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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.1334146-A18.4.0Rel-18(NR_RRM_enh-Perf) corrections for FR2 inter-band SCell activation TC – R18 Details R4-2401462 agreedRAN4#110Nokia, Nokia Sh... Details RP-240575 approvedRAN#103RAN418.5.0NR_RRM_enh-Perf
See details 38.1334145-A17.12.0Rel-17(NR_RRM_enh-Perf) corrections for FR2 inter-band SCell activation TC – R17 Details R4-2401461 agreedRAN4#110Nokia, Nokia Sh... Details RP-240575 approvedRAN#103RAN417.13.0NR_RRM_enh-Perf
See details 38.13341441F16.18.0Rel-16(NR_RRM_enh-Perf) corrections for FR2 inter-band SCell activation TC – R16 Details R4-2403421 agreedRAN4#110Nokia, Nokia Sh... Details RP-240575 approvedRAN#103RAN416.19.0NR_RRM_enh-Perf
See details 38.1334144-F16.18.0Rel-16(NR_RRM_enh-Perf) corrections for FR2 inter-band SCell activation TC – R16 Details R4-2401460 revisedRAN4#110Nokia, Nokia Sh...    NR_RRM_enh-Perf
See details 38.1334098-A18.4.0Rel-18(NR_RRM_Enh-Perf) Correction to CGI measurement test cases_R18 Details R4-2401299 agreedRAN4#110Huawei, HiSilicon Details RP-240575 approvedRAN#103RAN418.5.0NR_RRM_enh-Perf
See details 38.1334097-A17.12.0Rel-17(NR_RRM_Enh-Perf) Correction to CGI measurement test cases_R17 Details R4-2401298 agreedRAN4#110Huawei, HiSilicon Details RP-240575 approvedRAN#103RAN417.13.0NR_RRM_enh-Perf
See details 38.13340961F16.18.0Rel-16(NR_RRM_Enh-Perf) Correction to CGI measurement test cases_R16 Details R4-2403420 agreedRAN4#110Huawei, HiSilicon Details RP-240575 approvedRAN#103RAN416.19.0NR_RRM_enh-Perf
See details 38.1334096-F16.18.0Rel-16(NR_RRM_Enh-Perf) Correction to CGI measurement test cases_R16 Details R4-2401297 revisedRAN4#110Huawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1334089-A18.4.0Rel-18(NR_RRM_Enh-Perf) Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern (Rel-18) Details R4-2401136 agreedRAN4#110MediaTek inc. Details RP-240575 approvedRAN#103RAN418.5.0NR_RRM_enh-Perf
See details 38.1334088-A17.12.0Rel-17(NR_RRM_Enh-Perf) Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern (Rel-17) Details R4-2401135 agreedRAN4#110MediaTek inc. Details RP-240575 approvedRAN#103RAN417.13.0NR_RRM_enh-Perf 2G
See details 38.13340871F16.18.0Rel-16(NR_RRM_Enh-Perf) Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern (Rel-16) Details R4-2403419 agreedRAN4#110MediaTek inc. Details RP-240575 approvedRAN#103RAN416.19.0NR_RRM_enh-Perf
See details 38.1334087-F16.18.0Rel-16(NR_RRM_Enh-Perf) Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern (Rel-16) Details R4-2401134 revisedRAN4#110MediaTek inc.    NR_RRM_enh-Perf
See details 38.1333898-A18.3.0Rel-18Corrections to NR Measurements with Autonomous Gaps Details R4-2320863 agreedRAN4#109Nokia, Nokia Sh... Details RP-233341 approvedRAN#102RAN418.4.0NR_RRM_enh-Perf
See details 38.1333897-A17.11.0Rel-17Corrections to NR Measurements with Autonomous Gaps Details R4-2320862 agreedRAN4#109Nokia, Nokia Sh... Details RP-233341 approvedRAN#102RAN417.12.0NR_RRM_enh-Perf
See details 38.13338961F16.17.0Rel-16Corrections to NR Measurements with Autonomous Gaps Details R4-2321541 agreedRAN4#109Nokia, Nokia Sh... Details RP-233330 approvedRAN#102RAN416.18.0TEI16, NR_RRM_e...
