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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.508-12799-F17.8.0Rel-17Adding uplink CA test frequencies for CA_n77(2A) Details R5-233091 agreedRAN5#99Huawei, HiSilicon Details RP-230919 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR1-UEConTest
See details 38.508-126931F17.7.0Rel-17Correction to high range reference test frequency for n66 DL CA Details R5-231867 agreedRAN5#98MediaTek Beijin... Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.508-12693-F17.7.0Rel-17Correction to high range reference test frequency for n66 DL CA Details R5-230235 revisedRAN5#98MediaTek Beijin...    NR_RF_FR1-UEConTest
See details 38.508-126751F17.6.0Rel-17Updates to determination of test frequencies for NR Intra-band Non-Contiguous CA Details R5-227892 agreedRAN5#97Keysight techno... Details RP-222745 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_FR1-UEConTest
See details 38.508-12675-F17.6.0Rel-17Updates to determination of test frequencies for NR Intra-band Non-Contiguous CA Details R5-227261 revisedRAN5#97Keysight techno...    NR_RF_FR1-UEConTest
See details 38.508-12304-F17.4.0Rel-17Editorial correction of test frequencies for CA_n77(2A) Details R5-222330 withdrawnRAN5#95-eKeysight Techno...    NR_RF_FR1-UEConTest
See details 38.508-12287-F17.3.0Rel-17Addition of Setup Diagram for RRM multicell 2x2 test cases Details R5-221292 agreedRAN5#94-eEricsson Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.508-11874-F17.0.0Rel-17Correction of test frequencies for CA_n78(2A) Details R5-212697 withdrawnRAN5#91-eEricsson    NR_RF_FR1-UEConTest
See details 38.508-116331F16.5.1Rel-16Updating message contents for Uplink carrier switching Details R5-206760 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.508-11633-F16.5.1Rel-16Updating message contents for Uplink carrier switching Details R5-206011 revisedRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.508-115991F16.5.1Rel-16Adding test frequencies for CA_n78A-n78A Details R5-206759 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.508-11599-F16.5.1Rel-16Adding test frequencies for CA_n78A-n78A Details R5-205730 revisedRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.508-115981F16.5.1Rel-16Adding test frequencies for CA_n77A-n77A Details R5-206758 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.508-11598-F16.5.1Rel-16Adding test frequencies for CA_n77A-n77A Details R5-205729 revisedRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.508-11597-F16.5.1Rel-16Adding test frequencies for CA_n78B Details R5-205728 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.508-115961F16.5.1Rel-16Adding test frequencies for CA_n40B Details R5-206757 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.508-11596-F16.5.1Rel-16Adding test frequencies for CA_n40B Details R5-205727 revisedRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.508-20350-F17.4.0Rel-17Removal of redundant condition for FR1 DL Interruptions test cases applicability Details R5-223301 agreedRAN5#95-eEricsson Details RP-221086 approvedRAN#96TSG WG RAN517.5.0NR_RF_FR1-UEConTest
See details 38.508-20342-F17.4.0Rel-17Addition of Condition for FR1 DL Interruptions test cases applicability Details R5-223184 withdrawnRAN5#95-eEricsson    NR_RF_FR1-UEConTest
See details 38.508-203161F17.3.0Rel-17Addition of Condition for FR1 DL Interruptions test cases applicability Details R5-221793 agreedRAN5#94-eEricsson Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.508-20316-F17.3.0Rel-17Addition of Condition for FR1 DL Interruptions test cases applicability Details R5-221293 revisedRAN5#94-eEricsson    NR_RF_FR1-UEConTest
See details 38.508-20157-F16.6.0Rel-16Introduction of PICS for intra-band non-contiguous CA configurations Details R5-210926 withdrawnRAN5#90-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.508-201551F16.6.0Rel-16Adding PICS for UL switching Details R5-211910 agreedRAN5#90-eHuawei, HiSilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.508-20155-F16.6.0Rel-16Adding PICS for UL switching Details R5-210744 revisedRAN5#90-eHuawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12706-F18.1.0Rel-18Correction to UL configuration for intra-band contiguous CA Details R5-241099 agreedRAN5#102Anritsu Details RP-240232 approvedRAN#103RAN518.2.0TEI16_Test, NR_...
