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 1123 items in 6 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 34.1080993-F12.2.0Rel-12Correction to URA Update message Details R5-165902 agreedRAN5#72Rohde&Schwarz Details RP-161437 approvedRAN#73RAN512.3.0TEI10_Test
See details 34.1080974-F11.12.0Rel-11Corrections in the default RADIO BEARER SETUP message for 4C-HSDPA Details R5-150542 agreedRAN5#66MCC TF160, Noki... Details RP-150327 approvedRAN#67R511.13.0TEI10_Test 2G
See details 34.121-116461F14.1.0Rel-14Correction to Table 4.0B Dual band 4C-HSDPA configurations Details R5-173336 agreedRAN5#75CGC Inc. Details RP-171374 approvedRAN#76RAN514.2.0TEI10_Test
See details 34.121-11646-F14.1.0Rel-14Correction to Table 4.0B Dual band 4C-HSDPA configurations Details R5-172682 revisedRAN5#75CGC Inc.    TEI10_Test
See details 34.121-11637-F13.0.0Rel-13Update Test Tolerances and Test requirements for Test cases 8.6.6.1 and 8.6.6.2 Details R5-165300 agreedRAN5#72ANRITSU LTD Details RP-161437 approvedRAN#73RAN513.1.0TEI10_Test
See details 34.121-116141F12.1.0Rel-12Update Test Tolerances and Test requirements for Test cases 8.3.4a and 8.3.4b Details R5-155891 agreedRAN5#69ANRITSU LTD Details RP-151688 approvedRAN#70RAN512.2.0TEI10_Test
See details 34.121-11614-F12.1.0Rel-12Update Test Tolerances and Test requirements for Test cases 8.3.4a and 8.3.4b Details R5-155192 revisedRAN5#69ANRITSU LTD    TEI10_Test
See details 34.121-11601-F11.6.0Rel-11Corrections to test procedure of Test Cases 8.7.11 and 8.7.13 Details R5-151363  RAN5#67 Details RP-150888 approvedRAN#68R511.7.0TEI10_Test
See details 34.121-11600-F11.6.0Rel-11Corrections to Test Case 8.4.3.1A Details R5-151362  RAN5#67 Details RP-150888 approvedRAN#68R511.7.0TEI10_Test
See details 34.1220437-F11.11.0Rel-1134.122 - Correction to In-band blocking test procedure. Details R5-155677 agreedRAN5#69Keysight Techno... Details RP-151688 approvedRAN#70RAN511.12.0TEI10_Test
See details 34.1220436-F11.10.0Rel-11Corrections to Test Case 8.6.5.4 Details R5-151364  RAN5#67 Details RP-150888 approvedRAN#68R511.11.0TEI10_Test
See details 34.123-13939-F15.6.0Rel-15Correction to UTRAN Inter-RAT TC 8.6.3.3 Details R5-240550 agreedRAN5#102MCC TF160 Details RP-240222 approvedRAN#103RAN515.7.0TEI10_Test
See details 34.123-13907-F14.1.0Rel-14Correction to emergency call test cases 13.2.1.1 and 13.2.2.1 Details R5-173878 agreedRAN5#76QUALCOMM Incorp... Details RP-171697 approvedRAN#77TSG WG RAN514.2.0TEI10_Test
See details 34.123-13903-F14.1.0Rel-14Update UTRA Inter-RAT RRC test cases 8.6.3.1 and 8.6.3.3 for Band > 64 Details R5-173829 agreedRAN5#76Ericsson Details RP-171697 approvedRAN#77TSG WG RAN514.2.0TEI10_Test
See details 34.123-138791F12.5.0Rel-12Correction to UTRA test cases to update test USIM contents Details R5-169008 agreedRAN5#73Keysight Techno... Details RP-162113 approvedRAN#74TSG WG RAN512.6.0TEI10_Test
See details 34.123-13879-F12.5.0Rel-12Correction to UTRA test cases to update test USIM contents Details R5-168443 revisedRAN5#73Keysight Techno...    TEI10_Test
See details 34.123-138681F12.4.0Rel-12Correction to UTRAN MDT testcase 8.6.2.3 Details R5-165886 agreedRAN5#72ROHDE & SCHWARZ... Details RP-161437 approvedRAN#73RAN512.5.0TEI10_Test
See details 34.123-13868-F12.4.0Rel-12Correction to UTRAN MDT testcase 8.6.2.3 Details R5-165326 revisedRAN5#72ROHDE & SCHWARZ...    TEI10_Test
See details 34.123-138671F12.4.0Rel-12Correction to UTRAN MDT testcase 8.6.2.2 Details R5-166246 agreedRAN5#72ROHDE & SCHWARZ... Details RP-161437 approvedRAN#73RAN512.5.0TEI10_Test
See details 34.123-13867-F12.4.0Rel-12Correction to UTRAN MDT testcase 8.6.2.2 Details R5-165325 revisedRAN5#72ROHDE & SCHWARZ...    TEI10_Test
See details 34.123-138541F12.3.0Rel-12Correction of test cases 8.6.2.2 and 8.6.2.2a Details R5-163071 agreedRAN5#71Intel Corporati... Details RP-160856 approvedRAN#72TSG WG RAN512.4.0TEI10_Test
See details 34.123-13854-F12.3.0Rel-12Correction of test cases 8.6.2.2 and 8.6.2.2a Details R5-162203 revisedRAN5#71Intel Corporati...    TEI10_Test
See details 34.123-13853-F12.3.0Rel-12Correction to UTRAN MDT testcase 8.6.2.3 Details R5-162182 agreedRAN5#71ROHDE & SCHWARZ... Details RP-160856 approvedRAN#72TSG WG RAN512.4.0TEI10_Test
