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 2474 items in 13 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 34.1081003-F15.1.0Rel-15Updates to Test USIM parameters Details R5-196834 agreedRAN5#84ROHDE & SCHWARZ Details RP-191703 approvedRAN#85TSG WG RAN515.2.0TEI_Test
See details 34.1080938-F11.7.0Rel-11Correction to reference test frequencies for Band XII, XXV and XXVI Details R5-134905 agreedRAN5#61Rohde & Schwarz... Details RP-131857 approvedRAN#62R511.8.0TEI_Test 2G
See details 34.1080914-F11.3.0Rel-11Addition of a connection set up procedure for CS+PS multi RAB combination. Details R5-125480 agreedRAN5#577Layers Details RP-121705 approvedRAN#58R511.4.0TEI_Test 2G
See details 34.1080892-F11.1.0Rel-11Correction to QoS for requested bearer Details R5-121434 agreedRAN5#55Ericsson, ST-Er... Details RP-120635 approvedRAN#56R511.2.0TEI_Test 2G
See details 34.1080875-F9.6.0Rel-9Use of IPv4 in session setup procedure Details R5-115369 agreedRAN5#53MCC TF160 Details RP-111571 approvedRAN#54R59.7.0TEI_Test 2G
See details 34.1080853-F9.2.0Rel-9Corrections to default settings of Elementary Files (EFs) on Test USIM Details R5-106701 agreedRAN5#49Rohde & Schwarz Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.1080853-F9.2.0Rel-9Corrections to default Test USIM contents and extension of test algorithm for authentication in case of GERAN-only tests. Details R5-106701  RAN5#49Rohde & Schwarz Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.1080852-F9.2.0Rel-9Correction to DL DPCH transmit power for 64 KBPS CS + 64 KBPS PS call Details R5-106669 agreedRAN5#49Anite Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.1080852-F9.2.0Rel-9Correction to DL DPCH transmit power for 64 KBPS CS + 64 KBPS PS call Details R5-106669  RAN5#49Anite Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.1080851-F9.2.0Rel-9Update of the default RADIO BEARER SETUP message (FDD) for support of SRBs mapped on E-DCH/DCH Details R5-106499 agreedRAN5#49Qualcomm Incorp... Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.1080849-F9.2.0Rel-9Update for Band IX testing Details R5-106382 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.1080849-F9.2.0Rel-9Update for Band IX testing Details R5-106382  RAN5#49Nokia, MCC160 Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.1080843-F9.1.0Rel-9Clarification to the FDD inter-band network environment Details R5-105031 agreedRAN5#48Nokia Details RP-100808 approvedRAN#49R59.2.0TEI_Test
See details 34.1080840-F9.1.0Rel-9Correcting default USIM contents Details R5-104679 agreedRAN5#48Research In Motion Details RP-100808 approvedRAN#49R59.2.0TEI_Test
See details 34.1080830-F9.0.0Rel-9Addition band d and band e for LCR TDD in 34.108 Details R5-103812 agreed CATT Details RP-100505 approvedRAN#48R59.1.0TEI_Test
See details 34.1080804-F8.9.0Rel-8Addition of new combinations for LCR TDD RAB testing in 34.108 Details R5-100336 agreedRAN5#46CATT Details RP-100137 approvedRAN#47R58.10.0TEI_Test
See details 34.1080791-F8.8.0Rel-8Editorial correction in clause 8.1.2.1 Details R5-096049 agreedRAN5#45Motorola and MCC160 Details RP-091115 approvedRAN#46R58.9.0TEI_Test
See details 34.1080777-F8.7.0Rel-8Addition of section 6.1.4.1a: Default Cell parameters Two PLMN in UTRAN test scenario with cells on PLMN1 belonging to two different frequencies Details R5-095026 agreedRAN5#44Anite Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.1080764-F8.7.0Rel-8Update of 9.2 Default RF Messages Details R5-094744 agreedRAN5#44Anritsu Ltd Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.1080707-F8.4.0Rel-8Correction to System Information Block type 11 Details R5-085039 agreedRAN5#41NTT DOCOMO Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.1080695-F8.3.0Rel-8Correction to Contents of default RADIO BEARER SET-UP messages Details R5-083336 agreedRAN5#40Anritsu Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.1080677-F8.2.0Rel-8Clarification of TDD test channels used for signaling test cases Details R5-081354 agreedRAN5#39CETECOM GmbH Details RP-080363 approvedRAN#40R58.3.0TEI_Test
See details 34.1080639-F8.0.0Rel-8Editorial moving the word Default1 or Default2 in the correct column Details R5-073425 agreedRAN5#37TF160 Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.1080638-F8.0.0Rel-8Correction to SIB1 Details R5-073418 agreedRAN5#37RIM Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.1080637-F8.0.0Rel-8Addition of general SS requirements for UL and DL RF signal levels Details R5-073269 agreedRAN5#37Nokia Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.1080625-F8.0.0Rel-8Addition of test frequencies for low and high ranges for serving cell Details R5-073311 agreedRAN5#37Anritsu Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.1080623-F8.0.0Rel-8Correction to DL RLC PDU size in 9.1 for RB setup and RRC connection setup Details R5-073204 agreedRAN5#37Anritsu Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.1080621-F8.0.0Rel-8Addition of exceptional messages for RF test procedure Details R5-073202 agreedRAN5#37Anritsu Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.1080590-F7.0.0Rel-7Correction to the list of RAB combinations on DPCH and HS-PDSCH Details R5-071448 agreedRAN5#35Nokia Details RP-070344 approvedRAN#36R57.1.0TEI_Test
See details 34.1080588-F7.0.0Rel-7Clarification of two default values for IE Scrambling code change Details R5-071435 agreedRAN5#35MCC TF160 Details RP-070344 approvedRAN#36R57.1.0TEI_Test
See details 34.1080556-F6.4.0Rel-6Clarification of FDD test channels used for signaling test cases Details R5-063260 agreedRAN5#33 Details RP-060731 approvedRAN#34NEC, NTT DoCoMo...6.5.0TEI_Test
See details 34.1080555-F6.4.0Rel-6Correction to default content for System Information Block Type 7 Details R5-063079 agreedRAN5#33 Details RP-060731 approvedRAN#34Anite6.5.0TEI_Test
See details 34.1080554-F6.4.0Rel-6to 34.108, Modify MCC value in IMSI of test USIM for Band VI test Details R5-063341 agreedRAN5#33 Details RP-060731 approvedRAN#34MCC Task 1606.5.0TEI_Test
See details 34.1080553-F6.4.0Rel-6to 34.108, Add MCC value for Band VI test Details R5-063340 agreedRAN5#33 Details RP-060731 approvedRAN#34MCC Task 1606.5.0TEI_Test
See details 34.1080547-F6.4.0Rel-6Correction the Default System Information Block type6 Messages in 6.1.0b Details R5-063294 agreedRAN5#33 Details RP-060731 approvedRAN#34CATT/CCSA6.5.0TEI_Test
See details 34.1080545-F6.4.0Rel-6Correction to RADIO BEARER SETUP message in 9.2 Details R5-063402 agreedRAN5#33 Details RP-060731 approvedRAN#34Anritsu6.5.0TEI_Test
See details 34.1080543-F6.4.0Rel-6Correction to SECURITY MODE COMMAND message in 9.2.2 Details R5-063296 agreedRAN5#33 Details RP-060731 approvedRAN#34CATT/CCSA6.5.0TEI_Test
See details 34.1080541-F6.3.0Rel-6Corrections to maximum data rate for combinations on PRACH (FDD) Details R5-062350 agreedRAN5#32 Details RP-060549 approvedRAN#33R56.4.0TEI_Test
See details 34.1080540-F6.3.0Rel-6Correction to 34.108 Section 6.1 : Inclusion of System Information Block Type 5bis Details R5-062398 agreedRAN5#32 Details RP-060549 approvedRAN#33R56.4.0TEI_Test
See details 34.1080539-F6.3.0Rel-6Clarification to section 6.10 and 6.11 Details R5-062194 agreedRAN5#32 Details RP-060549 approvedRAN#33R56.4.0TEI_Test
See details 34.1080529-F6.3.0Rel-6Correction to SECURITY MODE COMMAND message in 9.2.1 Details R5-062403 agreedRAN5#32 Details RP-060549 approvedRAN#33R56.4.0TEI_Test
See details 34.1080528-F6.3.0Rel-6Correction to SIB11 in 6.1 Details R5-062427 agreedRAN5#32 Details RP-060549 approvedRAN#33R56.4.0TEI_Test
See details 34.1080527-F6.3.0Rel-6to 34.108: Correction of reference test frequencies for UMTS800 (Band VI) Details R5-062440 agreedRAN5#32 Details RP-060549 approvedRAN#33R56.4.0TEI_Test
See details 34.1080525-F6.2.0Rel-6Addition of a new section for downlink physical channels code allocation for signalling in FDD Details R5-061385 agreedRAN5#31 Details RP-060322 approvedRAN#32R56.3.0TEI_Test
See details 34.1080524-F6.2.0Rel-6Corrections to the values for IE based on calculated ASN.1 value to 34.108 clause 6 Details R5-061281 agreedRAN5#31 Details RP-060322 approvedRAN#32R56.3.0TEI_Test
See details 34.1080523-F6.2.0Rel-6Correction to specific message contents for UE Capability Information confirm message Details R5-061139 agreedRAN5#31 Details RP-060322 approvedRAN#32R56.3.0TEI_Test
