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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.508-130591F18.1.0Rel-18RF TRx testing - P-Max configuration extension to RX tests to enable TxD Details R5-241704 agreedRAN5#102Keysight Techno... Details RP-240234 approvedRAN#103RAN518.2.0TEI17_Test, NR_...
See details 38.508-13059-F18.1.0Rel-18RF TRx testing - P-Max configuration extension to RX tests to enable TxD Details R5-240616 revisedRAN5#102Keysight Techno...    NR_RF_TxD-UECon...
See details 38.508-12781-F17.8.0Rel-17Correction to default P-Max value for Power Class 1.5 UEs Details R5-232723 agreedRAN5#99Huawei, HiSilicon Details RP-230936 approvedRAN#100TSG WG RAN517.9.0NR_RF_TxD-UEConTest
See details 38.508-124391F17.5.0Rel-17Update UE capability information elements for PC1.5 duty cycle Details R5-225686 agreedRAN5#96-eCMCC Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.508-12439-F17.5.0Rel-17Update UE capability information elements for PC1.5 duty cycle Details R5-224211 revisedRAN5#96-eCMCC    NR_RF_TxD-UEConTest
See details 38.508-12373-F17.4.0Rel-17Addition of connection diagram for Tx Diversity support Details R5-222924 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.508-203401F17.4.0Rel-17Addition of PICS for TxD Details R5-223772 agreedRAN5#95-eCMCC Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.508-20340-F17.4.0Rel-17Addition of PICS for TxD Details R5-223163 revisedRAN5#95-eCMCC    NR_RF_TxD-UEConTest
See details 38.508-20330-F17.4.0Rel-17Addition of physical layer baseline capability for Tx Diversity support Details R5-222925 withdrawnRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-12954-F18.3.0Rel-18Updates on 6.2G for delta TIB description for Tx diversity transmitter power Details R5-244942 revisedRAN5#104ZTE Corporation    TEI17_Test, NR_...
See details 38.521-127351F18.1.0Rel-18Corrections for 6.3G.3.3 Details R5-241779 agreedRAN5#102Keysight Techno... Details RP-240235 approvedRAN#103RAN518.2.0TEI17_Test, NR_...
See details 38.521-12716-F18.1.0Rel-18Editorial correction in FR1 test case 6.4G.2.1 Details R5-241154 agreedRAN5#102Keysight Techno... Details RP-240235 approvedRAN#103RAN518.2.0TEI17_Test, NR_...
See details 38.521-126531F18.1.0Rel-18Message exceptions clarifications for 6.3G.3.3 Details R5-241726 withdrawnRAN5#102Keysight Techno...    TEI17_Test, NR_...
See details 38.521-12653-F18.1.0Rel-18Message exceptions clarifications for 6.3G.3.3 Details R5-240622 revisedRAN5#102Keysight Techno...    NR_RF_TxD-UECon...
See details 38.521-126391F18.1.0Rel-18Removal of square brackets for Tx Diversity capability Details R5-241879 agreedRAN5#102Huawei, HiSilicon Details RP-240235 approvedRAN#103RAN518.2.0TEI17_Test, NR_...
See details 38.521-12639-F18.1.0Rel-18Removal of square brackets for Tx Diversity capability Details R5-240337 revisedRAN5#102Huawei, HiSilicon    TEI17_Test, NR_...
See details 38.521-12638-F18.1.0Rel-18Addition of new test case 6.3G.4.1 Absolute power tolerance for Tx Diversity Details R5-240336 agreedRAN5#102Huawei, HiSilicon Details RP-240235 approvedRAN#103RAN518.2.0TEI17_Test, NR_...
See details 38.521-124831F18.0.0Rel-18TxDiversity - in-band emissions test procedure correction Details R5-237651 agreedRAN5#101Keysight Techno... Details RP-232849 approvedRAN#102RAN518.1.0TEI17_Test, NR_...
See details 38.521-12483-F18.0.0Rel-18TxDiversity - in-band emissions test procedure correction Details R5-236345 revisedRAN5#101Keysight Techno...    TEI17_Test, NR_...