See details 34.123-138331F12.2.0Rel-12Correction to Rel-10 UTRAN MDT testcase 8.6.2.1 Details R5-160925 agreedRAN5#70ROHDE & SCHWARZ... Details RP-160128 approvedRAN#71TSG WG RAN512.3.0TEI10_Test
See details 34.123-13833-F12.2.0Rel-12Correction to Rel-10 UTRAN MDT testcase 8.6.2.1 Details R5-160359 revisedRAN5#70ROHDE & SCHWARZ...    TEI10_Test
See details 34.123-13815-F12.1.0Rel-12Correction to Rel-10 NIMTC testcase 9.4.3.7 Details R5-155328 agreedRAN5#69ROHDE & SCHWARZ... Details RP-151688 approvedRAN#70RAN512.2.0TEI10_Test
See details 34.123-13801-F12.1.0Rel-12Update to NIMTC test case 12.4.3.2a Details R5-155079 agreedRAN5#69MCC TF160, Rohd... Details RP-151688 approvedRAN#70RAN512.2.0TEI10_Test
See details 34.123-137652F12.1.0Rel-12Correction to Rel-10 NIMTC testcases   9.4.5.5 and  12.4.3.2a Details R5-153698 agreedRAN5#68ROHDE & SCHWARZ...    TEI10_Test
See details 34.123-137651F12.1.0Rel-12Correction to Rel-10 NIMTC testcases   9.4.5.5 and  12.4.3.2a Details R5-153698 agreedRAN5#68ROHDE & SCHWARZ...    TEI10_Test
See details 34.123-13765-F12.0.0Rel-12Correction to Rel-10 NIMTC testcases 9.4.5.5 and 12.4.3.2a Details R5-153193  RAN5#68    TEI10_Test
See details 34.123-137632F12.1.0Rel-12Correction to Rel-10 NIMTC testcase 11.1.3.4 Details R5-153697 agreedRAN5#68ROHDE & SCHWARZ    TEI10_Test
See details 34.123-137631F12.1.0Rel-12Correction to Rel-10 NIMTC testcase 11.1.3.4 Details R5-153697 agreedRAN5#68ROHDE & SCHWARZ    TEI10_Test
See details 34.123-13763-F12.0.0Rel-12Correction to Rel-10 NIMTC testcase 11.1.3.4 Details R5-153191  RAN5#68    TEI10_Test
See details 34.123-13726-F11.5.0Rel-11Correction to Rel-10 testcase 12.4.1.4f Details R5-150635 agreedRAN5#66Rohde & Schwarz... Details RP-150327 approvedRAN#67R511.6.0TEI10_Test 2G
See details 34.123-13725-F11.5.0Rel-11Correction to Rel-10 testcase 9.4.3.3a Details R5-150634 agreedRAN5#66Rohde & Schwarz Details RP-150327 approvedRAN#67R511.6.0TEI10_Test 2G
See details 34.123-207641F12.3.0Rel-12Editorial correction of UTRAN PICS Mnemonics Details R5-162762 agreedRAN5#71Intel Corporati... Details RP-160856 approvedRAN#72TSG WG RAN512.4.0TEI10_Test
See details 34.123-20764-F12.3.0Rel-12Editorial correction of UTRAN PICS Mnemonics Details R5-162080 revisedRAN5#71Intel Corporati...    TEI10_Test
See details 34.123-20746-F12.0.0Rel-12Correction to test case 12.4.1.4f applicability Details R5-153459  RAN5#68    TEI10_Test
See details 34.123-33677-F17.4.0Rel-17Corrections to selection expressions of UTRAN Test Suite Details R5s240312 agreed#2024-TTCN emailMCC TF160    TEI10_Test
See details 34.123-336141F14.1.0Rel-14Correction to the function f_UTRAN34_ActivateFirstPDP_Context Details R5s180082 agreed#2018-TTCN emailMCC TF160 Details RP-180114 approvedRAN#79TSG WG RAN514.2.0TEI10_Test
See details 34.123-33614-F14.0.0Rel-14Correction to the function f_UTRAN34_ActivateFirstPDP_Context Details R5s170936 revised#2017-TTCN emailMCC TF160    TEI10_Test
See details 34.123-33571-F13.0.0Rel-13Add new verified and e-mail agreed TTCN test cases in the TC lists in 34.123-3 (prose), Annex A Details R5s160954 agreed#2016-TTCN emailMCC TF160 Details RP-162107 approvedRAN#74TSG WG RAN513.1.0TEI10_Test
See details 34.123-33553-F13.0.0Rel-13Correction to UTRAN MDT testcases 8.6.2.2. and 8.6.2.3 Details R5s160863 agreed#2016-TTCN emailROHDE & SCHWARZ Details RP-162108 approvedRAN#74TSG WG RAN513.1.0TEI10_Test
See details 34.123-33540-F12.4.0Rel-12Correction to Rel-10 3G MDT test case 8.6.2.3 Details R5s160729 agreed#2016-TTCN emailROHDE & SCHWARZ... Details RP-161432 approvedRAN#73RAN512.5.0TEI10_Test
See details 34.123-335391B13.0.0Rel-13Addition of UTRAN MDT test case 8.6.2.2 to UTRAN test suite Details R5s160957 agreed#2016-TTCN emailROHDE & SCHWARZ... Details RP-162108 approvedRAN#74TSG WG RAN513.1.0TEI10_Test
See details 34.123-33539-B12.4.0Rel-12Addition of UTRAN MDT test case 8.6.2.2 to UTRAN test suite Details R5s160726 revised#2016-TTCN emailROHDE & SCHWARZ...    TEI10_Test
See details 34.123-335131B12.4.0Rel-12Addidtion of UTRAN MDT testcase 8.6.2.3 to UTRAN testsuite Details R5s160761 agreed#2016-TTCN emailROHDE & SCHWARZ... Details RP-161432 approvedRAN#73RAN512.5.0TEI10_Test