See details 38.1333821-A18.3.0Rel-18[NR_RRM_Enh-Perf] CR on TCs for UE specific CBW change R18 Details R4-2320170 agreedRAN4#109Apple Details RP-233341 approvedRAN#102RAN418.4.0NR_RRM_enh-Perf
See details 38.1333820-A17.11.0Rel-17[NR_RRM_Enh-Perf] CR on TCs for UE specific CBW change R17 Details R4-2320169 agreedRAN4#109Apple Details RP-233341 approvedRAN#102RAN417.12.0NR_RRM_enh-Perf
See details 38.1333819-F16.17.0Rel-16[NR_RRM_Enh-Perf] CR on TCs for UE specific CBW change R16 Details R4-2320168 agreedRAN4#109Apple Details RP-233341 approvedRAN#102RAN416.18.0NR_RRM_enh-Perf
See details 38.1333749-A18.3.0Rel-18[NR_RRM_Enh-Perf] Correction to CGI measurement test cases_R18 Details R4-2319344 withdrawnRAN4#109Huawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1333748-A17.11.0Rel-17[NR_RRM_Enh-Perf] Correction to CGI measurement test cases_R17 Details R4-2319343 withdrawnRAN4#109Huawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1333747-F16.17.0Rel-16[NR_RRM_Enh-Perf] Correction to CGI measurement test cases_R16 Details R4-2319342 postponedRAN4#109Huawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1333678-A18.3.0Rel-18[NR_RRM_enh-Perf] CR for Spatial relation info switch test requirements - Rel18 Details R4-2318568 agreedRAN4#109Apple Details RP-233341 approvedRAN#102RAN418.4.0NR_RRM_enh-Perf
See details 38.1333677-F17.11.0Rel-17[NR_RRM_enh-Perf] CR for Spatial relation info switch test requirements - Rel17 Details R4-2318567 agreedRAN4#109Apple Details RP-233341 approvedRAN#102RAN417.12.0NR_RRM_enh-Perf
See details 38.1333671-A18.3.0Rel-18[NR_RRM_Enh-Perf] Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern R18 Details R4-2318459 agreedRAN4#109MediaTek inc. Details RP-233341 approvedRAN#102RAN418.4.0NR_RRM_enh-Perf
See details 38.1333670-A17.11.0Rel-17[NR_RRM_Enh-Perf] Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern R17 Details R4-2318458 agreedRAN4#109MediaTek inc. Details RP-233341 approvedRAN#102RAN417.12.0NR_RRM_enh-Perf
See details 38.1333669-F16.17.0Rel-16[NR_RRM_Enh-Perf] Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern R16 Details R4-2318457 agreedRAN4#109MediaTek inc. Details RP-233341 approvedRAN#102RAN416.18.0NR_RRM_enh-Perf
See details 38.1333517-A18.2.0Rel-18[NR_RRM_Enh-Perf] CR: Correction of SRS configuration for SRS carrier based switching tests Details R4-2312785 agreedRAN4#108Ericsson Details RP-232499 approvedRAN#101RAN418.3.0NR_RRM_enh-Perf
See details 38.1333516-A17.10.0Rel-17[NR_RRM_Enh-Perf] CR: Correction of SRS configuration for SRS carrier based switching tests Details R4-2312784 agreedRAN4#108Ericsson Details RP-232499 approvedRAN#101RAN417.11.0NR_RRM_enh-Perf
See details 38.13335151F16.16.0Rel-16[NR_RRM_Enh-Perf] CR: Correction of SRS configuration for SRS carrier based switching tests Details R4-2314442 agreedRAN4#108Ericsson Details RP-232499 approvedRAN#101RAN416.17.0NR_RRM_enh-Perf
See details 38.1333515-F16.16.0Rel-16[NR_RRM_Enh-Perf] CR: Correction of SRS configuration for SRS carrier based switching tests Details R4-2312783 revisedRAN4#108Ericsson    NR_RRM_enh-Perf
See details 38.1333481-A18.2.0Rel-18[NR_RRM_Enh-Perf] Correction to simultaneous BWP switching TCs_R18 Details R4-2312389 agreedRAN4#108Huawei, HiSilicon Details RP-232499 approvedRAN#101RAN418.3.0NR_RRM_enh-Perf
See details 38.1333480-A17.10.0Rel-17[NR_RRM_Enh-Perf] Correction to simultaneous BWP switching TCs_R17 Details R4-2312388 agreedRAN4#108Huawei, HiSilicon Details RP-232499 approvedRAN#101RAN417.11.0NR_RRM_enh-Perf