See details 38.521-12482-F18.0.0Rel-18Editorial correction for referred tables for NS_04 in FR1 test 6.5G.2.2 Details R5-236344 agreedRAN5#101Keysight Techno... Details RP-232849 approvedRAN#102RAN518.1.0TEI17_Test, NR_...
See details 38.521-12394-F17.9.0Rel-17Update of 6.2G.2 MPR for Power Class 1.5 for TxD Details R5-234787 agreedRAN5#100Huawei, HiSilicon Details RP-231651 approvedRAN#101RAN517.10.0NR_RF_TxD-UEConTest
See details 38.521-123931F17.9.0Rel-17Update of 6.2G.1 MOP test requirements for TxD Details R5-235642 agreedRAN5#100Huawei, HiSilicon Details RP-231651 approvedRAN#101RAN517.10.0NR_RF_TxD-UEConTest
See details 38.521-12393-F17.9.0Rel-17Update of 6.2G.1 MOP test requirements for TxD Details R5-234786 revisedRAN5#100Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-12328-F17.9.0Rel-17Correction of requirements of Spurious emissions for UE co-existence in 6.5G.3.2 Details R5-234125 withdrawnRAN5#100CAICT    NR_RF_TxD-UEConTest
See details 38.521-123011F17.8.0Rel-17Correction of ON/OFF time mask for Tx Diversity Details R5-233540 agreedRAN5#99ROHDE & SCHWARZ Details RP-230936 approvedRAN#100TSG WG RAN517.9.0NR_RF_TxD-UEConTest
See details 38.521-12301-F17.8.0Rel-17Correction of ON/OFF time mask for Tx Diversity Details R5-233173 revisedRAN5#99ROHDE & SCHWARZ    NR_RF_TxD-UEConTest
See details 38.521-12242-F17.8.0Rel-17Addition of abbreviation and clause 4 general description for Tx diversity Details R5-232726 agreedRAN5#99Huawei, HiSilicon Details RP-230936 approvedRAN#100TSG WG RAN517.9.0NR_RF_TxD-UEConTest
See details 38.521-12241-F17.8.0Rel-17Update of 6.5G.2.3.1 NR ACLR for checking TxD capability Details R5-232725 withdrawnRAN5#99Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-122401F17.8.0Rel-17Update of 6.4G.2.4 EVM equalizer spectrum flatness for Tx Diversity Details R5-233720 agreedRAN5#99Huawei, HiSilicon Details RP-230936 approvedRAN#100TSG WG RAN517.9.0NR_RF_TxD-UEConTest
See details 38.521-12240-F17.8.0Rel-17Update of 6.4G.2.4 EVM equalizer spectrum flatness for Tx Diversity Details R5-232724 revisedRAN5#99Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-12217-F17.8.0Rel-17Correction of Spurious emissions for UE co-existence requirement in 6.5G.3.2 Details R5-232378 withdrawnRAN5#99CAICT    NR_RF_TxD-UEConTest
See details 38.521-12102-F17.7.0Rel-17Editorial correction for content style in test applicability section of some TxD test cases Details R5-230561 agreedRAN5#98CAICT Details RP-230211 approvedRAN#99TSG WG RAN517.8.0NR_RF_TxD-UEConTest
See details 38.521-12081-F17.7.0Rel-17FR1 - ACLR requirements for PC3 missing in 6.5G.2.3.1 Details R5-230303 agreedRAN5#98Keysight Techno... Details RP-230211 approvedRAN#99TSG WG RAN517.8.0NR_RF_TxD-UEConTest
See details 38.521-120311F17.6.1Rel-17Limit transmit modulation quality for Tx Diversity to power per any antenna connector higher than a threshold Details R5-227934 agreedRAN5#97Keysight techno... Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12031-F17.6.1Rel-17Limit transmit modulation quality for Tx Diversity to power per any antenna connector higher than a threshold Details R5-227067 revisedRAN5#97Keysight techno...    NR_RF_TxD-UEConTest
See details 38.521-12030-F17.6.1Rel-17Limit transmit modulation quality for Tx Diversity to power per all antenna connectors higher than a threshold Details R5-227066 withdrawnRAN5#97Keysight techno...    NR_RF_TxD-UEConTest
See details 38.521-12029-F17.6.1Rel-17Limit transmit modulation quality for Tx Diversity to maximum output UL power Details R5-227065 withdrawnRAN5#97Keysight techno...    NR_RF_TxD-UEConTest
See details 38.521-12028-F17.6.1Rel-17Suffix definition for Tx Diversity clauses Details R5-227064 agreedRAN5#97Keysight techno... Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12025-F17.6.1Rel-17Updating Annex F for TxD test cases Details R5-226915 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12024-F17.6.1Rel-17Updating Annex E for TxD test cases Details R5-226914 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-120231F17.6.1Rel-17Updating section 7 for TxD Details R5-228066 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12023-F17.6.1Rel-17Updating section 7 for TxD Details R5-226913 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-12022-F17.6.1Rel-17Addition of 6.5G.3.3 ASE for TxD Details R5-226912 withdrawnRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-12021-F17.6.1Rel-17Addition of 6.5G.3.2 spurious co-ex for TxD Details R5-226911 withdrawnRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120201F17.6.1Rel-17Addition of 6.5G.2.3.2 UTRA ACLR for TxD Details R5-228065 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12020-F17.6.1Rel-17Addition of 6.5G.2.3.2 UTRA ACLR for TxD Details R5-226910 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120191F17.6.1Rel-17Addition of 6.5G.2.2 A-SEM for TxD Details R5-228064 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12019-F17.6.1Rel-17Addition of 6.5G.2.2 A-SEM for TxD Details R5-226909 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120181F17.6.1Rel-17Addition of 6.5G.2.1 SEM for TxD Details R5-228063 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12018-F17.6.1Rel-17Addition of 6.5G.2.1 SEM for TxD Details R5-226908 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120171F17.6.1Rel-17Updating 6.5, 6.5D and 6.5G to coordinate the output spectrum emission test Details R5-228062 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12017-F17.6.1Rel-17Updating 6.5, 6.5D and 6.5G to coordinate the output spectrum emission test Details R5-226907 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120161F17.6.1Rel-17Addition of 6.4G.2.1 EVM for TxD Details R5-228061 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12016-F17.6.1Rel-17Addition of 6.4G.2.1 EVM for TxD Details R5-226906 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120151F17.6.1Rel-17Updating 6.4, 6.4D and 6.4G to coordinate the transmit signal quality test Details R5-228060 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12015-F17.6.1Rel-17Updating 6.4, 6.4D and 6.4G to coordinate the transmit signal quality test Details R5-226905 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120141F17.6.1Rel-17Addition of 6.3G.4.1 absolute power tolerance for TxD Details R5-228059 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12014-F17.6.1Rel-17Addition of 6.3G.4.1 absolute power tolerance for TxD Details R5-226904 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120131F17.6.1Rel-17Updating 6.3, 6.3D and 6.3G to coordinate the output power dynamic test Details R5-228058 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12013-F17.6.1Rel-17Updating 6.3, 6.3D and 6.3G to coordinate the output power dynamic test Details R5-226903 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120121F17.6.1Rel-17Updating 6.2.4 and 6.2D.4 to coordinate the Configured transmitted power test Details R5-228057 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12012-F17.6.1Rel-17Updating 6.2.4 and 6.2D.4 to coordinate the Configured transmitted power test Details R5-226902 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120111F17.6.1Rel-17Updating 6.2.2, 6.2D.2 and 6.2G.2 to coordinate the MPR test Details R5-227913 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12011-F17.6.1Rel-17Updating 6.2.2, 6.2D.2 and 6.2G.2 to coordinate the MPR test Details R5-226900 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-120101F17.6.1Rel-17Updating 6.2.1, 6.2D.1 and 6.2G.1 to coordinate the MOP test Details R5-228056 agreedRAN5#97Huawei, HiSilic... Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-12010-F17.6.1Rel-17Updating 6.2.1, 6.2D.1 and 6.2G.1 to coordinate the MOP test Details R5-226899 revisedRAN5#97Huawei, HiSilic...    NR_RF_TxD-UEConTest
See details 38.521-119871F17.6.1Rel-17Configured transmitted power for Tx Diversity Details R5-228055 agreedRAN5#97Google Inc. Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-11987-F17.6.1Rel-17Configured transmitted power for Tx Diversity Details R5-226813 revisedRAN5#97Google Inc.    NR_RF_TxD-UEConTest
See details 38.521-119861F17.6.1Rel-17Add new test case 6.5G.3.3 Details R5-228054 agreedRAN5#97China Telecom C... Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-11986-F17.6.1Rel-17Add new test case 6.5G.3.3 Details R5-226801 revisedRAN5#97China Telecom C...    NR_RF_TxD-UEConTest
See details 38.521-119851F17.6.1Rel-17Add new test case 6.5G.3.2 Details R5-228053 agreedRAN5#97China Telecom C... Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.521-11985-F17.6.1Rel-17Add new test case 6.5G.3.2 Details R5-226800 revisedRAN5#97China Telecom C...    NR_RF_TxD-UEConTest
See details 38.521-11937-F17.6.1Rel-17Style correction in 6.4G.1.5 Details R5-226288 withdrawnRAN5#97CAICT    NR_RF_TxD-UEConTest
See details 38.521-118711F17.5.0Rel-17Updates to receiver requirements for TxD scenarios Details R5-225763 agreedRAN5#96-eApple Portugal Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11871-F17.5.0Rel-17Updates to receiver requirements for TxD scenarios Details R5-225036 revisedRAN5#96-eApple Portugal    NR_RF_TxD-UEConTest
See details 38.521-118671F17.5.0Rel-17Add new test case 6.5G.4 Details R5-225762 agreedRAN5#96-eChina Telecom C... Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11867-F17.5.0Rel-17Add new test case 6.5G.4 Details R5-225014 revisedRAN5#96-eChina Telecom C...    NR_RF_TxD-UEConTest
See details 38.521-11866-F17.5.0Rel-17Add new test case 6.5G.3.1 Details R5-225011 agreedRAN5#96-eChina Telecom C... Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-118621F17.5.0Rel-17Add new test case 6.5G.1 Details R5-225761 agreedRAN5#96-eChina Telecom C... Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11862-F17.5.0Rel-17Add new test case 6.5G.1 Details R5-224969 revisedRAN5#96-eChina Telecom C...    NR_RF_TxD-UEConTest
See details 38.521-11826-F17.5.0Rel-17Update of Annex F to add 6.3G and 6.4G new test cases Details R5-224790 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-118251F17.5.0Rel-17Addition of 6.4G.2.4 EVM equalizer spectrum flatness for Tx Diversity Details R5-225760 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11825-F17.5.0Rel-17Addition of 6.4G.2.4 EVM equalizer spectrum flatness for Tx Diversity Details R5-224789 revisedRAN5#96-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-118241F17.5.0Rel-17Addition of 6.4G.2.3 In-band emissions for Tx Diversity Details R5-225759 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11824-F17.5.0Rel-17Addition of 6.4G.2.3 In-band emissions for Tx Diversity Details R5-224788 revisedRAN5#96-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-118231F17.5.0Rel-17Addition of 6.4G.2.2 Carrier leakage for Tx Diversity Details R5-225758 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11823-F17.5.0Rel-17Addition of 6.4G.2.2 Carrier leakage for Tx Diversity Details R5-224787 revisedRAN5#96-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-118221F17.5.0Rel-17Addition of 6.4G.1 Frequency error for Tx Diversity Details R5-225757 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11822-F17.5.0Rel-17Addition of 6.4G.1 Frequency error for Tx Diversity Details R5-224786 revisedRAN5#96-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-11821-F17.5.0Rel-17Addition of 6.3G.4.3 Aggregate power tolerance for Tx Diversity Details R5-224785 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11820-F17.5.0Rel-17Addition of 6.3G.4.2 Relative power tolerance for Tx Diversity Details R5-224784 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11819-F17.5.0Rel-17Addition of 6.3G.3.3 SRS time mask for Tx Diversity Details R5-224783 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11818-F17.5.0Rel-17Addition of 6.3G.3.2 PRACH time mask for Tx Diversity Details R5-224782 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11817-F17.5.0Rel-17Addition of 6.3G.3.1 General ON/OFF time mask for Tx Diversity Details R5-224781 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11816-F17.5.0Rel-17Addition of 6.3G.2 Transmit OFF power for Tx Diversity Details R5-224780 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11815-F17.5.0Rel-17Addition of 6.3G.1 Minimum output power for Tx Diversity Details R5-224779 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-118071F17.5.0Rel-17Removal of PC1.5 n41 from TC 6.2.3 A-MPR Details R5-225204 withdrawnRAN5#96-eT-Mobile USA Inc.    NR_RF_TxD-UEConTest
