WI # 560010 - LTE_e850_LB-UEConTest
General
Related
Name:
Test part: LTE E850 - Lower Band for Region 2 (non-US), Band 27
Acronym:
LTE_e850_LB-UEConTest
Effective Acronym:
LTE_e850_LB-UEConTest
WI Level:
Building Block (2nd level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-11
Start date:
2012-06-18
End date:
2013-03-01
Remarks (1)
Creation date
Author
Remark
2015-01-22 12:40 UTC
RP#59 completed
Parent Work Item:
510032
- LTE E850 - Lower Band for Region 2 (non-US), Band 27
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
R5
Rapporteur(s):
NII Holdings
Latest WID version:
RP-120603
TSG Approval meeting:
56
PCG Approval meeting:
29
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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