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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9050783-F17.8.0Rel-17TP Analysis for FR2 RF test case involving EIRP with UL-Gaps Details R5-233256 agreedRAN5#99Apple Inc Details RP-230960 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR2_req_e...
See details 38.9050782-F17.8.0Rel-17Addition of Test Point Analysis for CA_NS_202 Details R5-233171 agreedRAN5#99ROHDE & SCHWARZ Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.90507811F17.8.0Rel-17Correction of test point analysis for CA_n66A-n71A Details R5-233530 agreedRAN5#99ROHDE & SCHWARZ Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050780-F17.8.0Rel-17Updating TP analysis for Transmit ON/OFF time mask for CA Details R5-233094 agreedRAN5#99Huawei, HiSilicon Details RP-230919 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR1-UEConTest
See details 38.90507791F17.8.0Rel-17Updating REFSENS exception test frequency selection for CA_n7A-n78A Details R5-233526 agreedRAN5#99Huawei, HiSilicon Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050778-F17.8.0Rel-17Introduction of TP analysis for A-MPR - New NR band n13 Details R5-232976 agreedRAN5#99Nokia, Nokia Sh... Details RP-230983 approvedRAN#100TSG WG RAN517.9.0TEI17_Test, NR_...
See details 38.90507771F17.8.0Rel-17Clarification/improvement of clause B9. Details R5-233523 agreedRAN5#99Ericsson Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050776-F17.8.0Rel-17Addition of CA_n41A-n66A-n71A in sensitivity test case config table. Details R5-232878 agreedRAN5#99Ericsson Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050775-F17.8.0Rel-17Editorial in Table 4.1.3.1-2 Details R5-232876 agreedRAN5#99Ericsson Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.90507732F17.8.0Rel-17TP analysis for PC2 PC3 n39 A-MPR and A-SE Details R5-233528 agreedRAN5#99CMCC Details RP-230988 approvedRAN#100TSG WG RAN517.9.0NR_UE_PC2_n39-U...
See details 38.90507721F17.8.0Rel-17Correction to test point analysis for FR1 test cases Details R5-233522 agreedRAN5#99Huawei, HiSilicon Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050770-F17.8.0Rel-17Addition of reference sensitivity test point analysis for DC_21A_n28A Details R5-232718 agreedRAN5#99NTT DOCOMO INC. Details RP-230932 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050769-F17.8.0Rel-17Addition of reference sensitivity test point analysis for n28A-n77A Details R5-232709 agreedRAN5#99KDDI Corporation Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050768-F17.8.0Rel-17Addition of reference sensitivity test point analysis for n3A-n77A Details R5-232707 agreedRAN5#99KDDI Corporation Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.90507671F17.8.0Rel-17Spur_TpAnalysis for CA_n5A_n48A Details R5-233513 agreedRAN5#99Qualcomm India ... Details RP-230932 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050766-F17.8.0Rel-17Ref sensitivity TP selection for DC_7A_n66A DC_7A_n77A and DC_66A_n25A Details R5-232608 agreedRAN5#99Qualcomm India ... Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.90507651F17.8.0Rel-17Ref sensitivity TP selection for DC_38A_n78A DC_18A_n77A and DC_19A_n77A Details R5-233519 agreedRAN5#99Qualcomm India ... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.90507641F17.8.0Rel-17TP analysis for NR NTN configured transmission power tests Details R5-233514 agreedRAN5#99Google Details RP-230953 approvedRAN#100TSG WG RAN517.9.0NR_NTN_solution...
See details 38.9050763-F17.8.0Rel-17Addition of spurious emission TP analysis for CA_n1A-n3A Details R5-232424 agreedRAN5#99China Unicom Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.90507621F17.8.0Rel-17Correction to spurious emissions TP analysis for 21A_n28A Details R5-233512 agreedRAN5#99DOCOMO Communic... Details RP-230932 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.90507611F17.8.0Rel-17FR1 MPR - ACLR - SEM - TP analysis update for almost contiguous RB allocation Details R5-233521 agreedRAN5#99Keysight Techno... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.90507601F17.8.0Rel-17TP analysis update for FR2 2 UL CA Tx tests to support PHR method Details R5-233518 agreedRAN5#99Keysight Techno... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050759-F17.8.0Rel-17TP analysis updated for NTN maximum input level test case 7.4 Details R5-232347 agreedRAN5#99Keysight Techno... Details RP-230953 approvedRAN#100TSG WG RAN517.9.0NR_NTN_solution...
See details 38.90507581F17.8.0Rel-17Update inter-band NR CA reference sensitivity exception cases due to UL PC2 Details R5-233713 agreedRAN5#99Verizon Switzer... Details RP-230934 approvedRAN#100TSG WG RAN517.9.0NR_PC2_CA_R17_2...
See details 38.9050757-F17.8.0Rel-17Introduction of reference sensitivity test point analysis for CA_n28A-n78A Details R5-232116 agreedRAN5#99Nokia, Nokia Sh... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050756-F17.8.0Rel-17Introduction of spurious emission TP analysis for CA_n28A-n78A Details R5-232115 agreedRAN5#99Nokia, Nokia Sh... Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050755-F17.8.0Rel-17Introduction of MOP test point analysis for CA_n28A-n78A Details R5-232114 agreedRAN5#99Nokia, Nokia Sh... Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...