WI # 55078
General
Related
Name:
Deleted at TSG #27 - MS Test in 51.010
Acronym:
Effective Acronym:
WI Level:
Work Task (3rd Level)
Type:
Work Item
Status:
TSG stopped
Release:
Rel-6
Start date:
2004-02-06
End date:
2004-02-06
Remarks (0)
Creation date
Author
Remark
No Remarks Added
Parent Work Item:
55077
- Deleted - GERAN MS Conformance test for the Flexible Layer One - DELETE
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
G4
,
G5
Rapporteur(s):
benoist.sebire@nokia.com
(Nokia)
Latest WID version:
-
TSG Approval meeting:
-
PCG Approval meeting:
-
TSG Stopped meeting:
GP-22
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
Exit