WI # 400060 - MBMSE-UEConTest_RANPhysFDD

Name:

Conformance Test Aspects MBSFN for FDD

Acronym:

MBMSE-UEConTest_RANPhysFDD

Effective Acronym:

MBMSE-UEConTest_RANPhysFDD

WI Level:

Building Block (2nd level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-7

Start date:

2008-05-30

End date:

2009-12-04

Remarks (1)

Creation date	Author	Remark


2015-01-22 12:40 UTC		RP#46 completed

Parent Work Item:

400058 - MBMS - UE Conformance Testing

Child Work Items:

WI UID	WI name


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Responsible group(s):

Rapporteur(s):

Huawei

Latest WID version:

RP-080336

TSG Approval meeting:

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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