See details 34.1080521-F6.2.0Rel-6Corrections to the values for IE based on calculated ASN.1 value to 34.108 clause 9 Details R5-061369 agreedRAN5#31 Details RP-060322 approvedRAN#32R56.3.0TEI_Test
See details 34.1080499-F6.1.1Rel-6Corrections to default message contents for RF Details R5-060257 agreedRAN5#30 Details RP-060154 approvedRAN#31R56.2.0TEI_Test
See details 34.1080495-F6.1.1Rel-6Clarification of RB Test Mode State for RF testing Details R5-060446 agreedRAN5#30 Details RP-060154 approvedRAN#31R56.2.0TEI_Test
See details 34.1080493-F6.1.1Rel-6Correction to DPCCH power offset value in RADIO BEARER SETUP messages Details R5-060459 agreedRAN5#30 Details RP-060154 approvedRAN#31R56.2.0TEI_Test
See details 34.1080490-F6.1.1Rel-6Corrections to default message contents for signaling Details R5-060274 agreedRAN5#30 Details RP-060154 approvedRAN#31R56.2.0TEI_Test
See details 34.1080486-F6.1.1Rel-6Corrections to GPS data files for signalling tests. Details R5-060522 agreedRAN5#30 Details RP-060154 approvedRAN#31R56.2.0TEI_Test
See details 34.1080482-F6.0.0Rel-6Correction to puncturing limit in radio bearer configuration 6.10.2.4.1.38a Details R5-052096 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080481-F6.0.0Rel-6Proposed to 34.108 [R6 version, R99 affected] to change slot format for AMR 5.9 mono rate RAB Details R5-052055 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080479-F6.0.0Rel-6Corrections to default message contents of ‘HANDOVER FROM UTRAN COMMAND-GSM’ message. Details R5-051955 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080478-F6.0.0Rel-6Correction of UE states tables for Generic setup procedures. Details R5-051942 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080477-F6.0.0Rel-6Correction of references to IB UL:8 DL:8 kbps transport channel parameters in reference radio bearer configuration 6.10.2.4.1.58a Details R5-051858 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080476-F6.0.0Rel-6Correction to the default RRC message contents for the IE “UARFCN uplink (Nu)” Details R5-052155 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080475-F6.0.0Rel-6Removal of deprecated values from the default contents for RRC Connection Setup (Cell FACH) and RRC Connection Release (Cell DCH) messages. Details R5-051848 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080474-D6.0.0Rel-6Editorial corrections to TS 34.108 Details R5-051840 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080465-F6.0.0Rel-6Removal of temporary BLER measurement configuration Details R5-051933 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1080464-F6.0.0Rel-6Correction of UE test states for RF testing. Details R5-052302 agreedRAN5#29 Details RP-050769 approvedRAN#30R56.1.0TEI_Test
See details 34.1210669-F6.3.0Rel-6Correction to the operating conditions in TS34.121 5.13.1 and 5.13.1A Details R5-060043 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210668-F6.3.0Rel-6Correction to Frequency Error Details R5-060235 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210667-F6.3.0Rel-6Correction of TGD parameter for compressed mode tests Details R5-060237 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210666-F6.3.0Rel-6Correction to 7.8.2 Details R5-060238 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210663-F6.3.0Rel-6Correction to 8.3.2.2 FDD/FDD Hard Handover to inter-frequency cell Details R5-060240 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210661-F6.3.0Rel-6Correction to 8.7.4.2 Inter frequency measurement requirement Details R5-060242 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210655-F6.3.0Rel-6Detection and measurements of new cells not belonging to monitored set Details R5-060418 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210652-F6.3.0Rel-6Band IX additions to tables 5.4.1.3 and 5.5.2.3 Details R5-060408 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210651-D6.3.0Rel-6Editorial errors in Clause 5 Details R5-060403 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210650-F6.3.0Rel-6Correction to TC7.7.2 