See details 38.521-11807-F17.5.0Rel-17Removal of PC1.5 n41 from TC 6.2.3 A-MPR Details R5-224397 revisedRAN5#96-eT-Mobile USA Inc.    NR_RF_TxD-UEConTest
See details 38.521-117891F17.5.0Rel-17TxD A-MPR test requirements for NS_04 Details R5-225756 agreedRAN5#96-eGoogle Inc. Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11789-F17.5.0Rel-17TxD A-MPR test requirements for NS_04 Details R5-224285 revisedRAN5#96-eGoogle Inc.    NR_RF_TxD-UEConTest
See details 38.521-11777-F17.5.0Rel-17Adding additional tolerance to test requirement of TxD Transmitter power test cases Details R5-224242 agreedRAN5#96-eCAICT Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-117691F17.5.0Rel-17Update test procedure of MOP for TxD Details R5-225687 agreedRAN5#96-eCMCC Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.521-11769-F17.5.0Rel-17Update test procedure of MOP for TxD Details R5-224212 revisedRAN5#96-eCMCC    NR_RF_TxD-UEConTest
See details 38.521-117291F17.4.0Rel-17Introduce SRS IL for UE with NR TxD Details R5-223781 agreedRAN5#95-eApple Portugal Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11729-F17.4.0Rel-17Introduce SRS IL for UE with NR TxD Details R5-223029 revisedRAN5#95-eApple Portugal    NR_RF_TxD-UEConTest
See details 38.521-11719-F17.4.0Rel-17Update of the definition of uplink RB allocation for power class 1.5 UE Details R5-222930 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-117181F17.4.0Rel-17Addition of Annex F for Tx Diversity test cases Details R5-223782 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11718-F17.4.0Rel-17Addition of Annex F for Tx Diversity test cases Details R5-222923 revisedRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-11717-F17.4.0Rel-17Update of 7.4 Maximum input level for Tx Diversity support Details R5-222922 withdrawnRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-117161F17.4.0Rel-17Addition of new test case 6.5G.2.3 Adjacent channel leakage ratio for Tx Diversity Details R5-223780 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11716-F17.4.0Rel-17Addition of new test case 6.5G.2.3 Adjacent channel leakage ratio for Tx Diversity Details R5-222921 revisedRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-117151F17.4.0Rel-17Addition of new test case 6.2G.3 additional maximum output power reduction for Tx Diversity Details R5-223779 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11715-F17.4.0Rel-17Addition of new test case 6.2G.3 additional maximum output power reduction for Tx Diversity Details R5-222920 revisedRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-117141F17.4.0Rel-17Addition of new test case 6.2G.2 maximum output power reduction for Tx Diversity Details R5-223778 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11714-F17.4.0Rel-17Addition of new test case 6.2G.2 maximum output power reduction for Tx Diversity Details R5-222919 revisedRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-117131F17.4.0Rel-17Addition of new test case 6.2G.1 maximum output power for Tx Diversity Details R5-223777 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11713-F17.4.0Rel-17Addition of new test case 6.2G.1 maximum output power for Tx Diversity Details R5-222918 revisedRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.521-116281F17.4.0Rel-17Removal of PC1.5 from TC 6.5.2.4.1 ACLR Details R5-223776 agreedRAN5#95-eCMCC Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11628-F17.4.0Rel-17Removal of PC1.5 from TC 6.5.2.4.1 ACLR Details R5-222230 revisedRAN5#95-eCMCC    NR_RF_TxD-UEConTest
See details 38.521-116271F17.4.0Rel-17Removal of PC1.5 from TC 6.2.3 A-MPR Details R5-223775 agreedRAN5#95-eCMCC Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11627-F17.4.0Rel-17Removal of PC1.5 from TC 6.2.3 A-MPR Details R5-222229 revisedRAN5#95-eCMCC    NR_RF_TxD-UEConTest
See details 38.521-116261F17.4.0Rel-17Removal of PC1.5 from TC 6.2.2 MPR Details R5-223774 agreedRAN5#95-eCMCC Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11626-F17.4.0Rel-17Removal of PC1.5 from TC 6.2.2 MPR Details R5-222228 revisedRAN5#95-eCMCC    NR_RF_TxD-UEConTest
See details 38.521-116251F17.4.0Rel-17Removal of PC1.5 from TC 6.2.1 MOP Details R5-223773 agreedRAN5#95-eCMCC Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.521-11625-F17.4.0Rel-17Removal of PC1.5 from TC 6.2.1 MOP Details R5-222227 revisedRAN5#95-eCMCC    NR_RF_TxD-UEConTest
See details 38.521-11612-F17.3.0Rel-17CR on SRS IL for TxD Details R5-221358 withdrawnRAN5#94-eApple Portugal    NR_RF_TxD-UEConTest
See details 38.5220246-F17.7.0Rel-17Editorial correction for Applicability Comment of 6.2G.3 and 6.2G.4 in 4.1.1 Details R5-230576 agreedRAN5#98CAICT Details RP-230211 approvedRAN#99TSG WG RAN517.8.0NR_RF_TxD-UEConTest
See details 38.52202291F17.6.0Rel-17Updating test applicability for TxD test cases Details R5-228040 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.5220229-F17.6.0Rel-17Updating test applicability for TxD test cases Details R5-226916 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.52202041F17.5.0Rel-17Addition of test applicability for TxD test cases Details R5-225765 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.5220204-F17.5.0Rel-17Addition of test applicability for TxD test cases Details R5-224791 revisedRAN5#96-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.52201941F17.5.0Rel-17Correction of Applicability of conformance test cases conditions, Tested Bands Selection Criteria and Branch for the TxD test cases in 38.521-1 Details R5-225764 agreedRAN5#96-eCAICT Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.5220194-F17.5.0Rel-17Correction of Applicability of conformance test cases conditions, Tested Bands Selection Criteria and Branch for the TxD test cases in 38.521-1 Details R5-224252 revisedRAN5#96-eCAICT    NR_RF_TxD-UEConTest
See details 38.5220173-F17.4.0Rel-17Addition of test applicabilities for Tx Diversity test cases Details R5-222926 withdrawnRAN5#95-eHuawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.52201701F17.4.0Rel-17Jumbo Applicability CR for NR_RF_TxD WI Details R5-223783 agreedRAN5#95-eCMCC Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.5220170-F17.4.0Rel-17Jumbo Applicability CR for NR_RF_TxD WI Details R5-222870 revisedRAN5#95-eCMCC    NR_RF_TxD-UEConTest
See details 38.523-139571F17.3.0Rel-17Addition of 8.1.5.1.1 TxD capability check Details R5-235311 agreedRAN5#100Huawei, HiSilicon Details RP-231651 approvedRAN#101RAN517.4.0NR_RF_TxD-UEConTest
See details 38.523-13957-F17.3.0Rel-17Addition of 8.1.5.1.1 TxD capability check Details R5-234788 revisedRAN5#100Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.90507111F17.6.0Rel-17Updating TP analysis for 6.2G.2 to add power class 3 Details R5-227912 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.9050711-F17.6.0Rel-17Updating TP analysis for 6.2G.2 to add power class 3 Details R5-226901 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.9050640-F17.5.0Rel-17Addition of test point analysis for TxD test cases Details R5-224792 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.9050624-F17.4.0Rel-17Addition of test point analysis for new test case 6.2G.3 Details R5-222929 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.9050623-F17.4.0Rel-17Addition of test point analysis for new test cases 6.2G.2 and 6.5G.2.3.1 Details R5-222928 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.9050622-F17.4.0Rel-17Addition of test point analysis for new test case 6.2G.1 Details R5-222927 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest