WI # 25011 - MBMS_Test
General
Related
Name:
Conformance Test Aspects – MBMS
Acronym:
MBMS_Test
Effective Acronym:
MBMS_Test
WI Level:
Work Task (3rd Level)
Type:
Work Item
Status:
Awaiting approval
Release:
Rel-6
Start date:
2006-03-10
End date:
2007-09-14
Remarks (0)
Creation date
Author
Remark
No Remarks Added
Parent Work Item:
25024
- MBMS UE Conformance Testing
Child Work Items:
WI UID
WI name
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Responsible group(s):
T1
,
R5
Rapporteur(s):
Qualcomm
Latest WID version:
-
TSG Approval meeting:
-
PCG Approval meeting:
-
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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