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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.508-13358-F18.4.0Rel-18Correction of ServingCellConfig Details R5-246580 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.508-133061F18.3.0Rel-18Adding new connection diagrams for SUL operation with inter-band CA Details R5-246040 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-13306-F18.3.0Rel-18Adding new connection diagrams for SUL operation with inter-band CA Details R5-244876 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.508-132891F18.3.0Rel-18Update of ServingCellConfig for DCI format 1_3 and 0_3 Details R5-245638 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-13289-F18.3.0Rel-18Update of ServingCellConfig for DCI format 1_3 and 0_3 Details R5-244698 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.508-132881F18.3.0Rel-18Update of PUSCH-Config for DCI format 0_3 Details R5-245637 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-13288-F18.3.0Rel-18Update of PUSCH-Config for DCI format 0_3 Details R5-244697 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.508-13287-F18.3.0Rel-18Update of PDSCH-Config for DCI format 1_3 Details R5-244696 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-132861F18.3.0Rel-18Update of Searchspace for DCI format 1_3 and 0_3 Details R5-245636 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-13286-F18.3.0Rel-18Update of Searchspace for DCI format 1_3 and 0_3 Details R5-244695 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.508-13285-F18.3.0Rel-18Addition of Physical layer parameters for DCI format 1_3 Details R5-244694 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-13284-F18.3.0Rel-18Addition of Physical layer parameters for DCI format 0_3 Details R5-244693 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-13279-F18.3.0Rel-18Correction to default configurations for MCE test cases Details R5-244602 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-207391F18.4.0Rel-18Updating PICS for R18 dynamic UL Tx switching Details R5-247710 agreedRAN5#105Huawei, HiSilicon Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.508-20739-F18.4.0Rel-18Updating PICS for R18 dynamic UL Tx switching Details R5-247026 revisedRAN5#105Huawei, Hisilicon    NR_MC_enh-UEConTest
See details 38.508-206881F18.3.0Rel-18Updating PICS for R18 dynamic UL Tx switching across up to 4 bands Details R5-245807 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-20688-F18.3.0Rel-18Updating PICS for R18 dynamic UL Tx switching across up to 4 bands Details R5-244880 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.508-206781F18.3.0Rel-18Add new PICS for DCI format 1_3 and 0_3 Details R5-245639 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-20678-F18.3.0Rel-18Add new PICS for DCI format 1_3 and 0_3 Details R5-244699 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.508-20674-F18.3.0Rel-18Addition of PICS for MCE test cases Details R5-244603 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.508-20637-F18.2.0Rel-18Addition of PICS for MCE RRM test cases Details R5-242865 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.521-12932-F18.3.0Rel-18Updating MU and TT for SUL uplink switching across three bands testing Details R5-244877 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.521-12931-F18.3.0Rel-18Adding new uplink switching time mask test case 6.3C.3.6_1 Details R5-244875 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.521-12930-F18.3.0Rel-18Updating Time mask for switching across three uplink bands test case Details R5-244874 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.521-128401F18.2.0Rel-18Updating MU and TT for Time mask for switching across up to four bands testing Details R5-243645 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.521-12840-F18.2.0Rel-18Updating MU and TT for Time mask for switching across up to four bands testing Details R5-243213 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.521-128391F18.2.0Rel-18Adding new SUL test case Time mask for switching across four uplink bands Details R5-243644 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.521-12839-F18.2.0Rel-18Adding new SUL test case Time mask for switching across four uplink bands Details R5-243212 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.521-128381F18.2.0Rel-18Adding new SUL test case Time mask for switching across three uplink bands Details R5-243620 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.521-12838-F18.2.0Rel-18Adding new SUL test case Time mask for switching across three uplink bands Details R5-243211 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.521-128371F18.2.0Rel-18Adding new test case Time mask for switching across four uplink bands Details R5-243659 