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10 items in 1 pages

		Spec #	CR #	Revision #	CR Cat	Impacted Version	Target Release	Title	WG TDoc #	CR status at WG	WG meeting ref	WG Source information	TSG TDoc #	CR status at TSG	TSG meeting ref	TSG Source information	New Version	Work Items	Remarks


		36.133	4998	1	B	14.3.0	Rel-14	Introduction of test cases for NCSG	R4-1706170	agreed	RAN4#83	Qualcomm Incorp...	RP-171264	approved	RAN#76	RAN4	14.4.0	LTE_meas_gap_en...
		36.133	4998	-	B	14.3.0	Rel-14	Introduction of test case for NCSG	R4-1705754	revised	RAN4#83	Qualcomm Incorp...						LTE_meas_gap_en...
		36.133	4997	1	B	14.3.0	Rel-14	Introduction of test cases for burst gap	R4-1706171	agreed	RAN4#83	Qualcomm Incorp...	RP-171264	approved	RAN#76	RAN4	14.4.0	LTE_meas_gap_en...
		36.133	4997	-	B	14.3.0	Rel-14	Introduction of test case for Burst gap	R4-1705753	revised	RAN4#83	Qualcomm Incorp...						LTE_meas_gap_en...
		36.133	4858	-	B	14.3.0	Rel-14	CR on NCSG for TDD-TDD inter-frequency measurements	R4-1704720	noted	RAN4#83	Intel Corporation						LTE_meas_gap_en...
		36.133	4857	-	B	14.3.0	Rel-14	CR on per-CC measurement gap for TDD-TDD inter-frequency measurements	R4-1704719	noted	RAN4#83	Intel Corporation						LTE_meas_gap_en...
		36.133	4856	-	B	14.3.0	Rel-14	CR on NCSG for FDD-FDD inter-frequency measurements	R4-1704718	noted	RAN4#83	Intel Corporation						LTE_meas_gap_en...
		36.133	4855	-	B	14.3.0	Rel-14	CR on per-CC measurement gap for FDD-FDD inter-frequency measurements	R4-1704717	noted	RAN4#83	Intel Corporation						LTE_meas_gap_en...
		36.133	4854	-	B	14.3.0	Rel-14	CR on reduced MGL test case for TDD-TDD	R4-1704716	revised	RAN4#83	Intel Corporation						LTE_meas_gap_en...
		36.133	4853	-	B	14.3.0	Rel-14	CR on reduced MGL test case for FDD-FDD	R4-1704715	revised	RAN4#83	Intel Corporation						LTE_meas_gap_en...