See details 34.123-33513-B12.3.0Rel-12Addidtion of UTRAN MDT testcase 8.6.2.3 to UTRAN testsuite Details R5s160431 revised#2016-TTCN emailROHDE & SCHWARZ...    TEI10_Test
See details 34.123-33510-F12.3.0Rel-12Correction to UTRAN MDT testcase 8.6.2.1 Details R5s160378 agreed#2016-TTCN emailROHDE & SCHWARZ Details RP-160851 approvedRAN#72TSG WG RAN512.4.0TEI10_Test
See details 34.123-33503-F12.3.0Rel-12Correction to Rel-10 NIMTC testcase 12.2.2.3a Details R5s160297 agreed#2016-TTCN emailROHDE & SCHWARZ Details RP-160851 approvedRAN#72TSG WG RAN512.4.0TEI10_Test
See details 34.123-334971F12.3.0Rel-12Correction to Rel-10 NIMTC testcase 9.4.5.4.7 Details R5s160475 agreed#2016-TTCN emailROHDE & SCHWARZ Details RP-160851 approvedRAN#72TSG WG RAN512.4.0TEI10_Test
See details 34.123-33497-F12.2.0Rel-12Correction to Rel-10 NIMTC testcase 9.4.5.4.7 Details R5s160250 revised#2016-TTCN emailROHDE & SCHWARZ    TEI10_Test
See details 34.123-33473-F12.2.0Rel-12Correction to Rel-10 NIMTC testcase 12.2.2.3a Details R5s160122 agreed#2016-TTCN emailROHDE & SCHWARZ Details RP-160121 approvedRAN#71TSG WG RAN512.2.0TEI10_Test
See details 34.123-33471-B12.2.0Rel-12Addidtion of UTRAN MDT testcase 8.6.2.1 to UTRAN testsuite Details R5s160060 agreed#2016-TTCN emailROHDE & SCHWARZ Details RP-160121 approvedRAN#71TSG WG RAN512.2.0TEI10_Test
See details 34.123-33463-F12.1.0Rel-12Correction to Rel-10 NAS testcase 12.4.1.4f Details R5s150951 agreedRAN5-TTCN email 2015Rohde & Schwarz Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33462-F12.1.0Rel-12Correction to Rel-10 NIMTC testcase 11.1.3.4 Details R5s150950 agreedRAN5-TTCN email 2015Rohde & Schwarz Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33456-F12.1.0Rel-12Correction to UTRA NIMTC testcase 9.4.5.5 Details R5s150894 agreedRAN5-TTCN email 2015Anite Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33450-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 12.2.2.3a to UTRAN testsuite Details R5s150830 agreedRAN5-TTCN email 2015Rohde & Schwarz... Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33449-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 9.4.5.4.7 to UTRAN testsuite Details R5s150829 agreedRAN5-TTCN email 2015Rohde & Schwarz... Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33445-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 12.4.3.2a to UTRAN testsuite Details R5s150682 agreedRAN5-TTCN email 2015Rohde & Schwarz... Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33444-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 9.4.3.7 to UTRAN testsuite Details R5s150674 agreedRAN5-TTCN email 2015Rohde & Schwarz... Details RP-151691 approvedRAN#70TSG WG RAN512.2.0TEI10_Test
See details 34.123-33428-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 12.2.1.1a to UTRAN testsuite Details R5s150680 agreedRAN5-TTCN email 2015Rohde & Schwarz...    TEI10_Test
See details 34.123-33427-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 11.1.3.4 to UTRAN testsuite Details R5s150678 agreedRAN5-TTCN email 2015Rohde & Schwarz...    TEI10_Test
See details 34.123-33426-B12.1.0Rel-12Addidtion of Rel-10 NIMTC testcase 9.4.5.5 to UTRAN testsuite Details R5s150676 agreedRAN5-TTCN email 2015Rohde & Schwarz...    TEI10_Test
See details 34.123-33307-B11.5.0Rel-11Addidtion of Rel-10 NAS testcase 9.4.3.3a to UTRAN testsuite Details R5s141390 agreedRAN5#66Rohde & Schwarz Details RP-150331 approvedRAN#67R511.6.0TEI10_Test 2G
See details 34.123-33304-B11.5.0Rel-11Addidtion of Rel-10 NAS testcase 12.4.1.4f to UTRAN testsuite Details R5s141355 agreedRAN5#66Rohde & Schwarz Details RP-150331 approvedRAN#67R511.6.0TEI10_Test 2G
See details 34.229-11217-F14.0.0Rel-14Corrections to usage of SRVCC alerting feature tag for video calls Details R5-176209 agreedRAN5#77ROHDE & SCHWARZ Details RP-172235 approvedRAN#78TSG WG RAN514.1.0TEI10_Test
See details 34.229-10681-F Rel-12Removal of Route header checking in REGISTER method Details R5-151599  RAN5#67    TEI10_Test
See details 34.229-20155-F10.3.0Rel-10Removal of technical content in 34.229-2 v10.3.0 and substitution with pointer to the next Release Details R5-155032 agreedRAN5#69ETSI Secretariat Details RP-151688 approvedRAN#70RAN510.4.0TEI10_Test