See details 38.521-125691F18.0.0Rel-18Updating annexF MU and TT for intra-band UL CA testing Details R5-237907 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12569-F18.0.0Rel-18Updating annexF MU and TT for intra-band UL CA testing Details R5-237066 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12568-F18.0.0Rel-18Updating In-band emissions for intra-band UL CA Details R5-237064 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-125671F18.0.0Rel-18Updating carrier leakage testing for intra-band UL CA Details R5-237906 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12567-F18.0.0Rel-18Updating carrier leakage testing for intra-band UL CA Details R5-237062 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-125661F18.0.0Rel-18Updating EVM testing for intra-band UL CA Details R5-237905 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12566-F18.0.0Rel-18Updating EVM testing for intra-band UL CA Details R5-237060 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-125651F18.0.0Rel-18Updating Transmit intermodulation testing for intra-band UL CA Details R5-237632 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12565-F18.0.0Rel-18Updating Transmit intermodulation testing for intra-band UL CA Details R5-237058 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12564-F18.0.0Rel-18Updating additional spurious emissions for MIMO for n39 Details R5-237057 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-125631F18.0.0Rel-18Updating Spurious emission testing for intra-band non-contiguous CA Details R5-237904 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12563-F18.0.0Rel-18Updating Spurious emission testing for intra-band non-contiguous CA Details R5-237055 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-125621F18.0.0Rel-18Updating Frequency error for CA test case for intra-band UL CA Details R5-237631 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12562-F18.0.0Rel-18Updating Frequency error for CA test case for intra-band UL CA Details R5-237053 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-125611F18.0.0Rel-18Updating minimum output power for UL non-contiguous CA Details R5-237903 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12561-F18.0.0Rel-18Updating minimum output power for UL non-contiguous CA Details R5-237051 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-125601F18.0.0Rel-18Updating AMPR for MIMO for band n39 Details R5-237650 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12560-F18.0.0Rel-18Updating AMPR for MIMO for band n39 Details R5-237050 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-125591F18.0.0Rel-18Updating Configured output power for intra-band non-contiguous CA Details R5-237902 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.521-12559-F18.0.0Rel-18Updating Configured output power for intra-band non-contiguous CA Details R5-237048 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12428-F17.9.0Rel-17Editorial: Removing editor’s note in test case 6.3C.3.2 Details R5-235048 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.521-124271F17.9.0Rel-17Updating RB allocations in table 6.1A-1b Details R5-235821 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.521-12427-F17.9.0Rel-17Updating RB allocations in table 6.1A-1b Details R5-235047 revisedRAN5#100Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-124051F17.9.0Rel-17Correction of minimum requirement of 7.3A.0.2.2 Details R5-235641 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.521-12405-F17.9.0Rel-17Correction of minimum requirement of 7.3A.0.2.2 Details R5-234840 revisedRAN5#100Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-124041F17.9.0Rel-17Addition of intra-band non-contiguous CA to spurious emision for CA Details R5-235628 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.521-12404-F17.9.0Rel-17Addition of intra-band non-contiguous CA to spurious emision for CA Details R5-234838 revisedRAN5#100Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-124031F17.9.0Rel-17Update to 6.2A.1.1 MOP for CA Details R5-235640 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.521-12403-F17.9.0Rel-17Update to 6.2A.1.1 MOP for CA Details R5-234837 revisedRAN5#100Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12402-F17.9.0Rel-17Update to 6.3A.3.1_1 of 1Tx-2Tx UL switching for inter-band CA Details R5-234836 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.521-12310-F17.8.0Rel-17Clarification of UL Tx Switching in SA RF test case Details R5-233236 agreedRAN5#99Apple Inc Details RP-230919 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR1-UEConTest