power step threshold Details R5-060407 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210649-F6.3.0Rel-6Correction to 7.7.3 Combining of reliable TPC commands from radio links of different radio link sets Details R5-060246 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210647-F6.3.0Rel-6Clarification of CN domain for BLER measurements Details R5-060261 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210646-F6.3.0Rel-6Correction to monitored cell lists Details R5-060420 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210637-F6.3.0Rel-6Alignment of 34.121 and 25.133 for TC 8.4.1.2 Details R5-060421 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210635-F6.3.0Rel-6Clarification of Connection Diagrams in Annex A Details R5-060452 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210634-F6.3.0Rel-6Correction to spurious emissions requirements in TC 5.11 Details R5-060461 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210630-F6.3.0Rel-6Allowance of DL power control response time in TC 7.8.2 Details R5-060114 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210628-D6.3.0Rel-6Allowance of alternative DL power control response time Details R5-060466 agreedRAN5#30 Details RP-060155 approvedRAN#31R56.4.0TEI_Test
See details 34.1210625-F6.2.0Rel-6Removal of temporary BLER measurement configuration Details R5-051935 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210624-F6.2.0Rel-6Corrections to Annex F for Change of TFC Details R5-052316 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210623-F6.2.0Rel-6Correction to Measurement Report messages Details R5-052344 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210619-F6.2.0Rel-6Addition of integrity check info in MEASUREMENT CONTROL messages Details R5-052314 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210618-F6.2.0Rel-6Correction to 8.3.7 Cell Re-selection in URA_PCH Details R5-052007 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210617-F6.2.0Rel-6Clarification of monitored cell list Details R5-052336 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210616-F6.2.0Rel-6Correction to 8.3.1 Test procedure Details R5-052312 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210615-F6.2.0Rel-6Correction to 8.2.3.1 and 8.2.3.2 Monitored cell list information added Details R5-052338 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210614-F6.2.0Rel-6Removal of some event 1C reporting which may fill RLC buffer in RRM testcases 8.6.1.2 and 8.6.1.2A Details R5-052310 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210613-F6.2.0Rel-6Modification of BLER target in RRM hard handover test cases Details R5-051853 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210611-F6.2.0Rel-6Correction to TC7.7.2 statistical requirements Details R5-052306 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210610-F6.2.0Rel-6Clarification on TFCS size for DCH demodulation requirements Details R5-051934 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210609-F6.2.0Rel-6Correction to Measurement Configuration in TS34.121 Chapter 7 Details R5-052309 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210608-F6.2.0Rel-6Correction to TS34.121 TC7.7.3 Details R5-051844 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210607-F6.2.0Rel-6Correction to TC5.4.1 and 5.5.2 <REFIor> and levels Details R5-052304 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210606-F6.2.0Rel-6Addition of test tolerance to Power setting in Uplink compressed mode Test Case Details R5-052303 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210605-F6.2.0Rel-6Addition of test tolerance to Change of TFC Test Case Details R5-051843 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210604-F6.2.0Rel-6Clarification of UE measurement reference point Details R5-052305 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210603-F6.2.0Rel-6Revision of additional receiver spurious emissions requirements on 800MHz band in Japan Details R5-051995 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.1210602-F6.2.0Rel-6Modification of the protection band for PHS Details R5-051994 agreedRAN5#29 Details RP-050770 approvedRAN#30R56.3.0TEI_Test
