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 1308 items in 7 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 31.12102671F14.5.0Rel-14Correction of wrong implementation of CR#0262 Details C6-180382 agreedCT6#89-BisComprion GmbH Details CP-182188 approvedCT#81CT614.6.0TEI14_Test
See details 31.1210267-F14.5.0Rel-14Correction of wrong implementation of CR#0262 Details C6-180342 revisedCT6#89-BisComprion GmbH    TEI14_Test
See details 31.1210266-F14.5.0Rel-14Modification of test procedures under cl. 13, and cl. 14 Details C6-180340 agreedCT6#89-BisComprion GmbH Details CP-182188 approvedCT#81CT614.6.0TEI14_Test
See details 31.12102652D14.5.0Rel-14Editorial correction to TC 13.2 and cl. 3.8 Details C6-180368 agreedCT6#89-BisComprion GmbH Details CP-182188 approvedCT#81CT614.6.0TEI14_Test
See details 31.12102651D14.5.0Rel-14Editorial correction to TC 13.2 and cl. 3.8 Details C6-180341 revisedCT6#89-BisComprion GmbH    TEI14_Test
See details 31.1210265-D14.5.0Rel-14Editorial correction to TC 13.2 Details C6-180334 revisedCT6#89-BisComprion GmbH    TEI14_Test
See details 31.12102621B14.4.0Rel-14Introduction of new test cases for user and operator controlled PLMN selector handling Details C6-180157 agreedCT6#88Comprion GmbH Details CP-181153 approvedCT#80CT614.5.0TEI14_Test
See details 31.1210262-B14.4.0Rel-14Introduction of new test cases for user and operator controlled PLMN selector handling Details C6-180119 revisedCT6#88Comprion GmbH    TEI14_Test
See details 31.1210258-F14.3.0Rel-14Correction of implementation error in applicability table Details C6-180021 revisedCT6#87Comprion GmbH    TEI14_Test
See details 31.12102562B14.2.0Rel-14Introduction of test cases for UICC interface during PSM and eDRX Details C6-170744 agreedCT6#86Comprion GmbH Details CP-173134 reissuedCT#78CT614.3.0TEI14_Test
See details 31.12102562B14.2.0Rel-14Introduction of test cases for UICC interface during PSM and eDRX Details C6-170744 agreedCT6#86Comprion GmbH Details CP-173150 approvedCT#7814.3.0TEI14_Test
See details 31.12102561B14.2.0Rel-14Introduction of test cases for UICC interface during PSM and eDRX Details C6-170726 revisedCT6#86Comprion GmbH    TEI14_Test
See details 31.1210256-B14.2.0Rel-14Introduction of test cases for UICC interface during PSM and eDRX Details C6-170642 revisedCT6#86Comprion GmbH    TEI14_Test
See details 31.12102531B14.1.0Rel-14Addition of new test case on handling non-integrity protected NAS reject messages Details C6-170518 agreedCT6#85Comprion GmbH Details CP-172065 approvedCT#77CT614.2.0TEI14_Test
See details 31.1210253-B14.1.0Rel-14Addition of new test case on handling non-integrity protected NAS reject messages Details C6-170461 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12102503F14.1.0Rel-14Correction of handling NAS reject messages Details C6-170507 agreedCT6#85Comprion GmbH Details CP-172065 approvedCT#77CT614.2.0TEI14_Test
See details 31.12102502F14.1.0Rel-14Correction of handling NAS reject messages Details C6-170502 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12102501F14.1.0Rel-14Correction of handling NAS reject messages Details C6-170477 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.1210250-F14.1.0Rel-14Correction of handling NAS reject messages Details C6-170441 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12404961B14.5.0Rel-14Introduction of new test cases for Data Connection Status Change event Details C6-180381 agreedCT6#89-BisComprion GmbH    TEI14_Test
See details 31.1240496-B14.5.0Rel-14Introduction of new test cases for Data Connection Status Change event Details C6-180333 revisedCT6#89-BisComprion GmbH    TEI14_Test
See details 31.12404951B14.5.0Rel-14Addition of new test cases for 3GPP PS Data Off Details C6-180380 agreedCT6#89-BisComprion GmbH Details CP-182188 approvedCT#81CT614.6.0TEI14_Test
See details 31.1240495-B14.5.0Rel-14Addition of new test cases for 3GPP PS Data Off Details C6-180332 revisedCT6#89-BisComprion GmbH    TEI14_Test
See details 31.1240494-F14.5.0Rel-14Addition of Terminal Response verification to Test Sequences 1.3, 1.4 and 1.5 under 27.22.7.10 Details C6-180330 agreedCT6#89-BisComprion GmbH Details CP-182188 approvedCT#81CT614.6.0TEI14_Test
See details 31.12404932B14.5.0Rel-14Addition of new test case to cl. 27.22.7.12 Details C6-180331 agreedCT6#89-BisComprion GmbH Details CP-182188 approvedCT#81CT614.6.0TEI14_Test
See details 31.12404931B14.4.0Rel-14Modification of test case 27.22.7.12 Details C6-180255 revisedCT6#89Comprion GmbH    TEI14_Test
See details 31.1240493-B14.4.0Rel-14Modification of test case 27.22.7.12 Details C6-180228 revisedCT6#89Comprion GmbH    TEI14_Test
See details 31.1240490-B14.4.0Rel-14Inclusion of Rel-14 feature indication in the terminal profile support in Annex B Details C6-180118 agreedCT6#88Comprion GmbH Details CP-181153 approvedCT#80CT614.5.0TEI14_Test
See details 31.12404891B14.4.0Rel-14Introduction of new test cases on change eCall mode Details C6-180160 agreedCT6#88Comprion GmbH, ... Details CP-181153 approvedCT#80CT614.5.0TEI14_Test
See details 31.1240489-B14.4.0Rel-14Introduction of new test cases on change eCall mode Details C6-180143 revisedCT6#88Comprion GmbH, ...    TEI14_Test
See details 31.1240489-B14.4.0Rel-14Introduction of new test cases on change eCall mode Details C6-180117 revisedCT6#88Comprion GmbH    TEI14_Test
See details 31.1240488-F14.3.0Rel-14Correction of wrong implemenation of CR 0471 Details C6-180019 revisedCT6#87Comprion GmbH    TEI14_Test
See details 31.12404871B14.3.0Rel-14Introduction of new test cases on UICC interface in PSM & eDRX Details C6-180020 revisedCT6#87Comprion GmbH    TEI14_Test
See details 31.1240487-B14.2.0Rel-14Introduction of new test cases on UICC interface in PSM Details C6-170671 revisedCT6#86Comprion GmbH    TEI14_Test
See details 31.12404861F14.2.0Rel-14Correction of applicability condition for 27.22.4.26 Details C6-170697 postponedCT6#86Comprion GmbH    TEI14_Test
See details 31.1240486-F14.2.0Rel-14Correction of applicability condition for 27.22.4.26 Details C6-170654 revisedCT6#86Comprion GmbH    TEI14_Test
See details 31.1240481-F14.2.0Rel-14Correction of wrong implemention of CR 0471 Details C6-170647 agreedCT6#86Comprion GmbH Details CP-173134 reissuedCT#78CT614.3.0TEI14_Test
See details 31.1240481-F14.2.0Rel-14Correction of wrong implemention of CR 0471 Details C6-170647 agreedCT6#86Comprion GmbH Details CP-173150 approvedCT#7814.3.0TEI14_Test
See details 31.12404765B14.2.0Rel-14Introduction of new test case for Call Control on PS PDP connection Details C6-170743 agreedCT6#86Gemalto N.V. Details CP-173134 reissuedCT#78CT614.3.0TEI14_Test
See details 31.12404765B14.2.0Rel-14Introduction of new test case for Call Control on PS PDP connection Details C6-170743 agreedCT6#86Gemalto N.V. Details CP-173150 approvedCT#7814.3.0TEI14_Test
See details 31.12404763B14.2.0Rel-14Introduction of new test case for Call Control on PS PDP connection Details C6-170643 revisedCT6#86Gemalto N.V.    TEI14_Test
See details 31.12404762B14.1.0Rel-14Introduction of new test case for Call Control on PS PDP connection Details C6-170521 revisedCT6#85Gemalto N.V.    TEI14_Test
See details 31.12404761B14.1.0Rel-14Introduction of new test case for Call Control on PS PDP connection Details C6-170485 revisedCT6#85Gemalto N.V.    TEI14_Test
See details 31.1240476-B14.1.0Rel-14Introduction of new test case for Call Control on PS PDP connection Details C6-170462 revisedCT6#85Gemalto N.V.    TEI14_Test
See details 31.12404753B14.1.0Rel-14Adding content to FFS test sequences under 27.22.10 Details C6-170506 agreedCT6#85Comprion GmbH Details CP-172065 approvedCT#77CT614.2.0TEI14_Test
See details 31.12404752B14.1.0Rel-14Adding content to FFS test sequences under 27.22.10 Details C6-170490 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12404751B14.1.0Rel-14Adding content to FFS test sequences under 27.22.10 Details C6-170471 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.1240475-B14.1.0Rel-14Adding content to FFS test sequences under 27.22.10 Details C6-170460 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12404743F14.1.0Rel-14Corrections of test case 27.22.10 Details C6-170505 agreedCT6#85Comprion GmbH Details CP-172065 approvedCT#77CT614.2.0TEI14_Test
See details 31.12404742F14.1.0Rel-14Corrections of test case 27.22.10 Details C6-170489 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12404741F14.1.0Rel-14Corrections of test case 27.22.10 Details C6-170470 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.1240474-F14.1.0Rel-14Corrections of test case 27.22.10 Details C6-170459 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.12404732B14.1.0Rel-14Introduction of new test sequences for EVENT DOWNLOAD in E-UTRAN Details C6-170504 agreedCT6#85Comprion GmbH Details CP-172065 approvedCT#77CT614.2.0TEI14_Test
See details 31.12404731B14.1.0Rel-14Introduction of new test sequences for EVENT DOWNLOAD in E-UTRAN Details C6-170476 revisedCT6#85Comprion GmbH    TEI14_Test
See details 31.1240473-B14.1.0Rel-14Introduction of new test sequences for EVENT DOWNLOAD in E-UTRAN Details C6-170455 revisedCT6#85Comprion GmbH    TEI14_Test
See details 34.1081001-F14.2.0Rel-14Removal of technical content in 34.108 v14.2.0 and substitution with pointer to the next Release Details R5-184136 agreedRAN5#80ETSI Secretariat Details RP-181583 approvedRAN#81TSG WG RAN514.3.0TEI14_Test
See details 34.1081000-F14.1.0Rel-14Removal of the redundant entries of linkage between RAB and service Details R5-182832 withdrawnRAN5#79Huawei, Hisilicon    TEI14_Test, UMT...
See details 34.1080999-F14.1.0Rel-14Removal of the redundant entries of linkage between RAB and service Details R5-182783 agreedRAN5#79Huawei, Hisilicon Details RP-180726 approvedRAN#80TSG WG RAN514.2.0TEI14_Test, UMT...
See details 34.121-11653-F14.3.0Rel-14Removal of technical content in 34.121-1 v14.3.0 and substitution with pointer to the next Release Details R5-180270 agreedRAN5#78ETSI Secretariat Details RP-180096 approvedRAN#79TSG WG RAN514.4.0TEI14_Test
See details 34.121-20177-F14.1.0Rel-14Removal of technical content in 34.121-2 v14.1.0 and substitution with pointer to the next Release Details R5-184137 agreedRAN5#80ETSI Secretariat Details RP-181583 approvedRAN#81TSG WG RAN514.2.0TEI14_Test
See details 34.123-13930-F14.5.0Rel-14Removal of technical content in 34.123-1 v14.5.0 and substitution with pointer to the next Release Details R5-184138 agreedRAN5#80ETSI Secretariat Details RP-181583 approvedRAN#81TSG WG RAN514.6.0TEI14_Test
See details 34.123-13927-F14.4.0Rel-14Editorial correction of test case title Details R5-182833 withdrawnRAN5#79Huawei, Hisilicon    TEI14_Test, UMT...
See details 34.123-13926-F14.4.0Rel-14Editorial correction of test case title Details R5-182784 agreedRAN5#79Huawei, Hisilicon Details RP-180726 approvedRAN#80TSG WG RAN514.5.0TEI14_Test, UMT...
See details 34.123-13922-F14.3.0Rel-14Updates to eDECOR test cases 12.2.1.1c and 12.4.1.1g Details R5-180867 agreedRAN5#78Ericsson Details RP-180096 approvedRAN#79TSG WG RAN514.4.0TEI14_Test, eDE...
See details 34.123-20790-F14.4.0Rel-14Removal of technical content in 34.123-2 v14.4.0 and substitution with pointer to the next Release Details R5-184139 agreedRAN5#80ETSI Secretariat Details RP-181583 approvedRAN#81TSG WG RAN514.5.0TEI14_Test
See details 34.123-33647-F14.5.0Rel-14Removal of technical content in 34.123-3 v14.5.0 and substitution with pointer to the next Release Details R5-200058 agreedRAN5#86-eETSI Secretariat Details RP-200075 approvedRAN#87-eTSG WG RAN514.6.0TEI14_Test
See details 34.123-33605-F13.3.0Rel-14Rel-14 baseline upgrade for UTRAN TTCN-3 Test Suites Details R5s170598 agreed#2017-TTCN emailMCC TF160 Details RP-171694 approvedRAN#77TSG WG RAN514.0.0TEI14_Test
See details 34.229-11527-F16.6.0Rel-16Correction of Call-Info in default messages Details R5-234300 agreedRAN5#100MCC TF160 Details RP-231689 approvedRAN#101RAN516.7.0TEI14_Test, EIE...
See details 34.229-11513-F16.4.0Rel-16Update to generic procedure C.47 Details R5-230124 agreedRAN5#98MCC TF160 Details RP-230245 approvedRAN#99TSG WG RAN516.5.0TEI14_Test, EIE...
See details 34.229-11501-F16.2.0Rel-16Correction to clause A.2.1 for EIEI test cases Details R5-224136 agreedRAN5#96-eKeysight Techno... Details RP-221996 approvedRAN#97-eTSG WG RAN516.3.0TEI14_Test, EIE...
See details 34.229-11490-F16.0.0Rel-16Update to A.2.1 for eCall over IMS Details R5-220971 agreedRAN5#94-eQualcomm Incorp... Details RP-220122 approvedRAN#95-eTSG WG RAN516.1.0TEI14_Test, EIE...
See details 34.229-114851F15.9.0Rel-15Update to clause A.2.1 Details R5-217960 agreedRAN5#93-eQualcomm Incorp... Details RP-212800 approvedRAN#94-eTSG WG RAN515.10.0TEI14_Test
See details 34.229-11485-F15.9.0Rel-15Update to clause A.2.1 Details R5-217681 revisedRAN5#93-eQualcomm Incorp...    TEI14_Test
See details 34.229-114841F15.9.0Rel-15Correction to Annexure A for eCall over IMS Details R5-217959 agreedRAN5#93-eKeysight Techno... Details RP-212800 approvedRAN#94-eTSG WG RAN515.10.0TEI14_Test
See details 34.229-11484-F15.9.0Rel-15Correction to Annexure A for eCall over IMS Details R5-217283 revisedRAN5#93-eKeysight Techno...    TEI14_Test
See details 34.229-114731F15.8.0Rel-15Correction to annex A.2.19: MO INFO for eCall over IMS Details R5-216339 agreedRAN5#92-eKeysight Techno... Details RP-211737 approvedRAN#93-eTSG WG RAN515.9.0TEI14_Test
See details 34.229-11473-F15.8.0Rel-15Correction to annex A.2.19: MO INFO for eCall over IMS Details R5-215173 revisedRAN5#92-eKeysight Techno...    TEI14_Test
See details 34.229-114721F15.8.0Rel-15Correction of EIEI test cases 21.5 and 21.6 Details R5-216338 agreedRAN5#92-eQualcomm commun... Details RP-211737 approvedRAN#93-eTSG WG RAN515.9.0TEI14_Test, EIE...
See details 34.229-11472-F15.8.0Rel-15Correction of EIEI test cases 21.5 and 21.6 Details R5-215148 revisedRAN5#92-eQualcomm commun...    TEI14_Test, EIE...
See details 34.229-11471-F15.8.0Rel-15Correction of EIEI test cases 21.5 and 21.6 Details R5-214963 withdrawnRAN5#92-eQualcomm commun...    TEI14_Test
See details 34.229-11457-F15.6.0Rel-15Clarification of conditions used in INVITE for eCall setup Details R5-210324 agreedRAN5#90-eKeysight Techno... Details RP-210166 approvedRAN#91-eTSG WG RAN515.7.0TEI14_Test, EIE...
See details 34.229-114561F15.6.0Rel-15Correction to annexure A.3.1 Details R5-211353 agreedRAN5#90-eKeysight Techno... Details RP-210166 approvedRAN#91-eTSG WG RAN515.7.0TEI14_Test, EIE...
See details 34.229-11456-F15.6.0Rel-15Correction to annexure A.3.1 Details R5-210323 revisedRAN5#90-eKeysight Techno...    TEI14_Test, EIE...
See details 34.229-11432-F15.3.0Rel-15Corrections for re-registration on V-PLMN and UTRAN Details R5-201451 withdrawnRAN5#87-eROHDE & SCHWARZ...    TEI14_Test
See details 34.229-11421-F14.7.0Rel-14Removal of technical content in 34.229-1 v14.7.0 and substitution with pointer to the next Release Details R5-200059 agreedRAN5#86-eETSI Secretariat Details RP-200075 approvedRAN#87-eTSG WG RAN514.8.0TEI14_Test
See details 34.229-11404-F15.0.0Rel-15Updated of MO MTSI voice call without preconditions test case 12.12a Details R5-196162 agreedRAN5#84Qualcomm Incorp... Details RP-191710 approvedRAN#85TSG WG RAN515.1.0TEI14_Test
See details 34.229-114001F15.0.0Rel-15Update of IMS eCall test cases 21.1 and 21.2 Details R5-197038 agreedRAN5#84Qualcomm Incorp... Details RP-191710 approvedRAN#85TSG WG RAN515.1.0TEI14_Test, EIE...
See details 34.229-11400-F15.0.0Rel-15Update of IMS eCall test cases 21.1 and 21.2 Details R5-196018 revisedRAN5#84Qualcomm Incorp...    TEI14_Test, EIE...
See details 34.229-113021F14.5.0Rel-14Update to A.2.1 for Test eCall Request-URI Details R5-192310 agreedRAN5#82Qualcomm Incorp... Details RP-190097 approvedRAN#83TSG WG RAN514.6.0TEI14_Test, EIE...
See details 34.229-11302-F14.5.0Rel-14Update to A.2.1 for Test eCall Request-URI Details R5-191102 revisedRAN5#82Qualcomm Incorp...    TEI14_Test, EIE...
See details 34.229-11294-F14.3.0Rel-14Update to A.2.1 for Test eCall Request-URI Details R5-184779 withdrawnRAN5#80Qualcomm Incorp...    TEI14_Test, EIE...
See details 34.229-11292-F14.3.0Rel-14Update to IMS eCall test cases for eCall category bit usage Details R5-184704 agreedRAN5#80Qualcomm Incorp... Details RP-181583 approvedRAN#81TSG WG RAN514.4.0TEI14_Test, EIE...
See details 34.229-112801F14.2.0Rel-14Updates to several IMS eCall test cases Details R5-183100 agreedRAN5#79MCC TF160 Details RP-180726 approvedRAN#80TSG WG RAN514.3.0TEI14_Test, EIE...
See details 34.229-11280-F14.2.0Rel-14Updates to several IMS eCall test cases Details R5-182304 revisedRAN5#79MCC TF160    TEI14_Test, EIE...
See details 34.229-112742F14.2.0Rel-14Corrections to IMS test case G.19.1 Details R5-183096 agreedRAN5#79ROHDE & SCHWARZ... Details RP-180726 approvedRAN#80TSG WG RAN514.3.0TEI14_Test, MTS...
See details 34.229-11182-F13.3.0Rel-14Addition of new XML parameters defined in Rel-14 into TC 19.1.6, 19.4.6 and 19.4.7 Details R5-174442 agreedRAN5#76NTT DOCOMO, INC. Details RP-171684 approvedRAN#77TSG WG RAN514.0.0TEI14_Test
See details 34.229-11148-F13.3.0Rel-13Addition of new XML parameters defined in Rel-14 into TC 19.1.6, 19.4.6 and 19.4.7 Details R5-173771 withdrawnRAN5#76NTT DOCOMO, INC.    TEI14_Test
See details 34.229-202981F16.0.0Rel-16Update to applicability of eCall over IMS test cases Details R5-217961 agreedRAN5#93-eQualcomm Incorp... Details RP-212800 approvedRAN#94-eTSG WG RAN516.1.0TEI14_Test, EIE...
See details 34.229-20298-F16.0.0Rel-16Update to applicability of eCall over IMS test cases Details R5-217781 revisedRAN5#93-eQualcomm Incorp...    TEI14_Test, EIE...
See details 34.229-20292-F15.7.0Rel-15Applicability updates to EIEI IMS test cases Details R5-215119 agreedRAN5#92-eQualcomm commun... Details RP-211737 approvedRAN#93-eTSG WG RAN515.8.0TEI14_Test, EIE...
See details 34.229-20269-F14.7.0Rel-14Removal of technical content in 34.229-2 v14.7.0 and substitution with pointer to the next Release Details R5-200060 agreedRAN5#86-eETSI Secretariat Details RP-200075 approvedRAN#87-eTSG WG RAN514.8.0TEI14_Test
See details 34.229-20232-F13.3.0Rel-14Update of PICS condition related to IMS emergency registration failure case in Rel-14 Details R5-174559 agreedRAN5#76NTT DOCOMO, INC. Details RP-171684 approvedRAN#77TSG WG RAN514.0.0TEI14_Test
See details 34.229-202261F13.3.0Rel-13Update of PICS condition related to IMS emergency registration failure case in Rel-14 Details R5-174470 withdrawnRAN5#76NTT DOCOMO, INC.    TEI14_Test
See details 34.229-20226-F13.3.0Rel-13Update of PICS condition related to IMS emergency registration failure case in Rel-14 Details R5-173772 revisedRAN5#76NTT DOCOMO, INC.    TEI14_Test
See details 34.229-30935-F17.3.0Rel-17Correction to function f_IMS_ECall_MIME_GetMSD_ContentId Details R5s230701 agreed#2023-TTCN emailROHDE & SCHWARZ Details RP-232834 approvedRAN#102RAN517.4.0TEI14_Test, EIE...
See details 34.229-30757-F16.3.0Rel-16Add new verified and e-mail agreed TTCN test cases in the TC lists in 34.229-3 (prose), Annex A Details R5s211694 agreed#2021-TTCN emailMCC TF160 Details RP-212799 approvedRAN#94-eTSG WG RAN516.4.0TEI14_Test, EIE...
See details 34.229-307371B16.3.0Rel-16Addition of eCall over IMS test case 21.6 Details R5s211685 agreed#2021-TTCN emailKeysight Techno... Details RP-212799 approvedRAN#94-eTSG WG RAN516.4.0TEI14_Test, EIE...
See details 34.229-30737-B16.2.0Rel-16Addition of eCall over IMS test case 21.6 Details R5s210853 revised#2021-TTCN emailKeysight Techno...    TEI14_Test, EIE...
See details 34.229-307361B16.3.0Rel-16Addition of eCall over IMS test case 21.5 Details R5s211684 agreed#2021-TTCN emailKeysight Techno... Details RP-212799 approvedRAN#94-eTSG WG RAN516.4.0TEI14_Test, EIE...
See details 34.229-30736-B16.2.0Rel-16Addition of eCall over IMS test case 21.5 Details R5s210851 revised#2021-TTCN emailKeysight Techno...    TEI14_Test, EIE...
See details 34.229-307351B16.3.0Rel-16Addition of eCall over IMS test case 21.4 Details R5s211683 agreed#2021-TTCN emailKeysight Techno... Details RP-212799 approvedRAN#94-eTSG WG RAN516.4.0TEI14_Test, EIE...
See details 34.229-30735-B16.2.0Rel-16Addition of eCall over IMS test case 21.4 Details R5s210849 revised#2021-TTCN emailKeysight Techno...    TEI14_Test, EIE...
See details 34.229-30673-F16.0.0Rel-16Add new verified and e-mail agreed TTCN test cases in the TC lists in 34.229-3 (prose), Annex A Details R5s210320 agreed#2021-TTCN emailMCC TF160 Details RP-210167 approvedRAN#91-eTSG WG RAN516.1.0TEI14_Test
See details 34.229-306601B16.0.0Rel-16Addition of eCall over IMS test case 21.2 Details R5s210318 agreed#2021-TTCN emailKeysight Techno... Details RP-210167 approvedRAN#91-eTSG WG RAN516.1.0TEI14_Test, EIE...
See details 34.229-30660-B15.6.1Rel-15Addition of eCall over IMS test case 21.2 Details R5s210011 revised#2021-TTCN emailKeysight Techno...    TEI14_Test, EIE...
See details 34.229-306591B16.0.0Rel-16Addition of eCall over IMS test case 21.1 Details R5s210317 agreed#2021-TTCN emailKeysight Techno... Details RP-210167 approvedRAN#91-eTSG WG RAN516.1.0TEI14_Test, EIE...
See details 34.229-30659-B15.6.1Rel-15Addition of eCall over IMS test case 21.1 Details R5s210009 revised#2021-TTCN emailKeysight Techno...    TEI14_Test, EIE...
See details 34.229-30649-F15.6.0Rel-15Correction to function f_WLAN_IPCAN_MainLoop Details R5s201508 agreed#2020-TTCN emailROHDE & SCHWARZ Details RP-202249 approvedRAN#90-eTSG WG RAN515.7.0TEI14_Test, MTS...
See details 34.229-30613-F14.5.0Rel-14Removal of technical content in 34.229-3 v14.5.0 and substitution with pointer to the next Release Details R5-200061 agreedRAN5#86-eETSI Secretariat Details RP-200075 approvedRAN#87-eTSG WG RAN514.6.0TEI14_Test
See details 34.229-30512-F13.3.0Rel-14Rel-14 baseline upgrade for IMS Test Suites Details R5s170600 agreed#2017-TTCN emailMCC TF160 Details RP-171692 approvedRAN#77TSG WG RAN514.0.0TEI14_Test
See details 36.5081424-F18.0.0Rel-18Correction to generic procedure of EIEI test cases with ecall only support Details R5-233152 agreedRAN5#99Qualcomm Incorp... Details RP-230972 approvedRAN#100TSG WG RAN518.1.0TEI14_Test, EIE...
See details 36.5081398-F17.2.0Rel-17Update of test frequencies for CA_46C Details R5-225109 agreedRAN5#96-eROHDE & SCHWARZ Details RP-221996 approvedRAN#97-eTSG WG RAN517.3.0TEI14_Test, LTE...
See details 36.50813851F17.1.0Rel-17Update to GNSS configuration for E-UTRA V2X Details R5-221914 agreedRAN5#94-eHuawei, HiSilicon Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI14_Test, LTE...
See details 36.5081385-F17.1.0Rel-17Update to GNSS configuration for E-UTRA V2X Details R5-220826 revisedRAN5#94-eHuawei, HiSilicon    TEI14_Test, LTE...
See details 36.5081384-F17.1.0Rel-17Correction to default AT command and information element Details R5-220620 agreedRAN5#94-eHuawei, Hisilicon Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI14_Test
See details 36.50813831F17.1.0Rel-17Reference dedicated EPS bearer contexts for MCVideo and MCData Details R5-222015 agreedRAN5#94-eMCC TF160 Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI14_Test, MCI...
See details 36.5081383-F17.1.0Rel-17Reference dedicated EPS bearer contexts for MCVideo and MCData Details R5-220459 revisedRAN5#94-eMCC TF160    TEI14_Test, MCI...
See details 36.50813711F16.9.0Rel-16Update to GNSS nominal start time for V2X testing Details R5-216003 agreedRAN5#92-eHuawei, HiSilic... Details RP-211737 approvedRAN#93-eTSG WG RAN516.10.0TEI14_Test, LTE...
See details 36.5081371-F16.9.0Rel-16Update to GNSS nominal start time for V2X testing Details R5-215108 revisedRAN5#92-eHuawei, HiSilic...    TEI14_Test, LTE...
See details 36.5081356-F16.8.0Rel-16MCPTT Packet Filter Details R5-212391 agreedRAN5#91-eMCC TF160 Details RP-211033 approvedRAN#92-eTSG WG RAN516.9.0TEI14_Test, MCP...
See details 36.5081352-F16.8.0Rel-16Change to the Geographical Area for V2X and MCS testing Details R5-212179 agreedRAN5#91-eSpirent Communi... Details RP-211033 approvedRAN#92-eTSG WG RAN516.9.0TEI14_Test
See details 36.50813491F16.7.0Rel-16Editorial for Table 6.6.2-10 Reference packet filter #9 Details R5-211506 agreedRAN5#90-eNIST Details RP-210166 approvedRAN#91-eTSG WG RAN516.8.0TEI14_Test
See details 36.5081349-F16.7.0Rel-16Editorial for Table 6.6.2-10 Reference packet filter #9 Details R5-211203 revisedRAN5#90-eNIST    TEI14_Test
See details 36.5081341-F16.7.0Rel-16MCPTT Packet Filter Details R5-210201 agreedRAN5#90-eMCC TF160 Details RP-210166 approvedRAN#91-eTSG WG RAN516.8.0TEI14_Test, MCP...
See details 36.50813401F16.7.0Rel-16Correction to emergency bearer service over S1 for eCall test cases Details R5-211505 agreedRAN5#90-eKeysight Techno... Details RP-210166 approvedRAN#91-eTSG WG RAN516.8.0TEI14_Test, EIE...
See details 36.5081340-F16.7.0Rel-16Correction to emergency bearer service over S1 for eCall test cases Details R5-210071 revisedRAN5#90-eKeysight Techno...    TEI14_Test, EIE...
See details 36.5081323-F16.5.0Rel-16Correction to USIM content for eCall over IMS test cases Details R5-203495 agreedRAN5#88-eKeysight Techno... Details RP-201466 approvedRAN#89-eTSG WG RAN516.6.0TEI14_Test
See details 36.5081247-F15.4.0Rel-15Addition of NB-IoT DCI Physical layer parameters for SC-PTM Details R5-192268 agreedRAN5#82TDIA, CATT Details RP-190097 approvedRAN#83TSG WG RAN515.5.0TEI14_Test, NB_...
See details 36.5081193-F15.2.0Rel-15Add Band 31 Test Frequencies for NB-IoT Inter-frequency Test cases Details R5-184569 agreedRAN5#80ANRITSU LTD Details RP-181583 approvedRAN#81TSG WG RAN515.3.0TEI14_Test
See details 36.50811761F15.2.0Rel-15Update Reference Table 6.6.2-1A dedicated EPS bearer contexts Details R5-185158 agreedRAN5#80FirstNet, AT&T Details RP-181583 approvedRAN#81TSG WG RAN515.3.0TEI14_Test
See details 36.5081176-F15.2.0Rel-15Update Reference Table 6.6.2-1A dedicated EPS bearer contexts Details R5-184045 revisedRAN5#80FirstNet, AT&T    TEI14_Test
See details 36.5081174-F15.1.0Rel-15Corrections to 4.5A.24 Details R5-183055 agreedRAN5#79ROHDE & SCHWARZ... Details RP-180726 approvedRAN#80TSG WG RAN515.2.0TEI14_Test, MTS...
See details 36.50811431F15.1.0Rel-15Addition of WLAN and BLE to test frequencies Details R5-183894 agreedRAN5#79Spirent Communi... Details RP-180726 approvedRAN#80TSG WG RAN515.2.0TEI14_Test, LTE...
See details 36.5081143-F15.1.0Rel-15Addition of WLAN and BLE to test frequencies Details R5-182386 revisedRAN5#79Spirent Communi...    TEI14_Test, LTE...
See details 36.5081091-F14.4.0Rel-14Removal of technical content in 36.508 v14.4.0 and substitution with pointer to the next Release Details R5-180274 agreedRAN5#78ETSI Secretariat Details RP-180096 approvedRAN#79TSG WG RAN514.5.0TEI14_Test
See details 36.5080892-F14.0.0Rel-14Correction to Band 70 test frequencies to clarify the use of two duplex spacings Details R5-171354 withdrawnRAN5#74Dish Network    TEI14_Test
See details 36.5090204-A15.2.0Rel-15Editorial updates Details R5-198153 agreedRAN5#85MCC TF160 Details RP-192486 approvedRAN#86TSG WG RAN515.3.0TEI14_Test
See details 36.5090203-F14.6.0Rel-14Editorial updates Details R5-198152 agreedRAN5#85MCC TF160 Details RP-192486 approvedRAN#86TSG WG RAN514.7.0TEI14_Test
See details 36.5090188-A14.2.0Rel-14Clarifying loop back mode operation when the RRC connection is suspended or released Details R5-180846 withdrawnRAN5#78MediaTek Inc.    NB_IOT-UEConTes...
See details 36.521-15499-F18.3.0Rel-18Update to freq error cat 1bis test procedure Details R5-241057 agreedRAN5#102Qualcomm Techno... Details RP-240223 approvedRAN#103RAN518.4.0TEI14_Test, LTE...
See details 36.521-15498-F18.3.0Rel-18Update to freq error to refer to cat 1bis refsens values table Details R5-240969 withdrawnRAN5#102Qualcomm Techno...    TEI14_Test, LTE...
See details 36.521-15488-F18.3.0Rel-18E-UTRA V2X spurious emissions MU definition up to 26GHz Details R5-240614 agreedRAN5#102Keysight Techno... Details RP-240223 approvedRAN#103RAN518.4.0TEI14_Test, LTE...
See details 36.521-15482-F18.2.0Rel-18Addition of CA_5B-66A-66A to 7.3A.9 Details R5-236798 withdrawnRAN5#101Anritsu, Eurofi...    TEI14_Test, LTE...
See details 36.521-154811F18.2.0Rel-18Correction to test configuration for 4DL CA combos in 7.3A.9 Details R5-237303 withdrawnRAN5#101Anritsu    TEI14_Test, LTE...
See details 36.521-15481-F18.2.0Rel-18Correction to test configuration for 4DL CA combos in 7.3A.9 Details R5-236797 revisedRAN5#101Anritsu    TEI14_Test, LTE...
See details 36.521-15478-F18.2.0Rel-18Adding test requirement for CA_2A-2A-5A-30A-66A, CA_2A-2A-5A-66A-66A and CA_2A-2A-12A-30A-66A in TC7.3A.10 Details R5-236528 agreedRAN5#101SRTC,Tejet,ZTE Details RP-232838 approvedRAN#102RAN518.3.0TEI14_Test, LTE...
See details 36.521-15477-F18.2.0Rel-18Adding test requirement for CA_2A-2A-5A-30A-66A, CA_2A-2A-5A-66A-66A and CA_2A-2A-12A-30A-66A in TC7.3A.10 Details R5-236527 withdrawnRAN5#101SRTC,Tejet,ZTE    TEI14_Test, LTE...
See details 36.521-15476-F18.2.0Rel-18Adding test configuration and test requirement for CA_2A-2A-66A-66A in TC7.3A.9 Details R5-236523 withdrawnRAN5#101SRTC,Tejet,ZTE    TEI14_Test, LTE...
See details 36.521-154681F18.1.0Rel-18Addition of DL RMC for Band 46 BW 10 MHz Details R5-235922 agreedRAN5#100Anritsu, Rohde ... Details RP-231689 approvedRAN#101RAN518.2.0TEI14_Test, LTE...
See details 36.521-15468-F18.1.0Rel-18Addition of DL RMC for Band 46 BW 10 MHz Details R5-234901 revisedRAN5#100Anritsu, Rohde ...    TEI14_Test, LTE...
See details 36.521-154621F18.1.0Rel-18Correction of MPR requirments for UL 256QAM Details R5-235814 agreedRAN5#100vivo, Ericsson Details RP-231689 approvedRAN#101RAN518.2.0TEI14_Test, LTE...
See details 36.521-15462-F18.1.0Rel-18Correction of MPR requirments for UL 256QAM Details R5-234158 revisedRAN5#100vivo, Ericsson    TEI14_Test, LTE...
See details 36.521-154581F18.1.0Rel-18Adding test configuration and test requirement for CA_5A-30A-66A-66A and CA_12A-30A-66A-66A in TC7.3A.9 Details R5-235810 agreedRAN5#100SRTC,ZTE,Tejet Details RP-231689 approvedRAN#101RAN518.2.0TEI14_Test, LTE...
See details 36.521-15458-F18.1.0Rel-18Adding test configuration and test requirement for CA_5A-30A-66A-66A and CA_12A-30A-66A-66A in TC7.3A.9 Details R5-233958 revisedRAN5#100SRTC,ZTE,Tejet    TEI14_Test, LTE...
See details 36.521-154571F18.1.0Rel-18Adding test configuration and test requirement for CA_2A-2A-5A-66A,CA_2A-2A-12A-66A,CA_2A-2A-30A-66A and CA_2A-5A-66A-66A in TC7.3A.9 Details R5-235805 agreedRAN5#100Tejet,ZTE,SRTC Details RP-231689 approvedRAN#101RAN518.2.0TEI14_Test, LTE...
See details 36.521-15457-F18.1.0Rel-18Adding test configuration and test requirement for CA_2A-2A-5A-66A,CA_2A-2A-12A-66A,CA_2A-2A-30A-66A and CA_2A-5A-66A-66A in TC7.3A.9 Details R5-233955 revisedRAN5#100Tejet,ZTE,SRTC    TEI14_Test, LTE...
See details 36.521-154331F17.5.0Rel-17Update Table 8.2.3.3.1.2.3-1 and Table 8.2.3.3.1.2.5-3: Minimum performance for multiple CA configurations with 3DL CCs (FRC) Details R5-231823 agreedRAN5#98SGS Wireless Details RP-230245 approvedRAN#99TSG WG RAN517.6.0TEI14_Test
See details 36.521-15433-F17.5.0Rel-17Update Table 8.2.3.3.1.2.3-1 and Table 8.2.3.3.1.2.5-3: Minimum performance for multiple CA configurations with 3DL CCs (FRC) Details R5-230453 revisedRAN5#98SGS Wireless    TEI14_Test
See details 36.521-15400-F17.1.0Rel-17Update to maximum output power for UL CA Band combo 2A-46A Details R5-221144 agreedRAN5#94-eQualcomm Tech. ... Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI14_Test, LTE...
See details 36.521-153961F17.1.0Rel-17Correction of 6.6.2.2_2 Additional Spectrum Emission Mask Details R5-221918 agreedRAN5#94-eMediaTek Inc. Details RP-220122 approvedRAN#95-eTSG WG RAN517.2.0TEI14_Test
See details 36.521-15396-F17.1.0Rel-17Correction of 6.6.2.2_2 Additional Spectrum Emission Mask Details R5-220055 revisedRAN5#94-eMediaTek Inc.    TEI14_Test
See details 36.521-15381-F17.0.0Rel-17Cleaning up description of TDD slots in V2X test cases Details R5-217400 agreedRAN5#93-eHuawei, HiSilicon Details RP-212800 approvedRAN#94-eTSG WG RAN517.1.0TEI14_Test, LTE...
See details 36.521-15380-F17.0.0Rel-17Correction to V2X OBW for intra-band multi-carrier Details R5-217399 agreedRAN5#93-eHuawei, HiSilicon Details RP-212800 approvedRAN#94-eTSG WG RAN517.1.0TEI14_Test, LTE...
See details 36.521-15379-F17.0.0Rel-17Removing R15 V2X requirements Details R5-217398 agreedRAN5#93-eHuawei, HiSilic... Details RP-212800 approvedRAN#94-eTSG WG RAN517.1.0TEI14_Test, LTE...
See details 36.521-15347-F16.9.0Rel-16Update to V2X test cases Details R5-215374 agreedRAN5#92-eBureau Veritas,... Details RP-211737 approvedRAN#93-eTSG WG RAN516.10.0TEI14_Test, LTE...
See details 36.521-15274-F16.7.0Rel-16Update for Band 48 in test case 6.2.2 Details R5-211257 agreedRAN5#90-eROHDE & SCHWARZ Details RP-210166 approvedRAN#91-eTSG WG RAN516.8.0TEI14_Test, LTE...
See details 36.521-15232-F16.6.0Rel-16Clarification of V2X spurious emission measurement method Details R5-205903 agreedRAN5#89-eHuawei, HiSilicon Details RP-202248 approvedRAN#90-eTSG WG RAN516.7.0TEI14_Test, LTE...
See details 36.521-15231-F16.6.0Rel-16Cleanning up of V2X test configurations Details R5-205902 agreedRAN5#89-eHuawei, HiSilicon Details RP-202248 approvedRAN#90-eTSG WG RAN516.7.0TEI14_Test, LTE...
See details 36.521-15230-F16.6.0Rel-16Alignment of V2X A-MPR, A-SEM and A-SE Details R5-205901 agreedRAN5#89-eHuawei, HiSilicon Details RP-202248 approvedRAN#90-eTSG WG RAN516.7.0TEI14_Test, LTE...
See details 36.521-15229-F16.6.0Rel-16Update of V2X MOP and MPR test cases Details R5-205899 agreedRAN5#89-eHuawei, HiSilicon Details RP-202248 approvedRAN#90-eTSG WG RAN516.7.0TEI14_Test, LTE...
See details 36.521-15219-F16.6.0Rel-16Editorial, wrong references in test case 6.3.5EC Power Control for UE category M2 Details R5-205549 agreedRAN5#89-eEricsson Details RP-202248 approvedRAN#90-eTSG WG RAN516.7.0TEI14_Test
See details 36.521-151751F16.5.0Rel-16Cleaning up of V2X RB allocation for multi-carrier operation Details R5-204843 agreedRAN5#88-eHuawei, HiSilicon Details RP-201466 approvedRAN#89-eTSG WG RAN516.6.0TEI14_Test, LTE...
See details 36.521-15175-F16.5.0Rel-16Cleaning up of V2X RB allocation for multi-carrier operation Details R5-203985 revisedRAN5#88-eHuawei, HiSilicon    TEI14_Test, LTE...
See details 36.521-151741F16.5.0Rel-16Cleaning up of V2X RB allocation for simultaneous transmission Details R5-204842 agreedRAN5#88-eHuawei, HiSilicon Details RP-201466 approvedRAN#89-eTSG WG RAN516.6.0TEI14_Test, LTE...
See details 36.521-15174-F16.5.0Rel-16Cleaning up of V2X RB allocation for simultaneous transmission Details R5-203984 revisedRAN5#88-eHuawei, HiSilicon    TEI14_Test, LTE...
See details 36.521-151731F16.5.0Rel-16Cleaning up of V2X RB allocation for non-concurrent transmission Details R5-204841 agreedRAN5#88-eHuawei, HiSilicon Details RP-201466 approvedRAN#89-eTSG WG RAN516.6.0TEI14_Test, LTE...
See details 36.521-15173-F16.5.0Rel-16Cleaning up of V2X RB allocation for non-concurrent transmission Details R5-203983 revisedRAN5#88-eHuawei, HiSilicon    TEI14_Test, LTE...
See details 36.521-15154-F16.5.0Rel-16Cleanup in test case 7.3EC, Reference sensitivity level for UE category M2 Details R5-203738 agreedRAN5#88-eEricsson Details RP-201466 approvedRAN#89-eTSG WG RAN516.6.0TEI14_Test
See details 36.521-15139-F16.5.0Rel-16Addition of B34 into UE Category 1bis and update B41 UE Category 1bis Details R5-203335 agreedRAN5#88-eCMCC Details RP-201466 approvedRAN#89-eTSG WG RAN516.6.0TEI14_Test
See details 36.521-151241F16.4.0Rel-16Updated to NB-IOT TC 6.2.3FA Details R5-202796 agreedRAN5#87-eHuawei, HiSilic... Details RP-200597 approvedRAN#88-eTSG WG RAN516.5.0TEI14_Test, NB_...
See details 36.521-15124-F16.4.0Rel-16Updated to NB-IOT TC 6.2.3FA Details R5-202191 revisedRAN5#87-eHuawei, HiSilic...    TEI14_Test, NB_...
See details 36.521-151231F16.4.0Rel-16Adding NB-IOT ACLR for PC6 Details R5-202795 agreedRAN5#87-eHuawei, HiSilic... Details RP-200597 approvedRAN#88-eTSG WG RAN516.5.0TEI14_Test, NB_...
See details 36.521-15123-F16.4.0Rel-16Adding NB-IOT ACLR for PC6 Details R5-202189 revisedRAN5#87-eHuawei, HiSilic...    TEI14_Test, NB_...
See details 36.521-15115-F16.4.0Rel-16Cleanup in category M2 test cases Details R5-201928 agreedRAN5#87-eEricsson Details RP-200597 approvedRAN#88-eTSG WG RAN516.5.0TEI14_Test
See details 36.521-151141F16.4.0Rel-16Addition of B40 into UE Category 1bis and Addition of Power Class 2 into B41 UE Category 1bis Details R5-202935 agreedRAN5#87-eCMCC Details RP-200597 approvedRAN#88-eTSG WG RAN516.5.0TEI14_Test
See details 36.521-15114-F16.4.0Rel-16Addition of B40 into UE Category 1bis and Addition of Power Class 2 into B41 UE Category 1bis Details R5-201927 revisedRAN5#87-eCMCC    TEI14_Test
See details 36.521-146341F15.3.1Rel-15Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission Details R5-187992 agreedRAN5#81Intel Corporati... Details RP-182289 approvedRAN#82TSG WG RAN515.4.0TEI14_Test
See details 36.521-14634-F15.3.1Rel-15Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission Details R5-187488 revisedRAN5#81Intel Corporati...    TEI14_Test
See details 36.521-14540-F15.3.1Rel-15Update 6.2.4G.1 the V2V AMPR test case to remove brackets and add Power Class 2 Details R5-187004 agreedRAN5#81Huawei, HiSilicon Details RP-182289 approvedRAN#82TSG WG RAN515.4.0TEI14_Test, LTE...
See details 36.521-145391F15.3.1Rel-15Alignment of 256QAM EVM Test Tolerance between LTE and NR Details R5-187991 agreedRAN5#81Intel Deutschla... Details RP-182289 approvedRAN#82TSG WG RAN515.4.0TEI14_Test