See details 34.229-30500-F13.2.0Rel-13Add new verified and e-mail agreed TTCN test cases in the TC lists in 34.229-3 (prose), Annex A Details R5s170415 agreed#2017-TTCN emailMCC TF160 Details RP-171366 approvedRAN#76RAN513.3.0TEI10_Test
See details 34.229-304831B13.2.0Rel-13Addition of IMS test case 8.15 Details R5s170390 agreed#2017-TTCN emailROHDE & SCHWARZ... Details RP-171367 approvedRAN#76RAN513.3.0TEI10_Test
See details 34.229-30483-B13.1.0Rel-13Addition of IMS test case 8.15 Details R5s170201 revised#2017-TTCN emailROHDE & SCHWARZ...    TEI10_Test
See details 34.229-30431-F12.0.0Rel-12Correction to Recv-Info header checking in MO INVITE Details R5s160616 agreed#2016-TTCN emailROHDE & SCHWARZ... Details RP-161430 approvedRAN#73RAN512.1.0TEI10_Test
See details 34.229-30430-F11.4.0Rel-11Correction to Recv-Info header checking in MO INVITE Details R5s160615 withdrawn#2016-TTCN emailROHDE & SCHWARZ...    TEI10_Test
See details 34.229-30332-F10.7.0Rel-10Removal of technical content in 34.229-3 v10.7.0 and substitution with pointer to the next Release Details R5-155034 agreedRAN5#69ETSI Secretariat Details RP-151688 approvedRAN#70RAN510.8.0TEI10_Test
See details 34.9020025-F11.2.0Rel-11Update Test Tolerance analyses for TS 34.121-1 Test cases 8.6.6.1 and 8.6.6.2 Details R5-165299 agreedRAN5#72ANRITSU LTD Details RP-161437 approvedRAN#73RAN511.3.0TEI10_Test
See details 34.90200231F11.0.0Rel-11Update Test Tolerance analyses for TS 34.121-1 Test cases 8.3.4a and 8.3.4b Details R5-155890 agreedRAN5#69ANRITSU LTD Details RP-151688 approvedRAN#70RAN511.1.0TEI10_Test
See details 34.9020023-F11.0.0Rel-11Update Test Tolerance analyses for TS 34.121-1 Test cases 8.3.4a and 8.3.4b Details R5-155191 revisedRAN5#69ANRITSU LTD    TEI10_Test
See details 36.5081427-F17.5.0Rel-17Correction of 36.508 4.1.1 on lower humidity limit in temperature test environment Details R5-233270 withdrawnRAN5#99Samsung R&D Ins...    TEI10_Test
See details 36.5080880-F14.0.0Rel-14Addition of test frequencies for 10+15MHz and 15+10MHz in CA_41C Details R5-170948 agreedRAN5#74Keysight Techno... Details RP-170106 approvedRAN#75TSG WG RAN514.1.0TEI10_Test
See details 36.5080835-F13.1.0Rel-13Addition of test frequencies for CA_7C Details R5-168778 agreedRAN5#73Keysight Techno... Details RP-162113 approvedRAN#74TSG WG RAN513.2.0TEI10_Test
See details 36.50808301F13.1.0Rel-13Correction to test frequencies for CA_66C Details R5-169500 agreedRAN5#73Anritsu Details RP-162113 approvedRAN#74TSG WG RAN513.2.0TEI10_Test
See details 36.5080830-F13.1.0Rel-13Correction to test frequencies for CA_66C Details R5-168666 revisedRAN5#73Anritsu    TEI10_Test
See details 36.50808291F13.1.0Rel-13Correction to test frequencies for CA_12B Details R5-169504 agreedRAN5#73Anritsu Details RP-162113 approvedRAN#74TSG WG RAN513.2.0TEI10_Test
See details 36.5080829-F13.1.0Rel-13Correction to test frequencies for CA_12B Details R5-168665 revisedRAN5#73Anritsu    TEI10_Test
See details 36.50808101F13.1.0Rel-13New connection diagram for TC7.9A Details R5-169503 agreedRAN5#73Rohde & Schwarz Details RP-162113 approvedRAN#74TSG WG RAN513.2.0TEI10_Test
See details 36.5080810-F13.1.0Rel-13New connection diagram for TC7.9A Details R5-168366 revisedRAN5#73Rohde & Schwarz    TEI10_Test
See details 36.5080796-F13.0.1Rel-1336.508: Addition of test frequencies for band CA_7B Details R5-166015 agreedRAN5#72Keysight Techno... Details RP-161437 approvedRAN#73RAN513.1.0TEI10_Test
See details 36.50807941F13.0.1Rel-1336.508: Addition of test frequencies for band CA_7B and CA_8B Details R5-166000 withdrawnRAN5#72Keysight Techno...    TEI10_Test
See details 36.5080794-F13.0.1Rel-1336.508: Addition of test frequencies for band CA_7B and CA_8B Details R5-165835 revisedRAN5#72Keysight Techno...    TEI10_Test
See details 36.50807911F13.0.1Rel-1336.508 UL CA correction for RF test cases Details R5-166142 agreedRAN5#72Keysight Techno... Details RP-161437 approvedRAN#73RAN513.1.0TEI10_Test, LTE...
See details 36.5080791-F13.0.1Rel-1336.508 UL CA correction for RF test cases Details R5-165821 revisedRAN5#72Keysight Techno...    TEI10_Test, LTE...