See details 34.121-11636-F13.0.0Rel-13Editorial corrections to test case 7.7.2 Details R5-165146 agreedRAN5#72CATR Details RP-161425 approvedRAN#73RAN513.1.0TEI_Test
See details 34.121-116272F12.3.0Rel-12Update to HS-DPCCH power control test cases Details R5-163198 agreedRAN5#71QUALCOMM Inc Details RP-160845 approvedRAN#72TSG WG RAN512.4.0TEI_Test
See details 34.121-116271F12.3.0Rel-12Update to HS-DPCCH power control test cases Details R5-163114 revisedRAN5#71QUALCOMM Inc    TEI_Test
See details 34.121-11627-F12.3.0Rel-12Update to HS-DPCCH power control test cases Details R5-162164 revisedRAN5#71QUALCOMM Inc    TEI_Test
See details 34.121-116261F12.3.0Rel-12Update to WCDMA ILPC Test cases Details R5-163113 agreedRAN5#71QUALCOMM UK Ltd Details RP-160844 approvedRAN#72TSG WG RAN512.4.0TEI_Test
See details 34.121-11626-F12.3.0Rel-12Update to WCDMA ILPC Test cases Details R5-162163 revisedRAN5#71QUALCOMM UK Ltd    TEI_Test
See details 34.121-11607-F12.0.0Rel-12Updates of minimum requirement of Rx spurious eimissions Details R5-153309  RAN5#68    TEI_Test
See details 34.121-11604-F Rel-12Correction to Tx spurious emissions test cases Details R5-151434  RAN5#67    TEI_Test
See details 34.121-11603-F Rel-12Correction to Rx spurious emissions test case Details R5-151433  RAN5#67    TEI_Test
See details 34.121-11524-F11.1.1Rel-11Update of test conditions for RRM delay tests in F.6.2.8 Details R5-134497 agreedRAN5#61Anritsu Details RP-131857 approvedRAN#62R511.2.0TEI_Test 2G
See details 34.121-11523-F11.1.1Rel-11Changes to referense sensitivity test cases Details R5-134430 agreedRAN5#61Broadcom Corporation Details RP-131857 approvedRAN#62R511.2.0TEI_Test 2G
See details 34.121-11485-F10.4.0Rel-10Introduction of new RRM Test Case 8.4.3.1A Details R5-125914 agreedRAN5#577Layers Details RP-121705 approvedRAN#58R510.5.0TEI_Test 2G
See details 34.121-11459-F10.3.0Rel-10Adding band XXII in spurious emission test cases in 34.121-1 Details R5-123975 agreedRAN5#56Ericsson, ST-Er... Details RP-121089 approvedRAN#57R510.4.0TEI_Test 2G
See details 34.121-11422-F10.2.1Rel-10Correction of Maximum Test System Uncertainty in Annex F.1.2 Table F.1.2 Details R5-121303 agreedRAN5#55SGS Wireless Details RP-120635 approvedRAN#56R510.3.0TEI_Test 2G
See details 34.121-11319-F9.4.0Rel-9Spurious Emission requirement extension due to EN spec change Details R5-112836 agreedRAN5#51Samsung Details RP-110638 approvedRAN#52R59.5.0TEI_Test 2G
See details 34.121-11296-F9.3.0Rel-9Correction to Notes in Tx Spurious Emissions Details R5-110425 agreedRAN5#50Anritsu Details RP-110152 approvedRAN#51R59.4.0TEI_Test
See details 34.121-11285-F9.2.0Rel-9Removal of lower limit for humidity in normal conditions Details R5-106417 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11285-F9.2.0Rel-9Removal of lower limit for humidity in normal conditions Details R5-106417  RAN5#49Nokia Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11281-F9.2.0Rel-9Adding Band XII, XIII and XIV operation info into out-of-band blocking test case Details R5-106412 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11281-F9.2.0Rel-9Adding Band XII, XIII and XIV operation info into out-of-band blocking test case Details R5-106412  RAN5#49Nokia Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11280-F9.2.0Rel-9Correction to references in out-of-sync tests 5.4.4 and 5.4.4A Details R5-106411 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11280-F9.2.0Rel-9Correction to references in out-of-sync tests 5.4.4 and 5.4.4A Details R5-106411  RAN5#49Nokia Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11270-F9.1.0Rel-934.121-1 Correction parameters of Chapter 9 Details R5-104832 agreedRAN5#48CGC Details RP-100808 approvedRAN#49R59.2.0TEI_Test
See details 34.121-11269-F9.1.0Rel-934.121-1_TC9.2.1HA_Definition and applicability correction Details R5-104831 agreedRAN5#48CGC Details RP-100808 approvedRAN#49R59.2.0TEI_Test
See details 34.121-11211-F8.9.0Rel-8Clarification to testing of RRM test cases with multiple antenna connectors Details R5-100144 agreedRAN5#46Nokia Details RP-100137 approvedRAN#47R58.10.0TEI_Test