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.521-12837-F18.2.0Rel-18Adding new test case Time mask for switching across four uplink bands Details R5-243210 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.521-128361F18.2.0Rel-18Adding new test case Time mask for switching across three uplink bands Details R5-243658 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.521-12836-F18.2.0Rel-18Adding new test case Time mask for switching across three uplink bands Details R5-243209 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.521-12835-F18.2.0Rel-18Updating general clause for Uplink switching across up to four bands Details R5-243208 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.52205161F18.4.0Rel-18Correcting test applicablilty for FR1 switching time mask test cases Details R5-247818 agreedRAN5#105Huawei, HiSilicon Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.5220516-F18.4.0Rel-18Correcting test applicablilty for FR1 switching time mask test cases Details R5-247027 revisedRAN5#105Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.52204641F18.3.0Rel-18Adding test applicability for new FR1 SUL test case 6.3C.3.6 and 6.3C.3.6_1 Details R5-245917 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.5220464-F18.3.0Rel-18Adding test applicability for new FR1 SUL test case 6.3C.3.6 and 6.3C.3.6_1 Details R5-244879 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.5220459-F18.3.0Rel-18Correction to applicabilities for MCE RRM test cases Details R5-244604 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.52204221F18.2.0Rel-18Addition of applicability for MCE RRM test cases Details R5-243914 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.5220422-F18.2.0Rel-18Addition of applicability for MCE RRM test cases Details R5-242866 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-147211F18.0.0Rel-18Correction of single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 Details R5-247579 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-14721-F18.0.0Rel-18Correction of single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 Details R5-246586 revisedRAN5#105Huawei, HiSilic...    NR_MC_enh-UEConTest
See details 38.523-14720-F18.0.0Rel-18Correction of single DCI test case 7.1.1.7.4 - Reference cell is not scheduling cell - DCI format 1_3 Details R5-246585 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-14719-F18.0.0Rel-18Correction of single DCI test case 7.1.1.7.3 - Reference cell is scheduling cell - DCI format 0_3 Details R5-246584 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-14718-F18.0.0Rel-18Correction of single DCI test case 7.1.1.7.2 - Reference cell is scheduling cell - DCI format 1_3 Details R5-246583 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-14717-F18.0.0Rel-18Correction of single DCI test case 7.1.1.2.9 - Scheduled cell indicator - DCI format 1_3 Details R5-246582 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-14716-F18.0.0Rel-18Correction of single DCI test case 7.1.1.2.8 - FDRA - DCI format 1_3 Details R5-246581 agreedRAN5#105Huawei, HiSilic... Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-147121F18.0.0Rel-18Addition to new single DCI test case 7.1.1.3.26 - FDRA - DCI format 0_3 Details R5-247578 agreedRAN5#105MediaTek Inc. Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-14712-F18.0.0Rel-18Addition to new single DCI test case 7.1.1.3.26 - FDRA - DCI format 0_3 Details R5-246560 revisedRAN5#105MediaTek Inc.    NR_MC_enh-UEConTest
See details 38.523-145731F17.7.0Rel-18Add new single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 Details R5-245645 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-14573-F17.7.0Rel-18Add new single DCI test case 7.1.1.7.5 - Reference cell is not scheduling cell - DCI format 0_3 Details R5-244705 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-145721F17.7.0Rel-18Add new single DCI test case 7.1.1.7.4 - Reference cell is not scheduling cell - DCI format 1_3 Details R5-245644 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-14572-F17.7.0Rel-18Add new single DCI test case 7.1.1.7.4 - Reference cell is not scheduling cell - DCI format 1_3 Details R5-244704 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-145711F17.7.0Rel-18Add new single DCI test case 7.1.1.7.3 - Reference cell is scheduling cell - DCI format 0_3 Details R5-245643 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-14571-F17.7.0Rel-18Add new single DCI test case 7.1.1.7.3 - Reference cell is scheduling cell - DCI format 0_3 Details R5-244703 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-145701F17.7.0Rel-18Add new single DCI test case 7.1.1.7.2 - Reference cell is scheduling cell - DCI format 1_3 Details R5-245642 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-14570-F17.7.0Rel-18Add