See details 36.50807691F13.0.1Rel-13Correction of test frequencies for CA intra band combinations CA_2C, CA_3C, CA_7C and CA_12B Details R5-165894 agreedRAN5#72Keysight Techno... Details RP-161437 approvedRAN#73RAN513.1.0TEI10_Test
See details 36.5080769-F13.0.1Rel-13Correction of test frequencies for CA intra band combinations CA_2C, CA_3C, CA_7C and CA_12B Details R5-165497 revisedRAN5#72Keysight Techno...    TEI10_Test
See details 36.5080687-F12.8.0Rel-12Correction of test frequencies for CA_3C and CA_7C Details R5-160647 agreedRAN5#70ROHDE & SCHWARZ... Details RP-160128 approvedRAN#71TSG WG RAN512.8.0TEI10_Test
See details 36.50806811F12.8.0Rel-13Correction to extendedPHR-r10 for UL CA Details R5-161003 agreedRAN5#70Anritsu Details RP-160128 approvedRAN#71TSG WG RAN512.9.0TEI10_Test
See details 36.5080681-F12.8.0Rel-13Correction to extendedPHR-r10 for UL CA Details R5-160481 revisedRAN5#70Anritsu    TEI10_Test
See details 36.50806252F12.7.0Rel-12Update the default configuration of channel bandwidth for Band 42 for signalling testing Details R5-153715 agreedRAN5#68KDDI Corporatio...    TEI10_Test
See details 36.50806251F12.7.0Rel-12Update the default configuration of channel bandwidth for Band 42 for signalling testing Details R5-153715 agreedRAN5#68KDDI Corporatio...    TEI10_Test
See details 36.5080623-F12.6.0Rel-12Correction to Table 4.4.2-1A to change root sequence index for Cell 30 Details R5-153408  RAN5#68    TEI10_Test
See details 36.5080620-F12.6.0Rel-12CA RRM: Additions to cell mapping Table E-1 Details R5-153352  RAN5#68    TEI10_Test
See details 36.5080618-F12.6.0Rel-12Update to Loopback activation procedure for IMS enabled UE Details R5-153284  RAN5#68    TEI10_Test
See details 36.50806171F12.7.0Rel-12eICIC RRM: Corrections to cell mapping Table E-1 Details R5-153919 agreedRAN5#68Rohde & Schwarz    TEI10_Test
See details 36.5080617-F12.6.0Rel-12eICIC RRM: Corrections to cell mapping Table E-1 Details R5-153242  RAN5#68    TEI10_Test
See details 36.5080600-F Rel-12Addition of exception of RRC Connection Setup(UTRA) Details R5-151476  RAN5#67    TEI10_Test
See details 36.5080595-F12.5.0Rel-12Change of default Network Signalling Value for Uplink Carrier aggregation test cases Details R5-151423  RAN5#67 Details RP-150888 approvedRAN#68R512.6.0TEI10_Test
See details 36.5080593-F Rel-12Correction of CA_18A-28A test frequency Details R5-151350  RAN5#67    TEI10_Test
See details 36.5090215-F17.0.0Rel-17Encoding of ellipsoidPointWithAltitude in UPDATE UE LOCATION INFORMATION Details R5-224764 agreedRAN5#96-eANRITSU LTD Details RP-221996 approvedRAN#97-eTSG WG RAN517.1.0TEI10_Test
See details 36.5090147-F10.3.0Rel-10Removal of technical content in 36.509 v10.3.0 and substitution with pointer to the next Release Details R5-155038 withdrawnRAN5#69ETSI Secretariat    TEI10_Test
See details 36.5090144-F12.0.0Rel-12Update to Loopback data procedure with IMS signalling Details R5-153285  RAN5#68    TEI10_Test
See details 36.521-15438-F17.5.0Rel-17Editorial: References correction in additional spurious for CA minimum requirements Details R5-231249 withdrawnRAN5#98Keysight Techno...    TEI10_Test
See details 36.521-154371F17.5.0Rel-17Editorial: References correction in additional spurious for CA minimum requirements Details R5-231822 agreedRAN5#98Keysight Techno... Details RP-230244 approvedRAN#99TSG WG RAN517.6.0TEI10_Test
See details 36.521-15437-F17.5.0Rel-17Editorial: References correction in additional spurious for CA minimum requirements Details R5-231242 revisedRAN5#98Keysight Techno...    TEI10_Test
See details 36.521-15427-F17.4.0Rel-17Correction to lower limit of NS_56 in 6.2.4 Details R5-227078 agreedRAN5#97Anritsu Details RP-222789 approvedRAN#98-eTSG WG RAN517.5.0TEI10_Test, L_B...