See details 34.121-11190-F8.7.0Rel-8Change C_RF51 to void of 34.121-2 Details R5-094963 agreedRAN5#44CGC Inc. Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.121-11181-B8.7.0Rel-8Adding reference to the new test cases 9.2.2E and 9.2.3E in annex Details R5-094828 agreedRAN5#44Ericsson, ST-Er... Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.121-11180-B8.7.0Rel-8Correction of applicability of test case 7.8.1 Details R5-094825 agreedRAN5#44Ericsson, ST-Er... Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.121-11179-F8.7.0Rel-8Removing Table A.3 in TS 34.121-2 Details R5-094590 agreedRAN5#44CGC Inc. Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.121-11175-F8.7.0Rel-8Correction to the condition of C_RF55 of 34.121-2 Details R5-094312 agreedRAN5#44CGC Inc. Details RP-090791 approvedRAN#45R58.8.0TEI_Test
See details 34.121-11138-F8.5.0Rel-8Correction to RRM Random Access Procedure testcase 8.4.2.4 Details R5-091037 agreedRAN5#42Anite Details RP-090200 approvedRAN#43R58.6.0TEI_Test
See details 34.121-11135-F8.5.0Rel-8Statistical requirements for TC 7.8.5 (Power control in the downlink for F-DPCH) Details R5-090378 agreedRAN5#42Rohde&Schwarz Details RP-090200 approvedRAN#43R58.6.0TEI_Test
See details 34.121-11134-F8.5.0Rel-8Correction to 8.7.1 and 8.7.2 Details R5-090305 agreedRAN5#42NEC Details RP-090200 approvedRAN#43R58.6.0TEI_Test
See details 34.121-11109-F8.3.0Rel-8Correction to WI-10 RRM test case 8.3.5.3 Details R5-083846 agreedRAN5#40RIM Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11107-F8.3.0Rel-8Missing AWGN in connection A.13 and A.18 Details R5-083833 agreedRAN5#40Rohde & Schwarz Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11105-F8.3.0Rel-8Correction to the reference table of test case 6.8 Details R5-083827 agreedRAN5#40CGC Inc. Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11098-F8.3.0Rel-8Correction to for the DL reference measurement channel 2 for 64 kbps Details R5-083389 agreedRAN5#40Rohde & Schwarz Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11096-F8.3.0Rel-8Typo in 6.5.2 Details R5-083385 agreedRAN5#40Rohde & Schwarz Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11094-F8.3.0Rel-8Correction 7.8.5 (Power control in F-DPCH) Details R5-083381 agreedRAN5#40Rohde & Schwarz Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11090-F8.3.0Rel-8Correction to RRM test case 8.6.5.1 – compressed mode and Measurement report Details R5-083349 agreedRAN5#40Anite Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11089-F8.3.0Rel-8Correction to RRM test case 8.3.4 Details R5-083343 agreedRAN5#40Anite Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11083-F8.3.0Rel-8Correction to RRM tests cases in clause 8.2.3 Details R5-083219 agreedRAN5#40AT4 wireless Details RP-080554 approvedRAN#41R58.4.0TEI_Test
See details 34.121-11072-F8.2.1Rel-8Correction to 8.7.1.1 and 8.7.3A Details R5-081272 agreedRAN5#39Anritsu Ltd Details RP-080363 approvedRAN#40R58.3.0TEI_Test
See details 34.121-11071-F8.2.1Rel-88.6.2.1 and 8.6.2.1A: correction to Measurement Control message Details R5-081442 agreedRAN5#39Anite Details RP-080363 approvedRAN#40R58.3.0TEI_Test
See details 34.121-11027-F8.1.0Rel-8Completion and correction of Annex F.6.2.8 (Statistical testing) Details R5-080403 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-11026-F8.1.0Rel-8Uniform application of Annex F.6.2.8 (statistical annex) to all tests in clause 8.7 Details R5-080319 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-11025-F8.1.0Rel-8TC 8.3.2.1 û Correction to Measurement Report Details R5-080288 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-11021-F8.1.0Rel-8Correction to system uncertainty of RRM test cases Details R5-080243 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-11016-F8.1.0Rel-8Correction to SHO messages Details R5-080240 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-11013-F8.1.0Rel-8Correction to test case 6.5 for Band V operation Details R5-080141 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-11011-F8.1.0Rel-8Correction to Spectrum emission mask Details R5-080419 agreedRAN5#38 Details RP-080091 approvedRAN#39R58.2.0TEI_Test