new single DCI test case 7.1.1.7.2 - Reference cell is scheduling cell - DCI format 1_3 Details R5-244702 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-145691F17.7.0Rel-18Add new single DCI test case 7.1.1.2.9 - Scheduled cell indicator - DCI format 1_3 Details R5-245641 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-14569-F17.7.0Rel-18Add new single DCI test case 7.1.1.2.9 - Scheduled cell indicator - DCI format 1_3 Details R5-244701 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-145681F17.7.0Rel-18Add new single DCI test case 7.1.1.2.8 - FDRA - DCI format 1_3 Details R5-245640 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-14568-F17.7.0Rel-18Add new single DCI test case 7.1.1.2.8 - FDRA - DCI format 1_3 Details R5-244700 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-20521-F18.0.0Rel-18Addition to test applicability for new multi-cell scheduling with a single DCI test cases Details R5-246561 agreedRAN5#105MediaTek Inc. Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-205091F17.7.0Rel-18Add test applicability for new multi-cell scheduling with a single DCI test case Details R5-245646 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.0.0NR_MC_enh-UEConTest
See details 38.523-20509-F17.7.0Rel-18Add test applicability for new multi-cell scheduling with a single DCI test case Details R5-245219 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-20497-F17.7.0Rel-18Add test applicability for new multi-cell scheduling with a single DCI test case Details R5-244706 withdrawnRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.523-33578-F18.0.0Rel-18NR MC enhancements: Initial Test Model Details R5-246401 agreedRAN5#105MCC TF160 Details RP-242708  RAN#106RAN5 NR_MC_enh-UEConTest
See details 38.523-33507-F17.11.0Rel-18Add new PIXIT for DCI format 1_3 and 0_3 Details R5-244707 withdrawnRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.5333315-F18.3.0Rel-18Correction to Annex H for Tx switch RRM test cases Details R5-244610 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.53333141F18.3.0Rel-18Correction to Annex F for MCE RRM test cases Details R5-245945 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.5333314-F18.3.0Rel-18Correction to Annex F for MCE RRM test cases Details R5-244609 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.5333313-F18.3.0Rel-18Correction to Annex A for MCE RRM test cases Details R5-244608 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.5333312-F18.3.0Rel-18Correction to MCE RRM test case 6.5.7D.3 with TT Details R5-244607 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.5333311-F18.3.0Rel-18Correction to MCE RRM test case 6.5.7D.2 with TT Details R5-244606 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.5333310-F18.3.0Rel-18Correction to MCE RRM test case 6.5.7D.1 with TT Details R5-244605 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.5333132-F18.2.1Rel-18Correction to Annex E for MCE RRM test cases Details R5-242870 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.5333131-F18.2.1Rel-18Addition of MCE RRM test case 6.5.7D.3 Details R5-242869 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.5333130-F18.2.1Rel-18Addition of MCE RRM test case 6.5.7D.2 Details R5-242868 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.5333129-F18.2.1Rel-18Addition of MCE RRM test case 6.5.7D.1 Details R5-242867 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.90307851F18.3.0Rel-18TT analysis for MCE RRM test cases Details R5-246014 agreedRAN5#104Huawei, HiSilicon Details RP-242276 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.9030785-F18.3.0Rel-18TT analysis for MCE RRM test cases Details R5-244611 revisedRAN5#104Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.9050933-F18.3.0Rel-18Updating TP analysis for new FR1 test case 6.3C.3.6_1 Details R5-244878 agreedRAN5#104Huawei, HiSilicon Details RP-242275 approvedRAN#105RAN518.4.0NR_MC_enh-UEConTest
See details 38.90509142F18.2.0Rel-18Adding TP analysis for new SUL test case 6.3C.3.6 Details R5-243796 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.90509141F18.2.0Rel-18Adding TP analysis for new SUL test case 6.3C.3.6 Details R5-243619 revisedRAN5#103Huawei, HiSilicon    NR_MC_enh-UEConTest
See details 38.9050914-F18.2.0Rel-18Adding TP analysis for new SUL test case 6.3C.3.6 Details R5-243215 revisedRAN5#103Huawei, Hisilicon    NR_MC_enh-UEConTest
See details 38.90509131F18.2.0Rel-18Adding TP analysis for new FR1 test case 6.3A.3.6 and 6.3A.3.7 Details R5-243618 agreedRAN5#103Huawei, HiSilicon Details RP-240999 approvedRAN#104RAN518.3.0NR_MC_enh-UEConTest
See details 38.9050913-F18.2.0Rel-18Adding TP analysis for new FR1 test case 6.3A.3.6 and 6.3A.3.7 Details R5-243214 revisedRAN5#103Huawei, Hisilicon    NR_MC_enh-UEConTest