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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.508-12070-F17.2.0Rel-17Correction to IE Table 4.6.3-169 - ServingCellConfigCommonSIB Details R5-216907 withdrawnRAN5#93-eHuawei, Hisilicon    NR_HST-UEConTest
See details 38.508-12069-F17.2.0Rel-17Correction to IE Table 4.6.3-168 - ServingCellConfigCommon Details R5-216906 withdrawnRAN5#93-eHuawei, Hisilicon    NR_HST-UEConTest
See details 38.508-12068-F17.2.0Rel-17Correction to IE Table 4.6.3-62A - HighSpeedConfig Details R5-216905 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN517.3.0NR_HST-UEConTest
See details 38.508-203251F17.4.0Rel-17Addition of PICS for NR HST RRM TCs Details R5-223721 agreedRAN5#95-eHuawei,Hisilicon Details RP-221097 approvedRAN#96TSG WG RAN517.5.0NR_HST-UEConTest
See details 38.508-20325-F17.4.0Rel-17Addition of PICS for NR HST RRM TCs Details R5-222634 revisedRAN5#95-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.508-202861F17.3.0Rel-17Addition of UE capability for maximum number of activated TCI states Details R5-221853 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN517.4.0NR_HST-UEConTest
See details 38.508-20286-F17.3.0Rel-17Addition of UE capability for maximum number of activated TCI states Details R5-220165 revisedRAN5#94-eCMCC    NR_HST-UEConTest
See details 38.508-202311F17.1.0Rel-17Addition of PICs for NR HST TCs Details R5-215943 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.508-20231-F17.1.0Rel-17Addition of PICs for NR HST TCs Details R5-215028 revisedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.508-201421F16.6.0Rel-16Addition of common ICS in A.4.3.11 for Rel-16 HST Details R5-211815 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.508-20142-F16.6.0Rel-16Addition of common ICS in A.4.3.11 for Rel-16 HST Details R5-210285 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-40921-F18.4.0Rel-18Core alignment in FR1 HST DPS Performance test cases Details R5-247410  RAN5#105Keysight Techno...    TEI16_Test, NR_...
See details 38.521-406551F17.2.1Rel-17Correction to Rel-16 NR HST DPS cases Details R5-233726 withdrawnRAN5#99MediaTek Inc.    TEI16_Test, NR_...
See details 38.521-40655-F17.2.1Rel-17Correction to Rel-16 NR HST DPS cases Details R5-232528 revisedRAN5#99MediaTek Inc.    TEI16_Test, NR_...
See details 38.521-406451F17.1.0Rel-17Update of HST DPS TCs Details R5-231698 agreedRAN5#98Rohde & Schwarz Details RP-230256 approvedRAN#99TSG WG RAN517.2.0TEI16_Test, NR_...
See details 38.521-40645-F17.1.0Rel-17Update of HST DPS TCs Details R5-230994 revisedRAN5#98Rohde & Schwarz    TEI16_Test, NR_...
See details 38.521-406441F17.1.0Rel-17Correction to test point 1-7 in 5.2.2.1.1_1 Details R5-231848 agreedRAN5#98Anritsu Details RP-230256 approvedRAN#99TSG WG RAN517.2.0TEI16_Test, NR_...
See details 38.521-40644-F17.1.0Rel-17Correction to test point 1-7 in 5.2.2.1.1_1 Details R5-230983 revisedRAN5#98Anritsu    TEI16_Test, NR_...
See details 38.521-406372F17.1.0Rel-17Clarification to Annex B.3 for HST-SFN and HST-DPS models Details R5-231986 agreedRAN5#98QUALCOMM JAPAN LLC. Details RP-230256 approvedRAN#99TSG WG RAN517.2.0TEI16_Test, NR_...
See details 38.521-406371F17.1.0Rel-17Clarification to Annex B.3 for HST-SFN and HST-DPS models Details R5-231898 revisedRAN5#98QUALCOMM JAPAN LLC.    TEI16_Test, NR_...
See details 38.521-40637-F17.1.0Rel-17Clarification to Annex B.3 for HST-SFN and HST-DPS models Details R5-230713 revisedRAN5#98QUALCOMM JAPAN LLC.    TEI16_Test, NR_...
See details 38.521-40562-F16.12.0Rel-16Correction to message exception in 5.2.3.2.10_1 Details R5-224644 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN516.13.0TEI16_Test, NR_...