See details 34.121-10990-F8.0.0Rel-8Correction of Table F.6.2.8 (statistical testing) Details R5-073222 agreedRAN5#37Rohde & Schwarz Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10987-F8.0.0Rel-8Addition of new TCs to Annex K - cell configuration mapping table Details R5-073127 agreedRAN5#37Marvell Semicon... Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10985-F8.0.0Rel-8Correction to extreme condition voltages for Lithium batteries Details R5-073122 agreedRAN5#37Nokia Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10980-F8.0.0Rel-8to 34.121-1: Correction to UARFCN for Band V and Band VI Details R5-073064 agreedRAN5#37Motorola Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10978-F8.0.0Rel-8Correction to Annex I Details R5-073215 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10977-F8.0.0Rel-8Correction to IE Reporting interval in RRM event triggered tests Details R5-073213 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10976-F8.0.0Rel-8Correction to Primary CPICH Tx Power in Measurement Control message for RRM TCs Details R5-073324 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10975-F8.0.0Rel-8Corrections to the BCCH ARFCN for RRM TCs Details R5-073211 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10974-F8.0.0Rel-8Correction to RRM test case 8.7.3.A Details R5-073210 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10973-F8.0.0Rel-8Correction to system uncertainty of RRM test cases Details R5-073209 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10972-F8.0.0Rel-8Addition of specific reference messages for 8.4.3 Details R5-073208 agreedRAN5#37Anritsu Details RP-070859 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10971-F8.0.0Rel-8Correction to Qhyst parameter in 8.3.5 Details R5-073207 agreedRAN5#37Anritsu Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10970-F8.0.0Rel-8Corrections to test cases 8.6.1.3 and 8.6.1.3A Details R5-073179 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10969-F8.0.0Rel-8Correction to test case 8.7.4.2 û compressed mode Details R5-073387 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10968-F8.0.0Rel-8Correction to the test case 8.7.3.1 û compressed mode Details R5-073394 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10967-F8.0.0Rel-8Correction to the test case 8.7.2.2.2 û compressed mode Details R5-073385 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10966-F8.0.0Rel-8Correction to the test case 8.7.1.2.1 û compressed mode Details R5-073384 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10965-F8.0.0Rel-8Correction to test case 8.6.4.1 û compressed mode Details R5-073393 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10961-F8.0.0Rel-8Correction to the test case 8.6.2.1 û compressed mode Details R5-073379 agreedRAN5#37Anite Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10955-F8.0.0Rel-8to 34.121-1: Test time reduction for RRM delay tests Details R5-073316 agreedRAN5#37Motorola Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10954-F8.0.0Rel-8to 34.121-1: Test time reduction for Cell Re-selection in CELL_FACH State for one and two frequency present in neighbour list Details R5-073071 agreedRAN5#37Motorola Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10952-F8.0.0Rel-8to 34.121-1: Correction to test case CPICH RSCP intra frequency test parameters Details R5-073314 agreedRAN5#37Motorola Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10951-F8.0.0Rel-8to 34.121-1: Correction to test case CPICH RSCP intra frequency measurements absolute accuracy minimum requirements Details R5-073068 agreedRAN5#37Motorola Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10947-F8.0.0Rel-8to 34.121-1: Correction to Spectrum Emission Mask Limits for Band V (UMTS 850) Details R5-073067 agreedRAN5#37Motorola Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10946-F8.0.0Rel-8to 34.121-1: Correction to TFC and Compressed Mode Time Mask Diagrams Details R5-073065 agreedRAN5#37Motorola Details RP-070858 approvedRAN#38R58.1.0TEI_Test
