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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 31.12406561F16.9.0Rel-1631.124 Correction to TC 27.22.14.2 and 27.22.14.3 Details C6-220707 agreedCT6#113Qualcomm Techno... Details CP-223077 approvedCT#98-eCT616.10.0nrUICC_UEConTest
See details 31.1240656-F16.9.0Rel-1631.124 Correction to TC 27.22.14.2 and 27.22.14.3 Details C6-220632 revisedCT6#113Qualcomm Techno...    nrUICC_UEConTest
See details 31.12700052F17.2.0Rel-17TS 31.127 Correction to Test Env in section 4 and Annex A Details C6-240533 postponedCT6#119-bisQualcomm, Apple...    nrUICC_UEConTest
See details 31.12700051F17.2.0Rel-17TS 31.127 Correction to Test Env in section 4 and Annex A Details C6-240528 revisedCT6#119-bisQualcomm, Apple...    nrUICC_UEConTest
See details 31.1270005-F17.2.0Rel-17TS 31.127 Correction to Test Env in section 4 and Annex A Details C6-240470 revisedCT6#119-bisQualcomm Techno...    nrUICC_UEConTest
See details 31.12700041F17.1.0Rel-17Correction of PIN handling tests Details C6-240266 agreedCT6#119Comprion GmbH Details CP-241209 approvedCT#104CT617.2.0nrUICC_UEConTest
See details 31.1270004-F17.1.0Rel-17Correction of PIN handling tests Details C6-240218 revisedCT6#119Comprion GmbH    nrUICC_UEConTest