See details 38.521-405461F16.11.0Rel-16Adding TT and removal of editors note in test case 5.2.3.2.10_1 Details R5-223724 agreedRAN5#95-eEricsson Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-40546-F16.11.0Rel-16Adding TT and removal of editors note in test case 5.2.3.2.10_1 Details R5-222974 revisedRAN5#95-eEricsson    NR_HST-UEConTest
See details 38.521-405451F16.11.0Rel-16Adding TT and removal of editors note in test case 5.2.3.2.9_1 Details R5-223723 agreedRAN5#95-eEricsson Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-40545-F16.11.0Rel-16Adding TT and removal of editors note in test case 5.2.3.2.9_1 Details R5-222958 revisedRAN5#95-eEricsson    NR_HST-UEConTest
See details 38.521-405441F16.11.0Rel-16Editorial, removal of editors note in test case 5.2.2.2.10_1 Details R5-223722 agreedRAN5#95-eEricsson Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-40544-F16.11.0Rel-17Editorial, removal of editors note in test case 5.2.2.2.10_1 Details R5-222957 revisedRAN5#95-eEricsson    NR_HST-UEConTest
See details 38.521-40506-F16.11.0Rel-16Update of Demod TC 5.2.3.1.10_1 4Rx FDD FR1 HST-DPS performance Details R5-222234 agreedRAN5#95-eCMCC Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-40505-F16.11.0Rel-16Update of Demod TC 5.2.3.1.9_1 4Rx FDD FR1 HST-SFN performance Details R5-222233 agreedRAN5#95-eCMCC Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-40504-F16.11.0Rel-16Update of Demod TC 5.2.3.1.1_1 4Rx FDD FR1 PDSCH mapping Type A perf for NR HST Details R5-222232 agreedRAN5#95-eCMCC, LG Electronics Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-40503-F16.11.0Rel-16Update of Demod TC 5.2.2.1.9_1 2Rx FDD FR1 HST-SFN performance Details R5-222231 agreedRAN5#95-eCMCC, Huawei, H... Details RP-221097 approvedRAN#96TSG WG RAN516.12.0NR_HST-UEConTest
See details 38.521-405021F16.10.0Rel-16Update to HST Demod test cases Details R5-221855 agreedRAN5#94-eQualcomm CDMA T... Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-40502-F16.10.0Rel-16Update to HST Demod test cases Details R5-221169 revisedRAN5#94-eQualcomm CDMA T...    NR_HST-UEConTest
See details 38.521-40490-F16.10.0Rel-16Correction to HST Demod TC 5.2.2.1.9_1 - HST-SFN Details R5-220881 withdrawnRAN5#94-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.521-40472-F16.10.0Rel-16Adding new HST test cases to 38.522 Details R5-220680 withdrawnRAN5#94-eEricsson    NR_HST-UEConTest
See details 38.521-40471-F16.10.0Rel-16Correcting applicability part of HST test cases in 38.521-4 Details R5-220678 agreedRAN5#94-eEricsson Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-404701F16.10.0Rel-16Addition of test case 5.2.3.2.10_1, 4Rx TDD FR1 HST DPS performance - 2x4 MIMO with baseline receiver for both SA and NSA Details R5-221854 agreedRAN5#94-eEricsson Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-40470-F16.10.0Rel-17Addition of test case 5.2.3.2.10_1, 4Rx TDD FR1 HST DPS performance - 2x4 MIMO with baseline receiver for both SA and NSA Details R5-220672 revisedRAN5#94-eEricsson    NR_HST-UEConTest
See details 38.521-40469-F16.10.0Rel-16Editorial change for the position of clause 5.2.3.1.9 and 5.2.3.1.10 Details R5-220664 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-40468-F16.10.0Rel-16Editorial correction for test case title in Annex F Details R5-220651 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-404661F16.10.0Rel-16Addition of HST test case 5.2.3.1.10_1 to annex F Details R5-221857 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-40466-F16.10.0Rel-16Addition of HST test case 5.2.3.1.10_1 to annex F Details R5-220637 revisedRAN5#94-eCMCC    NR_HST-UEConTest
See details 38.521-404651F16.10.0Rel-16Addition of HST test case 5.2.3.1.9_1 to annex F Details R5-221856 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-40465-F16.10.0Rel-16Addition of HST test case 5.2.3.1.9_1 to annex F Details R5-220636 revisedRAN5#94-eCMCC    NR_HST-UEConTest
See details 38.521-40464-F16.10.0Rel-16Updates to HST test case 5.2.3.1.10_1 Details R5-220635 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-40463-F16.10.0Rel-16Updates to HST test case 5.2.3.1.9_1 Details R5-220634 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN516.11.0NR_HST-UEConTest