See details 34.121-10911-F7.5.0Rel-7to 34.121-1: Correction to FDD/FDD Soft Handover test cases Details R5-072357 agreedRAN5#36Motorola Details RP-070588 approvedRAN#37R57.6.0TEI_Test
See details 34.121-10888-F7.5.0Rel-7Removing test procedure for event trigger tests Details R5-072263 agreedRAN5#36Anritsu Details RP-070588 approvedRAN#37R57.6.0TEI_Test
See details 34.121-10886-F7.5.0Rel-7Clarification of Transmission gap pattern sequence Details R5-072260 agreedRAN5#36Anritsu Details RP-070588 approvedRAN#37R57.6.0TEI_Test
See details 34.121-10883-F7.5.0Rel-7Correction to ACTIVESET UPDATE message in Annex I Details R5-072257 agreedRAN5#36Anritsu Details RP-070588 approvedRAN#37R57.6.0TEI_Test
See details 34.121-10882-F7.5.0Rel-7Correction to call setup procedure Details R5-072256 agreedRAN5#36Anritsu Details RP-070588 approvedRAN#37R57.6.0TEI_Test
See details 34.121-10881-F7.4.0Rel-7Corrections to RRM test case 8.7.3.A when run in FDD Band V and VI Details R5-071379r1 agreed Rohde & Schwarz Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10880-F7.4.0Rel-7Correction of testcase 8.3.4 for Inter-system Handover from UTRAN FDD to GSM Details R5-071249 agreedRAN5#35Ericsson Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10868-F7.4.0Rel-7TC 8.6.4.1 test 1 and 2 - addition of physical channel reconfiguration messages Details R5-071364 agreedRAN5#35Marvell Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10853-F7.4.0Rel-7Correction to Annex K - ' cell configuration mapping' table Details R5-071336 agreedRAN5#35Marvell Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10845-F7.4.0Rel-7Correction to 5.13.1 Details R5-071324 agreedRAN5#35Anritsu Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10844-F7.4.0Rel-7Applicability change of vibration condition to 34.121-1 test case 5.3 Details R5-071323 agreedRAN5#35Nokia Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10839-F7.4.0Rel-7Correction to Measurement report message in Annex I for Inter RAT tests Details R5-071217 agreedRAN5#35Anritsu Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10830-F7.4.0Rel-7TC 8.3.4 - addition of physical channel reconfiguration message Details R5-071103 agreedRAN5#35Marvell Details RP-070344 approvedRAN#36R57.5.0TEI_Test
See details 34.121-10825-F7.3.0Rel-7Test time reduction to event trigger tests Details R5-070560 agreedRAN5#34 Details RP-070101 approvedRAN#35Anritsu7.4.0TEI_Test
See details 34.121-10793-F7.3.0Rel-7Correction to Active Set Update messsage in Annex I Details R5-070506 agreedRAN5#34 Details RP-070101 approvedRAN#35Nokia, Anritsu7.4.0TEI_Test
See details 34.121-10792-F7.3.0Rel-7Default Qrxlevmin value for RRM Testcases Details R5-070505 agreedRAN5#34 Details RP-070101 approvedRAN#35Anite7.4.0TEI_Test
See details 34.121-10789-F7.3.0Rel-7Correction to system uncertainty of GSM test cases Details R5-070256 agreedRAN5#34 Details RP-070101 approvedRAN#35Anritsu7.4.0TEI_Test
See details 34.121-10788-F7.3.0Rel-7Correction of the definition of known cell Details R5-070218 agreedRAN5#34 Details RP-070101 approvedRAN#35Nokia7.4.0TEI_Test
See details 34.121-10787-F7.3.0Rel-7Correction to the content of Measurement Control message in RRM Test cases 8.3.2.2, 8.6.2.1 and 8.6.2.2 Details R5-070503 agreedRAN5#34 Details RP-070101 approvedRAN#35Anite7.4.0TEI_Test
See details 34.121-10786-F7.3.0Rel-7Correction to Table 8.3.7.2.1 and Table F.4.1 Details R5-070555 agreedRAN5#34 Details RP-070101 approvedRAN#35RITT/CTTL,CMCC,CATT7.4.0TEI_Test
See details 34.121-10785-F7.3.0Rel-7Correction to test requirements in section 8.4.2.4 and F.4.4 Details R5-070502 agreedRAN5#34 Details RP-070101 approvedRAN#35RITT/CTTL,CMCC,CATT7.4.0TEI_Test
See details 34.121-10784-F7.3.0Rel-7Correction to test tolerances in test cases 7.7.1 and 7.7.2. Details R5-070216 agreedRAN5#34 Details RP-070101 approvedRAN#35Nokia7.4.0TEI_Test
See details 34.121-10782-F7.3.0Rel-7Correction to 34.121-1 test case for: Change of TFC Details R5-070501 agreedRAN5#34 Details RP-070101 approvedRAN#35Motorola7.4.0TEI_Test
See details 34.121-10762-F7.2.0Rel-7Correction to UARFCN frequency offset for Band VII Details R5-063070 agreedRAN5#33 Details RP-060732 approvedRAN#34Nokia7.3.0TEI_Test