See details 38.1333479-F16.16.0Rel-16[NR_RRM_Enh-Perf] Correction to simultaneous BWP switching TCs_R16 Details R4-2312387 agreedRAN4#108Huawei, HiSilicon Details RP-232499 approvedRAN#101RAN416.17.0NR_RRM_enh-Perf
See details 38.1333415-A18.2.0Rel-18[NR_RRM_enh-Perf] Editorial CR for Spatial relation info switch test requirements - Rel18 Details R4-2311348 agreedRAN4#108Apple Details RP-232499 approvedRAN#101RAN418.3.0NR_RRM_enh-Perf
See details 38.1333414-A17.10.0Rel-17[NR_RRM_enh-Perf] Editorial CR for Spatial relation info switch test requirements - Rel17 Details R4-2311347 agreedRAN4#108Apple Details RP-232499 approvedRAN#101RAN417.11.0NR_RRM_enh-Perf
See details 38.1333413-F16.16.0Rel-16[NR_RRM_enh-Perf] Editorial CR for Spatial relation info switch test requirements - Rel16 Details R4-2311346 agreedRAN4#108Apple Details RP-232499 approvedRAN#101RAN416.17.0NR_RRM_enh-Perf
See details 38.1333205-A18.1.0Rel-18Correction to UE specific CBW RMCs_R18 Details R4-2308293 agreedRAN4#107Huawei, HiSilicon Details RP-231343 approvedRAN#100RAN418.2.0NR_RRM_enh-Perf
See details 38.1333204-A17.9.0Rel-17Correction to UE specific CBW RMCs_R17 Details R4-2308292 agreedRAN4#107Huawei, HiSilicon Details RP-231343 approvedRAN#100RAN417.10.0NR_RRM_enh-Perf
See details 38.13332031F16.15.0Rel-16Correction to UE specific CBW RMCs_R16 Details R4-2310108 agreedRAN4#107Huawei, HiSilicon Details RP-231343 approvedRAN#100RAN416.16.0NR_RRM_enh-Perf
See details 38.1333203-F16.15.0Rel-16Correction to UE specific CBW RMCs_R16 Details R4-2308291 revisedRAN4#107Huawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1332978-A18.0.0Rel-18Correction to CBW change TCs_R18 Details R4-2301992 agreedRAN4#106Huawei, HiSilicon Details RP-230507 approvedRAN#99RAN418.1.0NR_RRM_enh-Perf...
See details 38.13329771F17.8.0Rel-17Correction to CBW change TCs_R17 Details R4-2303156 agreedRAN4#106Huawei, HiSilicon Details RP-230507 approvedRAN#99RAN417.9.0NR_RRM_enh-Perf...
See details 38.1332977-F17.8.0Rel-17Correction to CBW change TCs_R17 Details R4-2301991 revisedRAN4#106Huawei, HiSilicon    NR_RRM_enh-Perf...
See details 38.13329761F16.14.0Rel-16Correction to CBW change TCs_R16 Details R4-2303155 agreedRAN4#106Huawei, HiSilico Details RP-230507 approvedRAN#99RAN416.15.0NR_RRM_enh-Perf
See details 38.1332976-F16.14.0Rel-16Correction to CBW change TCs_R16 Details R4-2301990 revisedRAN4#106Huawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1332705-A17.7.0Rel-1738133 Cat. A CR on SRS configuration for SRS carrier based switching Details R4-2218676 agreedRAN4#105Nokia, Nokia Sh... Details RP-223296 approvedRAN#98-eRAN417.8.0NR_RRM_enh-Perf
See details 38.1332704-F16.13.0Rel-1638133 CR on SRS configuration for SRS carrier based switching Details R4-2218675 agreedRAN4#105Nokia, Nokia Sh... Details RP-223296 approvedRAN#98-eRAN416.14.0NR_RRM_enh-Perf
See details 38.13325721F17.6.0Rel-17Big CR for 38.133 maintenance part2 (Rel-17)    Details RP-222558 approvedRAN#97-eApple17.7.0NR_RRM_enh-Core...
See details 38.1332572-F17.6.0Rel-17Big CR for 38.133 maintenance part2 (Rel-17) Details R4-2215216 agreedRAN4#104-eMCC, Apple Details RP-222027 revisedRAN#97-eRAN4 NR_RRM_enh-Core...
See details 38.13325711F16.12.0Rel-16Big CR for 38.133 maintenance part2 (Rel-16)    Details RP-222559 approvedRAN#97-eApple16.13.0NR_RRM_enh-Core...
See details 38.1332571-F16.12.0Rel-16Big CR for 38.133 maintenance part2 (Rel-16) Details R4-2215215 agreedRAN4#104-eMCC, Apple Details RP-222027 revisedRAN#97-eRAN4 NR_RRM_enh-Core...
See details 38.1332281-F17.4.0Rel-17Big CR to TS 38.133: Rel-16 WIs RRM maintenance Part 3 (Rel-17) Details R4-2207538 agreedRAN4#102-eMCC, OPPO Details RP-220339 approvedRAN#95-eRAN417.5.0NR_Mob_enh-Perf...
See details 38.1332280-F16.10.0Rel-16Big CR to TS 38.133: Rel-16 WIs RRM maintenance Part 3 (Rel-16) Details R4-2207143 agreedRAN4#102-eMCC, OPPO Details RP-220339 approvedRAN#95-eRAN416.11.0NR_Mob_enh-Perf...
See details 38.1332216-A17.2.0Rel-17Big CR to TS 38.133: Rel-16 WIs RRM maintenance Part 1 (Rel-17) Details R4-2115469 agreedRAN4#100-eMCC, OPPO Details RP-211891 approvedRAN#93-eRAN417.3.0NR_eMIMO-Core, ...
See details 38.1332215-F16.8.0Rel-16Big CR to TS 38.133: Rel-16 WIs RRM maintenance Part 1 (Rel-16) Details R4-2115468 agreedRAN4#100-eMCC, OPPO Details RP-211891 approvedRAN#93-eRAN416.9.0NR_eMIMO-Core, ...
See details 38.1332179-A17.1.0Rel-17CR on introducing RRC based Active BWP Switch on multiple CCs in EN-DC FR2 Details R4-2108238 agreedRAN4#99-eHuawei Details RP-211097 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13321781F16.7.0Rel-16CR on introducing RRC based Active BWP Switch on multiple CCs in EN-DC FR2 Details R4-2108031 agreedRAN4#99-eHuawei, HiSilicon Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1332178-F16.7.0Rel-16CR on introducing RRC based Active BWP Switch on multiple CCs in EN-DC FR2 Details R4-2108237 revisedRAN4#99-eHuawei    NR_RRM_enh-Perf
See details 38.1332147-A17.1.0Rel-17Correction to beam assumptions in FR2 tests on UL spatial relation Details R4-2111327 agreedRAN4#99-eEricsson Details RP-211098 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13321461F16.7.0Rel-16Correction to beam assumptions in FR2 tests on UL spatial relation Details R4-2108241 agreedRAN4#99-eEricsson Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1332146-F16.7.0Rel-16Correction to beam assumptions in FR2 tests on UL spatial relation Details R4-2111326 revisedRAN4#99-eEricsson    NR_RRM_enh-Perf
See details 38.1332145-A17.1.0Rel-17Correction to beam assumptions in FR2 tests on Rel-16 Mandatory gaps Details R4-2111325 agreedRAN4#99-eEricsson Details RP-211098 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13321441F16.7.0Rel-16Correction to beam assumptions in FR2 tests on Rel-16 Mandatory gaps Details R4-2108244 agreedRAN4#99-eEricsson Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1332144-F16.7.0Rel-16Correction to beam assumptions in FR2 tests on Rel-16 Mandatory gaps Details R4-2111324 revisedRAN4#99-eEricsson    NR_RRM_enh-Perf
See details 38.1332118-A17.1.0Rel-17CR on test case for RRC-based BWP switch on multiple CCs - TC3 in Rel-17 - Cat A Details R4-2111041 agreedRAN4#99-eNokia, Nokia Sh... Details RP-211098 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13321171F16.7.0Rel-16CR on test case for RRC-based BWP switch on multiple CCs - TC3 Details R4-2108030 agreedRAN4#99-eNokia, Nokia Sh... Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1332117-B16.7.0Rel-16CR on test case for RRC-based BWP switch on multiple CCs - TC3 Details R4-2111040 revisedRAN4#99-eNokia, Nokia Sh...    NR_RRM_enh-Perf
See details 38.1332005-A17.1.0Rel-17CR on maintaining SCell activation and deactication delay test for FR2 inter-band CA R17 Details R4-2110290 agreedRAN4#99-eHuawei, HiSilicon Details RP-211097 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13320041F16.7.0Rel-16CR on maintaining SCell activation and deactication delay test for FR2 inter-band CA R16 Details R4-2108252 agreedRAN4#99-eHuawei, HiSilicon Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1332004-F16.7.0Rel-16CR on maintaining SCell activation and deactication delay test for FR2 inter-band CA R16 Details R4-2110289 revisedRAN4#99-eHuawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1331948-A17.1.0Rel-17CR to 38.133 correction on SRS carrier based switching test cases Details R4-2109926 agreedRAN4#99-evivo Details RP-211097 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.1331947-F16.7.0Rel-16CR to 38.133 correction on SRS carrier based switching test cases Details R4-2109925 revisedRAN4#99-evivo    NR_RRM_enh-Perf
See details 38.1331924-A17.1.0Rel-17CR for test cases for simultaneous DCI and Timer based BWP switch on multiple CCs for NR SA Details R4-2109620 agreedRAN4#99-evivo Details RP-211097 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13319231F16.7.0Rel-16CR for test cases for simultaneous DCI and Timer based BWP switch on multiple CCs for NR SA Details R4-2108239 agreedRAN4#99-eVivo Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1331923-F16.7.0Rel-16CR for test cases for simultaneous DCI and Timer based BWP switch on multiple CCs for NR SA Details R4-2109619 revisedRAN4#99-evivo    NR_RRM_enh-Perf
See details 38.13319221F16.7.0Rel-16CR: UL spatial relation test Details R4-2108240 agreedRAN4#99-eQualcomm Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.13319211F16.7.0Rel-16CR: CGI reading test Details R4-2108243 agreedRAN4#99-eQualcomm, MediaTek Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1331907-A17.1.0Rel-17CR to introduce testcase for RRC based BWP switch on multiple CCs- SA in FR2 -R17 Details R4-2109343 agreedRAN4#99-eApple Details RP-211097 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13319062F16.7.0Rel-16CR to introduce testcase for RRC based BWP switch on multiple CCs- SA in FR2 -R16 Details R4-2108027 agreedRAN4#99-eApple Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.13319061B16.7.0Rel-16CR to introduce testcase for RRC based BWP switch on multiple CCs- SA in FR2 -R16 Details R4-2108236 revisedRAN4#99-eApple    NR_RRM_enh-Perf
See details 38.1331906-B16.7.0Rel-16CR to introduce testcase for RRC based BWP switch on multiple CCs- SA in FR2 -R16 Details R4-2109342 revisedRAN4#99-eApple    NR_RRM_enh-Perf
See details 38.1331880-A17.1.0Rel-17CR on RRC based BWP switching on multiple CCs of EN-DC for FR1 (R17) Details R4-2109241 agreedRAN4#99-eIntel Corporation Details RP-211097 approvedRAN#92-eTSG WG RAN417.2.0NR_RRM_enh-Perf
See details 38.13318791F16.7.0Rel-16CR on RRC based BWP switching on multiple CCs of EN-DC for FR1 (R16) Details R4-2108421 agreedRAN4#99-eIntel Details RP-211097 approvedRAN#92-eTSG WG RAN416.8.0NR_RRM_enh-Perf
See details 38.1331879-F16.7.0Rel-16CR on RRC based BWP switching on multiple CCs of EN-DC for FR1 (R16) Details R4-2109240 revisedRAN4#99-eIntel Corporation    NR_RRM_enh-Perf
See details 38.1331639-A17.0.0Rel-17CR on test requirements for measurement performance tests R17 Details R4-2101666 agreedRAN4#98-eHuawei, HiSilicon Details RP-210122 approvedRAN#91-eRAN417.1.0NR_RRM_enh-Perf
See details 38.1331638-A16.6.0Rel-16CR on test requirements for measurement performance tests R16 Details R4-2101665 agreedRAN4#98-eHuawei, HiSilicon Details RP-210122 approvedRAN#91-eRAN416.7.0NR_RRM_enh-Perf
See details 38.13316371F15.12.0Rel-15CR on test requirements for measurement performance tests R15 Details R4-2103494 agreedRAN4#98-eHuawei, HiSilicon Details RP-210122 approvedRAN#91-eRAN415.13.0NR_RRM_enh-Perf
See details 38.1331637-F15.12.0Rel-15CR on test requirements for measurement performance tests R15 Details R4-2101664 revisedRAN4#98-eHuawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1331636-A17.0.0Rel-17CR on maintaining Antenna configurations in TS38.133 R17 Details R4-2101663 agreedRAN4#98-eHuawei, HiSilicon Details RP-210122 approvedRAN#91-eRAN417.1.0NR_RRM_enh-Perf
See details 38.1331635-A16.6.0Rel-16CR on maintaining Antenna configurations in TS38.133 R16 Details R4-2101662 agreedRAN4#98-eHuawei, HiSilicon Details RP-210122 approvedRAN#91-eRAN416.7.0NR_RRM_enh-Perf
See details 38.13316342F15.12.0Rel-15CR on maintaining Antenna configurations in TS38.133 R15 Details R4-2104056 agreedRAN4#98-eHuawei, HiSilicon Details RP-210122 approvedRAN#91-eRAN415.13.0NR_RRM_enh-Perf
See details 38.13316341F15.12.0Rel-15CR on maintaining Antenna configurations in TS38.133 R15 Details R4-2103493 revisedRAN4#98-eHuawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1331634-F15.12.0Rel-15CR on maintaining Antenna configurations in TS38.133 R15 Details R4-2101661 revisedRAN4#98-eHuawei, HiSilicon    NR_RRM_enh-Perf
See details 38.1331600-A17.0.0Rel-17Big CR: Introduction of Rel-16 NR RRM enhancements WI performance requirements and test cases (Rel-17) Details R4-2101417 agreedRAN4#98-eIntel Corporati... Details RP-210122 approvedRAN#91-eRAN417.1.0NR_RRM_enh-Perf
See details 38.13315991B16.6.0Rel-16Big CR: Introduction of Rel-16 NR RRM enhancements WI performance requirements and test cases (Rel-16) Details R4-2103608 agreedRAN4#98-eIntel Corporati... Details RP-210122 approvedRAN#91-eRAN416.7.0NR_RRM_enh-Perf
See details 38.1331599-B16.6.0Rel-16Big CR: Introduction of Rel-16 NR RRM enhancements WI performance requirements and test cases (Rel-16) Details R4-2101416 revisedRAN4#98-eIntel Corporati...    NR_RRM_enh-Perf
See details 38.13315951B16.6.0Rel-16CR for test cases for simultaneously DCI/timer based bwp switch over mulitple CCs on FR1 in SA Details R4-2103604 withdrawnRAN4#98-evivo    NR_RRM_enh-Perf
See details 38.1331595-B16.6.0Rel-16CR for test cases for simultaneously DCI/timer based bwp switch over mulitple CCs on FR1 in SA Details R4-2101390 revisedRAN4#98-evivo    NR_RRM_enh-Perf
See details 38.1331405-A16.5.0Rel-16CR on correcting SSB and RACH configuration in CSI-RS based beam failure detection and link recovery tests Details R4-2017162 withdrawnRAN4#97-eQualcomm CDMA T...    NR_RRM_enh-Perf
See details 38.13313681B16.5.0Rel-16TC3: UE specific CBW change on FR1 NR PCell in NR SA (A.6.5.7) Details R4-2017220 endorsedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.1331368-B16.5.0Rel-16TC3: UE specific CBW change on FR1 NR PCell in NR SA (A.6.5.7) Details R4-2016169 revisedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.13313451B16.5.0Rel-16CR 38.133 TC3 MAC-CE based spatial relation info switching Details R4-2017179 endorsedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.1331345-B16.5.0Rel-16CR 38.133 TC3 MAC-CE based spatial relation info switching Details R4-2016015 revisedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.1331339-F16.5.0Rel-16RRC based spatial relation switch associated with a known DL-RS in SA Details R4-2015885 withdrawnRAN4#97-eNokia, Nokia Sh...    NR_RRM_enh-Perf
See details 38.13312431B16.5.0Rel-16Test cases for mandatory measurement gap Details R4-2017339 endorsedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.1331243-B16.5.0Rel-16Test cases for mandatory measurement gap Details R4-2015175 revisedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.13312421B16.5.0Rel-16CR to introduce interfrequency FR2 CGI reading test for SA NR (TC2) Details R4-2017195 endorsedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.1331242-B16.5.0Rel-16CR to introduce interfrequency FR2 CGI reading test for SA NR (TC2) Details R4-2015172 revisedRAN4#97-eEricsson    NR_RRM_enh-Perf
See details 38.1331207-B16.5.0Rel-16CR for test cases for simultaneously DCI/timer based bwp switch over mulitple CCs Details R4-2014838 postponedRAN4#97-evivo    NR_RRM_enh-Perf