See details 38.521-404181F16.9.0Rel-16Addition of test cases 5.2.2.2.9_1, 5.2.2.2.10_1, 5.2.3.2.9_1 to annex F Details R5-218350 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40418-F16.9.0Rel-16Addition of test cases 5.2.2.2.9_1, 5.2.2.2.10_1, 5.2.3.2.9_1 to annex F Details R5-217110 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.521-404171F16.9.0Rel-16Update of test case 5.2.3.2.1_1, 4Rx TDD FR1 PDSCH mapping Type A performance - 2x4 MIMO with baseline receiver for both SA and NSA Details R5-218466 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40417-F16.9.0Rel-16Update of test case 5.2.3.2.1_1, 4Rx TDD FR1 PDSCH mapping Type A performance - 2x4 MIMO with baseline receiver for both SA and NSA Details R5-217109 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.521-404161F16.9.0Rel-16Addition of test case 5.2.3.2.9_1, 4Rx TDD FR1 HST-SFN performance - 2x4 MIMO with baseline receiver for both SA and NSA Details R5-218349 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40416-F16.9.0Rel-16Addition of test case 5.2.3.2.9_1, 4Rx TDD FR1 HST-SFN performance - 2x4 MIMO with baseline receiver for both SA and NSA Details R5-217107 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.521-404151F16.9.0Rel-16Addition of test case 5.2.2.2.10_1, 2Rx TDD FR1 HST-DPS performance - 2x2 MIMO with baseline receiver for both SA and NSA Details R5-218348 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40415-F16.9.0Rel-16Addition of test case 5.2.2.2.10_1, 2Rx TDD FR1 HST-DPS performance - 2x2 MIMO with baseline receiver for both SA and NSA Details R5-217106 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.521-404141F16.9.0Rel-16Addition of test case 5.2.2.2.9_1, 2Rx TDD FR1 HST-SFN performance - 2x2 MIMO with baseline receiver for both SA and NSA Details R5-218347 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40414-F16.9.0Rel-16Addition of test case 5.2.2.2.9_1, 2Rx TDD FR1 HST-SFN performance - 2x2 MIMO with baseline receiver for both SA and NSA Details R5-217098 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.521-40409-F16.9.0Rel-16Correction to NR HST Demod TC 5.2.2.1.9_1 - HST-SFN Details R5-216910 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40408-F16.9.0Rel-16Addition of NR HST Demod TC 5.2.2.2.1_1 - 2Rx TDD type A Details R5-216909 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40407-F16.9.0Rel-16Addition of NR HST Demod TC 5.2.2.1.1_1 - 2Rx FDD type A Details R5-216908 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-404001F16.9.0Rel-16Addition of new test case 5.2.3.1.10_1 for NR HST Details R5-218346 agreedRAN5#93-eCMCC Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40400-F16.9.0Rel-16Addition of new test case 5.2.3.1.10_1 for NR HST Details R5-216538 revisedRAN5#93-eCMCC    NR_HST-UEConTest
See details 38.521-403991F16.9.0Rel-16Addition of new test case 5.2.3.1.9_1 for NR HST Details R5-218345 agreedRAN5#93-eCMCC Details RP-212778 approvedRAN#94-eTSG WG RAN516.10.0NR_HST-UEConTest
See details 38.521-40399-F16.9.0Rel-16Addition of new test case 5.2.3.1.9_1 for NR HST Details R5-216537 revisedRAN5#93-eCMCC    NR_HST-UEConTest
See details 38.521-40352-F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.2.1_3 2Rx TDD type A Details R5-215032 not pursuedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.521-403511F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.1.10 - HST DPS Details R5-215947 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.521-40351-F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.1.10 - HST DPS Details R5-215031 revisedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.521-403501F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.1.9 - HST SFN Details R5-215946 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.521-40350-F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.1.9 - HST SFN Details R5-215030 revisedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.521-403491F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.1.1_3 - 2Rx FDD type A Details R5-215945 not pursuedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.521-40349-F16.8.0Rel-16Addition of NR HST Demod TC 5.2.2.1.1_3 - 2Rx FDD type A Details R5-215029 revisedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.521-403451F16.8.0Rel-16Update Applicability of requirement for HST-DPS and multi-TRxP test cases Details R5-215944 agreedRAN5#92-eApple Italia S.R.L. Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.521-40345-F16.8.0Rel-16Update Applicability of requirement for HST-DPS and multi-TRxP test cases Details R5-214889 revisedRAN5#92-eApple Italia S.R.L.    NR_HST-UEConTest
