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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90508171F17.9.0Rel-17TP analysis for FR2 RF phase continuity test Details R5-235855 agreedRAN5#100Apple Benelux B.V. Details RP-231655 approvedRAN#101RAN517.10.0NR_cov_enh-UEConTest
See details 38.90508161F17.9.0Rel-17TP analysis for FR1 RF phase continuity test Details R5-235937 agreedRAN5#100Apple Benelux B.V. Details RP-231655 approvedRAN#101RAN517.10.0NR_cov_enh-UEConTest
See details 38.90508151F17.9.0Rel-17TP analysis for NTN TC 6.5.2.2 on Spectrum emission mask Details R5-235684 agreedRAN5#100Apple Benelux B.V. Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.90508141F17.9.0Rel-17TP analysis for NTN TC 6.5.2.4 on ACLR Details R5-235682 agreedRAN5#100Apple Benelux B.V. Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.90508131F17.9.0Rel-17TP analysis for NTN TC 6.3.3 on Tx on-off time mask Details R5-235680 agreedRAN5#100Apple Benelux B.V. Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.90508091F17.9.0Rel-17Updating REFSENS test point selection for CA_n39A-n41A Details R5-235622 agreedRAN5#100Huawei, HiSilicon Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050808-F17.9.0Rel-17Updating test frequency selection for REFSENS exception testing for CA Details R5-235041 agreedRAN5#100Huawei, HiSilicon Details RP-231695 approvedRAN#101RAN517.10.0TEI15_Test, 5GS...
See details 38.9050807-F17.9.0Rel-17Addition of spurious emission TP analysis for CA_n3A-n8A Details R5-235015 agreedRAN5#100CU Digital Tech... Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050805-F17.9.0Rel-17Addition of TP analysis of 6.3A.3.3 2Tx-2Tx UL switching for inter-band CA Details R5-234849 agreedRAN5#100Huawei, HiSilicon Details RP-231649 approvedRAN#101RAN517.10.0NR_RF_FR1_enh-U...
See details 38.9050804-F17.9.0Rel-17Addition of TP analysis of spurious emission co-existence for CA_n28-n79 Details R5-234846 agreedRAN5#100Huawei, HiSilicon Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050803-F17.9.0Rel-17Addition of TP analysis of SE-coex for intra-band non-contiguous CA Details R5-234839 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.90508021F17.9.0Rel-17Update TP analysis of Ref sense exception of NR CA PC2 configs Details R5-235626 agreedRAN5#100CMCC, Huawei, H... Details RP-231645 approvedRAN#101RAN517.10.0NR_PC2_CA_R17_2...
See details 38.9050801-F17.9.0Rel-17Introduction of TP analysis of CA_n28A-n41A-n79A Ref Sense exception Details R5-234730 agreedRAN5#100CMCC Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050800-F17.9.0Rel-17Introduction of TP analysis of CA_n3A_n41A Ref Sense exception Details R5-234728 agreedRAN5#100CMCC Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90507991F17.9.0Rel-17TP analysis update for NTN Details R5-235858 agreedRAN5#100Qualcomm France Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.9050798-F17.9.0Rel-17TP analysis for NR NTN AMPR tests Details R5-234630 agreedRAN5#100Google Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.9050795-F17.9.0Rel-17Update 38.521-1_TPanalysis_6.5.4_TxIm_v3 for NR-U Details R5-234590 agreedRAN5#100Qualcomm France Details RP-231641 approvedRAN#101RAN517.10.0NR_unlic-UEConTest
See details 38.90507941F17.9.0Rel-17Update 38.905 for NR-U Details R5-235632 agreedRAN5#100Qualcomm France... Details RP-231641 approvedRAN#101RAN517.10.0NR_unlic-UEConTest
See details 38.90507931F17.9.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n5A-n66A. Details R5-235620 agreedRAN5#100Ericsson Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050792-F17.9.0Rel-17Test point analysis for reference sensitivity for several NR CA combos Details R5-234450 agreedRAN5#100WE Certificatio... Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90507911F17.9.0Rel-17Addition of spurious emissions TP analysis for new NRCA comb within FR1 Details R5-235649 agreedRAN5#100KDDI Corporation Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050790-F17.9.0Rel-17Update reference sensitivity test cases for a few PC2 three band configurations Details R5-234204 agreedRAN5#100Verizon Spain, ... Details RP-231646 approvedRAN#101RAN517.10.0NR_UE_PC2_R17_C...
See details 38.9050789-F17.9.0Rel-17Update reference sensitivity test cases for additional three bands configurations Details R5-234200 agreedRAN5#100Verizon, Qualco... Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90507871F17.9.0Rel-17Update TP analysis for 7.4A Details R5-235857 agreedRAN5#100Qualcomm France Details RP-231654 approvedRAN#101RAN517.10.0NR_DL1024QAM_FR...
See details 38.90507861F17.9.0Rel-17Update TP analysis for 7.4 Details R5-235856 agreedRAN5#100Qualcomm France Details RP-231654 approvedRAN#101RAN517.10.0NR_DL1024QAM_FR...
See details 38.90507851F17.9.0Rel-17Introduction of reference sensitivity test point analysis for CA_n20A-n78A Details R5-235848 agreedRAN5#100Nokia, Nokia Sh... Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050784-F17.9.0Rel-17Introduction of spurious emission TP analysis for CA_n20A-n78A Details R5-233948 agreedRAN5#100Nokia, Nokia Sh... Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...