See details 36.521-15420-F17.3.0Rel-17Update of CA name release mapping Details R5-225120 agreedRAN5#96-eROHDE & SCHWARZ Details RP-221996 approvedRAN#97-eTSG WG RAN517.4.0TEI10_Test
See details 36.521-15406-F17.2.0Rel-17Update to test applicability for 4G test caes without UL CA Details R5-222693 agreedRAN5#95-eBureau Veritas Details RP-221114 approvedRAN#96TSG WG RAN517.3.0TEI10_Test
See details 36.521-15402-F17.1.0Rel-17Correction of RB allocation in LTE MPR CA test case Details R5-221364 agreedRAN5#94-eApple Portugal Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI10_Test
See details 36.521-154011F17.1.0Rel-17Correction of maximum output power for CA test case Details R5-221919 agreedRAN5#94-eROHDE & SCHWARZ Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI10_Test
See details 36.521-15401-F17.1.0Rel-17Correction of maximum output power for CA test case Details R5-221271 revisedRAN5#94-eROHDE & SCHWARZ    TEI10_Test
See details 36.521-153921F17.0.0Rel-17Update of MPR, ACLR, SEM CA test cases Details R5-218392 agreedRAN5#93-eROHDE & SCHWARZ... Details RP-212800 approvedRAN#94-eTSG WG RAN517.1.0TEI10_Test
See details 36.521-15392-F17.0.0Rel-17Update of MPR, ACLR, SEM CA test cases Details R5-217563 revisedRAN5#93-eROHDE & SCHWARZ...    TEI10_Test
See details 36.521-15382-F17.0.0Rel-17Correction to RB allocations in 6.2.3A.1, 6.6.2.1A.1, 6.6.2.3A.1 Details R5-217425 withdrawnRAN5#93-eAnritsu    TEI10_Test
See details 36.521-153491F16.9.0Rel-16Update of MPR, ACLR, SEM CA test cases Details R5-216005 agreedRAN5#92-eROHDE & SCHWARZ Details RP-211737 approvedRAN#93-eTSG WG RAN516.10.0TEI10_Test
See details 36.521-15349-F16.9.0Rel-16Update of MPR, ACLR, SEM CA test cases Details R5-215483 revisedRAN5#92-eROHDE & SCHWARZ    TEI10_Test
See details 36.521-15228-F16.6.0Rel-16Correction of UL allocations for In-band emissions TC 6.5.2A.3.1 Details R5-205848 agreedRAN5#89-eAnritsu Details RP-202248 approvedRAN#90-eTSG WG RAN516.7.0TEI10_Test
See details 36.521-15117-F16.4.0Rel-16Skipping 2Rx REFSENS testing on bands where UE support 4Rx Details R5-202047 agreedRAN5#87-eCAICT Details RP-200594 approvedRAN#88-eTSG WG RAN516.5.0TEI10_Test
See details 36.521-150931F16.4.0Rel-16Update to NS_05 Requirements Details R5-202794 agreedRAN5#87-eRohde & Schwarz Details RP-200594 approvedRAN#88-eTSG WG RAN516.5.0TEI10_Test
See details 36.521-15093-F16.4.0Rel-16Update to NS_05 Requirements Details R5-201832 revisedRAN5#87-eRohde & Schwarz    TEI10_Test
See details 36.521-15092-F16.4.0Rel-16Update of inband blocking requirements Details R5-201831 agreedRAN5#87-eRohde & Schwarz Details RP-200594 approvedRAN#88-eTSG WG RAN516.5.0TEI10_Test
See details 36.521-150541F16.2.1Rel-16Update to SEM and additional spurious emissions LTE CA 41C Details R5-199559 agreedRAN5#85Qualcomm commun... Details RP-192482 approvedRAN#86TSG WG RAN516.3.0TEI10_Test, LTE...
See details 36.521-15054-F16.2.1Rel-16Update to SEM and additional spurious emissions LTE CA 41C Details R5-198758 revisedRAN5#85Qualcomm commun...    LTE_CA-UEConTes...
See details 36.521-15000-F16.1.0Rel-16Updating test case 6.6.1A.4 Details R5-196863 agreedRAN5#84Intel Details RP-191706 approvedRAN#85TSG WG RAN516.2.0TEI10_Test
See details 36.521-14999-F16.1.0Rel-16Updating test case 6.2.4A.2_2 Details R5-196861 agreedRAN5#84Intel Details RP-191706 approvedRAN#85TSG WG RAN516.2.0TEI10_Test
See details 36.521-14852-F16.0.0Rel-16Updating test case 8.7.2.1 Details R5-194600 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14833-F16.0.0Rel-16Updating test case 6.5.2A.3.4 Details R5-194540 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-148321F16.0.0Rel-16Updating test case 6.5.2A.3.2 Details R5-195111 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14832-F16.0.0Rel-16Updating test case 6.5.2A.3.2 Details R5-194538 revisedRAN5#83Intel Corporati...    TEI10_Test
See details 36.521-14831-F16.0.0Rel-16Updating test case 6.5.2A.1.2_1 Details R5-194536 withdrawnRAN5#83Intel Corporati...    TEI10_Test
See details 36.521-14830-F16.0.0Rel-16Updating test case 6.5.2A.1.1_2 Details R5-194534 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14829-F16.0.0Rel-16Updating test case 6.5.2A.1.1_1 Details R5-194532 withdrawnRAN5#83Intel Corporati...    TEI10_Test
See details 36.521-14828-F16.0.0Rel-16Updating test case 6.2.4A.2_2 Details R5-194531 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14827-F16.0.0Rel-16Updating test case 6.2.4A.2_1 Details R5-194527 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14826-F16.0.0Rel-16Updating test case 6.2.4A.2 Details R5-194525 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-148251F16.0.0Rel-16Correcting an equation in many Tx Requirement Test Cases Details R5-195070 agreedRAN5#83Intel Corporati... Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14825-F16.0.0Rel-16Correcting an equation in many Tx Requirement Test Cases Details R5-194523 revisedRAN5#83Intel Corporati...    TEI10_Test
See details 36.521-14817-F16.0.0Rel-16Correction to NS_04 test points Details R5-194406 agreedRAN5#83ROHDE & SCHWARZ Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-14789-F16.0.0Rel-16Correction to test configuration tables for intra-contiguous 2CA Tx tests Details R5-194206 agreedRAN5#83Anritsu Details RP-190889 approvedRAN#84TSG WG RAN516.1.0TEI10_Test
See details 36.521-147331F15.4.0Rel-15Updating test case 6.2.3A.2 Details R5-192595 agreedRAN5#82Intel Corporati... Details RP-190093 approvedRAN#83TSG WG RAN515.5.0TEI10_Test
See details 36.521-14733-F15.4.0Rel-15Updating test case 6.2.3A.2 Details R5-192109 revisedRAN5#82Intel Corporati...    TEI10_Test
See details 36.521-14727-F15.4.0Rel-15Update to test cases 6.2.2_1 and 6.2.3_1 in F.3.2 Details R5-192093 agreedRAN5#82CGC Inc. Details RP-190093 approvedRAN#83TSG WG RAN515.5.0TEI10_Test
See details 36.521-14724-F15.4.0Rel-15Correction to dual layer spatial multiplexing TCs Details R5-192073 agreedRAN5#82Rohde & Schwarz Details RP-190093 approvedRAN#83TSG WG RAN515.5.0TEI10_Test, LTE...