See details 38.521-402741F16.6.0Rel-16Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1 Details R5-211816 agreedRAN5#90-eLG Electronics Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40274-F16.6.0Rel-16Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1 Details R5-210418 revisedRAN5#90-eLG Electronics    NR_HST-UEConTest
See details 38.521-402721F16.6.0Rel-16Update of Single Tap Channel Profile for R16 NR HST in B.3.1 Details R5-211825 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40272-F16.6.0Rel-16Update of Single Tap Channel Profile for R16 NR HST in B.3.1 Details R5-210116 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402711F16.6.0Rel-16Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2 Details R5-211824 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40271-F16.6.0Rel-16Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2 Details R5-210115 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402701F16.6.0Rel-16Update of Combinations of channel model parameters for R16 NR HST in B.2.2 Details R5-211823 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40270-F16.6.0Rel-16Update of Combinations of channel model parameters for R16 NR HST in B.2.2 Details R5-210114 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402691F16.6.0Rel-16Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3 Details R5-211819 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40269-F16.6.0Rel-16Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3 Details R5-210113 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402681F16.6.0Rel-16Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4 Details R5-211818 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40268-F16.6.0Rel-16Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4 Details R5-210112 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402671F16.6.0Rel-16Addition of HST-SFN Channel Profile in B.3.2 Details R5-211822 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40267-F16.6.0Rel-16Addition of HST-SFN Channel Profile in B.3.2 Details R5-210111 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402661F16.6.0Rel-16Addition of HST-DPS Channel Profile in B.3.3 Details R5-211821 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40266-F16.6.0Rel-16Addition of HST-DPS Channel Profile in B.3.3 Details R5-210110 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402651F16.6.0Rel-16Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7 Details R5-211817 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40265-F16.6.0Rel-16Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7 Details R5-210109 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.521-402641F16.6.0Rel-16Addition of Abbreviations and References for R16 NR HST in 3.3 and References Details R5-211820 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.521-40264-F16.6.0Rel-16Addition of Abbreviations and References for R16 NR HST in 3.3 and References Details R5-210108 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.5220227-F17.6.0Rel-17Update applicability for performance test case 5.2.3.2.9_1 Details R5-226795 agreedRAN5#97TTA Details RP-222800 approvedRAN#98-eTSG WG RAN517.7.0TEI16_Test, NR_...
See details 38.5220202-F17.5.0Rel-17Correction to applicability of C097 Details R5-224634 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN517.6.0TEI16_Test, NR_...
See details 38.5220176-F17.4.0Rel-17Removal of NOTE1 for test case 5.2.2.2.9_1, 5.2.2.2.10_1, 5.2.3.2.9_1 Details R5-222992 agreedRAN5#95-eEricsson Details RP-221097 approvedRAN#96TSG WG RAN517.5.0NR_HST-UEConTest
See details 38.52201661F17.4.0Rel-17Correction to applicability of HST RRM TCs Details R5-223725 agreedRAN5#95-eHuawei,Hisilicon Details RP-221097 approvedRAN#96TSG WG RAN517.5.0NR_HST-UEConTest
See details 38.5220166-F17.4.0Rel-17Correction to applicability of HST RRM TCs Details R5-222635 revisedRAN5#95-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.5220158-F17.3.0Rel-17Adding new HST test cases Details R5-221371 agreedRAN5#94-eEricsson Details RP-220101 approvedRAN#95-eTSG WG RAN517.4.0NR_HST-UEConTest
See details 38.5220142-F17.3.0Rel-17Correcting applicability of HST test cases in 38.522 Details R5-220673 agreedRAN5#94-eEricsson Details RP-220101 approvedRAN#95-eTSG WG RAN517.4.0NR_HST-UEConTest
See details 38.5220140-F17.3.0Rel-17Update of HST Demod test case applicability - Note 1 removal Details R5-220663 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN517.4.0NR_HST-UEConTest
See details 38.52201351F17.3.0Rel-17Correction of HST test case applicability Details R5-221858 agreedRAN5#94-eCMCC, Anritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.4.0NR_HST-UEConTest
See details 38.5220135-F17.3.0Rel-17Correction of HST test case applicability Details R5-220169 revisedRAN5#94-eCMCC, Anritsu    NR_HST-UEConTest
See details 38.5220134-F17.3.0Rel-17Update of RRM test case applicability - Note 1 removal Details R5-220166 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN517.4.0NR_HST-UEConTest
See details 38.5220123-F17.2.0Rel-17Correction of RRM HST test cases applicability Details R5-217568 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5220112-F17.2.0Rel-17Correction to applicability of HST TCs Details R5-216911 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5220106-F17.2.0Rel-17Addition of applicability for HST test case 5.2.3.1.10_1 Details R5-216540 agreedRAN5#93-eCMCC Details RP-212778 approvedRAN#94-eTSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5220105-F17.2.0Rel-17Addition of applicability for HST test case 5.2.3.1.9_1 Details R5-216539 agreedRAN5#93-eCMCC Details RP-212778 approvedRAN#94-eTSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5220103-F17.1.0Rel-17Correction of RRM HST test cases applicability Details R5-215411 agreedRAN5#92-eEricsson Details RP-211718 approvedRAN#93-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5220099-F17.1.0Rel-17Addition of test applicability for RRM test case 6.6.4.5 Details R5-215245 agreedRAN5#92-eCMCC Details RP-211718 approvedRAN#93-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5220092-F17.1.0Rel-17Addition of applicability for NR HST TCs Details R5-215033 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.52200681F16.6.0Rel-16Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 Details R5-211918 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5220068-F16.6.0Rel-16Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 Details R5-211611 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.52200661F16.6.0Rel-16Addition of new RRM test cases to the applicability table in 4.2 Details R5-211917 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5220066-F16.6.0Rel-16Addition of new RRM test cases to the applicability table in 4.2 Details R5-211218 revisedRAN5#90-eEricsson    NR_HST-UEConTest
See details 38.53329951F18.1.0Rel-18Correction to test applicability of 4.6.1.7 Details R5-241834 agreedRAN5#102Anritsu, MediaT... Details RP-240233 approvedRAN#103RAN518.2.0TEI16_Test, NR_...
See details 38.5332995-F18.1.0Rel-18Correction to test applicability of 4.6.1.7 Details R5-241119 revisedRAN5#102Anritsu, MediaT...    TEI16_Test, NR_...
See details 38.5332447-F17.6.1Rel-17Corrections to RRM HST 6.1.1.7 test case Details R5-233019 agreedRAN5#99Keysight Techno... Details RP-230982 approvedRAN#100TSG WG RAN517.7.0TEI16_Test, NR_...
See details 38.5332265-F17.5.0Rel-17Correction to L1-RSRP report delay requirement Details R5-230990 agreedRAN5#98Anritsu Details RP-230257 approvedRAN#99TSG WG RAN517.6.0TEI16_Test, NR_...
See details 38.53322421F17.5.0Rel-17Update to HST RRM test cases Details R5-231896 agreedRAN5#98Qualcomm Incorp... Details RP-230257 approvedRAN#99TSG WG RAN517.6.0TEI16_Test, NR_...
See details 38.5332242-F17.5.0Rel-17Update to HST RRM test cases Details R5-230785 revisedRAN5#98Qualcomm Incorp...    TEI16_Test, NR_...
See details 38.53321411F17.4.0Rel-17Update on priority cell configuration in 8.2.1.2 Details R5-227834 agreedRAN5#97Keysight Techno... Details RP-222801 approvedRAN#98-eTSG WG RAN517.5.0TEI16_Test, NR_...
See details 38.5332141-F17.4.0Rel-17Update on priority cell configuration in 8.2.1.2 Details R5-227339 revisedRAN5#97Keysight Techno...    TEI16_Test, NR_...
See details 38.53320591F17.4.0Rel-17Corrections to 6.1.2.5 Details R5-227833 agreedRAN5#97ROHDE & SCHWARZ... Details RP-222801 approvedRAN#98-eTSG WG RAN517.5.0TEI16_Test, NR_...