See details 38.521-122941F17.8.0Rel-17Updating Transmit ON/OFF time mask for CA for intra-band non-contiguous CA Details R5-233515 agreedRAN5#99Huawei, HiSilicon Details RP-230919 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR1-UEConTest
See details 38.521-12294-F17.8.0Rel-17Updating Transmit ON/OFF time mask for CA for intra-band non-contiguous CA Details R5-233093 revisedRAN5#99Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12293-F17.8.0Rel-17Correction to test frequency description for intra-band UL non-contiguous CA Details R5-233092 agreedRAN5#99Huawei, HiSilicon Details RP-230919 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR1-UEConTest
See details 38.521-12181-F17.7.0Rel-17Corrections on the requirements for UE MPR for intra-band contiguous CA in FR1 Details R5-231295 agreedRAN5#98ZTE Corporation Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.521-12180-F17.7.0Rel-17Corrections on scaling factors for MPR and NS_04 SEM requirements Details R5-231291 agreedRAN5#98ZTE Corporation Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.521-12162-F17.7.0Rel-17Editorial correction to In-band blocking for Intra-band contiguous CA Details R5-231092 agreedRAN5#98Huawei, HiSilicon Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.521-12147-F17.7.0Rel-17Correction to RB allocations for intra-band contiguous CA Details R5-231075 agreedRAN5#98Huawei, HiSilicon Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.521-12146-F17.7.0Rel-17Updating test procedure of test case SEM for UL CA Details R5-231074 withdrawnRAN5#98Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-12139-F17.7.0Rel-17Clarification on applicability of intra-band CA for UE not supporting dualPA-Architecture Details R5-230973 withdrawnRAN5#98Anritsu    NR_RF_FR1-UEConTest
See details 38.521-12082-F17.7.0Rel-17FR1 - Out-of-band blocking 3DL and 4DL CA - carrier selection correction Details R5-230304 agreedRAN5#98Keysight Techno... Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.521-120711F17.7.0Rel-17Correction to RB allocation configuration for intra-band contiguous CA in Table 6.1A-1b Details R5-231637 agreedRAN5#98MediaTek Beijin... Details RP-230192 approvedRAN#99TSG WG RAN517.8.0NR_RF_FR1-UEConTest
See details 38.521-12071-F17.7.0Rel-17Correction to RB allocation configuration for intra-band contiguous CA in Table 6.1A-1b Details R5-230234 revisedRAN5#98MediaTek Beijin...    NR_RF_FR1-UEConTest
See details 38.521-12035-F17.6.1Rel-17Correction to test procedure of 7.6A.2.2 Details R5-227082 agreedRAN5#97Anritsu Details RP-222745 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_FR1-UEConTest
See details 38.521-12034-F17.6.1Rel-17Addition of intra-band CA configurations to 3CA Rx test cases Details R5-227081 agreedRAN5#97Anritsu Details RP-222745 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_FR1-UEConTest
See details 38.521-119361F17.6.1Rel-17Style correction for 6.3C.3.2 Details R5-227729 agreedRAN5#97CAICT Details RP-222745 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_FR1-UEConTest
See details 38.521-11936-F17.6.1Rel-17Style correction for 6.3C.3.2 Details R5-226287 revisedRAN5#97CAICT    NR_RF_FR1-UEConTest
See details 38.521-11898-F17.5.0Rel-17Editorial correction of common uplink configuration Details R5-225114 agreedRAN5#96-eROHDE & SCHWARZ Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.521-11884-F17.5.0Rel-17Updating MU and TT in Annex F for several time mask test cases Details R5-225078 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.521-118831F17.5.0Rel-17Updating test case 6.3A.3.1_1 Time mask for switching between two uplink carriers Details R5-225722 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.521-11883-F17.5.0Rel-17Updating test case 6.3A.3.1_1 Time mask for switching between two uplink carriers Details R5-225075 revisedRAN5#96-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-118821F17.5.0Rel-17Adding ON/OFF time mask for Tx Uplink switching testing for SUL Details R5-225721 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.521-11882-F17.5.0Rel-17Adding ON/OFF time mask for Tx Uplink switching testing for SUL Details R5-225073 revisedRAN5#96-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-118511F17.5.0Rel-17Update 6.5.3 Spur-emiss R16_17 Details R5-225720 agreedRAN5#96-eQualcomm Austri... Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.521-11851-F17.5.0Rel-17Update 6.5.3 Spur-emiss R16_17 Details R5-224898 revisedRAN5#96-eQualcomm Austri...    NR_RF_FR1-UEConTest
See details 38.521-118101F17.5.0Rel-17Correction to CA configuration in 7.4A.2 Details R5-225723 agreedRAN5#96-eAnritsu Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.521-11810-F17.5.0Rel-17Correction to CA configuration in 7.4A.2 Details R5-224627 revisedRAN5#96-eAnritsu    NR_RF_FR1-UEConTest
See details 38.521-117321F17.4.0Rel-17Correction to NS_27 in test case AMPR for MIMO Details R5-223699 agreedRAN5#95-eHuawei, Hisilicon Details RP-221086 approvedRAN#96TSG WG RAN517.5.0NR_RF_FR1-UEConTest
See details 38.521-11732-F17.4.0Rel-17Correction to NS_27 in test case AMPR for MIMO Details R5-223125 revisedRAN5#95-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-117021F17.4.0Rel-17Update 6.5.3.2 Spur-emiss R16_17 for UE co-exist Details R5-223698 agreedRAN5#95-eQualcomm Israel Ltd. Details RP-221086 approvedRAN#96TSG WG RAN517.5.0NR_RF_FR1-UEConTest
See details 38.521-11702-F17.4.0Rel-17Update 6.5.3.2 Spur-emiss R16_17 for UE co-exist Details R5-222807 revisedRAN5#95-eQualcomm Israel Ltd.    NR_RF_FR1-UEConTest
See details 38.521-11678-F17.4.0Rel-17Addition of UE co-existence requirements for band n18 to TS 38.521-1 Details R5-222655 agreedRAN5#95-eNTT DOCOMO INC.... Details RP-221086 approvedRAN#96TSG WG RAN517.5.0NR_RF_FR1-UEConTest
See details 38.521-11677-F17.4.0Rel-17Addition of UE co-existence requirements for band n18 to TS 38.521-1 Details R5-222616 withdrawnRAN5#95-eNTT DOCOMO INC.    NR_RF_FR1-UEConTest
See details 38.521-116661F17.4.0Rel-17Corrections in message exceptions and test points for FR1 test case 6.3A.4.1.1 Details R5-223697 agreedRAN5#95-eKeysight Techno... Details RP-221086 approvedRAN#96TSG WG RAN517.5.0NR_RF_FR1-UEConTest
See details 38.521-11666-F17.4.0Rel-17Corrections in message exceptions and test points for FR1 test case 6.3A.4.1.1 Details R5-222428 revisedRAN5#95-eKeysight Techno...    NR_RF_FR1-UEConTest
See details 38.521-116511F17.4.0Rel-17Test procedure correction in FR1 CA test case 7.6A.4.2 Details R5-223700 agreedRAN5#95-eKeysight Techno... Details RP-221086 approvedRAN#96TSG WG RAN517.5.0NR_RF_FR1-UEConTest
See details 38.521-11651-F17.4.0Rel-17Test procedure correction in FR1 CA test case 7.6A.4.2 Details R5-222333 revisedRAN5#95-eKeysight Techno...    NR_RF_FR1-UEConTest
See details 38.521-11615-F17.3.0Rel-17Addition of UE co-existence requirements for band n18 Details R5-221388 withdrawnRAN5#94-eNTT DOCOMO INC....    NR_RF_FR1-UEConTest
See details 38.521-11610-F17.3.0Rel-17A-MPR updates for n77 Details R5-221339 agreedRAN5#94-eVerizon Switzer... Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11589-F17.3.0Rel-17Updating Relative power control tolerance testing for intra-band CA Details R5-221130 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11588-F17.3.0Rel-17Updating FR1 Spectrum emission mask for intra-band CA test case Details R5-221128 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-115871F17.3.0Rel-17Updating FR1 ACLR for intra-band CA test case Details R5-221796 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11587-F17.3.0Rel-17Updating FR1 ACLR for intra-band CA test case Details R5-221126 revisedRAN5#94-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-115861F17.3.0Rel-17Updating Absolute power tolerance for intra-band non-contiguous CA Details R5-221795 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11586-F17.3.0Rel-17Updating Absolute power tolerance for intra-band non-contiguous CA Details R5-221124 revisedRAN5#94-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11585-F17.3.0Rel-17Updating test case 6.2A.2 MPR for intra-band non-contiguous CA Details R5-221122 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11584-F17.3.0Rel-17Updating 6.1A for intra-band contiguous CA Outer1 RB allocation Details R5-221121 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11583-F17.3.0Rel-17Updating Additional spurious emissions for UL MIMO Rel-16 onward for several bands Details R5-221120 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11582-F17.3.0Rel-17Updating UTRA ACLR for UL MIMO Rel-16 onward for NS_100 Details R5-221119 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-115811F17.3.0Rel-17Updating test case AMPR for MIMO Details R5-221794 agreedRAN5#94-eHuawei, Hisilicon Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11581-F17.3.0Rel-17Updating test case AMPR for MIMO Details R5-221118 revisedRAN5#94-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11537-F17.3.0Rel-17Updating on n74 co-existence for TS 38.521-1 Details R5-220753 agreedRAN5#94-eNTT DOCOMO INC. Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11536-F17.3.0Rel-17Updating on additional UE co-ex requirements for 2 Band UL CA Details R5-220752 agreedRAN5#94-eNTT DOCOMO INC. Details RP-220088 approvedRAN#95-eTSG WG RAN517.4.0NR_RF_FR1-UEConTest
See details 38.521-11524-F17.3.0Rel-17Addition of UE co-existence requirements for band n40 to TS 38.521-1 Details R5-220351 withdrawnRAN5#94-eNTT DOCOMO INC....    NR_RF_FR1-UEConTest
See details 38.521-11523-F17.3.0Rel-17Addition of UE co-existence requirements for band n18 to TS 38.521-1 Details R5-220350 withdrawnRAN5#94-eNTT DOCOMO INC.    NR_RF_FR1-UEConTest
See details 38.521-114541F17.2.1Rel-17Updating 6.5A.1.1 Occupied bandwidth for CA Details R5-218459 agreedRAN5#93-eHuawei, Hisilicon Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-11454-F17.2.1Rel-17Updating 6.5A.1.1 Occupied bandwidth for CA Details R5-217493 revisedRAN5#93-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11453-F17.2.1Rel-17Updating 6.3A.4.3 Aggregate power tolerance for intra-band CA Details R5-217492 agreedRAN5#93-eHuawei, Hisilicon Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-11452-F17.2.1Rel-17Updating 6.3A.4.2 Relative power tolerance for intra-band CA Details R5-217491 withdrawnRAN5#93-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-114511F17.2.1Rel-17Updating 6.3A.4.1 Absolute power tolerance for intra-band CA Details R5-218458 agreedRAN5#93-eHuawei, Hisilicon Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-11451-F17.2.1Rel-17Updating 6.3A.4.1 Absolute power tolerance for intra-band CA Details R5-217490 revisedRAN5#93-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-114501F17.2.1Rel-17Updating 6.2A.4 Configured output power for intra-band UL CA Details R5-218292 agreedRAN5#93-eHuawei, Hisilicon Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-11450-F17.2.1Rel-17Updating 6.2A.4 Configured output power for intra-band UL CA Details R5-217489 revisedRAN5#93-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-114491F17.2.1Rel-17Updating 6.2A.2 MPR for CA test case for intra-band UL CA Details R5-218457 agreedRAN5#93-eHuawei, Hisilicon Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-11449-F17.2.1Rel-17Updating 6.2A.2 MPR for CA test case for intra-band UL CA Details R5-217488 revisedRAN5#93-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11448-F17.2.1Rel-17Adding intra-band contiguous CA non-contiguous RB allocations in 6.1A Details R5-217487 agreedRAN5#93-eHuawei, Hisilicon Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-114341F17.2.1Rel-17Addition of UE co-existence requirements for band n40 to TS 38.521-1 Details R5-218456 agreedRAN5#93-eDOCOMO Communic... Details RP-212766 approvedRAN#94-eTSG WG RAN517.3.0NR_RF_FR1-UEConTest
See details 38.521-11434-F17.2.1Rel-17Addition of UE co-existence requirements for band n40 to TS 38.521-1 Details R5-217445 revisedRAN5#93-eDOCOMO Communic...    NR_RF_FR1-UEConTest
See details 38.521-113961F17.2.1Rel-17PC1.5 A-MPR n77 Details R5-218404 withdrawnRAN5#93-eVerizon Switzer...    NR_RF_FR1-UEConTest
See details 38.521-11396-F17.2.1Rel-17PC1.5 A-MPR n77 Details R5-216524 revisedRAN5#93-eVerizon Switzer...    NR_RF_FR1-UEConTest
See details 38.521-11345-F17.1.0Rel-17Updating test case 6.3A.2 Transmit OFF power for intra-band non-contiguous UL CA Details R5-215307 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11344-F17.1.0Rel-17Updating test case 6.5A.1.1 occupied bandwidth for intra-band CA Details R5-215305 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-113431F17.1.0Rel-17Updating test case 6.3A.4.3 Aggregate power tolerance for intra-band non-contiguous UL CA Details R5-216067 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11343-F17.1.0Rel-17Updating test case 6.3A.4.3 Aggregate power tolerance for intra-band non-contiguous UL CA Details R5-215303 revisedRAN5#92-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-113421F17.1.0Rel-17Updating test case 6.3A.4.2 Relative power tolerance for intra-band non-contiguous UL CA Details R5-216066 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11342-F17.1.0Rel-17Updating test case 6.3A.4.2 Relative power tolerance for intra-band non-contiguous UL CA Details R5-215301 revisedRAN5#92-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-113411F17.1.0Rel-17Updating test case 6.3A.4.1 Absolute power tolerance for intra-band non-contiguous UL CA Details R5-216065 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11341-F17.1.0Rel-17Updating test case 6.3A.4.1 Absolute power tolerance for intra-band non-contiguous UL CA Details R5-215299 revisedRAN5#92-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11340-F17.1.0Rel-17Updating NR test case 6.2A.1 MOP for intra-band non-contiguous UL CA Details R5-215298 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11339-F17.1.0Rel-17Updating the test requirement of NR test case MPR for MIMO Details R5-215297 agreedRAN5#92-eHuawei, Hisilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11319-F17.1.0Rel-17Addition of NR ACLR for intra-band CA Details R5-215080 agreedRAN5#92-eHuawei, HiSilicon Details RP-211704 approvedRAN#93-eTSG WG RAN517.2.0NR_RF_FR1-UEConTest
See details 38.521-11278-F17.0.0Rel-17Updating 6.5D.3_1.3 Additional spurious emissions for UL MIMO Rel-16 onward for NR band n1 Details R5-213100 agreedRAN5#91-eHuawei, HiSilicon Details RP-211007 approvedRAN#92-eTSG WG RAN517.1.0NR_RF_FR1-UEConTest
See details 38.521-11259-F17.0.0Rel-17Updating 6.5D.3_1.3 Additional spurious emissions for UL MIMO (Rel-16 onward) for NR band n1 Details R5-212991 withdrawnRAN5#91-eHuawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.521-11258-F17.0.0Rel-17Updating UTRA ACLR for MIMO testing for NR band n1 Details R5-212989 agreedRAN5#91-eHuawei, HiSilicon Details RP-211007 approvedRAN#92-eTSG WG RAN517.1.0NR_RF_FR1-UEConTest
See details 38.521-11257-F17.0.0Rel-17Updating 6.2D.3 A-MPR for UL MIMO for band n1 Details R5-212988 agreedRAN5#91-eHuawei, HiSilicon Details RP-211007 approvedRAN#92-eTSG WG RAN517.1.0NR_RF_FR1-UEConTest
See details 38.521-112391F17.0.0Rel-17Update of minimum conformance requirements for Occupied bandwidth for CA in TC 6.5A.1 Details R5-213995 agreedRAN5#91-eLG Electronics Details RP-211007 approvedRAN#92-eTSG WG RAN517.1.0NR_RF_FR1-UEConTest
See details 38.521-11239-F16.7.0Rel-16Update of minimum conformance requirements for Occupied bandwidth for CA in TC 6.5A.1 Details R5-212848 revisedRAN5#91-eLG Electronics    NR_RF_FR1-UEConTest
See details 38.521-11181-F16.6.0Rel-16Addition of minimum requirement for intra-band UL CA in the test case 6.4A.2 Details R5-211037 agreedRAN5#90-eKTL Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-111721F16.6.0Rel-16Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA Details R5-211804 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11172-F16.6.0Rel-16Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA Details R5-210936 revisedRAN5#90-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-111661F16.6.0Rel-16Adding MU and TT for Uplink carriers switching testing Details R5-211912 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11166-F16.6.0Rel-16Adding MU and TT for Uplink carriers switching testing Details R5-210925 revisedRAN5#90-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-111651F16.6.0Rel-16Adding NR test case-Time mask for Uplink carriers switching Details R5-211911 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11165-F16.6.0Rel-16Adding NR test case-Time mask for Uplink carriers switching Details R5-210923 revisedRAN5#90-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11164-F16.6.0Rel-16Updating test case 7.6A.4 for band n48 Details R5-210922 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11163-F16.6.0Rel-16Updating test case 7.3A.2 for CA_n79D Details R5-210921 withdrawnRAN5#90-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11162-F16.6.0Rel-16Updating test requirement of CA test cases for CA configurations including n90 Details R5-210920 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11161-F16.6.0Rel-16Updating 6.5A.3.1.0 for intra-band CA Details R5-210919 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11160-F16.6.0Rel-16Updating MOP and MPR for MIMO testing for several NR bands Details R5-210918 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-111591F16.6.0Rel-16Updating general requirements for intra-band non-contiguous CA Details R5-211805 agreedRAN5#90-eHuawei, Hisilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11159-F16.6.0Rel-16Updating general requirements for intra-band non-contiguous CA Details R5-210917 revisedRAN5#90-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11115-F16.6.0Rel-16Update MU/TT on power control for UL CA Details R5-210385 agreedRAN5#90-eGuangdong OPPO ... Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11114-F16.6.0Rel-16Add TT to power control for UL CA Details R5-210384 agreedRAN5#90-eGuangdong OPPO ... Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.521-11104-F16.5.0Rel-16Adding MU and TT for Uplink carriers switching testing Details R5-206234 withdrawnRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-110911F16.5.0Rel-16Update for 6.5A.3.1 General spurious emissions for CA Details R5-206912 agreedRAN5#89-eQUALCOMM Europe... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11091-F16.5.0Rel-16Update for 6.5A.3.1 General spurious emissions for CA Details R5-206119 revisedRAN5#89-eQUALCOMM Europe...    NR_RF_FR1-UEConTest
See details 38.521-110591F16.5.0Rel-16Updating NR test case 7.8A.2.2-Wide band Intermodulation for 3DL CA Details R5-206763 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11059-F16.5.0Rel-16Updating NR test case 7.8A.2.2-Wide band Intermodulation for 3DL CA Details R5-205749 revisedRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11058-F16.5.0Rel-16Updating Narrow band blocking for CA for band n48 Details R5-205748 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11057-F16.5.0Rel-16Updating NR test case 7.6A.2.2- In-band Blocking for 3DL CA Details R5-205746 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11056-F16.5.0Rel-16Updating NR test case 7.5A.2- Adjacent channel selectivity for 3DL CA Details R5-205745 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11055-F16.5.0Rel-16Updating NR test case 7.4A.2-Maximum input level for 3 DL CA Details R5-205743 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-110541F16.5.0Rel-16Updating NR test case REFSENS for 3DL CA Details R5-206892 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11054-F16.5.0Rel-16Updating NR test case REFSENS for 3DL CA Details R5-205741 revisedRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11052-F16.5.0Rel-16Adding NR test case-Time mask for Uplink carriers switching Details R5-205739 withdrawnRAN5#89-eHuawei, Hisilicon    NR_RF_FR1-UEConTest
See details 38.521-11051-F16.5.0Rel-16Update OBW testing for intra-band UL CA Details R5-205737 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11049-F16.5.0Rel-16Updating NR test case MPR for MIMO for several NR bands Details R5-205735 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11048-F16.5.0Rel-16Updating NR test case MOP for MIMO for several NR bands Details R5-205734 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11047-F16.5.0Rel-16Updating test configuration tables for intra-band UL CA test cases Details R5-205733 agreedRAN5#89-eHuawei, Hisilic... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11046-F16.5.0Rel-16Adding RB allocation for channel BW 70MHz Details R5-205732 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11045-F16.5.0Rel-16Introduce General requirement for CA configurations Details R5-205731 agreedRAN5#89-eHuawei, Hisilicon Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-110341F16.5.0Rel-16Update of Test case 6.3A.4.3 Details R5-206762 agreedRAN5#89-eGuangdong OPPO ... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11034-F16.5.0Rel-16Update of Test case 6.3A.4.3 Details R5-205613 revisedRAN5#89-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-110331F16.5.0Rel-16Update of Test case 6.3A.4.2 Details R5-206891 agreedRAN5#89-eGuangdong OPPO ... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11033-F16.5.0Rel-16Update of Test case 6.3A.4.2 Details R5-205603 revisedRAN5#89-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-110101F16.5.0Rel-16Update of Test case 6.3A.4.1 Details R5-206761 agreedRAN5#89-eGuangdong OPPO ... Details RP-202236 approvedRAN#90-eTSG WG RAN516.6.0NR_RF_FR1-UEConTest
See details 38.521-11010-F16.5.0Rel-16Update of Test case 6.3A.4.1 Details R5-205269 revisedRAN5#89-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-10989-F16.4.0Rel-16Update of NR test case 7.7A Spurious response for CA Details R5-204040 agreedRAN5#88-eSamsung R&D Ins... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-109881F16.4.0Rel-16Update of NR test case 7.5A Adjacent Channel selectivity for CA Details R5-204898 agreedRAN5#88-eSamsung R&D Ins... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10988-F16.4.0Rel-16Update of NR test case 7.5A Adjacent Channel selectivity for CA Details R5-204037 revisedRAN5#88-eSamsung R&D Ins...    NR_RF_FR1-UEConTest
See details 38.521-10987-F16.4.0Rel-16Updating NR test case 7.6A.3 for n48 Details R5-204035 agreedRAN5#88-eHuawei, Hisilicon Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-109571F16.4.0Rel-16Add intra-band contiguous CA to 6.3A.3 Details R5-204836 agreedRAN5#88-eGuangdong OPPO ... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10957-F16.4.0Rel-16Add intra-band contiguous CA to 6.3A.3 Details R5-203736 revisedRAN5#88-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-10956-F16.4.0Rel-16Add intra-band contiguous CA to 6.3A.2 Details R5-203735 agreedRAN5#88-eGuangdong OPPO ... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-109551F16.4.0Rel-16Add intra-band contiguous CA to 6.3A.1 Details R5-204835 agreedRAN5#88-eGuangdong OPPO ... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10955-F16.4.0Rel-16Add intra-band contiguous CA to 6.3A.1 Details R5-203734 revisedRAN5#88-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-109541F16.4.0Rel-16Introduce of new TC 6.3A.4.3 Details R5-204834 agreedRAN5#88-eGuangdong OPPO ... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10954-F16.4.0Rel-16Introduce of new TC 6.3A.4.3 Details R5-203726 revisedRAN5#88-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-109531F16.4.0Rel-16Introduce of new TC 6.3A.4.2 Details R5-204833 agreedRAN5#88-eGuangdong OPPO ... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10953-F16.4.0Rel-16Introduce of new TC 6.3A.4.2 Details R5-203723 revisedRAN5#88-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-109521F16.4.0Rel-16Introduce of new TC 6.3A.4.1 Details R5-204832 agreedRAN5#88-eGuangdong OPPO ... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10952-F16.4.0Rel-16Introduce of new TC 6.3A.4.1 Details R5-203721 revisedRAN5#88-eGuangdong OPPO ...    NR_RF_FR1-UEConTest
See details 38.521-10951-F16.4.0Rel-16Update of test case 7.6A.2.2 Inband blocking for 3DL CA Details R5-203701 agreedRAN5#88-eHuawei, Hisilicon Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-10950-F16.4.0Rel-16Update of test case 7.6A.2-Inband blocking for CA Details R5-203700 agreedRAN5#88-eHuawei, Hisilicon Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest
See details 38.521-109491F16.4.0Rel-16Adding band n48 for Blocking characteristics testing Details R5-204837 agreedRAN5#88-eHuawei, Hisilic... Details RP-201463 approvedRAN#89-eTSG WG RAN516.5.0NR_RF_FR1-UEConTest