WI # 540008 - MBMS_LTE_enh-UEConTest
General
Related
Name:
Test part: Further enhancements to MBMS for LTE
Acronym:
MBMS_LTE_enh-UEConTest
Effective Acronym:
MBMS_LTE_enh-UEConTest
WI Level:
Building Block (2nd level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-10
Start date:
2011-12-02
End date:
2012-03-02
Remarks (1)
Creation date
Author
Remark
2015-01-22 12:40 UTC
RP#55 completed
Parent Work Item:
480027
- Further enhancements to MBMS for LTE
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
R5
Rapporteur(s):
Zhang Xin (suzanna.zhang@huawei.com)
(Huawei)
Latest WID version:
RP-111615
TSG Approval meeting:
54
PCG Approval meeting:
28
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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