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 31 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1013810-A14.0.0Rel-14CR: On eDC demodulation performance requirements Details R4-166473 agreedRAN4#80Huawei, HiSilicon Details RP-161635 approvedRAN#73RAN414.1.0LTE_dualC_enh-Perf
See details 36.10138091F13.4.0Rel-13CR: On eDC demodulation performance requirements Details R4-167022 agreedRAN4#80Huawei, HiSilicon Details RP-161635 approvedRAN#73RAN413.5.0LTE_dualC_enh-Perf
See details 36.1013809-B13.4.0Rel-13On eDC demodulation performance requirements Details R4-166471 revisedRAN4#80Huawei, HiSilicon    LTE_dualC_enh-Perf
See details 36.10134601B13.2.1Rel-13CR: Correction of FRC for SDR test (Rel-13) Details R4-161192 agreedRAN4#78Huawei, HiSilicon Details RP-160475 approvedRAN#71MCC13.3.0LTE_dualC_enh-Perf
See details 36.1013460-F13.2.1Rel-13CR for eDC demodulation performance requirements Details R4-160774 revisedRAN4#78Huawei, HiSilicon    LTE_dualC_enh-Perf
See details 36.1334161-A14.1.0Rel-14Modifications on SSTD measurement reporting Details R4-168706 agreedRAN4#80-BISCATT Details RP-162424 approvedRAN#74RAN414.2.0LTE_dualC_enh-Perf
See details 36.1334008-A14.1.0Rel-14Corrections on DC test cases for measurements with autonomous gaps R14 Details R4-167763 agreedRAN4#80-BISHuawei, HiSilicon Details RP-162424 approvedRAN#74RAN414.2.0LTE_dualC_enh-Perf
See details 36.13340071F13.5.0Rel-13Corrections on DC test cases for measurements with autonomous gaps R13 Details R4-168675 agreedRAN4#80-BISHuawei, HiSilicon Details RP-162424 approvedRAN#74RAN413.6.0LTE_dualC_enh-Perf
See details 36.1334006-A14.1.0Rel-14Corrections on DC measurements test cases R14 Details R4-167761 agreedRAN4#80-BISHuawei, HiSilicon Details RP-162424 approvedRAN#74RAN414.2.0LTE_dualC_enh-Perf
See details 36.13340051F13.5.0Rel-13Corrections on DC measurements test cases R13 Details R4-168676 agreedRAN4#80-BISHuawei, HiSilicon Details RP-162424 approvedRAN#74RAN413.6.0LTE_dualC_enh-Perf
See details 36.1333988-F13.5.0Rel-13Modifications on SSTD measurement reporting Details R4-167509 agreedRAN4#80-BISCATT Details RP-162424 approvedRAN#74RAN413.6.0LTE_dualC_enh-Perf
See details 36.13336391B13.3.0Rel-13E-UTRAN TDD-TDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in synchronous DC Details R4-164588 agreedRAN4#79Nokia Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333639-B13.3.0Rel-13E-UTRAN TDD-TDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in synchronous DC Details R4-164153 revisedRAN4#79Nokia    LTE_dualC_enh-Perf
See details 36.13336371B13.3.0Rel-13E-UTRAN FDD-FDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in asynchronous DC Details R4-164587 agreedRAN4#79Nokia Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333637-B13.3.0Rel-13E-UTRAN FDD-FDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in asynchronous DC Details R4-164146 revisedRAN4#79Nokia    LTE_dualC_enh-Perf
See details 36.13336361B13.3.0Rel-13E-UTRAN FDD-FDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in synchronous DC Details R4-164586 agreedRAN4#79Nokia Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333636-B13.3.0Rel-13E-UTRAN FDD-FDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in synchronous DC Details R4-164144 revisedRAN4#79Nokia    LTE_dualC_enh-Perf
See details 36.1333608-B13.3.0Rel-13E-UTRAN TDD - TDD DC intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in synchronous DC Details R4-164082 agreedRAN4#79Huawei, HiSilicon Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333607-B13.3.0Rel-13E-UTRAN FDD - FDD DC intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in asynchronous DC Details R4-164081 agreedRAN4#79Huawei, HiSilicon Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333606-B13.3.0Rel-13E-UTRAN FDD - FDD DC intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in synchronous DC Details R4-164080 agreedRAN4#79Huawei, HiSilicon Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333603-B13.3.0Rel-13CR: Introduction of testing principle for different combination of duplex modes DC Details R4-164077 agreedRAN4#79Huawei, HiSilicon Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333568-B13.3.0Rel-13CR on additional test requirements for Maximum transmission timing difference for DC Details R4-163698 agreedRAN4#79NTT DOCOMO, INC. Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333567-B13.3.0Rel-13CR on activation and deactivation of known SCell for 3DL CC DC Details R4-163697 agreedRAN4#79NTT DOCOMO, INC. Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333550-B13.3.0Rel-13Dual connectivity enhancements test case : SSTD delay in non DRX Details R4-163476 agreedRAN4#79Ericsson Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333549-B13.3.0Rel-13Dual connectivity enhancements test case : SSTD delay with DRX Details R4-163475 agreedRAN4#79Ericsson Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.13335481B13.3.0Rel-13Dual connectivity enhancements test case : SSTD accuracy Details R4-164585 agreedRAN4#79Ericsson Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.1333548-B13.3.0Rel-13Dual connectivity enhancements test case : SSTD accuracy Details R4-163474 revisedRAN4#79Ericsson    LTE_dualC_enh-Perf
See details 36.13334671F13.3.0Rel-13E-UTRAN TDD-FDD Addition and Release Delay of known PSCell in Synchronous DC with PCell in TDD Details R4-163021 agreedRAN4#78-BISHuawei, HiSilicon Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.13334661F13.3.0Rel-13E-UTRAN TDD-FDD Addition and Release Delay of known PSCell in Synchronous DC with PCell in FDD Details R4-163020 agreedRAN4#78-BISHuawei, HiSilicon Details RP-161132 approvedRAN#72RAN413.4.0LTE_dualC_enh-Perf
See details 36.13333471B13.2.0Rel-13Correction to SSTD measurement accuracy and reporting range Details R4-161189 agreedRAN4#78Ericsson Details RP-160475 approvedRAN#71MCC13.3.0LTE_dualC_enh-Perf
See details 36.1333347-B13.2.0Rel-13Correction to SSTD measurement accuracy and reporting range Details R4-160955 revisedRAN4#78Ericsson    LTE_dualC_enh-Perf