See details 38.5332059-F17.4.0Rel-17Corrections to 6.1.2.5 Details R5-226512 revisedRAN5#97ROHDE & SCHWARZ...    TEI16_Test, NR_...
See details 38.5332058-F17.4.0Rel-17Corrections to 8.2.1.2 Details R5-226511 agreedRAN5#97ROHDE & SCHWARZ Details RP-222800 approvedRAN#98-eTSG WG RAN517.5.0TEI16_Test, NR_...
See details 38.5332056-F17.4.0Rel-17Corrections to 8.4.2.9 Details R5-226509 agreedRAN5#97ROHDE & SCHWARZ Details RP-222800 approvedRAN#98-eTSG WG RAN517.5.0TEI16_Test, NR_...
See details 38.5332042-F17.4.0Rel-17Correction to HST RRM TC 6.1.2.5 - N2L HO Details R5-226441 withdrawnRAN5#97Huawei, Hisilic...    TEI16_Test, NR_...
See details 38.5331915-F17.3.1Rel-17Correction to measurement delay in 4.6.4.5 Details R5-224645 agreedRAN5#96-eAnritsu Details RP-222008 approvedRAN#97-eTSG WG RAN517.4.0TEI16_Test, NR_...
See details 38.5331913-F17.3.1Rel-17Correction to test parameters in 6.1.1.7 Details R5-224636 withdrawnRAN5#96-eAnritsu    TEI16_Test, NR_...
See details 38.5331910-F17.3.1Rel-17Correction to NR HST RRM TC 8.2.1.2 - intra-RAT reselection Details R5-224553 agreedRAN5#96-eHuawei, HiSilicon Details RP-222008 approvedRAN#97-eTSG WG RAN517.4.0TEI16_Test, NR_...
See details 38.5331903-F17.3.1Rel-17Correction to NR HST RRM TC 6.1.1.7 - intra-freq reselection Details R5-224546 agreedRAN5#96-eHuawei, HiSilicon Details RP-222008 approvedRAN#97-eTSG WG RAN517.4.0TEI16_Test, NR_...
See details 38.5331873-F17.3.1Rel-17Corrections to 6.1.1.7 Details R5-224475 withdrawnRAN5#96-eROHDE & SCHWARZ    TEI16_Test, NR_...
See details 38.53318631F17.3.1Rel-17Correction on test applicability of HST TCs Details R5-225815 agreedRAN5#96-eCMCC Details RP-222008 approvedRAN#97-eTSG WG RAN517.4.0TEI16_Test, NR_...
See details 38.5331863-F17.3.1Rel-17Correction on test applicability of HST TCs Details R5-224225 revisedRAN5#96-eCMCC    TEI16_Test, NR_...
See details 38.5331762-F17.2.0Rel-17Correction to DRX offset setting in 8.4.2.x Details R5-222509 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331761-F17.2.0Rel-17Correction to DRX offset setting in 6.6.3.3 Details R5-222508 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331760-F17.2.0Rel-17Correction to DRX offset setting in 6.6.1.7 Details R5-222507 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331755-F17.2.0Rel-17Correction to test procedure in 8.2.1.2 Details R5-222493 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331754-F17.2.0Rel-17Correction to physical cell identity in 6.6.3.2 and 6.6.3.3 Details R5-222492 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331753-F17.2.0Rel-17Editorial correction in 6.1.2.5 Details R5-222491 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331752-F17.2.0Rel-17Correction to test time in 6.1.1.7 Details R5-222490 agreedRAN5#95-eAnritsu Details RP-221097 approvedRAN#96TSG WG RAN517.3.0NR_HST-UEConTest
See details 38.5331681-F17.1.0Rel-17Correction to SIB1 message exceptions of 4.6.1.7 and 4.6.4.5 Details R5-220941 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331680-F17.1.0Rel-17Correction to test procedure for 8.2.1.2 Details R5-220940 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331679-F17.1.0Rel-17Correction to message exception of 4.6.1.7 Details R5-220939 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331678-F17.1.0Rel-17Correction to DRX setting of 6.6.1.7 Details R5-220938 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331672-F17.1.0Rel-17Correction to SMTC configuration in 6.1.1.7 Details R5-220931 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331669-F17.1.0Rel-17Correction to NR-EUTRA and EUTRA-NR reselection with high speed Details R5-220928 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.53316641F17.1.0Rel-17Correction to DRX setting of 4.6.4.5 and 6.6.4.5 Details R5-221859 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331664-F17.1.0Rel-17Correction to DRX setting of 4.6.4.5 and 6.6.4.5 Details R5-220922 revisedRAN5#94-eAnritsu    NR_HST-UEConTest
