 approvedRAN#99RAN416.15.05G_V2X_NRSL
See details 38.13328481F16.14.0Rel-16CR on positioning test case in R16 Details R4-2303207 agreedRAN4#106CATT Details RP-230506 approvedRAN#99RAN416.15.0NR_pos-Perf
See details 38.1332829-A16.14.0Rel-16R16 Cat-A CR SA NR-LTE HO testcase correction Details R4-2300436 agreedRAN4#106Qualcomm Incorp... Details RP-230505 approvedRAN#99RAN416.15.0NR_newRAT-Perf
See details 38.1332810-A16.14.0Rel-16CR to ConfigNo of SSB Configuration and CSI-RS for tracking in redirection test Details R4-2300118 agreedRAN4#106Anritsu Corporation Details RP-230504 approvedRAN#99RAN416.15.0NR_newRAT-Perf
See details 38.13328061F16.14.0Rel-16CR to SNR of q0 level for BFD and LR in FR2 Details R4-2303205 agreedRAN4#106Anritsu Details RP-230506 approvedRAN#99RAN416.15.0NR_newRAT-Perf,...
See details 38.1332802-A16.14.0Rel-16CR to SNR on RLM-RS2 for FR2 CSI-RS based RLM OOS/IS tests Details R4-2300110 agreedRAN4#106Anritsu Corporation Details RP-230504 approvedRAN#99RAN416.15.0NR_newRAT-Perf
See details 38.1332798-A16.14.0Rel-16CR on TC for known PSCell addition in R16 Details R4-2300052 agreedRAN4#106MediaTek Inc. Details RP-230504 approvedRAN#99RAN416.15.0NR_newRAT-Perf
See details 38.1332794-A16.14.0Rel-16CR on TC for FR2 inter-frequency relative accuracy in R16 Details R4-2300048 agreedRAN4#106MediaTek Inc. Details RP-230504 approvedRAN#99RAN416.15.0NR_newRAT-Perf
See details 38.13326963F16.14.0Rel-16R16 Cat-F CR CLI measurement testcase correction Details R4-2303202 agreedRAN4#106Qualcomm Incorp... Details RP-230505 approvedRAN#99RAN416.15.0NR_newRAT-Perf 2G