See details 36.521-14699-F15.4.0Rel-15Correction to test requirements in A-MPR for intra-band contiguous UL CA Details R5-191780 agreedRAN5#82Anritsu Details RP-190093 approvedRAN#83TSG WG RAN515.5.0TEI10_Test
See details 36.521-14697-F15.4.0Rel-15Correction to 3DL CA Name/Release mapping table Details R5-191778 agreedRAN5#82Anritsu Details RP-190093 approvedRAN#83TSG WG RAN515.5.0TEI10_Test
See details 36.521-14682-F15.4.0Rel-15Correction to test requirements in A-MPR for intra-band contiguous UL CA Details R5-191750 withdrawnRAN5#82Anritsu    TEI10_Test
See details 36.521-14680-F15.4.0Rel-15Correction to 3DL CA Name/Release mapping table Details R5-191748 withdrawnRAN5#82Anritsu    TEI10_Test
See details 36.521-14665-F15.4.0Rel-15Editorial Correction - Alignment of CQI Index to MCS Mapping to TS 36.101 Details R5-191278 agreedRAN5#82ROHDE & SCHWARZ Details RP-190093 approvedRAN#83TSG WG RAN515.5.0TEI10_Test, LTE...
See details 36.521-146391F15.3.1Rel-15Update to test cases 7.6.1A.5 Details R5-187872 agreedRAN5#81CGC Inc. Details RP-182285 approvedRAN#82TSG WG RAN515.4.0TEI10_Test
See details 36.521-14639-F15.3.1Rel-15Update to test cases 7.6.1A.5 Details R5-187538 revisedRAN5#81CGC Inc.    TEI10_Test
See details 36.521-14637-F15.3.1Rel-15Update the parameters to test cases 7.6.1A.1, 7.6.1A.2, 7.6.1A.3 and 7.6.1A.4 Details R5-187535 agreedRAN5#81CGC Inc. Details RP-182285 approvedRAN#82TSG WG RAN515.4.0TEI10_Test
See details 36.521-14627-F15.3.1Rel-15Correction to general clause 7.1 Details R5-187364 agreedRAN5#81Rohde & Schwarz Details RP-182285 approvedRAN#82TSG WG RAN515.4.0TEI10_Test
See details 36.521-14620-F15.3.1Rel-15Correction for test procedure step 4 in TC 6.6.3.3A.1 Details R5-187347 agreedRAN5#81CETECOM GmbH Details RP-182285 approvedRAN#82TSG WG RAN515.4.0TEI10_Test
See details 36.521-14609-F15.3.1Rel-15Correction to clause 9.1.1.4.2 Details R5-187322 agreedRAN5#81TTA Details RP-182285 approvedRAN#82TSG WG RAN515.4.0TEI10_Test, LTE...
See details 36.521-145811F15.3.1Rel-15Align CA information in clause 7.3A.0 with TS36.101 v15.4.0 Details R5-187988 agreedRAN5#81Bureau Veritas Details RP-182285 approvedRAN#82TSG WG RAN515.4.0TEI10_Test
See details 36.521-14581-F15.3.1Rel-15Align CA information in clause 7.3A.0 with TS36.101 v15.4.0 Details R5-187144 revisedRAN5#81Bureau Veritas    TEI10_Test
See details 36.521-14494-F15.2.0Rel-15Correction to Reference sensitivity level for CA UL Allocation in Table 7.3A.1.4.1-1 Details R5-184991 agreedRAN5#80Intel Corporati... Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-144841F15.2.0Rel-154Rx support in some 4DL CA and 5DL CA Demodulation test cases Details R5-185186 agreedRAN5#80Ericsson Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-14484-F15.2.0Rel-154Rx support in some 4DL CA and 5DL CA Demodulation test cases Details R5-184891 revisedRAN5#80Ericsson    TEI10_Test
See details 36.521-14466-F15.2.0Rel-15Correction to Reference sensitivity level for CA UL Allocation in Table 7.3A.1.4.1-1 Details R5-184836 withdrawnRAN5#80Intel Corporati...    TEI10_Test
See details 36.521-14463-F15.2.0Rel-15Correction to Power Control for CA Test Procedure of TCs 6.3.5A.1.1, 6.3.5A.1.2 and 6.3.5A.1.4 Details R5-184812 agreedRAN5#80Intel Corporati... Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-14462-F15.2.0Rel-15Correction to Note 1 of Table 7.3A.0-0bB Reference sensitivity level for CA Details R5-184811 agreedRAN5#80Intel Corporati... Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-143621F15.2.0Rel-15Editorial correction to RMC name in PHICH demodulation test Details R5-185451 agreedRAN5#80Anritsu Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-14362-F15.2.0Rel-15Editorial correction to RMC name in PHICH demodulation test Details R5-184245 revisedRAN5#80Anritsu    TEI10_Test
See details 36.521-14285-F15.1.2Rel-15Correction of MPR for Multi Cluster PUSCH test case 6.2.3_2 Details R5-182772 agreedRAN5#79CETECOM GmbH Details RP-180722 approvedRAN#80TSG WG RAN515.2.0TEI10_Test
See details 36.521-14277-F15.1.2Rel-15Correction to TM4 4Tx Perf tests Details R5-182748 agreedRAN5#79Anritsu Details RP-180722 approvedRAN#80TSG WG RAN515.2.0TEI10_Test, LTE...
