WI # 450026 - HSDSCH_UEConTest
General
Related
Name:
Conformance Test Aspects – HS-DSCH Serving Cell Change Enhancements
Acronym:
HSDSCH_UEConTest
Effective Acronym:
HSDSCH_UEConTest
WI Level:
Building Block (2nd level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-8
Start date:
2009-09-18
End date:
2010-03-19
Remarks (1)
Creation date
Author
Remark
2015-01-22 12:40 UTC
RP#47 completed. Testing for UID_390030
Parent Work Item:
25126
- Rel-8 RAN improvements - UE Conformance Testing
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
R5
Rapporteur(s):
Qualcomm
Latest WID version:
RP-090756
TSG Approval meeting:
45
PCG Approval meeting:
23
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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