|
| 38.508-1 | 3358 | - | F | 18.4.0 | Rel-18 | Correction of ServingCellConfig |
R5-246580
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3306 | 1 | F | 18.3.0 | Rel-18 | Adding new connection diagrams for SUL operation with inter-band CA |
R5-246040
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3306 | - | F | 18.3.0 | Rel-18 | Adding new connection diagrams for SUL operation with inter-band CA |
R5-244876
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3289 | 1 | F | 18.3.0 | Rel-18 | Update of ServingCellConfig for DCI format 1_3 and 0_3 |
R5-245638
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3289 | - | F | 18.3.0 | Rel-18 | Update of ServingCellConfig for DCI format 1_3 and 0_3 |
R5-244698
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3288 | 1 | F | 18.3.0 | Rel-18 | Update of PUSCH-Config for DCI format 0_3 |
R5-245637
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3288 | - | F | 18.3.0 | Rel-18 | Update of PUSCH-Config for DCI format 0_3 |
R5-244697
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3287 | - | F | 18.3.0 | Rel-18 | Update of PDSCH-Config for DCI format 1_3 |
R5-244696
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3286 | 1 | F | 18.3.0 | Rel-18 | Update of Searchspace for DCI format 1_3 and 0_3 |
R5-245636
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3286 | - | F | 18.3.0 | Rel-18 | Update of Searchspace for DCI format 1_3 and 0_3 |
R5-244695
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3285 | - | F | 18.3.0 | Rel-18 | Addition of Physical layer parameters for DCI format 1_3 |
R5-244694
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3284 | - | F | 18.3.0 | Rel-18 | Addition of Physical layer parameters for DCI format 0_3 |
R5-244693
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-1 | 3279 | - | F | 18.3.0 | Rel-18 | Correction to default configurations for MCE test cases |
R5-244602
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0739 | 1 | F | 18.4.0 | Rel-18 | Updating PICS for R18 dynamic UL Tx switching |
R5-247710
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0739 | - | F | 18.4.0 | Rel-18 | Updating PICS for R18 dynamic UL Tx switching |
R5-247026
| revised | RAN5#105 | Huawei, Hisilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0688 | 1 | F | 18.3.0 | Rel-18 | Updating PICS for R18 dynamic UL Tx switching across up to 4 bands |
R5-245807
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0688 | - | F | 18.3.0 | Rel-18 | Updating PICS for R18 dynamic UL Tx switching across up to 4 bands |
R5-244880
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0678 | 1 | F | 18.3.0 | Rel-18 | Add new PICS for DCI format 1_3 and 0_3 |
R5-245639
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0678 | - | F | 18.3.0 | Rel-18 | Add new PICS for DCI format 1_3 and 0_3 |
R5-244699
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0674 | - | F | 18.3.0 | Rel-18 | Addition of PICS for MCE test cases |
R5-244603
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.508-2 | 0637 | - | F | 18.2.0 | Rel-18 | Addition of PICS for MCE RRM test cases |
R5-242865
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2932 | - | F | 18.3.0 | Rel-18 | Updating MU and TT for SUL uplink switching across three bands testing |
R5-244877
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2931 | - | F | 18.3.0 | Rel-18 | Adding new uplink switching time mask test case 6.3C.3.6_1 |
R5-244875
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2930 | - | F | 18.3.0 | Rel-18 | Updating Time mask for switching across three uplink bands test case |
R5-244874
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2840 | 1 | F | 18.2.0 | Rel-18 | Updating MU and TT for Time mask for switching across up to four bands testing |
R5-243645
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2840 | - | F | 18.2.0 | Rel-18 | Updating MU and TT for Time mask for switching across up to four bands testing |
R5-243213
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2839 | 1 | F | 18.2.0 | Rel-18 | Adding new SUL test case Time mask for switching across four uplink bands |
R5-243644
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2839 | - | F | 18.2.0 | Rel-18 | Adding new SUL test case Time mask for switching across four uplink bands |
R5-243212
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2838 | 1 | F | 18.2.0 | Rel-18 | Adding new SUL test case Time mask for switching across three uplink bands |
R5-243620
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2838 | - | F | 18.2.0 | Rel-18 | Adding new SUL test case Time mask for switching across three uplink bands |
R5-243211
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2837 | 1 | F | 18.2.0 | Rel-18 | Adding new test case Time mask for switching across four uplink bands |
R5-243659
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2837 | - | F | 18.2.0 | Rel-18 | Adding new test case Time mask for switching across four uplink bands |
R5-243210
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2836 | 1 | F | 18.2.0 | Rel-18 | Adding new test case Time mask for switching across three uplink bands |
R5-243658
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2836 | - | F | 18.2.0 | Rel-18 | Adding new test case Time mask for switching across three uplink bands |
R5-243209
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.521-1 | 2835 | - | F | 18.2.0 | Rel-18 | Updating general clause for Uplink switching across up to four bands |
R5-243208
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0516 | 1 | F | 18.4.0 | Rel-18 | Correcting test applicablilty for FR1 switching time mask test cases |
R5-247818
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0516 | - | F | 18.4.0 | Rel-18 | Correcting test applicablilty for FR1 switching time mask test cases |
R5-247027
| revised | RAN5#105 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0464 | 1 | F | 18.3.0 | Rel-18 | Adding test applicability for new FR1 SUL test case 6.3C.3.6 and 6.3C.3.6_1 |
R5-245917
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0464 | - | F | 18.3.0 | Rel-18 | Adding test applicability for new FR1 SUL test case 6.3C.3.6 and 6.3C.3.6_1 |
R5-244879
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0459 | - | F | 18.3.0 | Rel-18 | Correction to applicabilities for MCE RRM test cases |
R5-244604
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0422 | 1 | F | 18.2.0 | Rel-18 | Addition of applicability for MCE RRM test cases |
R5-243914
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.522 | 0422 | - | F | 18.2.0 | Rel-18 | Addition of applicability for MCE RRM test cases |
R5-242866
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4721 | 1 | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 |
R5-247579
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4721 | - | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 |
R5-246586
| revised | RAN5#105 | Huawei, HiSilic... |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4720 | - | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.7.4 - Reference cell is not scheduling cell - DCI format 1_3 |
R5-246585
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4719 | - | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.7.3 - Reference cell is scheduling cell - DCI format 0_3 |
R5-246584
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4718 | - | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.7.2 - Reference cell is scheduling cell - DCI format 1_3 |
R5-246583
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4717 | - | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.2.9 - Scheduled cell indicator - DCI format 1_3 |
R5-246582
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4716 | - | F | 18.0.0 | Rel-18 | Correction of single DCI test case 7.1.1.2.8 - FDRA - DCI format 1_3 |
R5-246581
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4712 | 1 | F | 18.0.0 | Rel-18 | Addition to new single DCI test case 7.1.1.3.26 - FDRA - DCI format 0_3 |
R5-247578
| agreed | RAN5#105 | MediaTek Inc. |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4712 | - | F | 18.0.0 | Rel-18 | Addition to new single DCI test case 7.1.1.3.26 - FDRA - DCI format 0_3 |
R5-246560
| revised | RAN5#105 | MediaTek Inc. |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4573 | 1 | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 |
R5-245645
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4573 | - | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 |
R5-244705
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4572 | 1 | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.4 - Reference cell is not scheduling cell - DCI format 1_3 |
R5-245644
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4572 | - | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.4 - Reference cell is not scheduling cell - DCI format 1_3 |
R5-244704
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4571 | 1 | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.3 - Reference cell is scheduling cell - DCI format 0_3 |
R5-245643
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4571 | - | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.3 - Reference cell is scheduling cell - DCI format 0_3 |
R5-244703
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4570 | 1 | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.2 - Reference cell is scheduling cell - DCI format 1_3 |
R5-245642
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4570 | - | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.7.2 - Reference cell is scheduling cell - DCI format 1_3 |
R5-244702
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4569 | 1 | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.2.9 - Scheduled cell indicator - DCI format 1_3 |
R5-245641
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4569 | - | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.2.9 - Scheduled cell indicator - DCI format 1_3 |
R5-244701
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4568 | 1 | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.2.8 - FDRA - DCI format 1_3 |
R5-245640
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-1 | 4568 | - | F | 17.7.0 | Rel-18 | Add new single DCI test case 7.1.1.2.8 - FDRA - DCI format 1_3 |
R5-244700
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-2 | 0521 | - | F | 18.0.0 | Rel-18 | Addition to test applicability for new multi-cell scheduling with a single DCI test cases |
R5-246561
| agreed | RAN5#105 | MediaTek Inc. |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-2 | 0509 | 1 | F | 17.7.0 | Rel-18 | Add test applicability for new multi-cell scheduling with a single DCI test case |
R5-245646
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.0.0 | NR_MC_enh-UEConTest |
|
|
| 38.523-2 | 0509 | - | F | 17.7.0 | Rel-18 | Add test applicability for new multi-cell scheduling with a single DCI test case |
R5-245219
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-2 | 0497 | - | F | 17.7.0 | Rel-18 | Add test applicability for new multi-cell scheduling with a single DCI test case |
R5-244706
| withdrawn | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.523-3 | 3578 | - | F | 18.0.0 | Rel-18 | NR MC enhancements: Initial Test Model |
R5-246401
| agreed | RAN5#105 | MCC TF160 |
RP-242708
| | RAN#106 | RAN5 | | NR_MC_enh-UEConTest |
|
|
| 38.523-3 | 3507 | - | F | 17.11.0 | Rel-18 | Add new PIXIT for DCI format 1_3 and 0_3 |
R5-244707
| withdrawn | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3315 | - | F | 18.3.0 | Rel-18 | Correction to Annex H for Tx switch RRM test cases |
R5-244610
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3314 | 1 | F | 18.3.0 | Rel-18 | Correction to Annex F for MCE RRM test cases |
R5-245945
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3314 | - | F | 18.3.0 | Rel-18 | Correction to Annex F for MCE RRM test cases |
R5-244609
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3313 | - | F | 18.3.0 | Rel-18 | Correction to Annex A for MCE RRM test cases |
R5-244608
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3312 | - | F | 18.3.0 | Rel-18 | Correction to MCE RRM test case 6.5.7D.3 with TT |
R5-244607
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3311 | - | F | 18.3.0 | Rel-18 | Correction to MCE RRM test case 6.5.7D.2 with TT |
R5-244606
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3310 | - | F | 18.3.0 | Rel-18 | Correction to MCE RRM test case 6.5.7D.1 with TT |
R5-244605
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3132 | - | F | 18.2.1 | Rel-18 | Correction to Annex E for MCE RRM test cases |
R5-242870
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3131 | - | F | 18.2.1 | Rel-18 | Addition of MCE RRM test case 6.5.7D.3 |
R5-242869
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3130 | - | F | 18.2.1 | Rel-18 | Addition of MCE RRM test case 6.5.7D.2 |
R5-242868
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.533 | 3129 | - | F | 18.2.1 | Rel-18 | Addition of MCE RRM test case 6.5.7D.1 |
R5-242867
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.903 | 0785 | 1 | F | 18.3.0 | Rel-18 | TT analysis for MCE RRM test cases |
R5-246014
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242276
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.903 | 0785 | - | F | 18.3.0 | Rel-18 | TT analysis for MCE RRM test cases |
R5-244611
| revised | RAN5#104 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.905 | 0933 | - | F | 18.3.0 | Rel-18 | Updating TP analysis for new FR1 test case 6.3C.3.6_1 |
R5-244878
| agreed | RAN5#104 | Huawei, HiSilicon |
RP-242275
| approved | RAN#105 | RAN5 | 18.4.0 | NR_MC_enh-UEConTest |
|
|
| 38.905 | 0914 | 2 | F | 18.2.0 | Rel-18 | Adding TP analysis for new SUL test case 6.3C.3.6 |
R5-243796
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.905 | 0914 | 1 | F | 18.2.0 | Rel-18 | Adding TP analysis for new SUL test case 6.3C.3.6 |
R5-243619
| revised | RAN5#103 | Huawei, HiSilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.905 | 0914 | - | F | 18.2.0 | Rel-18 | Adding TP analysis for new SUL test case 6.3C.3.6 |
R5-243215
| revised | RAN5#103 | Huawei, Hisilicon |
| | | | | NR_MC_enh-UEConTest |
|
|
| 38.905 | 0913 | 1 | F | 18.2.0 | Rel-18 | Adding TP analysis for new FR1 test case 6.3A.3.6 and 6.3A.3.7 |
R5-243618
| agreed | RAN5#103 | Huawei, HiSilicon |
RP-240999
| approved | RAN#104 | RAN5 | 18.3.0 | NR_MC_enh-UEConTest |
|
|
| 38.905 | 0913 | - | F | 18.2.0 | Rel-18 | Adding TP analysis for new FR1 test case 6.3A.3.6 and 6.3A.3.7 |
R5-243214
| revised | RAN5#103 | Huawei, Hisilicon |
| | | | | NR_MC_enh-UEConTest |
|