See details 36.521-14276-F15.1.2Rel-15Correction of RMC name in PHICH demodulation test Details R5-182747 agreedRAN5#79Anritsu Details RP-180722 approvedRAN#80TSG WG RAN515.2.0TEI10_Test
See details 36.521-14275-F15.1.2Rel-15Correction to eDL-MIMO RI Reporting Test Details R5-182746 agreedRAN5#79Anritsu Details RP-180722 approvedRAN#80TSG WG RAN515.2.0TEI10_Test
See details 36.521-14155-F15.1.2Rel-15Update minimum conformance requirements for B43 in Spurious emission band UE co-existence test case (editorial) Details R5-182273 agreedRAN5#79CETECOM GmbH Details RP-180722 approvedRAN#80TSG WG RAN515.2.0TEI10_Test
See details 36.521-14134-F15.0.0Rel-15Editorial Correction of DCI format in 4Rx demodulation test case Details R5-181080 agreedRAN5#78ROHDE & SCHWARZ Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-141331F15.0.0Rel-15Correction of message exceptions with zeroTxPowerResourceConfigList-r10 and zeroTxPowerSubframeConfig-r10 Details R5-181550 agreedRAN5#78ROHDE & SCHWARZ Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-14133-F15.0.0Rel-15Correction of message exceptions with zeroTxPowerResourceConfigList-r10 and zeroTxPowerSubframeConfig-r10 Details R5-181078 revisedRAN5#78ROHDE & SCHWARZ    TEI10_Test, LTE...
See details 36.521-141321F15.0.0Rel-15CSI 4RX: Correction to RI tests and used reference channels and MCS schemes Details R5-181546 agreedRAN5#78ROHDE & SCHWARZ Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-14132-F15.0.0Rel-15CSI 4RX: Correction to RI tests and used reference channels and MCS schemes Details R5-181075 revisedRAN5#78ROHDE & SCHWARZ    TEI10_Test, LTE...
See details 36.521-141311F15.0.0Rel-15Reference sensitivity adjustment due to support for 4 antenna ports Details R5-181549 agreedRAN5#78ROHDE & SCHWARZ Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-14131-F15.0.0Rel-15Reference sensitivity adjustment due to support for 4 antenna ports Details R5-181074 revisedRAN5#78ROHDE & SCHWARZ    TEI10_Test, LTE...
See details 36.521-141141F15.0.0Rel-15Correction to test case 6.6.3.1A.1 Details R5-181653 agreedRAN5#78CGC Inc. Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test
See details 36.521-14114-F15.0.0Rel-15Correction to test case 6.6.3.1A.1 Details R5-181002 revisedRAN5#78CGC Inc.    TEI10_Test
See details 36.521-14104-F15.0.0Rel-15Editorial correction to 4x4MIMIO demodulation test cases Details R5-180947 agreedRAN5#78Anritsu Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-141031F15.0.0Rel-15Correction to 4x4MIMO CSI test cases Details R5-181362 agreedRAN5#78Anritsu Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-14103-F15.0.0Rel-15Correction to 4x4MIMO CSI test cases Details R5-180946 revisedRAN5#78Anritsu    TEI10_Test, LTE...
See details 36.521-14099-F15.0.0Rel-15Correction to test configuration tables for intra-contiguous 2CA Tx tests Details R5-180942 agreedRAN5#78Anritsu Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test
See details 36.521-14060-F15.0.0Rel-15Editorial Correction – Alignment of RMC to 36.101 Details R5-180795 agreedRAN5#78ROHDE & SCHWARZ Details RP-180106 approvedRAN#79TSG WG RAN515.1.0TEI10_Test, LTE...
See details 36.521-13943-F14.4.0Rel-14Update of UL CA relative power control Details R5-176792 agreedRAN5#77Ericsson Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test
See details 36.521-13937-F14.4.0Rel-14Missed additions and corrections in TS 36.521-1 Details R5-176721 agreedRAN5#77ETSI MCC (Rohde... Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test
See details 36.521-139261F14.4.0Rel-14Correction to test case 6.2.2A.1 Details R5-177320 agreedRAN5#77CGC Inc. Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test
See details 36.521-13926-F14.4.0Rel-14Correction to test case 6.2.2A.1 Details R5-176662 revisedRAN5#77CGC Inc.    TEI10_Test
See details 36.521-13895-F14.4.0Rel-14Editorial correction of titel for 4Rx chapter 9 TCs in 36.521-2 Details R5-176556 withdrawnRAN5#77Rohde & Schwarz    TEI10_Test, LTE...
See details 36.521-13894-F14.4.0Rel-14Editorial correction of titel for 4Rx chapter 9 TCs in 36.521-1 Details R5-176555 agreedRAN5#77Rohde & Schwarz Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test, LTE...
See details 36.521-13885-F14.4.0Rel-14Correction to the test applicability for 2Rx SDR tests (36.521-1) Details R5-176507 agreedRAN5#77ANRITSU LTD Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test
See details 36.521-13882-F14.4.0Rel-14Editorial correction to 8.2.1.4.2_A.3 Details R5-176504 agreedRAN5#77ANRITSU LTD Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test
See details 36.521-13881-F14.4.0Rel-14Correction to requirement of 9.4.1.3.2_D Details R5-176503 agreedRAN5#77ANRITSU LTD Details RP-172235 approvedRAN#78TSG WG RAN514.5.0TEI10_Test