WI # 450026 - HSDSCH_UEConTest
Name: Conformance Test Aspects – HS-DSCH Serving Cell Change Enhancements
Acronym: HSDSCH_UEConTest
Effective Acronym: HSDSCH_UEConTest
WI Level: Building Block (2nd level)
Type: Work Item
Status: PCG approved
Release: Rel-8
Start date: 2009-09-18
End date: 2010-03-19
Remarks (1)
Creation dateAuthorRemark
2015-01-22 12:40 UTC
RP#47 completed. Testing for UID_390030
Parent Work Item: 25126 - Rel-8 RAN improvements - UE Conformance Testing
Child Work Items:
WI UIDWI name
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Responsible group(s): R5
Rapporteur(s): Qualcomm
Latest WID version: RP-090756
TSG Approval meeting: 45
PCG Approval meeting: 23
TSG Stopped meeting: -
PCG Stopped meeting: -
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