See details 38.5331662-F17.1.0Rel-17Correction to DRX setting of 8.4.2.9 Details R5-220920 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.53316561F17.1.0Rel-17Correction to NR SA FR1 cell re-selection for UE configured with highSpeedMeasFlag-r16 Details R5-221655 agreedRAN5#94-eAnritsu Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331656-F17.1.0Rel-17Correction to NR SA FR1 cell re-selection for UE configured with highSpeedMeasFlag-r16 Details R5-220879 revisedRAN5#94-eAnritsu    NR_HST-UEConTest
See details 38.5331585-F17.1.0Rel-17Updates to RRM HST Test Case 6.6.4.5 Details R5-220168 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.5331584-F17.1.0Rel-17Updates to RRM HST Test Case 6.6.1.7 Details R5-220167 agreedRAN5#94-eCMCC Details RP-220101 approvedRAN#95-eTSG WG RAN517.2.0NR_HST-UEConTest
See details 38.53315701F17.0.0Rel-17Correction of Measurement Uncertainty and Test Tolerance in Annex F for RRM HST test cases Details R5-218352 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331570-F17.0.0Rel-17Correction of Measurement Uncertainty and Test Tolerance in Annex F for RRM HST test cases Details R5-217579 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.5331563-F17.0.0Rel-17Correction of RRM HST E-UTRA NR Inter-RAT event triggered reporting test case 8.4.2.9 including Test Tolerance Details R5-217572 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.53315621F17.0.0Rel-17Correction of RRM HST E-UTRA NR FR1 Cell reselection test case 8.2.1.2 including Test Tolerance Details R5-218351 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331562-F17.0.0Rel-17Correction of RRM HST E-UTRA NR FR1 Cell reselection test case 8.2.1.2 including Test Tolerance Details R5-217571 revisedRAN5#93-eEricsson    NR_HST-UEConTest
See details 38.5331561-F17.0.0Rel-17Correction of RRM HST Inter-RAT measurements test case 6.6.3.3 including Test Tolerance Details R5-217570 agreedRAN5#93-eEricsson Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331503-F17.0.0Rel-17Correction to Annex F for HST RRM TCs Details R5-216915 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331502-F17.0.0Rel-17Correction to HST RRM TC 6.1.2.5 - inter-RAT reselection Details R5-216914 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331501-F17.0.0Rel-17Correction to HST RRM TC 4.6.4.5 - L1-RSRP Details R5-216913 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331500-F17.0.0Rel-17Correction to HST RRM TC 4.6.1.7 - intra-freq meas Details R5-216912 agreedRAN5#93-eHuawei, Hisilicon Details RP-212778 approvedRAN#94-eTSG WG RAN517.1.0NR_HST-UEConTest
See details 38.5331420-F16.8.0Rel-16Correction of RRM HST E-UTRA NR Inter-RAT event triggered reporting test case 8.4.2.9 Details R5-215415 agreedRAN5#92-eEricsson Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331419-F16.8.0Rel-16Correction of RRM HST E-UTRA NR FR1 Cell reselection test case 8.2.1.2 Details R5-215414 agreedRAN5#92-eEricsson Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331418-F16.8.0Rel-16Correction of RRM HST Inter-RAT measurements test case 6.6.3.3 Details R5-215413 agreedRAN5#92-eEricsson Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331417-F16.8.0Rel-16Addition of cell configuration for RRM HST test cases in Annex E Details R5-215412 agreedRAN5#92-eEricsson Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331399-F16.8.0Rel-16Editorial change of RRM test case 6.6.1.7 Details R5-215244 agreedRAN5#92-eCMCC Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331398-F16.8.0Rel-16Update of test case 6.6.4.5 for R16 NR HST Details R5-215243 agreedRAN5#92-eCMCC Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331391-F16.8.0Rel-16Addition of cell mapping for NR HST RRM TCs Details R5-215039 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331390-F16.8.0Rel-16Correction to NR HST RRM TC 6.1.1.7-HST intra-freq cell reselection Details R5-215038 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331389-F16.8.0Rel-16Correction to minimum requirements for intra-frequency measurement with highSpeedMeasFlag Details R5-215037 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331388-F16.8.0Rel-16Correction to minimum requirements for inter-RAT cell reselection with highSpeedMeasFlag Details R5-215036 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.53313871F16.8.0Rel-16Addition of NR HST RRM TC 6.1.2.5-intra-freq cell reselection highSpeedMeasFlag Details R5-215949 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331387-F16.8.0Rel-16Addition of NR HST RRM TC 6.1.2.5-intra-freq cell reselection highSpeedMeasFlag Details R5-215035 revisedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.53313861F16.8.0Rel-16Addition of NR HST RRM TC 4.6.1.7-intra-freq DRX highSpeedMeasFlag Details R5-215948 agreedRAN5#92-eHuawei,Hisilicon Details RP-211718 approvedRAN#93-eTSG WG RAN516.9.0NR_HST-UEConTest
See details 38.5331386-F16.8.0Rel-16Addition of NR HST RRM TC 4.6.1.7-intra-freq DRX highSpeedMeasFlag Details R5-215034 revisedRAN5#92-eHuawei,Hisilicon    NR_HST-UEConTest
See details 38.5331196-F16.7.0Rel-16Addition of FR1 EN-DC TC 4.6.4.5-HST L1-RSRP Details R5-212911 agreedRAN5#91-eHuawei, Hisilicon Details RP-211019 approvedRAN#92-eTSG WG RAN516.8.0NR_HST-UEConTest
See details 38.5331195-F16.7.0Rel-16Correction of minimum requirements for L1-RSRP reporting test cases Details R5-212910 agreedRAN5#91-eHuawei, Hisilicon Details RP-211019 approvedRAN#92-eTSG WG RAN516.8.0NR_HST-UEConTest
See details 38.5331154-F16.7.0Rel-16Addition of cell configuration mapping in Annex E for TC 6.6.4.5 Details R5-212613 agreedRAN5#91-eCMCC Details RP-211019 approvedRAN#92-eTSG WG RAN516.8.0NR_HST-UEConTest
See details 38.5331153-F16.7.0Rel-16Addition of new test case 6.6.4.5 for R16 NR HST Details R5-212612 agreedRAN5#91-eCMCC Details RP-211019 approvedRAN#92-eTSG WG RAN516.8.0NR_HST-UEConTest
See details 38.53311291F16.6.0Rel-16Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9 Details R5-211833 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331129-F16.6.0Rel-16Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9 Details R5-211224 revisedRAN5#90-eEricsson    NR_HST-UEConTest
See details 38.53311281F16.6.0Rel-16Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0 Details R5-211832 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331128-F16.6.0Rel-16Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0 Details R5-211223 revisedRAN5#90-eEricsson    NR_HST-UEConTest
See details 38.53311271F16.6.0Rel-16Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2 Details R5-211831 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331127-F16.6.0Rel-16Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2 Details R5-211222 revisedRAN5#90-eEricsson    NR_HST-UEConTest
See details 38.53311261F16.6.0Rel-16Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0 Details R5-211830 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331126-F16.6.0Rel-16Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0 Details R5-211221 revisedRAN5#90-eEricsson    NR_HST-UEConTest
See details 38.5331125-F16.6.0Rel-16Addition of new RRM iRAT measurement Inter-RAT measurements test case 6.6.3.3 Details R5-211220 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331124-F16.6.0Rel-16Correction of the minimum conformance requirements for Inter-RAT measurements 6.6.3.0 Details R5-211219 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.53310221F16.6.0Rel-16Addition of cell configuration mapping in Annex E for R16 NR HST Details R5-211829 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331022-F16.6.0Rel-16Addition of cell configuration mapping in Annex E for R16 NR HST Details R5-210284 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.5331021-F16.6.0Rel-16Update of Annex H.2.1-3 for R16 NR HST Details R5-210283 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.53310201F16.6.0Rel-16Addition of new test case 6.6.1.7 for R16 NR HST Details R5-211828 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5331020-F16.6.0Rel-16Addition of new test case 6.6.1.7 for R16 NR HST Details R5-210282 revisedRAN5#90-eCMCC    NR_HST-UEConTest
See details 38.5331019-F16.6.0Rel-16Addition of minimum conformance requirements for R16 NR HST measurement in 6.6.1.0 Details R5-210281 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.53310181F16.6.0Rel-16Addition of new test case 6.1.1.7 for R16 NR HST Details R5-211827 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest